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| Brand | Attocube Systems AG |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | attoNVM |
| Temperature Range | 1.8–300 K |
| Magnetic Field Range | ±9 T (vector, 1–1–1 T) or ±1 T (vector, 1–1–1 T) |
| Brand | Attocube Systems AG |
|---|---|
| Origin | Germany |
| Model | attoCSFM |
| Operating Temperature Range | 1.5 K – 300 K |
| Magnetic Field Range | 0 – 15 T |
| Optical Spectral Range | 400 – 1600 nm |
| Objective Lens | Cryogenic Confocal Objective (NA = 0.82, Working Distance = 4 mm) |
| Scan Range | 30 × 30 µm (at 4 K) |
| Spatial Resolution | < 50 nm (lateral), < 5 nm (z-height control) |
| Magnetic Field Sensitivity | ≤ 3 nT/√Hz (100 s integration) |
| NV-center-based Diamond Nanosensor Integration | Yes |
| AFM Platform | Tuning-Fork-Based Non-Contact AFM |
| ESR Detection Method | Spin-Dependent Fluorescence via Confocal Microscopy |
| Drift Stability | < 10 nm over 1 h (room-temperature base stability reference) |
| Compliance | Designed for GLP/GMP-aligned lab environments |
| Brand | Attocube Systems AG |
|---|---|
| Origin | Germany |
| Model | attoAFM/attoMFM/attoSHPM |
| Temperature Range | mK to 373 K |
| Magnetic Field Compatibility | up to 15 T |
| Scan Range (4 K) | 30 µm × 30 µm |
| Lateral Resolution (MFM) | < 11 nm |
| Lateral Resolution (SHPM) | 250 nm |
| Z-bit Resolution (4 K, full range) | 7.6 pm |
| Z-bit Resolution (4 K, scan range) | 0.12 pm |
| RMS Z-noise (4 K) | 0.05 nm |
| Vacuum/Atmosphere | 1×10⁻⁶ mbar to 1 bar (He exchange gas) |
| Compatible Cryostats/Magnets | Quantum Design PPMS (1″ & 2″ bore), custom dilution refrigerators |
| Brand | Attocube Systems AG |
|---|---|
| Origin | Germany |
| Model | attoAFM/attoMFM/attoSHPM |
| Temperature Range | mK to 373 K |
| Magnetic Field Compatibility | Up to 15 T |
| Scan Range (4 K) | 30 µm × 30 µm |
| Lateral Resolution (MFM) | <11 nm |
| Lateral Resolution (SHPM) | 250 nm (high-res mode) |
| Z-Noise (4 K) | 0.05 nm RMS |
| Z-Bit Resolution (full range) | 7.6 pm |
| XY-Bit Resolution (4 K, 12 µm scan) | 0.18 nm |
| Vacuum/He Atmosphere | 1×10⁻⁶ mbar to 1 bar |
| Compatible Cryostats | Quantum Design PPMS, 1″ & 2″ bore systems |
| Modular Functionality | AFM, MFM, SHPM, c-AFM, EFM, STM, SNOM, Confocal Microscopy |
| Brand | Applied NanoFluorescence |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | Nano Spectralyzer NS3 |
| Pricing | Available Upon Request |
| Brand | ADVANCE RIKO |
|---|---|
| Origin | Japan |
| Model | F-PEM |
| Operating Atmosphere | Ambient Air |
| Temperature Range | Room Temperature to 600 °C (Heating Zone) |
| Sample Size | Square, 40 mm × 40 mm × (5–30) mm Thickness |
| Power Supply | AC200V, 5 kW (Main Unit) |
| Dimensions | W600 × D600 × H1700 mm |
| Weight | ~120 kg |
| Contact Force | Up to 160 kgf (via Constant-Pressure Spring Mechanism) |
| Measured Parameters | Maximum Output Power (P<sub>max</sub>), Heat Flow Rate (Q), Thermoelectric Conversion Efficiency (η) |
| Brand | ADVANCE RIKO |
|---|---|
| Origin | Japan |
| Model | F-CAL |
| Measurement Principle | Heat Flow Method |
| Thermal Resistance Range | 1×10⁻⁵ m²·K/W |
| Repeatability | <2% fluctuation |
| Test Atmosphere | Ambient air |
| Hot-Side Temperature Setting | 50°C |
| Sample Geometry | Square, 25 mm or 40 mm edge length, thickness 1–5 mm |
| Instrument Type | Steady-State Thermal Resistance Analyzer |
| Brand | ADVANCE RIKO |
|---|---|
| Origin | Japan |
| Model | PEM-2 |
| Maximum Temperature Gradient | 500 °C (up to 800 °C heating surface) |
| Sample Geometry | Square, 20/30/40 mm × 5–30 mm thickness |
| Contact Pressure | 2 MPa (at 30 mm square sample) |
| Atmosphere | Inert gas compatible |
| Measurement Method | One-dimensional heat flux input method |
| Measured Parameters | Thermoelectric conversion efficiency (η), electrical power output (P), thermal input flux (Q) |
| Heating System | High-precision infrared gold-mirror furnace |
| Cooling System | Integrated water-cooled lower stage |
| Load Control | Automated variable resistive load adjustment |
| Software | Fully integrated control with thermal stability detection, real-time data logging, and automated test sequencing |
| Brand | ADVANCE RIKO |
|---|---|
| Origin | Japan |
| Model | ZEM-d |
| Temperature Range | Up to 200 °C (sample surface) |
| Sample Cross-Section | Ø20 mm (max) |
| Sample Thickness | 10 µm – 20 mm |
| Measured Properties | Seebeck coefficient (S), electrical resistivity (ρ) |
| Atmosphere | Air or inert gas (N₂, Ar) |
| Measurement Orientation | Through-thickness (z-direction) |
| Brand | ADVANCE RIKO |
|---|---|
| Origin | Japan |
| Model | TCN-2ω |
| Measurement Principle | 2ω Lock-in Thermography (Frequency-Domain Modulated Joule Heating) |
| Test Temperature | Ambient (23 ± 2 °C) |
| Sample Dimensions | 10–20 mm (L) × 10 mm (W) × 0.3–1 mm (total thickness, including substrate) |
| Substrate Materials | Si (recommended), Ge, Al₂O₃ |
| Metal Transducer Film | Au (100 nm, 1.7 mm × 15 mm) |
| Thermal Conductivity Range | 0.1–10 W·m⁻¹·K⁻¹ |
| Atmosphere | Ambient air |
| Compliance | ISO/IEC 17025-aligned methodology, compatible with GLP documentation workflows |
| Brand | Advance Riko |
|---|---|
| Origin | Japan |
| Model | Peltier Evaluation System |
| Measurement Atmosphere | Vacuum |
| Temperature Range | 27–80 °C |
| Sample Dimensions | Square, 10–25 mm side length, thickness ≤ 3 mm |
| Measured Parameters | ΔTₘₐₓ (maximum temperature difference), Qc,ₘₐₓ (maximum cooling power), COP (coefficient of performance) |
| Compliance | Designed for thermoelectric module characterization per ISO 14405-1 and ASTM D5470 practices |
| Brand | Advance Riko |
|---|---|
| Origin | Japan |
| Model | ZEM-3 |
| Temperature Range | 50–800 °C (ZEM-3M8) / 50–1000 °C (ZEM-3M10) |
| Sample Geometry | Square (2–4 mm × 6–22 mm L) or Circular (Ø2–4 mm × 6–22 mm L) |
| Heating Method | Infrared gold-coated furnace with micro-heater for ΔT control |
| Max. Sample ΔT | 50 °C |
| Atmosphere | Ultra-high-purity helium (99.999%) |
| Automation | Fully computer-controlled measurement with background EMF compensation |
| Contact Verification | Real-time V–I curve analysis for ohmic contact validation |
| Optional Accessories | Thin-film adapter, cryogenic module (−100 to 200 °C), high-resistivity kit (up to 10 MΩ) |
| Brand | Advance Riko |
|---|---|
| Origin | Japan |
| Model | TC-1200RH |
| Measurement Principle | Laser Flash Method (LFM) |
| Temperature Range | RT to 1150 °C (up to 1200 °C short-term) |
| Thermal Conductivity Range | 0.1–2000 W/m·K |
| Accuracy | ±5% |
| Repeatability | ±3% |
| Sample Dimensions | Ø10 mm × 1–3 mm (thickness), measured through-thickness |
| Atmosphere | Vacuum (standard) |
| Heating Rate | 10 °C/min (to 100 °C), 20 °C/min (to 300 °C), 50 °C/min (to 1150 °C) |
| Dimensions (W×D×H) | 900 × 1050 × 1700 mm |
| Weight | ~350 kg |
| Power Supply | AC200 V, single-phase, 8 kVA (main unit) |
| Cooling Water | ≥5 L/min, pressure ≥0.15 MPa |
| Compliance | JIS R 1611, JIS R 1650-3, JIS H 7801, ISO 13826, ASTM E1461 |
| Brand | Advance Riko |
|---|---|
| Origin | Japan |
| Model | Mini-PEM |
| Operating Temperature Range (Hot Side) | 50–500 °C |
| Sample Dimensions | 2–10 mm × 1–20 mm (square/rectangular bulk) |
| Atmosphere | Vacuum-compatible |
| Measured Parameters | Thermoelectric conversion efficiency (η), electrical power output, heat flux |
| Measurement Principle | Simultaneous four-probe electrical characterization + calibrated heat flux sensor (thermopile-based) |
| Compliance | Designed for ASTM E3049–22 (Standard Practice for Measuring Thermoelectric Module Efficiency) and ISO 14405-1:2016 (Geometrical product specifications) alignment |
| Brand | Lake Shore |
|---|---|
| Origin | USA |
| Manufacturer Status | Authorized Distributor |
| Product Origin | Imported |
| Model | SuperVariMag |
| Pricing | Upon Request |
| Brand | Lake Shore |
|---|---|
| Origin | USA |
| Model | F71 (3-axis), F41 (1-axis) |
| Measurement Range | 35 mT to 35 T |
| DC Accuracy | ±0.15% of reading (standard probe, 350 mT–3.5 T range) |
| AC Bandwidth | 550 Hz (–3 dB), HF Mode: 20 Hz–7 kHz (–0.2%) |
| Resolution | < 0.1 µT |
| Probe Compatibility | FP-Series Hall Probes only |
| Compliance | Designed for GLP/GMP environments with audit-ready data logging capability |
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