Optical Instruments
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Showing 4861–4890 of 7842 results
| Brand | MiXran |
|---|---|
| Model | Meg1127 |
| Component Type | Optical Element |
| Design Wavelengths | 257 nm, 266 nm, 343 nm, 355 nm, 400 nm, 532 nm, 632.8 nm, 780 nm, 800 nm, 850 nm, 1030 nm, 1064 nm, 1550 nm |
| Retardation | λ/2 |
| Clear Aperture | ≥8.0 mm (for Ø12.7 mm variants) or ≥15.0–18.0 mm (for Ø25.4 mm variants) |
| Thickness | 6.35 mm or 7.92 mm |
| Incident Angle | 0° (optimized for normal incidence) |
| Substrate Material | Fused Silica (standard) |
| Surface Quality | 20–10 scratch-dig |
| Wavefront Distortion | <λ/8 @ 633 nm |
| Damage Threshold | >5 J/cm² (10 ns, 10 Hz, 1064 nm) |
| Brand | MiXran |
|---|---|
| Model | Meg1128 |
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Price | USD 0.14 (FOB, indicative only |
| Brand | MiXran |
|---|---|
| Model | Meg1129 |
| Optical Element Type | Positive Meniscus Lens |
| Diameter | 25.4 mm and 50.8 mm options |
| Focal Length (EFL) | 100–300 mm |
| Coating Options | Uncoated, VIS AR (400–700 nm), NIR AR (650–1050 nm), SWIR AR (1000–1650 nm) |
| Material | Optical Grade BK7 or Equivalent Crown Glass |
| Surface Quality | 40-20 Scratch-Dig |
| Center Thickness Tc | 2.52–9.71 mm |
| Edge Thickness Te | 1.1–7.29 mm |
| Radius of Curvature R1/R2 | Variable per focal length |
| Back Focal Length (BFL) | Specified per configuration |
| Conformance | ISO 10110-1, ISO 10110-2, MIL-PRF-13830B |
| Brand | MiXran |
|---|---|
| Model | Meg1130 |
| Material | UV-grade fused silica (SiO₂) |
| Lens Type | Positive meniscus |
| Coating Options | Uncoated or broadband AR coating (250–400 nm) |
| Diameter | 25.4 mm / 50.8 mm |
| Focal Length (EFL) | 100–1000 mm |
| Surface Radii (R₁, R₂) | Variable per focal length |
| Center Thickness (Tc) | 2.18–10.65 mm |
| Edge Thickness (Te) | 1.2–5.36 mm |
| Power | 1–10 m⁻¹ |
| Compliance | ISO 10110-1, MIL-O-13830 surface quality (scratch-dig 20–10 typical), RoHS-compliant manufacturing |
| Brand | MiXran |
|---|---|
| Model | Meg1131 |
| Material | Calcium Fluoride (CaF₂) |
| Lens Type | Positive Meniscus |
| Coating Options | Uncoated or IR1 Broadband Anti-Reflection Coating (Rₐᵥg < 1.5% @ 3–5 µm) |
| Diameter | 12.7 mm & 25.4 mm |
| Focal Length (EFL) | 20–500 mm |
| Surface Quality | 60–40 scratch-dig |
| Surface Flatness | λ/4 @ 633 nm |
| Transmission Range | 0.18–8.0 µm |
| Refractive Index @ 5 µm | ~1.39 |
| dn/dT | –1.1 × 10⁻⁶ /°C |
| Clear Aperture | ≥90% of diameter |
| Center Thickness (Tc) | 2.4–43.6 mm |
| Edge Thickness (Te) | 1.45–43.5 mm |
| Back Focal Length (BFL) | 16.3–495.4 mm |
| Radius of Curvature R₁ & R₂ | specified per configuration |
| Compliance | ISO 10110-1, ISO 10110-3, MIL-PRF-13830B |
| Brand | MiXran |
|---|---|
| Model | Meg1132 |
| Filter Type | Bandpass Interference Filter |
| Center Wavelength (CWL) | 340–1550 nm (multiple standard options) |
| Full Width at Half Maximum (FWHM) | 10 nm ± 0.5 nm |
| Peak Transmission (T<sub>max</sub>) | ≥30% to ≥75%, depending on CWL and variant |
| Substrate | Optical-grade fused silica or BK7 (customizable) |
| Surface Quality | 60-40 scratch-dig |
| Parallelism | <3 arcsec |
| Clear Aperture | ≥90% of diameter |
| Diameter Options | 12.7 mm (½″) and 25.4 mm (1″) |
| Thickness | 3.0 mm (standard), customizable |
| Mounting | Unmounted (optical component) |
| Brand | MiXran |
|---|---|
| Model | Meg1133 |
| Component Type | Optical Filter |
| Diameter Options | 12.7 mm & 25.4 mm |
| Center Wavelength Range | 214–2000 nm |
| FWHM Options | 13–75 nm |
| Center Wavelength Tolerance | ±2–±7 nm |
| FWHM Tolerance | ±2–±8 nm |
| Peak Transmission | 10–75% |
| Substrate Material | Optical-grade fused silica or BK7 (application-optimized) |
| Surface Quality | 60-40 scratch-dig |
| Parallelism | <3 arcsec |
| Clear Aperture | ≥90% of diameter |
| Operating Temperature Range | –20 °C to +70 °C |
| Damage Threshold | >500 mJ/cm² @ 10 ns, 10 Hz, 1064 nm |
| Brand | MiXran |
|---|---|
| Model | Meg1134 |
| Type | Zero-Order Quarter-Wave Plate (λ/4) |
| Construction | Air-Gap Retarder |
| Design Wavelengths | 257 nm to 1550 nm |
| Aperture | ≥8.0 mm (for Ø12.7 mm plates) or ≥15.0–18.0 mm (for Ø25.4 mm plates) |
| Thickness | 6.35 mm or 7.92 mm |
| Incident Angle | 0° |
| Surface Quality | λ/10 @ 633 nm |
| Wavefront Distortion | <λ/4 over clear aperture |
| Substrate Material | Fused Silica (UV-grade for ≤355 nm |
| Coating | Broadband AR coating (R<0.25% per surface, specified per wavelength band) |
| Damage Threshold | >5 J/cm² (10 ns, 10 Hz, 1064 nm) |
| Brand | MiXran |
|---|---|
| Model | Meg1135 |
| Type | Achromatic Quarter- and Half-Wave Plate |
| Diameter | 25.4 mm |
| Thickness | 6.35 mm |
| Clear Aperture | ≥18.0 mm |
| Incident Angle | 0° |
| Wavelength Ranges | VIS (450–650 nm), NIR (650–1100 nm), SWIR (900–2100 nm) |
| Retardation Accuracy | λ/150 (VIS/NIR), λ/50 (SWIR) |
| Surface Reflectivity | R < 0.5% (VIS/NIR), R < 0.75% (SWIR) |
| Coating | Broadband Anti-Reflection (AR) |
| Material | Fused Silica / MgF₂ / Crystal Quartz Composite Stack |
| Brand | MiXran |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Category | Imported Optical Instrument Component |
| Model | RELION VII CL |
| Component Type | Optical Instrument Module |
| Beam Voltage | 0–30 kV (continuously adjustable, typically operated ≤25 kV) |
| Beam Current | 0–2 mA (continuously adjustable, with overcurrent protection) |
| Vacuum Level | ≤0.25 Pa (ultimate), ~2.66 Pa (20 mTorr) typical operating pressure |
| Focusing Spot Size | Adjustable from defocused (several mm to >1 cm) to spot-focused (≤1 mm diameter) |
| Observation Window | 50 mm Ø lead-glass viewport (3 mm thick), plus optional 20 mm concave re-entrant window for high-magnification objectives |
| Sample Tray Dimensions | 100 × 60 × 20 mm |
| Power Supply | 220 V AC, 50–100 Hz |
| Max. Power Consumption | ≥800 W |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MK-300 |
| Price | USD 78,500 (FOB Yokohama) |
| Focal Length | 300 mm |
| Optical System | Aberration-Corrected Imaging Spectrograph |
| f-number | f/4.4 |
| Spectral Resolution (FWHM) | 0.2 nm (within 3 pixels) |
| Imaging Magnification | ~1.25× |
| Stray Light Level | ≤5×10⁻³ |
| Wavelength Accuracy | ±0.2 nm (within 3 pixels) |
| Wavelength Repeatability | ±0.2 nm (within 3 pixels) |
| Grating Exchange Repeatability | ±0.2 nm (within 3 pixels) |
| Spectral Range | 200–1000 nm (with 1200 lines/mm grating) |
| Mechanical Wavelength Coverage | 0–1200 nm |
| Wavelength Drive Mechanism | Sine-bar linear translation |
| Actuation | Stepper motor (PC-controlled via USB) |
| Grating Size | 50 × 50 mm |
| Max. Grating Capacity | 3 (motorized turret) |
| Slit Width Range | 0.01–4.00 mm (symmetrical, continuous, 0.01 mm resolution) |
| Shutter | Manual (optional motorized shutter available) |
| Software Interface | USB-connected wavelength control, scanning, and grating selection |
| Brand | MKN |
|---|---|
| Model | TES-1327K |
| Measurement Principle | Infrared Pyrometry (6–14 µm spectral response) + Contact Thermocouple (Type K) |
| Temperature Range (IR) | –35 °C to +500 °C (–31 °F to +932 °F) |
| Temperature Range (K-Type) | –150 °C to +1350 °C (–238 °F to +1999 °F) |
| IR Resolution | 0.1 °C / 0.2 °F |
| K-Type Resolution | 0.1 °C / 0.1 °F (≤200 °C), 1 °C / 1 °F (>200 °C) |
| IR Accuracy | ±2% of reading or ±2 °C, whichever is greater |
| K-Type Accuracy | ±(0.2% rdg + 1.0 °C) from –150 to 0 °C |
| Emissivity Adjustment | 0.17–1.00 (user-selectable) |
| Distance-to-Spot Ratio | 12:1 (min. target diameter: 25 mm) |
| Laser Targeting | Class II, ≤1 mW, visible red dot |
| Display | Backlit LCD with dual-parameter real-time readout |
| Data Logging | 50-point internal memory (viewable directly on display) |
| Auto Power-Off | ~15 seconds |
| Battery | 9 V alkaline (IEC 6LR61, 006P) |
| Operating Environment | 0–50 °C, ≤80% RH |
| Storage | –10–60 °C, ≤70% RH |
| Dimensions | 172 × 118 × 46 mm |
| Weight | 220 g |
| Brand | MKN |
|---|---|
| Model | TES-1327K-USB |
| Measurement Range | −35°C to 500°C (−31°F to 932°F) |
| Resolution | 0.1°C / 0.2°F |
| Accuracy | ±2% of reading or ±2°C, whichever is greater |
| Spectral Response | 6–14 µm |
| Distance-to-Spot Ratio | 12:1 (min. target diameter: 25 mm) |
| Emissivity Adjustment | 0.17–1.00 |
| Laser Targeting | Class II, ≤1 mW |
| Memory Capacity | 21,000 continuous readings + 99 manual records |
| Display | Backlit LCD with dual-temperature & dual-unit (°C/°F) capability |
| Alarm Function | Configurable high/low temperature thresholds with audible beep |
| Interface | USB 2.0 for data export and firmware/software interaction |
| Power | 9V alkaline battery (approx. 100 h continuous operation) |
| Operating Environment | 0–50°C, <80% RH |
| Storage | −10–60°C, <70% RH |
| Brand | MKN |
|---|---|
| Model | TES-1335 |
| Sensor Type | Silicon Photodiode with Diffuser & Cosine-Corrected Filter |
| Measurement Range | 0–40,000 lux (0–40,000 fc) |
| Resolution | 0.01 lux / 0.01 fc |
| Accuracy | ±3% rdg ± 0.5% f.s. (±4% rdg ±10 digits above 10,000 lux, calibrated against 2856 K standard lamp) |
| Spectral Response Compliance | CIE Photopic Luminosity Function (f'₁ < 6%) |
| Cosine Error Compensation | Built-in optical diffuser with cosine angular correction |
| Display | 3¾-digit LCD + analog bar graph |
| Sampling Rate | 1.3 Hz (digital), 13.3 Hz (analog) |
| Auto Power-Off | 30 minutes |
| Operating Temp. | 0–40 °C, ≤80% RH |
| Storage Temp. | −10–50 °C, ≤70% RH |
| Power | 6 × AAA (1.5 V), ~400 h continuous use (Zn-Carbon) |
| Detector Cable Length | 150 cm |
| Detector Dimensions | 92 × 60 × 29 mm |
| Meter Dimensions | 150 × 72 × 35 mm |
| Weight | 320 g |
| Standards Compliance | CNS 5119 Class AA, ISO/CIE photometric traceability |
| Brand | MKN |
|---|---|
| Model | TES-1336A |
| Sensor Type | Silicon Photodiode (not Selenium Cell — corrected per technical specification) |
| Measurement Range | 0–20,000 lux / 0–1,858 fc (1 fc = 10.764 lux) |
| Display | 3½-digit LCD |
| Ranges | 20 / 200 / 2000 / 20,000 lux/fc |
| Resolution | 0.01 lux (0.01 fc) |
| Accuracy | ±(3% of reading + 5 digits) |
| Repeatability | ±2% |
| Temperature Coefficient | ±0.1%/°C |
| Sampling Rate | 2.5 readings/sec |
| Overload Indication | "OL" |
| Data Logging Capacity | 255 groups, up to 16,000 records |
| Interface | RS-232 (9600 bps), includes 9-pin to 25-pin adapter |
| Operating Temp./RH | 0–40°C, 10–80% RH |
| Storage Temp./RH | 10–60°C, 10–70% RH |
| Power | 9V alkaline battery (IEC 6F22 / NEDA 1604 / 006P), ~50 h continuous use |
| Detector Cable Length | 150 cm |
| Detector Dimensions | 87.5 × 60 × 29 mm (L×W×H) |
| Meter Dimensions | 146 × 70 × 39 mm (L×W×H) |
| Weight | 300 g |
| Accessories | Instruction manual, carrying case, 9V battery, RS-232 cable, 9-pin/25-pin adapter, calibration rod, software disk |
| Brand | MKN |
|---|---|
| Model | TES-1337 |
| Sensor Type | Silicon Photodiode with CIE Photopic Filter |
| Measurement Range | 0.01–20,000 Lux (0.01–20,000 fc) |
| Resolution | 0.01 Lux (0.01 fc) |
| Accuracy | ±3% rdg ±0.5% f.s. (±4% rdg ±10 digits above 10 klux, calibrated at 2856 K standard lamp) |
| Spectral Match Error (f₁′) | ≤6% |
| Temperature Coefficient | ±0.1% / °C |
| Sampling Rate | 2.5 Hz |
| Display | 3½-digit LCD + analog bar graph |
| Operating Temp./RH | 0–40°C / <80% RH |
| Storage Temp./RH | −10–50°C / <70% RH |
| Power | 6 × AAA (1.5 V) batteries |
| Battery Life | ~400 h (carbon-zinc) |
| Detector Cable Length | 150 cm |
| Detector Dimensions | 92 × 60 × 29 mm |
| Meter Dimensions/Weight | 150 × 72 × 35 mm / 320 g |
| Overload Indication | OL |
| Hold/Max/Min Functions | Yes |
| Compliance | CIE photopic luminosity function (V(λ)) standard |
| Brand | MKN |
|---|---|
| Origin | Zhejiang, China |
| Model | TES-1339R Memory-Enabled Digital Illuminance Meter (RS232) |
| Sensor Type | Silicon Photodiode |
| Display | 4-digit dual LCD |
| Measurement Range | 0.01–999900 Lux (5 auto-ranging scales) |
| Resolution | 0.01 Lux / 0.001 fc |
| Accuracy | ±3% of reading ±5 digits (calibrated against 2856 K standard incandescent source) |
| Temperature coefficient | ±0.1%/°C |
| Sampling rate | ~5 readings/sec |
| Manual memory capacity | 99 data points |
| Auto-logging capacity | 40,000 records |
| Operating environment | 0–50°C, <80% RH |
| Storage environment | −10–60°C, <70% RH |
| Power | 6 × AAA batteries (~100 h life) |
| Sensor cable length | 150 cm |
| Sensor dimensions | 100 × 60 × 29 mm |
| Main unit dimensions | 150 × 72 × 35 mm |
| Weight | ~320 g |
| Compliance | CNS 5119 Class II |
| Interface | RS232 |
| Brand | Makeway |
|---|---|
| Model | MKW-3000 |
| Origin | Shanghai, China |
| Detector Type | Multi-probe EDS-compatible |
| Energy Resolution | 120 eV |
| Operating Environments | High Vacuum & Ambient Air |
| Maximum Beam Scan Area | 60 × 60 mm² |
| Sample Positioning | 4-axis Motorized Stage (Vacuum & Air) |
| Beam Control | Motorized Variable Aperture & Remote Focusing |
| Compliance | Designed for ISO/IEC 17025-aligned radiation effects testing workflows |
| Brand | MLOPTIC |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | Cylindrical Lens |
| Pricing | Upon Request |
| Component Type | Optical Element |
| Material Options | Schott, Ohara, Hoya, CDGM optical glasses |
| Max Diameter | 100 mm |
| Diameter Tolerance | +0/−0.01 mm |
| Surface Quality | 10–5 |
| Radius of Curvature | 5 mm to ∞ |
| Radius Tolerance | ±0.002 mm |
| Surface Figure Accuracy | λ/10 |
| Centering Error | ≤0.005 mm |
| Coating Options | Broadband AR, V-Coating, Custom Optical Coatings |
| Metrology | Zygo Interferometer with Computer-Generated Holography (CGH), Max Aperture φ95 mm, λ/10 verification |
| Origin | Tianjin, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (PRC) |
| Model | MN60-C |
| Pricing | Available Upon Request |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | 004 |
| Pricing | Available Upon Request |
| Wavelength Range | 457.9–514.5 nm |
| Max Total Output Power | 150 mW (multi-line) / 50 mW (single-line @ 488 nm) |
| Beam Mode | TEM₀₀ |
| Beam Diameter (1/e²) | 0.65 mm |
| Beam Divergence | 0.95 mrad |
| Beam Pointing Stability | <30 µrad |
| Output Power Drift (post-warm-up) | <±1% |
| Amplitude Noise | <1% RMS |
| Polarization Ratio | >100:1 |
| Warm-up Time | 5 min |
| Input Voltage/Frequency | 100–265 VAC, 50–60 Hz |
| Power Consumption | <1500 W |
| Dimensions (L×W×H) | 13.0" × 7.6" × 5.1" |
| Weight | 14 lbs (6.4 kg) |
| Wavelength | 457.9 nm (single-line) |
|---|---|
| Output Power | 10 mW (TEM₀₀) |
| Beam Diameter | 0.65 mm |
| Beam Divergence | 0.95 mrad |
| Pointing Stability | <30 µrad |
| Power Drift (after warm-up) | <±1% |
| Intensity Noise | <1% RMS |
| Polarization Ratio | >250:1 |
| Warm-up Time | 5 min |
| Input Voltage/Frequency | 100–265 VAC, 50–60 Hz |
| Power Consumption | <1500 W |
| Weight | 6.4 kg |
| Origin | USA |
| Configuration | Integrated sealed-tube laser head + embedded power supply |
| Compliance | CE, RoHS, FDA 21 CFR Part 1040.10 (Laser Product Safety) |
| Brand | Modulight |
|---|---|
| Origin | Finland |
| Laser Type | Solid-State / Semiconductor |
| Wavelength Range | 400–2000 nm |
| Output Power Range | 0.1 mW – 300 W |
| Packaging Options | TO-Can, C-Mount, CS-Mount |
| Laser Structures | FP, DFB, BA (Broad-Area), IAB (Individually Addressable Bar) |
| Operation Modes | CW and Pulsed |
| Compliance | RoHS, REACH, ISO 9001-certified manufacturing |
| Brand | Modulight (Finland) |
|---|---|
| Origin | Finland |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Laser Type | Solid-State Semiconductor Laser |
| Core Components | Integrated Solid-State Laser Engine with Fiber-Coupled Output |
| Control Interfaces | RS232, RS422, Ethernet |
| Power Input | DC |
| Housing | Anodized Aluminum |
| Compliance | IEC 60601-1, ISO 13485 Certified Manufacturing |
| Cloud Integration | Modulight Cloud (Wi-Fi/Ethernet/Cellular) |
| Beam Delivery | SMA-905 Fiber Connector or Custom Optics |
| Wavelength Range | 266 nm – 2000+ nm |
| Output Power Range | 10 mW – 100 W (wavelength-dependent) |
| Channel Architecture | Independently Addressable Multi-Wavelength Channels |
| Cooling & Drive | Integrated Thermal Management and Precision Current Drivers |
| Software | PC-Based GUI with Real-Time Control, Logging, and Remote Diagnostics |
| Brand | Modulight |
|---|---|
| Origin | Finland |
| Laser Type | Solid-State & Semiconductor Hybrid Platform |
| Wavelength Standard | 689 nm (Configurable 400–2000 nm) |
| Output Power | Up to 3 W (Primary Treatment Laser), 400 mW @ 635 nm (Class 2 Aiming Beam) |
| Beam Delivery | SMA-905 Fiber-Coupled Output |
| Spot Diameter Adjustment | 1–14 mm |
| Irradiance | Up to 600 mW/cm² |
| Beam Homogenization | Integrated Modulight Beam Shaper |
| Control Interface | iPad mini with Clinical GUI |
| Safety Compliance | IEC 60825-1:2014, EN 60601-2-22:2017, FDA 21 CFR Part 1040.10/1040.11 |
| Cloud Integration | Modulight Cloud (AES-256 Encrypted, HIPAA- and GDPR-Compliant Log Storage) |
| Slit Lamp Compatibility | Universal Mounting for All Major Slit Lamps (Haag-Streit, Topcon, Zeiss) |
| Brand | Modulight |
|---|---|
| Origin | Finland |
| Model | Tunable Broadband Light Source |
| Illumination Mode | External Illumination |
| Light Source Types | Xenon Lamp, Mercury Lamp |
| Compliance | CE, IEC 61000-6-3, IEC 61000-6-4 |
| Environmental Control | Integrated Hypoxia/O₂ Regulation (0.1–21% O₂) |
| Illumination Stations | Up to 4 configurable stations (e.g., 95 mm dish, 24/96/384/1536-well plates) |
| Wavelength Flexibility | Simultaneous multi-wavelength output (7 discrete channels, 350–850 nm range) |
| Control Interface | 10.1″ capacitive touchscreen + Modulight Cloud platform |
| Data Management | Audit-trail-enabled logging compliant with GLP/GMP principles |
| Software | MLControl v4.x with protocol scheduling, dose calibration (J/cm²), irradiance control (mW/cm²), and time-resolved exposure sequencing |
| Brand | Moglabs |
|---|---|
| Model | BOSA 400 |
| Wavelength Range | 1265–1345 nm, 1525–1565 nm, 1525–1615 nm |
| Optical Resolution | 10 MHz @ 1550 nm / 10 MHz @ 1310 nm |
| Wavelength Accuracy | ±0.5 pm (C/L-band), ±1.0 pm (O-band) |
| Spurious-Free Dynamic Range | >80 dB |
| Input Power Range | –70 to +13 dBm |
| Max Safe Total Input Power | +20 dBm |
| Sensitivity | –70 dBm / 10 MHz |
| Power Accuracy | ±0.5 dB |
| Polarization Capability | Dual orthogonal polarization channels |
| Scan Speed | 20 nm/s |
| Wavelength Calibration | Built-in atomic frequency reference |
| Optional Modules | Option 10 (1 MHz tunable laser), Option 20 (device characterization: IL/RL), Option 30 (polarization-resolved spectroscopy), Option 40 (phase-resolved spectral analysis) |
| Brand | Moglabs |
|---|---|
| Model | CEL Series |
| Type | External-Cavity Diode Laser (ECDL) |
| Wavelength Range | 450–530 nm & 630–1620 nm |
| Output Power | Up to 250 mW (LD-dependent) |
| Linewidth | <100 kHz (typical), down to 20 kHz (configuration-dependent) |
| Tuning Range | >20 GHz mode-hop-free scan (with MOGLabs controller) |
| Beam Diameter (1/e²) | ~0.6 mm × 0.3 mm |
| Polarization | >100:1 vertical linear |
| Modulation Bandwidth | 20 MHz (AC/DC-coupled, 20 ns delay optional) |
| RF Modulation | >2.5 GHz bandwidth via bias-tee |
| Piezo Feedback | High-bandwidth PZT actuation with user-replaceable Cateye module |
| Thermal Control | TEC (±14.5 V / 3.3 A |
| Cooling | Air-cooled standard |
| Compliance | Designed for GLP/GMP-aligned lab environments |
| Brand | Moglabs |
|---|---|
| Model | MENHIR-1550 |
| Wavelength | 1560 ± 10 nm |
| Repetition Rate | Up to 2.5 GHz (standard options: 250/500 MHz, 1/1.25/2/2.5 GHz |
| Pulse Width | ≤200 fs (transform-limited) |
| Average Power | ≥50 mW (up to 2 W with optional variant) |
| Pulse Energy | ≥0.05 nJ (up to 1 nJ) |
| Spectral Bandwidth | ≥12.5 nm (3 dB) |
| Beam Quality | TEM₀₀, M² ≤ 1.05 |
| Polarization | Linear (PER ≥ 23 dB) |
| Amplitude Noise | ≤0.1% RMS (24 h) |
| Timing Jitter | ≤30 fs (1 kHz – 10 MHz) |
| Cooling | Passive air conduction |
| Warm-up Time | ≤10 s (cold start) |
| Dimensions | 240 × 160 × 89 mm |
| Weight | 5 kg |
| Power Supply | DC 5 V / 2 A or DC 24 V / 2 A |
| Max. Power Consumption | ≤10 W (standard), ≤50 W (high-power option) |
| Output | Polarization-maintaining fiber (FC/APC) or free-space collimated beam |
| Brand | auniontech |
|---|---|
| Origin | Australia |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | Moku:Pro |
| Price Range | USD $105,000 – $132,000 (approx.) |