Energy Dispersive X-Ray Fluorescence Spectrometer
Filter
Showing 121–150 of 318 results
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | EA1280 |
| Configuration | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Al (Z=13) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <150 eV (Mn Kα) |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | MESA-50 |
| Detector Type | Silicon Drift Detector (SDD) |
| Excitation Source | Micro-focus X-ray Tube |
| Analytical Spot Sizes | 0.1 mm, 0.3 mm, and 1.2 mm |
| Minimum Detection Limit (MDL) | ≤2 ppm for Pb, Cd, Hg, Cr, Br |
| Measurement Time | Typically 60–300 s per point |
| Sample Viewing | Integrated High-Resolution CCD Camera with 30× Optical Zoom |
| Operating Environment | Ambient air (no vacuum or helium required) |
| Software Interface | Multilingual (English/Chinese), Excel-compatible data export |
| Compliance Support | RoHS Directive 2011/65/EU, WEEE Directive 2012/19/EU, ELV Directive 2000/53/EC, China RoHS II (SJ/T 11364-2014), JEITA EG0201, ASTM F2617-23 |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | MESA-50 |
| Configuration | Benchtop/Free-standing |
| Industry Application | Electronics Manufacturing & Compliance Testing |
| Elemental Range | Al (Z=13) to U (Z=92) |
| Quantitative Detection Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Relative Standard Deviation (RSD) | ≤0.05% for repeated measurements under standardized conditions |
| Detector | Silicon Drift Detector (SDD) |
| Signal Processing | HORIBA Digital Pulse Processor (DPP) |
| Collimator Options | Three fixed apertures (Ø0.1 mm, Ø0.3 mm, Ø1.0 mm) |
| Dimensions | 225 × 210 × 40 mm (L×W×H) |
| Weight | 12 kg |
| Battery Life | Up to 6 hours continuous operation (integrated rechargeable Li-ion) |
| Vacuum/Atmosphere | Ambient air analysis (no vacuum pump or cryogenic cooling required) |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | MESA-50 |
| Form Factor | Benchtop/Portable |
| Elemental Range | Al (13) to U (92) |
| Detection Limit | ppm-level |
| Energy Resolution | 131 eV (at Mn Kα) |
| Repeatability | <1% RSD |
| Dimensions | 294 × 208 × 205 mm |
| Weight | 12 kg |
| Battery Life | Up to 6 hours |
| Sample Imaging | Coaxial CCD camera |
| Detector | Silicon Drift Detector (SDD) |
| Signal Processing | HORIBA Digital Pulse Processor (DPP) |
| Vacuum/Nitrogen Requirement | None (ambient air operation, including Cl analysis) |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | MESA-7220V2 |
| Configuration | Benchtop / Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application-Specific Design | Petroleum & Lubricant Compliance Testing |
| Elemental Range | S, Cl |
| Quantification Range | S: 0.7 ppm – 10.0 wt% |
| Cl | 0.6 ppm – 10.0 wt% |
| Mn-Kα Energy Resolution | ≤175 eV |
| Detector | Silicon Drift Detector (SDD) |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | XGT-5200WR |
| Sample Environment | Air (Atmospheric) |
| Elemental Range | Na to U |
| Quantification Range | 1 ppm – 99.99% |
| Operating Conditions | 50 kV / 1 mA |
| Repeatability | ±0.1% RSD |
| Spot Size | Standard 400 µm, Optional 10 µm |
| Detector | Silicon Drift Detector (SDD), LN2-free |
| Geometry | Coaxial Optical Microscope Integration |
| Analysis Mode | Non-destructive, No Vacuum Required, No Sample Preparation |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | XGT-7000V |
| Detector | Silicon Drift Detector (SDD) |
| X-ray Source | Rh anode, 50 kV / 1 mA |
| Spatial Resolution | Down to 10 µm |
| Measurement Range | Na (11) to U (92) |
| Vacuum Modes | Full vacuum & local vacuum (switchable in <5 s) |
| Optical Imaging | Co-axial CCD with macro/micro view |
| Sample Chamber | 300 mm × 300 mm × 80 mm (full vacuum), XY stage: 100 mm × 100 mm |
| Software | SmartMap™ for hyperspectral mapping, INCA™ pulse processor, GLP-compliant data handling |
| Quantification Methods | Fundamental Parameters (FP), single-standard FP, calibration curve, multilayer thin-film analysis (nm–µm scale) |
| Elemental Mapping | Pixel-resolved full-spectrum acquisition, offline reprocessing, RGB overlay, line scan, ROI masking |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | XGT-7200WR |
| Detection Principle | Energy Dispersive X-Ray Fluorescence (ED-XRF) |
| Spot Size Range | 10 µm to 1.2 mm |
| Detector Type | Silicon Drift Detector (SDD), Liquid-Nitrogen-Free |
| Maximum Scan Area | 10 cm × 10 cm |
| Optical-Element Image Co-Registration | Yes |
| Elemental Mapping Resolution | ≤10 µm |
| Compliance | ASTM E1621, ISO 8256, IEC 62321-5 (RoHS), USP <232>/<233>, GLP/GMP-ready data audit trail |
| Brand | I-CHEQ |
|---|---|
| Origin | USA |
| Model | F2-9000 |
| Application | Handheld/Field-Portable |
| Element Range | Mg–Pu |
| Detection Range | 1 ppm – 99.99% |
| Energy Resolution | 120–140 eV |
| Repeatability | 0.1% |
| Detector | High-Resolution Silicon Drift Detector (SDD) |
| Excitation Source | Variable-Voltage (up to 50 kV) Microfocus X-ray Tube with Selectable Anode Materials (Au, Ag, W, Ta, Pd) |
| Cooling | Peltier Semiconductor |
| Operating System | Windows CE |
| Display | Industrial-Grade TFT Color Touchscreen |
| Dimensions (L×W×H) | 233 × 84 × 261 mm |
| Weight (with battery) | 1.46 kg |
| Compliance | Meets IEC 61000-6-3 (EMC), IEC 61000-6-2, ANSI N43.3, and FDA 21 CFR Part 1020.40 for X-ray safety |
| Brand | Innov-X |
|---|---|
| Origin | USA |
| Model | DELTA Series |
| Portability | Handheld |
| Elemental Range | Mg to U |
| Detection Limit | 1 ppm |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <165 eV |
| Repeatability | ≥95% |
| Excitation Source | Micro-focus X-ray Tube (10–40 kV) |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Weight | <1.5 kg |
| Operating System | Microsoft Windows Embedded CE |
| Battery Life | >4 hours continuous operation |
| Hot-Swap Battery Support | Yes |
| Display | 32-bit color touchscreen |
| Sample Targeting | Integrated camera + collimated beam optics |
| Trigger Options | Mechanical trigger, Deadman safety trigger, or external PC control |
| Brand | Innov-X |
|---|---|
| Origin | USA |
| Model | XDD-5000 Series |
| Elemental Range | Mg to U |
| Detection Limit | 1 ppm – 99.99% |
| Energy Resolution | <165 eV |
| Repeatability | 95% |
| Weight | <12 kg |
| Excitation Source | 10 W Microfocus X-ray Tube |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Operating System | Windows XP |
| Configuration | Benchtop or Floor-Standing |
| Distribution Type | Imported Instrument via Authorized Distributor |
| Brand | COX Analytical Systems |
|---|---|
| Origin | Sweden |
| Model | Itrax XRF FleXRay |
| Form Factor | Benchtop/Floor-Standing |
| Application Domain | Geological & Mining Core Analysis |
| Elemental Range | Na–U |
| Detection Principle | Energy-Dispersive X-Ray Fluorescence (ED-XRF) |
| Optical Resolution | High-Resolution RGB Imaging System |
| Surface Topography Compensation | Integrated Laser Distance Sensor (8 mm Fixed Working Distance) |
| Data Acquisition Speed | 0.2 s per measurement point |
| Sensitivity | Sub-ppm for heavy and transition metals |
| Calibration Approach | Pre-loaded Standard Reference Material Libraries |
| Compliance Context | Designed for GLP-compliant sediment core laboratories |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSX-1000S |
| Elemental Analysis Range | Mg–U (Na–U optional) |
| Quantitative Range | 0.1–99.9 wt% |
| Energy Resolution | <170 eV at Mn Kα |
| Repeatability | ±0.1% RSD |
| X-ray Tube | 5–50 kV, 1 mA, Rh anode |
| Filter Options | Standard — OPEN, ND, Cr, Pb, Cd |
| Detector | Silicon Drift Detector (SDD) |
| Sample Chamber | Ø300 mm × 80 mm H |
| Atmosphere Mode | Air (standard) |
| Imaging System | Integrated color camera |
| Software Suite | Qualitative & Quantitative Analysis, RoHS Compliance Module (Cd, Pb, Hg, Br, Cr), Quick-Analysis Mode, Report Generator, Daily Verification Tool |
| Origin | Beijing, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China) |
| Model | Portable 350 |
| Application | Field-Portable |
| Industry-Specific Use | Electronics, Petrochemical, Power, Aerospace, Scrap Recycling |
| Elemental Range | Mg (Z=12) to U (Z=92) |
| Quantitative Range | 1 ppm to 99.99 wt% |
| Energy Resolution | 149 ± 5 eV (at Mn Kα) |
| Repeatability | RSD ≤ 0.05% |
| Origin | Beijing, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China-made) |
| Model | Portable 450 |
| Application | Field-deployable handheld analysis |
| Industry-Specific Use | Electronics, Petrochemical, Aerospace, Power Generation, Scrap Recycling |
| Elemental Range | Mg (Z=12) to U (Z=92) |
| Quantification Range | 1 ppm to 99.99 wt% |
| Energy Resolution | 149 ± 5 eV at Mn Kα |
| Repeatability | RSD ≤ 0.05% for major alloying elements |
| Brand | Ju Chuang Environmental |
|---|---|
| Origin | Shandong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | JC-350X |
| Form Factor | Benchtop/Floor-Standing |
| Instrument Type | Conventional EDXRF |
| Application Scope | General-Purpose |
| Detection Range | 0.07 ppm – 99.9% |
| Energy Resolution | 125 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD (for major elements, 100 s counting) |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Measurement Range | 1–45 keV |
| High Voltage | 5–50 kV |
| Tube Current | 5–1000 µA |
| Vacuum Level | ≤10⁻² Pa within 10 s (operational range: 10⁻¹–10⁻⁵ Pa) |
| Sample Imaging | 5 MP CCD camera with real-time positioning |
| Power Consumption | 50 W (main unit), 550 W (vacuum pump) |
| Dimensions | 720 × 440 × 435 mm (W×D×H) |
| Weight | 65 kg |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Origin Category | Domestic |
| Model | In-flowX |
| Form Factor | Benchtop/Floor-standing |
| Instrument Type | Conventional ED-XRF Spectrometer |
| Measurement Principle | Energy Dispersive X-Ray Fluorescence (ED-XRF) |
| Detection Range | ppm to wt% |
| Compliance Framework | Designed for GLP/GMP-aligned process monitoring environments |
| Communication Protocols | RS485, TCP/IP |
| Enclosure Rating | IP65 |
| Sample Interface | Flow-through liquid cell with automated sampling loop |
| Core Functionalities | Automated sampling, real-time spectral acquisition, multi-element quantification, auto-calibration, self-cleaning cycle, threshold-based alarm triggering |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Domestic/Imported | Domestic |
| Model | IP68 |
| Application | Handheld / Submersible |
| Instrument Type | Conventional Energy Dispersive X-Ray Fluorescence (ED-XRF) Spectrometer |
| Ingress Protection Rating | IP68 |
| Operational Depth | Up to 10 m underwater |
| Measurement Mode | In-situ, non-destructive elemental analysis |
| Data Transmission | Real-time wireless telemetry to surface control unit |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | PeDX 980 / 980S / 980CS |
| Application Form Factor | Handheld / Portable |
| Instrument Type | General-Purpose ED-XRF |
| Elemental Analysis Range | Br, Cr, Pb, Hg, Cd, Cl |
| Quantitative Detection Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD (for major elements under standardized conditions) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Country of Origin | Domestic (China) |
| Model | PeDX RAMAN |
| Application | Handheld / Portable |
| Instrument Type | Conventional |
| Industry Use | General Purpose |
| Elemental Analysis Range | Mg–U |
| Quantitative Range | 1 ppm – 99.99% |
| Energy Resolution | 145 eV |
| Repeatability | 0.1% |
| Detector | High-Performance Silicon Drift Detector (SDD) with Peltier cooling |
| Dual-Mode Capability | Simultaneous Raman Spectroscopy & Energy-Dispersive X-ray Fluorescence (ED-XRF) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | ROCKSY |
| Configuration | Benchtop/Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Design | Geological & Mineralogical Analysis |
| Elemental Range | Na (11) – U (92) |
| Quantitative Range | 0.1 ppm – 99.99 wt% |
| Detection Geometry | Top-View (Vertical Illumination) |
| Detector | High-Resolution Silicon Drift Detector (SDD) |
| Vacuum Capability | Integrated Intelligent Vacuum System |
| Portability | Field-Deployable with Onboard Battery |
| Software | ROCKSY Smart Analysis Suite (Real-Time Visualization, Report Automation, GLP-Compliant Data Logging) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX 860CS |
| Form Factor | Benchtop/Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose with Copper Alloy Optimization |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm (for typical matrix elements under optimized conditions) |
| Detector | High-Resolution Silicon Drift Detector (SDD), Peltier-cooled, ≥140 eV Mn-Kα resolution |
| Vacuum System | Integrated Automatic Vacuum Pump |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Origin Category | Domestic |
| Model | ScopeX 980Quartz |
| Configuration | Benchtop/Floor-standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-purpose with Quartz Sand Optimization |
| Elemental Analysis Range | Na (11) to U (92) |
| Detection Limit | 1 ppm (for matrix-matched standards) |
| Energy Resolution | <125 eV at Mn Kα |
| Repeatability | ≤0.1% RSD (for major oxides at ≥1 wt%) |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX CSA 600 |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose Regulatory Compliance Analysis |
| Elemental Range | Mg to U (Z = 12–92) |
| Detection Limit | 1 ppm (for Cd, Pb, Hg, Cr, Br, Cl under optimized conditions) |
| Energy Resolution | <125 eV at Mn Kα (5.89 keV) |
| Repeatability | ≤0.1% RSD (for homogeneous reference materials, n=10) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX CSA 660 |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF Spectrometer |
| Application Scope | General-Purpose Regulatory Screening |
| Elemental Range | Mg to U |
| Detection Limit | 1 ppm (for Cd, Pb, Hg, Cr, Br, Cl in polymer matrices) |
| Energy Resolution | <125 eV at Mn Kα |
| Repeatability | ≤0.1% RSD (for 100 s counting time on homogeneous standards) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX CSA 660F |
| Configuration | Benchtop / Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose Elemental Analysis |
| Elemental Range | Mg (12) to U (92) |
| Detection Limit | 1 ppm (for typical matrixes) |
| Energy Resolution | <125 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD (for homogeneous standards) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Origin Category | Domestic |
| Model | ScopeX Industrial Silicon Analyzer |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm |
| Energy Resolution | <125 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Origin Category | Domestic |
| Model | ScopeX |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-purpose |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm |
| Energy Resolution | <125 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Regional Classification | Domestic |
| Model | ScopeX |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm |
| Energy Resolution | <125 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic |
| Model | ScopeX Al₂O₃ Powder Analyzer |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm |
| Energy Resolution | <125 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |