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| Brand | Bristol |
|---|---|
| Origin | USA |
| Model | 772B-MIR |
| Laser Type | CW or Pulsed (Rep. Rate ≥ 100 Hz) |
| Wavelength Range | 1–12 µm |
| Spectral Resolution | 4 GHz |
| Wavelength Accuracy | ±10 ppm (±0.08 nm @ 8 µm |
| Optical Rejection | >20 dB (>30,000 pulses) |
| Minimum Input Power | 0.005–2.5 µW |
| Measurement Time | 2 × Number of Pulses |
| Input | Free-space beam with auxiliary visible alignment guide |
| Display Units | 8-digit readout in nm, µm, cm⁻¹, GHz, THz |
| Calibration | Internal continuous calibration |
| Brand | Bristol |
|---|---|
| Origin | USA |
| Model | 828B |
| Wavelength Range | 1250–1650 nm (182–240 THz) |
| Absolute Accuracy | ±0.65 ppm (±1.0 pm @ 1550 nm) |
| Repeatability | ±0.2 ppm |
| Calibration Source | Internal NIST-traceable HeNe laser |
| Measurement Rate | 1000 Hz |
| Power Measurement Accuracy | ±0.5 dB (within ±30 nm of 1310/1550 nm) |
| Minimum Input Power | –40 dBm @ 100 Hz (0.1 µW) |
| Maximum Input Power | +10 dBm (display), +18 dBm (safe) |
| Display Resolution | 0.0001 nm |
| Output Units | nm, cm⁻¹, THz |
| Interface | USB 2.0, Ethernet (GPIB optional) |
| Brand | Bristol |
|---|---|
| Origin | USA |
| Model | 872 Series |
| Wavelength Range (VIS) | 375–1100 nm |
| Wavelength Range (NIR) | 630–1700 nm |
| Absolute Accuracy | ±0.2 ppm (±0.0002 nm @ 1000 nm) |
| Resolution | 0.001 ppm (300 kHz @ 300,000 GHz) |
| Measurement Rate | 1 kHz |
| Input | Fiber-coupled (free-space option available) |
| Calibration | Internal wavelength reference standard |
| PID Control | Integrated |
| Warm-up Time | <15 min |
| Dimensions (H×W×L) | 89 mm × 432 mm × 381 mm |
| Minimum Pulse Energy | 3–300 nJ (VIS), 50–600 nJ (NIR) |
| Brand | Brolis Semiconductors |
|---|---|
| Origin | Lithuania |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported |
| Model | FL21000055AZ |
| Pricing | Available Upon Request |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic (China) |
| Model | SuperSEM N10 |
| Instrument Type | Benchtop SEM |
| Electron Source | Tungsten Filament |
| SEM Class | Entry-Level Tungsten-Filament SEM |
| Max Sample Diameter | 90 mm |
| Max Sample Thickness | 40 mm |
| Stage Travel | X: 25 mm, Y: 25 mm, Z: 30 mm |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | Domestic (China) |
| Model | SuperSEM N10eV |
| Instrument Type | Desktop / Benchtop SEM |
| Electron Gun Type | Tungsten Filament |
| Microscope Class | Entry-Level Tungsten-Filament SEM |
| Maximum Sample Dimensions | 90 mm (diameter) × 40 mm (thickness) |
| Stage Travel Range | X: 25 mm, Y: 25 mm, Z: 30 mm |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Region Classification | Domestic (China) |
| Model | SuperSEM N10eX |
| Instrument Type | Desktop SEM |
| Electron Source | Tungsten Filament |
| SEM Class | Entry-Level Tungsten-Filament SEM |
| Maximum Sample Diameter | 90 mm |
| Maximum Sample Thickness | 40 mm |
| Stage Travel | X: 25 mm, Y: 25 mm, Z: 30 mm |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Category | Domestic (China) |
| Model | SuperSEM N10XL |
| Instrument Type | Desktop SEM |
| Electron Source | Tungsten Filament |
| SEM Class | Entry-Level Tungsten-Filament SEM |
| Sample Chamber Size | Up to 100 × 100 mm |
| Detector Configuration | Secondary Electron Detector (SED), Quadrant Backscattered Electron Detector (BSE), Integrated Silicon Drift Detector (SDD)-based EDS System |
| Real-Time Imaging Mode | Video-rate BSE + EDS spectral acquisition |
| Software Features | Auto-focus, Auto-stigmation, Auto-contrast/brightness, Large-area Stitching, Live EDS Mapping, Real-time Spectral Overlay |
| Power Requirement | Standard AC 220 V, 50 Hz |
| Footprint | < 0.8 m² |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Product Type | AFM Cantilever Probes |
| Material | Single-Crystal Silicon or Silicon Nitride |
| Tip Radius | 1 nm – 30 nm (model-dependent) |
| Spring Constant | 0.25 N/m – 450 N/m |
| Resonant Frequency | 10 kHz – 525 kHz |
| Coating Options | Al, Au, PtIr, Cr/Au, Conductive Diamond, DLC, Magnetic CoCr, Ptlr |
| Packaging | Individual Box (10 pcs), Wafer (300–400 pcs), or Custom Sets |
| Compliance | ISO/IEC 17025 traceable calibration available for certified probes |
| Brand | Alicona |
|---|---|
| Origin | Austria |
| Manufacturer Status | Authorized Distributor |
| Origin Category | Imported |
| Model | FocusX |
| Price | USD 245,000 (FOB Vienna, ex-works, configuration-dependent) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | AMICS Automated Mineralogy System (MLA) |
| Price | USD 210,000 (FOB Hamburg) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Dimension Edge |
| Instrument Type | Material-Focused AFM |
| Positioning Noise | X-Y ≤ 50 pm RMS, Z ≤ 50 pm RMS |
| Sample Diameter | 150 mm (vacuum chuck), Thickness: ≤ 15 mm |
| Scan Area | 150 mm × 150 mm |
| Imaging Bandwidth | Typical high-speed acquisition capability |
| Category | Scanning Probe Microscope (SPM) / Atomic Force Microscope (AFM) |
| Brand | Bruker |
|---|---|
| Origin | Malaysia |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | Dimension Edge |
| Price Range | USD 135,000 – 205,000 (FOB) |
| Instrument Type | Atomic Force Microscope (AFM) |
| Positional Noise (X-Y, Closed-Loop) | ≤0.15 nm RMS at standard imaging bandwidth (up to 625 Hz) |
| Z-Noise (Closed-Loop) | 35 pm RMS at standard imaging bandwidth (up to 625 Hz) |
| Sample Diameter Capacity | 210 mm |
| XY Stage Travel Range | 150 mm × 150 mm |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | Dimension FastScan |
| Instrument Type | Materials-Focused AFM |
| Position Detection Noise | X-Y ≤ 0.15 nm RMS, Z = 35 pm RMS |
| Typical Imaging Bandwidth | Up to 625 Hz |
| Sample Diameter | 210 mm (vacuum chuck), Max Thickness: ≤ 15 mm |
| Stage Travel Range | 180 mm × 150 mm |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | Dimension FastScan |
| Instrument Type | Materials-Focused AFM |
| XY Positioning Noise | ≤0.15 nm |
| Sample Dimensions | Ø ≤ 15 mm, Thickness ≤ 5 mm |
| Stage Travel Range | 180 mm × 180 mm |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Dimension FastScan |
| AFM Type | Industrial-grade |
| Instrument Category | Atomic Force Microscope |
| XY Positioning Noise | <1% |
| Sample Size Capacity | 200 mm diameter |
| XY Stage Travel Range | 210 × 210 mm |
| Z-Noise (Closed-loop) | <40 pm |
| Thermal Drift Rate | <200 pm/min |
| Max. Z-Approach Speed (Contact Mode) | 12 mm/s |
| Max. XY Tracking Speed (Closed-loop) | 2.5 mm/s |
| TappingMode Imaging Speed | ≥20 Hz (full-resolution) |
| ScanAsyst Imaging Speed | ≥6 Hz (full-resolution), up to 32 Hz (standard-res) |
| Resonance Frequency (Cantilever, air) | 1.3 MHz |
| Resonance Frequency (Cantilever, liquid) | 250–500 kHz |
| Controller | NanoScope V with enhanced bandwidth architecture |
| Optical Navigation System | MIRO integrated optical microscope |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dimension FASTSCAN |
| Pricing | Available Upon Request |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dimension Icon |
| Price Range | USD 135,000 – 205,000 (est.) |
| Instrument Type | Atomic Force Microscope |
| Application Class | Materials Science AFM |
| Position Detection Noise | <0.15 nm RMS (at typical imaging bandwidth up to 625 Hz) |
| Sample Diameter | Up to 210 mm |
| Sample Thickness Limit | ≤5 mm |
| XY Stage Travel Range | 180 mm × 150 mm |
| XY Repeatability | 2 µm (unidirectional), 3 µm (bidirectional) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dimension Icon |
| Price Range | USD 135,000 – 205,000 (est.) |
| Instrument Type | Atomic Force Microscope |
| Application Class | Industrial-Grade AFM |
| XY Positional Noise | ≤ 0.15 nm (RMS) |
| Z-Noise Floor | 35 pm (RMS) |
| Sample Diameter Capacity | 210 mm (vacuum chuck) |
| Maximum Sample Thickness | ≤ 15 mm |
| Scan Area | 180 mm × 150 mm (motorized stage travel) |
| Brand | Bruker |
|---|---|
| Origin | Malaysia |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dimension Icon |
| Instrument Type | Atomic Force Microscope |
| X-Y Positioning Noise (Closed-Loop) | ≤0.15 nm RMS (Standard Imaging Bandwidth, up to 625 Hz) |
| Z Positioning Noise (Closed-Loop) | 35 pm RMS (Standard Imaging Bandwidth, up to 625 Hz) |
| Maximum Sample Diameter | 210 mm |
| Sample Stage Travel Range | 150 mm |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Dimension Icon |
| Instrument Type | Atomic Force Microscope (AFM) |
| Vertical Noise Floor (Z-sensor, closed-loop) | <35 pm RMS |
| Typical Imaging Bandwidth | 625 Hz |
| Sample Stage | 210 mm vacuum chuck (Ø210 mm × 15 mm thick) |
| Stage Travel Range (X-Y visual field) | 180 mm × 180 mm |
| X-Y Scan Range (typical) | 90 µm × 90 µm |
| Z Scan Range (typical) | 10 µm |
| X-Y Positioning Noise (closed-loop) | <0.15 nm RMS (625 Hz) |
| Z Sensor Noise (closed-loop) | <35 pm RMS (625 Hz) |
| Overall Linearity Error (X-Y-Z) | 0.5% (typical) |
| Optical System | 5 MP digital camera, 180–1465 µm field of view, digital zoom & auto-focus |
| Controller | NanoScope V |
| Integrated Vibration Isolation | Monolithic pneumatic isolation table |
| Acoustic Enclosure | Rated for continuous ambient noise up to 85 dBC |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Dimension IconIR |
| Type | Modular Scanning Probe Microscope (SPM) with Integrated AFM-IR |
| Measurement Principle | Photothermal Induced Resonance (PTIR) / Nanoscale Fourier Transform Infrared (nano-FTIR) |
| Spatial Resolution | <10 nm |
| Sensitivity | Monolayer-level chemical detection |
| Compatibility | PeakForce Tapping® for nanomechanical & nanoelectrical correlative mapping |
| Software Platform | NanoScope Analysis with IR spectral library integration |
| Compliance | Supports GLP/GMP audit trails, ASTM E2987 (for nanoscale spectroscopic imaging), ISO/IEC 17025 traceability frameworks |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dimension Nexus |
| Instrument Type | Atomic Force Microscope |
| Application Class | Materials Science AFM |
| Architecture | Modular, Multi-Mode Scanning Probe Microscope |
| Controller Platform | NanoScope 6 |
| Core Imaging Modes | PeakForce Tapping®, PeakForce QNM®, PeakForce MFM®, ScanAsyst® Auto-Optimization |
| Environmental Operation | Air, Liquid, Controlled Atmosphere |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dimension Nexus AFM |
| Instrument Type | Atomic Force Microscope |
| Maximum Sample Size | 200 mm |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | Dimension XR |
| Instrument Type | Scanning Tunneling Microscope (STM) / Atomic Force Microscope (AFM) Platform |
| Maximum Sample Diameter | 210 mm (vacuum chuck), Thickness ≤ 15 mm |
| Environmental Operation Modes | Ambient air, liquid, electrochemical cell |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | QUANTAX ED-XS |
| CCD Camera Resolution | 640 × 480 pixels |
| Maximum Stage Speed | 10 mm/s |
| Spatial Resolution | 50 nm |
| Angular Resolution | 0.2° |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | OPTIMUS 2 QUANTAX EBSD eflash FS |
| CCD Camera Resolution | 640 × 480 |
| Maximum Stage Speed | 10 mm/s |
| Spatial Resolution | 1.5 nm |
| Angular Resolution | 0.2° |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Product Type | Imported Software for Electron Microscopy |
| Model | ESPRIT 2 |
| Price Range | USD 25,000 – 65,000 |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ESPRIT QUBE |
| Compatibility | Integrated with Bruker e-Flash EBSD detectors and QUANTAX EDS systems |
| Data Format Support | HDF5, .ctf, .ang, .h5ebsd, .edax, .oxford, .bmp, .tiff |
| Licensing | Concurrent or node-locked perpetual license |
| System Requirements | Windows 10/11 (64-bit), ≥32 GB RAM, ≥2 TB SSD storage recommended, NVIDIA GPU with ≥8 GB VRAM (CUDA 11.2+) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | eWARP |
| Quotation | Upon Request |
| Maximum Pattern Acquisition Rate | 14,400 patterns/second |
| Spatial Resolution | 20 nm |
| Angular Resolution | 0.1° |