Physical Property Testing Instruments
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| Brand | KLA |
|---|---|
| Origin | USA |
| Manufacturer | KLA Corporation |
| Instrument Type | Nanoindentation and Scratch Tester |
| Model | iNano® |
| Force Range | 0.1 µN – 50 mN |
| Displacement Range | ±25 µm |
| Force Resolution | < 10 nN |
| Displacement Resolution | < 0.01 nm |
| Thermal Drift | < 0.05 nm/s (at 25 °C, stabilized) |
| Maximum Scratch Load | 50 mN |
| Available Indenter Types | Berkovich, Cube-Corner, Spherical (1–100 µm radius), Conical, Flat Punch |
| Integrated Microscope | 10×–100× digital zoom, 1 µm lateral resolution |
| Controller | InQuest™ high-speed electronics (100 kHz sampling, 20 µs time constant) |
| XY Stage Travel | 100 mm × 100 mm |
| Z-Stage Travel | 25 mm |
| Compliance with Standards | ASTM E2546, ISO 14577-1/2/3, JIS H 8509 |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | InSEM HT |
| Instrument Type | High-Temperature In-Situ Nanoindentation and Mechanical Testing System for SEM/FIB Integration |
| Maximum Indentation Depth | 50 µm |
| Effective Load Range | 50 mN |
| Load Resolution | 3 nN |
| Displacement Range (X/Y) | 20 mm, (Z): 25 mm |
| Displacement Resolution | 4 nm |
| Maximum Friction Force | 0.05 N |
| Indenter Type | Diamond Berkovich / Cube-Corner / Spherical |
| Thermal Drift | < 0.05 nm at 800 °C |
| Operating Temperature Range | RT to 800 °C under vacuum |
| Compatibility | Integrated with SEM, FIB, or standalone high-vacuum chamber |
| Standards Compliance | ISO 14577-1/2/3, ASTM E2546, applicable to GLP/GMP-relevant mechanical property validation workflows |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | InSEM HT |
| Instrument Type | Nanoindentation System |
| Temperature Range | Up to 800 °C |
| Actuator Options | InForce 50 (50 mN) and InForce 1000 (1000 mN) |
| Data Acquisition Rate | 100 kHz |
| Time Constant | 20 µs |
| XYZ Stage Travel | 20 mm × 20 mm × 25 mm |
| Software Platform | InView (Windows® 10 compatible) with User Method Development, CSM, NanoBlitz 3D, AccuFilm™, ProbeDMA™, DataBurst™ |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | K-T G200 / I-Nano / Insitu |
| Application | In-situ nanomechanical characterization with optical, electrical, and structural correlation |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | Nano Indenter G200 |
| Force Range | 10 nN – 10 N (with modular transducers) |
| Displacement Resolution | < 0.01 nm |
| Maximum Indentation Depth | > 500 µm |
| Testing Speed | Up to 1 indentation point per second |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | G200 |
| Instrument Type | Integrated Nanoindentation and Scratch Tester |
| Maximum Load Capacity | 10 N |
| Displacement Resolution | < 0.01 nm (10 pm) |
| Load Resolution | < 50 nN |
| Compatible Modules | DCM II, XP Actuator, CSM, ProbeDMA™, AccuFilm™, Laser Heating, LFM, NanoVision, Survey Scanning, Express Test |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | G200X |
| Instrument Type | Integrated Nanoindentation and Scratch Tester |
| Maximum Load Capacity | 10 N |
| Load Resolution | <1 nN |
| Displacement Range | ±50 µm |
| Displacement Resolution | <0.01 nm |
| Indenter Types | Over 30 interchangeable tip geometries (Berkovich, cube-corner, spherical, flat-punch, etc.) |
| Brand | KLA |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | NanoFlip |
| Price Range | USD 260,000–390,000 (est.) |
| Instrument Type | In-Situ Nanomechanical Testing System |
| Max Indentation Depth | 50 µm |
| Effective Load Range | 50 mN |
| Load Resolution | 3 nN |
| Displacement Range (X/Y) | 20 mm, (Z): 25 mm |
| Displacement Resolution | 4 nm |
| Max Friction Force | 0.05 N |
| Indenter Tip | Diamond Berkovich or Cube-Corner |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | NanoFlip |
| Instrument Type | Integrated Nanoindentation and Scratch Tester |
| Environmental Operation | Vacuum and Controlled Atmosphere (including Glovebox-Compatible) |
| Actuator | InForce 50 Electromagnetic Force Actuator with Capacitive Displacement Sensing |
| Controller | InQuest High-Speed Digital Controller (100 kHz Data Acquisition, 20 µs Time Constant) |
| Motion System | Motorized XYZ Stage (X/Y: 21 mm Travel, Z: 25 mm Travel) |
| Sample Orientation | Flip Mechanism for SEM/FIB Imaging Alignment |
| FIB-to-Test Capability | 90° Sample Tilt for Seamless Transition from FIB Milling to Nanomechanical Testing |
| Software | InView™ v6.x (Windows® 10 Compatible), Includes ISO 14577 Compliance Module, User Method Development Toolkit, Real-Time SEM Video Synchronization, Integrated Tip Calibration Suite |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | Profilm 3D |
| Measurement Principle | Vertical Scanning Interferometry (VSI) & Phase-Shifting Interferometry (PSI) |
| Thickness Range (VSI) | 50 nm – 100 mm |
| Thickness Range (PSI) | 0 – 3 µm |
| Reflectance Range | 0.05% – 100% |
| Piezo Scan Range | 500 µm |
| XY Stage Options | 100 mm × 100 mm or 200 mm × 200 mm |
| Compliance | ISO 25178-604, ISO 9000, ASME B46.1 |
| Roughness Parameters | 47 standardized (ASME Y14.36M, ISO 4287, ISO 25178-2) |
| Software | ProfilmOnline cloud-based analysis platform |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Model | R50-4PP / R50-EC |
| Type | Imported Instrument |
| Distribution Channel | Authorized Distributor |
| Pricing | Available Upon Request |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | UTM T150 |
| Instrument Type | Nanoindentation and Scratch Tester |
| Application Category | Surface & Interface Property Testing |
| Compliance | ASTM-compliant |
| Brand | KaLiKe |
|---|---|
| Origin | Chongqing, China |
| Model | KLA2010-B6 |
| Instrument Type | Specific Surface Area and Pore Size Analyzer |
| Principle | Static Volumetric Gas Adsorption Method |
| Number of Analysis Stations | 6 |
| Surface Area Range | 0.0005 m²/g (using Kr adsorption) to unlimited |
| Pressure Range | 0–133 kPa |
| Measurement Theory | Gas adsorption based on static vacuum volumetric method |
| Sensor Repeatability Error | < ±0.1% |
| Ambient Temperature Operation | Yes |
| Temperature Control Accuracy | ±0.5 °C |
| Vacuum System | Custom-designed stainless-steel vacuum system with metal-sealed joints, silver-plated internal surfaces, dual-layer vacuum shielding, and ultra-high vacuum capability up to 1×10⁻⁸ Torr (standard pump base: 1×10⁻² Pa / 1×10⁻⁴ Torr) |
| AD Resolution | 24-bit |
| Pressure Transducer | High-precision capacitive absolute pressure transducer (accuracy: 0.1%) |
| Liquid Nitrogen Dewar Capacity | Sustains >70 h unattended operation |
| Isothermal Jacket | Integrated liquid nitrogen isothermal sleeve for thermal stability below sample zone |
| Dimensions (L×W×H) | 500×500×750 mm (customizable) |
| Brand | KaLiKe |
|---|---|
| Origin | Chongqing, China |
| Model | KLA2010-C2 |
| Analysis Stations | 2 |
| Specific Surface Area Range | 0.0005 m²/g (using Kr) to unlimited |
| Pore Size Range | 0.35 nm – 500 nm (N₂ adsorption, extendable with high-vacuum option) |
| Pressure Range | 0–133 kPa |
| Vacuum System | Dual-stage ultra-high vacuum system (molecular pump + stainless-steel piping), base pressure ≤1×10⁻⁸ Torr |
| Temperature Control Accuracy | ±0.5 °C |
| Sensor Repeatability Error | <±0.1% |
| Detection System | Dual-range capacitive absolute pressure transducers (0–10 Torr & 0–1000 Torr per station), 24-bit AD acquisition |
| Isothermal Jacket | Liquid nitrogen isothermal enclosure for thermal stabilization |
| Sample Capacity | 70-hour unattended operation enabled by large-capacity LN₂ Dewar |
| Compliance | Designed for ASTM D3663, ISO 9277, ISO 15901, and USP <846> compliant workflows |
| Origin | Tianjin, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China) |
| Model | ISO 11925-2 |
| Airflow Velocity Range | 0–10 m/s |
| Timer Resolution | 0.1 s |
| Ignition Angle Options | 0° (vertical) and 45° |
| Brand | Truth Instruments Company Limited |
|---|---|
| Origin | Shandong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | KMPL-PM |
| Pricing | Available Upon Request |
| Brand | Koehler |
|---|---|
| Origin | Germany |
| Model | ED Series |
| Temperature Range | Ambient +5°C to 300°C |
| Control System | DS Controller with Integrated Timer (0–99 h) |
| Temperature Setting Resolution | Digital, 0.1°C |
| Alarm | Visual Temperature Alarm |
| Airflow Adjustment | Rear Ventilation Flap (Ø50 mm) + Front Ventilation Slider |
| Standard Interior Volume Options | 20 L, 53 L, 115 L, 240 L, 400/700 L |
| Standard Shelves | 2 Nickel-Plated Adjustable Shelves |
| Interface Option | RS422 for APT-COM Data Control Software |
| Compliance | Designed for GLP/GMP-aligned laboratory environments |
| Brand | SMS |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Koenen |
| Price Range | USD 14,000 – 70,000 |
| Instrument Type | Multi-Functional Tribological Tester |
| Max Friction Force | 20 N |
| Friction Force Resolution | 4 mN |
| Max Operating Temperature | 400 °C |
| Origin | Guangdong, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Regional Origin | Domestic (PRC) |
| Model | EC2500H |
| Quotation | Available Upon Request |
| Origin | Guangdong, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China) |
| Model | KOSAKA LAB SEF680 |
| Pricing | Upon Request |
| Origin | Guangdong, China |
|---|---|
| Manufacturer Type | Distributor |
| Origin Category | Domestic (China) |
| Model | KOSAKA SE300 |
| Pricing | Upon Request |
| Brand | KP (UK) |
|---|---|
| Origin | United Kingdom |
| Model | HVKP |
| Vacuum Compatibility | UHV (≤1×10⁻¹⁰ mbar) |
| Measurement Principle | Non-contact, vibrating capacitor-based Kelvin probe force microscopy (KPFM) with off-null detection |
| Work Function Resolution | 1–3 meV (2 mm tip), 5–10 meV (50 µm tip) |
| Tip-to-Sample Distance Control | Down to 400 nm with patented Height Regulation (HR) mode |
| Spatial Resolution | Sub-micron (dependent on tip geometry and vacuum conditions) |
| Detection Mode | Off-Null (ON) signal amplification |
| Actuation | Voice-coil (VC) driver |
| Data Output | Digital export to Excel, Origin, or third-party analysis software |
| Compliance | Designed for GLP/GMP-aligned surface science workflows |
| Brand | KP (UK) |
|---|---|
| Origin | United Kingdom |
| Model | KP020 |
| Environment | Ambient & Controlled Atmosphere |
| Probe Options | 2 mm & 50 µm tip diameters |
| Work Function Resolution | 1–3 meV (2 mm tip), 5–10 meV (50 µm tip) |
| Tip-to-Sample Distance Control | Down to ≤400 nm |
| Height Regulation Mode (HR) | Active feedback-controlled vertical positioning |
| Detection Principle | Off-Null (ON) non-zero signal detection |
| Actuation | Voice-coil (VC) driver |
| Digital Control | Full digital parameter management (DC, SM, SA, WA, QT, DE, OC, FC, RS) |
| Software Export | Excel, Origin, third-party formats |
| Compliance | Designed for GLP-aligned surface potential mapping and work function metrology |
| Brand | KPM EyePro |
|---|---|
| Origin | Canada |
| Model | Q-bake |
| Category | Online Non-destructive Vision Inspection System for Food Manufacturing |
| Compliance | Designed for FDA 21 CFR Part 11–ready environments, supports GLP/GMP-aligned audit trails and electronic records |
| Brand | KPM Sightline |
|---|---|
| Origin | Canada |
| Model | IL Series |
| Type | In-line, 360°, Full-Color 3D Vision Inspection System |
| Throughput | Up to 100 objects/sec |
| Software | measura® Inspection Suite |
| Compliance | Designed for FDA, USDA, CFIA, and EU food safety regulatory alignment (HACCP, GMP, ISO 22000) |
| Integration | PLC-compatible, Ethernet/IP & Modbus TCP ready |
| Camera Options | Top, side, and bottom-mounted configurations |
| Lighting | Multi-spectral (visible, LED, structured light) |
| Measurement Library | 150+ built-in geometric, chromatic, and morphological parameters (expandable) |
| Reject Mechanisms | Air jet, pusher arm, diverter gate (field-selectable) |
| Data Output | Real-time OEE metrics, defect classification logs, batch-level SPC charts, audit-ready CSV/SQL export |
| Brand | KPM Sightline |
|---|---|
| Origin | Canada |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | P-Series |
| Pricing | Available Upon Request |
| Brand | KPM Sightline |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Sift AI |
| Pricing | Available Upon Request |
| Brand | KPM Sightline |
|---|---|
| Origin | Canada |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | TV Series |
| Pricing | Upon Request |
| Brand | KRK |
|---|---|
| Origin | Japan |
| Model | KRK 2000D |
| Maximum Load Capacity | 500 N (standard) |
| optional | 100 N, 200 N, 1000 N |
| Gauge Length | 100–180 mm |
| Elongation Range | up to 20 mm (at 180 mm gauge length) |
| Tensile Speed | 2–50 mm/min |
| Specimen Width | 15 mm or 25 mm |
| Clamping Method | Pneumatic jaws |
| Power Supply | 100/110/220 V AC, 50/60 Hz, 2 A |
| Air Supply | 0.4–0.6 MPa |
| Dimensions (W×D×H) | 700 × 430 × 440 mm |
| Weight | 38 kg |
| Compliance | TAPPI T494, ISO 1924-2, GB/T 12914 |
| Brand | KRUESS |
|---|---|
| Origin | Germany |
| Instrument Type | Laboratory Benchtop Oscillating U-Tube Densimeter |
| Detection Mode | Liquid Density Measurement |
| Density Range | DS7900: 0.00000–1.99999 g/cm³ |
| DS7800 | 0.0000–1.9999 g/cm³ |
| Density Accuracy | DS7900: ±0.00005 g/cm³ |
| DS7800 | ±0.0001 g/cm³ |
| Repeatability | DS7900: ±0.00001 g/cm³ |
| DS7800 | ±0.0001 g/cm³ |
| Temperature Control Range | 10–40 °C |
| Temperature Stability | ±0.02 °C |
| Sample Volume | 2 mL |
| Measurement Time | 30–60 s |
| Calibration Standards | Dry air and distilled water |
| Calibration Points | 4–10, 3rd-order polynomial fit |
| Data Storage Capacity | 999 results |
| User-Defined Methods | 99 |
| Compliance | ASTM D4052, ASTM D5002, NIST-traceable, GLP/GMP-ready, FDA 21 CFR Part 11 compatible (audit trail enabled) |