Optical Instruments
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Showing 1591–1620 of 7818 results
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | FilmTek 2000 PAR-SE |
| Spectral Range | 190 nm – 1700 nm |
| Spot Size | 25 µm – 300 µm |
| Measurement Speed | <1 second per site |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | FilmTek 2000M TSV |
| Quotation | Upon Request |
| Sample Size | 200 mm or 300 mm |
| Film Thickness Measurement Accuracy | <0.2% (1σ) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | FilmTek 2000M TSV |
| Optical Configuration | Collimated Beam Reflectometry |
| Spot Size Range | 2 × 1 µm to >100 µm (adjustable via microscope objectives) |
| Spectral Range | 190–1100 nm |
| Spectral Resolution | <1.5 nm FWHM |
| Thickness Measurement Range | 5 nm – 350 µm |
| Compliance | ASTM E2476, ISO/IEC 17025 (when operated in accredited lab environments), supports GLP/GMP data integrity requirements |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Filmtek 4000 |
| Measurement Angles | 0° (normal incidence) and 70° (grazing incidence) |
| Spectral Range | 400–1650 nm |
| Spot Size | 1 mm (0°), 2 mm (70°) |
| Thickness Range | 100 nm – 150 µm |
| Thickness Accuracy | ≤3 Å (1σ), Repeatability: ≤0.5 nm (1σ) |
| Refractive Index Resolution | 2×10⁻⁵ @ TE, 4×10⁻⁵ @ TM (1σ) |
| Stage Travel | 200 mm × 200 mm, Positioning Resolution: 1 µm |
| Light Source | Halogen lamp, Lifetime ≥2000 h |
| Detectors | Dual visible CCDs (380–950 nm, 0.3 nm resolution, 2048 px) + Dual IR InGaAs detectors (950–1650 nm, 2 nm resolution, 512 px) |
| Software | Filmtek 4000 Suite with DPSD, Cauchy, Sellmeier, Drude, Lorentz, Tauc, EMA, Graded, Superlattice, and NK modeling |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | FilmTek 6000 PAR-SE |
| Spectral Range | 190 nm – 1700 nm |
| Single-Measurement Time | 2 s |
| Minimum Measurable Spot Size | 50 µm |
| Thickness Range | 0 Å – 150 µm |
| Thickness Accuracy | ±1.0 Å (for NIST-traceable SiO₂, 100 Å – 1 µm) |
| Spectral Resolution | 0.3 nm – 2 nm |
| Sample Diameter Support | 2 mm – 300 mm |
| Light Source | Regulated deuterium-halogen lamp (2000 h lifetime) |
| Detectors | 2048-pixel Sony linear CCD (UV–Vis), 512-pixel cooled Hamamatsu InGaAs CCD (NIR) |
| Operating System | Windows 10 on multi-core processor |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | FilmTek CD |
| Spectral Range | 190 nm – 1000 nm |
| Spot Size | 50 µm |
| Single-Measurement Time | 2 s |
| Thickness Accuracy | ±1.0 Å (NIST-traceable SiO₂ standard, 100 Å to 1 µm) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | HYPERION II |
| Detection Principle | Fourier Transform Infrared Spectroscopy (FT-IR) and Quantum Cascade Laser (QCL) Infrared Imaging |
| Detector Options | Liquid Nitrogen-Cooled MCT, Thermoelectrically Cooled MCT, Focal Plane Array (FPA) |
| Measurement Modes | Transmission, Reflection, ATR |
| Spatial Resolution | Diffraction-Limited (≤ 3–5 µm typical in mid-IR) |
| Objective Compatibility | Wide Range of Reflective and Refractive IR Objectives (e.g., 15×, 36×, 74×, ATR objectives with integrated pressure sensor) |
| Software Platform | OPUS 8.x with IR Image Analysis Suite, ILIM Control Module |
| Compliance | Fully Compatible with GLP/GMP Data Integrity Requirements, Supports Audit Trail & Electronic Signatures per FDA 21 CFR Part 11 |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Hysitron PI 89 |
| Application | In-situ nanomechanical testing inside SEM and FIB/SEM chambers |
| Sensing Principle | Capacitive displacement sensing with sub-nanometer resolution |
| Actuation | Electromechanical force actuation |
| Force Range | Up to 100 mN (standard configuration) |
| Displacement Resolution | < 0.2 nm |
| Positioning Accuracy | ≤ 50 nm (with integrated linear encoder and motorized tilt/rotate stages) |
| Compatibility | Fully compatible with FEI/Thermo Fisher, Zeiss, JEOL, and Hitachi SEM/FIB platforms |
| Analytical Integration | Synchronized acquisition with EBSD, EDS, BSE, and TKD detectors |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Innova |
| Instrument Type | Atomic Force Microscope (AFM) |
| Sample Stage Travel Range | 90 µm |
| Positional Detection Noise | < 0.1 nm (RMS, Z-axis, typical in air) |
| Maximum Sample Size Compatibility | 90 mm diameter × 25 mm height |
| Closed-Loop Scan Linearity | ±0.05% over full range |
| Z-Range | 10 µm (standard), upgradable to 15 µm |
| Optical Navigation Resolution | 1.3 MP color CCD with 4×–40× motorized zoom |
| AFM Mode Support | Contact, Tapping, Phase Imaging, Force Modulation, Lateral Force, Conductive AFM, Kelvin Probe Force Microscopy (KPFM), Magnetic Force Microscopy (MFM) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Innova |
| Instrument Type | Atomic Force Microscope (AFM) |
| Positioning Detection Noise | <2 µm (with standard 10× objective) |
| Sample Dimensions | 50 mm × 50 mm × 18 mm (X × Y × Z) |
| Z-Axis Stage Travel | 18 mm |
| Closed-Loop Scanner Range | XY > 90 µm, Z > 7.5 µm |
| Open-Loop Scanner Range | XY > 5 µm, Z > 1.5 µm |
| Optical Field of View | 1.24 mm × 0.25 mm (motorized zoom, 10× objective) |
| Optical Resolution | <2 µm (10×), <0.75 µm (50×) |
| Controller | 20-bit DAC, 100 kHz ±10 V ADCs |
| Software | SPMLab™ v7.0 (Windows® XP) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | Innova SPM |
| Instrument Type | Scanning Tunneling Microscope (STM) & Atomic Force Microscope (AFM) |
| Sample Stage Dimensions | X-45 mm × Y-45 mm × Z-18 mm |
| Scan Range | 90 µm (max) down to sub-micron resolution |
| Control Architecture | Closed-loop piezoelectric positioning |
| Optical System | Upright, motorized zoom and intensity-controlled illumination |
| Compatible Modes | Contact Mode, TappingMode™, STM, Phase Imaging™, MFM, EFM, C-AFM, SCM, KPFM, Force-Distance Spectroscopy, I-V Spectroscopy, Nanoindentation, Nanolithography |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | InSight AFP |
| Price Range | USD $2.6M–$3.2M (FOB) |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Industrial Process Control System |
| XY Positioning Noise Floor | 65 nm (RMS, closed-loop) |
| Maximum Sample Size | 33 mm × 26 mm |
| Stage Travel Range | 100 mm × 300 mm (X-Y) |
| Z-Range | >2 µm (with HyperMap™ large-area stitching capability) |
| Scan Speed | Up to 36,000 µm/s (profile mode) |
| Long-Term Height Stability | <0.3 nm over 12 months (NIST-traceable calibration) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | InSight CAP |
| Price Range | USD $180,000 – $240,000 |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Industrial Metrology System |
| XY Positioning Noise | < 65 nm (RMS, 0.1–10 Hz) |
| Maximum Sample Size | 33 mm × 26 mm |
| Stage Travel Range | 100 mm × 300 mm (X × Y) |
| Scan Range | 65 µm × 65 µm (XY), up to 15 µm (Z) |
| Long-Term Dynamic Repeatability | < 0.5 nm |
| Surface Flatness Accuracy over 26 mm | < 20 nm PV |
| AFM Controller | NanoScope® V 64-bit Digital Signal Processor |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | LUMOS II |
| Detector Options | TE-MCT (liquid-nitrogen-free), DTGS, LN2-cooled MCT |
| FPA Imaging Capability | Yes |
| Spatial Resolution | 0.6 µm/pixel |
| Field of View | 1490 × 1118 µm² |
| PermaSure+ Real-Time Calibration System | Yes |
| Sealed Optics (No Purge Required) | Yes |
| ZnSe Optical Components | Standard |
| Motorized Automation | Fully motorized aperture, detector, and technique switching |
| Sample Stage | Free-access, manual/optional motorized, max. 40 mm sample size |
| Compliance | FDA 21 CFR Part 11, cGMP, USP <1119>, EP 2.2.24, ALCOA+ data integrity principles |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | MultiMode 8 |
| Instrument Type | Atomic Force Microscope (AFM) |
| Z-Direction Positioning Noise | <0.3 Å RMS (Tapping Mode, 0 nm scan size, with active vibration isolation) |
| Maximum Sample Size | 15 mm × 15 mm × 5 mm |
| XY Stage Travel Range | 15 mm × 15 mm |
| Optional Scan Heads | AS-0.5 (0.4 µm × 0.4 µm XY / 0.4 µm Z), AS-12 (10 µm × 10 µm XY / 2.5 µm Z), AS-130 (125 µm × 125 µm XY / 5.0 µm Z), PF50 (40 µm × 40 µm XY / 20 µm Z) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | MultiMode 8 |
| Instrument Type | Materials-Focused AFM |
| XY Positioning Noise | ≤0.15 nm |
| Maximum Sample Diameter | ≤15 mm |
| Maximum Sample Thickness | ≤5 mm |
| Sample Stage Travel Range | 180 mm × 180 mm (visible area) |
| Controller | NanoScope® V |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MultiMode 8 |
| Price Range | USD 135,000 – 205,000 |
| Instrument Type | Atomic Force Microscope (AFM) |
| Sample Dimensions | Ø15 mm × 5 mm thickness |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | nanoIR3 |
| Instrument Type | Nano-Fourier Transform Infrared Spectrometer |
| Category | Scanning Probe Microscope–Integrated Optical Spectroscopy System |
| Compliance | ASTM E2947-21 (Standard Guide for Nanoscale Infrared Spectroscopy), ISO/IEC 17025–Accredited Measurement Capability Context |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | NanoRacer |
| Instrument Type | Biological Atomic Force Microscope |
| XY Position Detection Noise | <0.09 nm RMS |
| Z Position Detection Noise | <0.04 nm RMS |
| Typical Sample Diameter | 4 mm |
| Software Version | V7 |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | NanoTracker 2 |
| Laser Class | Class 1 |
| Positional Resolution | Sub-nanometer (closed-loop) |
| Force Sensitivity | < 0.1 pN/√Hz |
| Trap Stiffness Range | 0.01–100 pN/µm |
| Detection Bandwidth | Up to 100 kHz |
| Sample Stage Options | Piezo-driven XYZ stage (optional) |
| Illumination | LED-based Köhler illumination with condenser lens |
| Control Interfaces | TTL-triggered external devices (cameras, spectrometers, PMTs, APDs) |
| Software Compliance | FDA 21 CFR Part 11–ready audit trail, GLP/GMP-compatible experiment logging |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | NanoWizard 4 XP |
| Instrument Type | Biological AFM (Atomic Force Microscope) |
| Z-Direction Position Detection Noise | RMS < 0.030 nm |
| Sample Dimensions | Diameter < 15 mm, Thickness < 5 mm |
| XY Scanner Range | 20 mm × 20 mm |
| Maximum Z-Range | 16.5 µm |
| Line Scan Rate | Up to 150 Hz |
| Controller | Vortis™ 2 |
| Software Platform | Nanoscope V7 Workflow-Based Control Suite |
| Integration Capability | Fully compatible with super-resolution optical microscopy platforms (e.g., STED, SIM, TIRF) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | NanoWizard 4 XP |
| Instrument Type | Biological Atomic Force Microscope |
| Position Detection Noise | X-Y direction RMS < 0.09 nm, Z direction RMS < 0.04 nm |
| Sample Scan Area | 100 µm × 100 µm × 15 µm |
| Stage Travel Range | 20 × 20 mm² |
| Software | V7 |
| Controller | Vortis™ 2 |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | NanoWizard PURE |
| Instrument Type | Biological Atomic Force Microscope |
| Category | Scanning Probe Microscope (SPM) |
| Architecture | Modular, Optically Compatible SPM Platform |
| Key Capabilities | Correlative Optical-AFM Imaging, Quantitative Nanomechanics, Multi-Modal Functional Imaging (PFM, MFM, EFM, KPFM, C-AFM, SSRM, STS, sThermal-AFM), Nanomanipulation & Nanolithography |
| Software Suite | JPK Instruments (now part of Bruker) SPMLab+, ExperimentalPlanner, RampDesigner, DirectOverlay2, DirectTiling |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ULTRA Speed 3 |
| Instrument Type | Biological Atomic Force Microscope |
| Category | Scanning Probe Microscope (SPM) |
| Architecture | Modular, Multi-Functional SPM Platform |
| Compliance | Designed for GLP/GMP-relevant environments with audit-trail-capable software |
| Data Format | Native HDF5 storage with metadata embedding |
| Automation Level | Fully integrated hardware-software automation for unattended operation |
| Software Framework | JPK Instruments’ BioAFM Suite (licensed and co-developed with Bruker) |
| Microscope Integration | Compatible with inverted optical microscopes (e.g., Zeiss Axio Observer, Nikon Ti2, Olympus IX83) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | NanoWizard V |
| Instrument Type | Biological Atomic Force Microscope |
| Sample Stage Travel Range | 20 × 20 mm² |
| Maximum Sample Height (with Head-Up Stage) | 140 mm Ø × 18 mm thickness |
| Free Sample Space | Ø140 × 18 mm³ |
| Software | V8 |
| Key Capabilities | PeakForce-QI, PeakForce Tapping®, PeakForce QNM®, Quantitative Imaging (QI), Single-Molecule Force Spectroscopy, Single-Cell Force Spectroscopy, DirectOverlay 2 for AFM–Optical Correlative Imaging, ExperimentPlanner & ExperimentControl modules, Integrated High-NA Optical Microscopy, Multi-Dimensional Environmental Control |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | NanoWizard® 4 XP BioScience |
| Instrument Type | Biological Atomic Force Microscope |
| Software Platform | V7 |
| Category | Scanning Probe Microscope |
| Import Status | Imported |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | PI 89 AUTO |
| Application Domain | In situ SEM-integrated nanomechanical characterization |
| Automation Level | Fully motorized stage + patented dual-axis rotation/tilt (R/T) mechanism |
| Software Platform | TriboScan Auto v5.0+ |
| Compliance Framework | Designed for GLP-compliant workflows |
| Sample Environment | Compatible with standard high-vacuum and low-vacuum SEM chambers (FEI, Thermo Fisher, Zeiss, JEOL) |
| Maximum Load Resolution | Sub-100 nN |
| Displacement Resolution | < 0.05 nm |
| Stage Precision | ±50 nm positional repeatability over 10 mm × 10 mm travel range |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | QUANTAX EBSD |
| Pricing | Upon Request |
| CCD Camera Resolution | 640 × 480 pixels |
| Maximum Stage Speed | 10 mm/s |
| Spatial Resolution | 1.5 nm |
| Angular Resolution | 0.1° |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model Series | QUANTAX Transmission Electron Microscopy (TEM/STEM) EDS |
| Energy Resolution | <129 eV |
| Peak-to-Background Ratio | 20,000:1 |
| Maximum Count Rate | 1500 kcps |
| Elemental Detection Range | Be to Cf |
| Detector Active Area | 10–300 mm² |
| Window Options | Polymer Ultrathin Window or Windowless |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | QUANTAX FlatQUAD |
| Energy Resolution | <129 eV |
| Peak-to-Background Ratio | 20,000:1 |
| Maximum Count Rate | 4,000 kcps |
| Elemental Detection Range | Boron (B) to Californium (Cf) |
| Detector Active Area | 10–300 mm² |
| Window Type | Windowless |