Optical Instruments
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Showing 4921–4950 of 7833 results
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | MPRT Test System |
| Pricing | Available Upon Request |
| Brand | MRC |
|---|---|
| Origin | Germany |
| Model Series | PKS, PSH, P4S30 |
| Component Category | Optical Element |
| Vacuum Compatible | Yes |
| Max Aperture Support | 4-inch optics |
| Operating Laser Frequency Range | Low-frequency lasers |
| Signal Processing | Real-time analog |
| Power Supply | 12 V DC |
| ISO 13485 Certified | Yes |
| Brand | MRC |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MRC Systems GmbH |
| Price Range | USD 13,500 – 27,000 |
| Brand | MSHOT |
|---|---|
| Origin | Guangdong, China |
| Model | MP41+KER3000 |
| Optical System | Infinity-Corrected |
| Objective Type | Strain-Free Long Working Distance Plan Apochromat |
| Eyepiece Field of View | Ø22 mm |
| Focusing Mechanism | Coaxial Coarse/Fine Adjustment (Fine Graduation: 2 µm |
| Polarizer & Analyzer | Rotatable 360°, Insertable/Removable from Light Path |
| Rotating Mechanical Stage | 360° Divided Scale, Vernier Resolution 6 arcmin, Center-Adjustable & Lockable, Vertical Travel 30 mm |
| Illumination | 6 V / 30 W Halogen, Brightness-Adjustable |
| Trinocular Port | Dual-View Path (100% Light Transmission for Imaging) |
| Heating Stage | KER3000 Thermally Isolated Digital Heating Stage |
| Temperature Range | Ambient to 400 °C |
| External Casing Max Temp (at 400 °C stage) | ≤70 °C (ambient 25 °C) |
| Control Mode | Adaptive Fuzzy Logic PID |
| Temperature Accuracy | ±0.5% FS |
| System Stability | ±1 °C |
| Ramp Rate Adjustable | 0.5–36 s/°C |
| Instant Hold Response Time | ≤0.01 s |
| Power Input | AC 220 V ±10%, 45–60 Hz |
| Max Power Consumption | 75 W |
| Safety | Low-Voltage DC Heating, No Water Cooling Required |
| Brand | A.L.S. GmbH / Advanced Laser Diode Systems |
|---|---|
| Origin | Germany |
| Model | MSM UltraFast-20 / UltraFast-35 |
| Bandwidth | DC–20 GHz / DC–35 GHz |
| Wavelength Range | 400–1600 nm |
| Detector Structure | Metal–Semiconductor–Metal (MSM) |
| Capacitance | Low |
| Series Impedance | Low |
| Active Area | Optimized for High-Speed Operation |
| Bias Voltage | 6 V (typ.) |
| Output Interface | 50 Ω RF coaxial |
| Compliance | RoHS, CE |
| Mounting Options | SM-fiber-coupled (UltraFast-20/35 SM) and free-space (UltraFast-20/35 FS) with integrated focusing lens |
| Origin | Guangdong, China |
|---|---|
| Manufacturer Type | Distributor |
| Origin Category | Domestic (China) |
| Model | MST |
| Price | USD 2,100 (FOB) |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MT Year-Ring Measurement and Analysis System |
| Pricing | Upon Request |
| Resolution | 5 µm |
| Max Sample Count per Session | 1000 |
| Measurement Points per Sample | Up to 500 |
| Data Memory Capacity | 256 kB / 512 kB / 1 MB (configurable) |
| Power Supply | DC 6–9 V |
| Max Annual Ring Width | 100 mm |
| Operating Temperature | 0 °C to 50 °C |
| Software | T-TOOLS LIGHT v3.x / T-TOOLS PRO v4.x |
| Data Export Formats | ASCII (tab-delimited), MST (proprietary binary format for T-TOOLS ecosystem) |
| Brand | Müller-BBM |
|---|---|
| Origin | Germany |
| Model | MACOM II |
| Operating Frequency Range | 0 Hz to 50 kHz |
| Control Interface | Ethernet / TCP/IP |
| Display | Integrated LCD with real-time monitoring and parameter adjustment |
| Remote Operation | Supported via internal network or internet (optional global remote support) |
| Compliance | Designed for integration with TEM/SEM, e-beam lithography, and MRI systems requiring ultra-low magnetic noise environments |
| Maintenance | Minimal — no consumables or routine calibration required |
| Brand | Müller-BBM |
|---|---|
| Origin | Germany |
| Model | MACOM II® |
| Frequency Range | 0 Hz – 50 kHz |
| Operating Axes | 3-axis (X, Y, Z) |
| Interface | RS-232 serial + Ethernet (TCP/IP) |
| Display | Integrated LCD for real-time monitoring of residual field & coil current per axis |
| Compliance | Designed for GLP/GMP-adjacent environments |
| Brand | MULLER-BBM |
|---|---|
| Origin | Germany |
| Model | MACOM II® |
| Frequency Range | 0 Hz to 50 kHz |
| Operating Axes | 3-axis (X, Y, Z) |
| Interface | RS-232 serial + Ethernet (TCP/IP) |
| Display | Integrated LCD for real-time monitoring and parameter adjustment |
| Control | Local front-panel + remote via LAN/internet |
| Maintenance | Maintenance-free after commissioning |
| Compliance | Designed for GLP/GMP-adjacent environments |
| Brand | Optronic Laboratories |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Price Range | USD 0 – 7,200 (est.) |
| Sphere Diameter | 2 m |
| Spectral Range | 400–1100 nm |
| Coating Reflectance | >98% (400–1100 nm) |
| Compliance | IES LM-79, CIE 127, LM-80 ready |
| Safety Features | Interlocked optical sensors, industrial-grade slip-clutch drive, safety foot pads |
| Cooling | Dual thermal fans + real-time temperature monitoring |
| Mounting Options | Suspension or upward support |
| Auxiliary Lamp | Integrated for self-absorption correction |
| Compatible Spectrometer | OL 770 series |
| Brand | FLC |
|---|---|
| Origin | USA |
| Type | Imported |
| Model | DL |
| Core Components | Solid-State Laser Systems and Modules |
| Wavelength Range | 375–2200 nm |
| Output Power Range | 100 mW – 60 W |
| Primary Applications | Laser Printing & Imaging, Solid-State Laser Pumping, Photobiomodulation Therapy, Ophthalmic Systems, Display & Projection, Target Illumination, Industrial Alignment |
| Brand | Incoatec |
|---|---|
| Origin | Germany |
| Model Series | XS-55, XS-N, XS-C, XS-B |
| 2d-spacing (XS-55) | 5.5 nm |
| Target Elements (XS-55) | C–Br (including F, Na, Mg as standard) |
| Crystal Type | Artificial Synthetic Multilayer |
| Substrate Material | Typically Si or glass |
| Reflectivity | High (optimized for soft X-ray range) |
| Resolution | Moderate (vs. natural crystals) |
| Application Domain | Wavelength-Dispersive X-ray Fluorescence (WDXRF) Spectrometry |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | DOT-7 |
| Price Range | USD 42,000 – 70,000 |
| Light Source | Broadband White LED |
| Spectral Range | 380–720 nm (standard), 390–730 nm (optional) |
| Wavelength Interval | 10 nm |
| Sensitivity Adjustment | Auto-Gain Calibration |
| Optical Configuration | Dual-Beam with Top-Illumination Integrating Sphere |
| Sample Thickness Capacity | Up to 30 mm |
| Polarization Measurement Capability | Crossed-Nicol configuration supported |
| Detection Sensitivity | 10× higher than predecessor model (DOT-6) |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | DOT-3C |
| Price Range | USD 42,000 – 70,000 |
| Light Source | Tungsten-Halogen Lamp |
| Spectral Range | 380–720 nm (standard), 390–730 nm (optional) |
| Wavelength Interval | Fixed at 10 nm |
| Calibration & Sensitivity Adjustment | Manual SPAN Knob |
| Sample Height Limit | ≤30 mm |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | DOT-41 |
| Price Range | USD 70,000 – 112,000 (FOB Japan) |
| Optical Configuration | Dual-beam, integrating sphere |
| Wavelength Range | 380–780 nm (standard) |
| Wavelength Interval Options | 1, 5, 10, 20, or 50 nm |
| Sensitivity Enhancement | Optional 100× gain module for low-transmittance and polarization degree measurement |
| Sample Chamber Depth | 15 cm from optical axis to sample stage |
| Maximum Sample Width | 30 cm (centered on stage) |
| Illumination Geometry | Diffuse illumination via integrating sphere |
| Polarization Measurement Capability | Yes, with crossed-Nicol configuration |
| Calibration Method | Manual SPAN knob adjustment |
| Brand | MX-AFM |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | MX-plorer Premium |
| Instrument Type | Atomic Force Microscope (AFM) |
| Position Detection Noise | ≤ 50 pm |
| XY Sample Stage Travel Range | ≥ 5 mm |
| Operating Modes | Contact, Tapping, Phase Imaging, Conductive AFM (C-AFM), Kelvin Probe Force Microscopy (KPFM), Force Spectroscopy, Nanolithography |
| Control Architecture | Closed-Loop Piezoelectric Scanning System |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | N-8α |
| Price | Upon Request |
| Scale Range | 0.0–8.0 % Brix |
| Minimum Scale Division | 0.1 % Brix |
| Dimensions | 4 × 4 × 21 cm |
| Weight | 260 g |
| Dedicated Accessory | RE-2360-51L Daylight Plate with Calibration Screw |
| Brand | Luqi Technology |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | OEM Manufacturer |
| Model | NAGA |
| Price | Upon Request |
| Spectral Range | 200–1100 nm |
| Optical Architecture | Crossed Czerny-Turner |
| F-number | f/4 |
| Slit Width Options | 10 / 25 / 50 / 75 / 100 µm |
| Grating Options | 300 / 600 / 900 / 1200 / 1800 lines/mm |
| Stray Light | <1% |
| Weight | 200 g |
| Interface | USB 2.0 Type-B, Digital I/O |
| Fiber Optic Connector | Standard SMA 905, Customizable |
| Brand | VitroTEM |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | Naiad |
| Pricing | Available Upon Request |
| Brand | Nano analytik |
|---|---|
| Origin | Germany |
| Model | AFM Series (SmartProbe Platform) |
| Instrument Type | Atomic Force Microscope |
| Vertical Position Detection Noise | 0.01 nm RMS |
| Maximum Sample Diameter | ≤10 cm |
| Scanner Range (Adeona) | 15 µm × 15 µm × 4 µm |
| Dimensions (Vacuum-Compatible Version) | 140 mm × 100 mm × 60 mm |
| Integrated Actuation & Sensing | Piezoresistive readout + bimaterial excitation on SmartProbe |
| XYZ Nanopositioning Range (Vacuum Variant) | 20 µm × 10 µm × 10 µm |
| Brand | Nano analytik |
|---|---|
| Origin | Germany |
| Model | SPL |
| Instrument Type | Atomic Force Microscope-based Scanning Probe Lithography System |
| Positioning Detection Noise | 0.01 nm (X, Y, Z) |
| Maximum Sample Diameter | 150 mm (6 in) |
| Stage Travel Range | 18 mm × 18 mm (expandable to 150 mm × 150 mm) |
| Minimum Feature Size | 5 nm (verified) |
| Direct-Write Speed | 300 µm/s |
| Overlay Accuracy | < 7 nm |
| Stitching Accuracy | < 10 nm |
| Maximum Writing Area per Field | 200 µm × 200 µm |
| Footprint | 80 cm × 100 cm × 190 cm |
| AFM Imaging Range | 10 µm × 10 µm × 5 µm (expandable to 200 µm × 200 µm) |
| Vertical RMS Noise | 0.01 nm |
| Closed-Loop Scan Linearity | 99.7% |
| Real-Time FPGA Feedback Bandwidth | 8 MHz |
| Data Acquisition Resolution | 16-bit (amplitude/phase) |
| Output Formats | BMP, PNG, JPG, TXT |
| Brand | HORIBA |
|---|---|
| Origin | United Kingdom |
| Manufacturer | Jobin Yvon IBH (acquired by HORIBA) |
| Model | NanoLED |
| Core Technology | Semiconductor-based pulsed diode laser |
| Wavelength Range | 250–830 nm (UV to NIR) |
| Pulse Width | <100 ps (typ. for 405 nm variant) |
| Repetition Rate | 10 kHz – 1 MHz (software-selectable in multiple discrete steps) |
| Pulse Energy | 10 pJ/pulse (at 405 nm, typical) |
| Control Interface | Single unified controller compatible with all NanoLED variants |
| Compliance | CE-marked |
| Brand | Nanolnsights |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China-made) |
| Model | SpinX |
| Pricing | Available Upon Request |
| Resolution | X-Y = 140 nm, Z = 450 nm |
| Excitation Wavelength Range | 400–750 nm |
| Detection Channels | Fluorescence + Brightfield |
| Fluorescence Detector | Scientific CMOS (sCMOS) Camera |
| Objective Lenses | 10×, 20×, 40×, 60×, 100× (oil/water immersion compatible) |
| Microscope Host | Fully Automated Motorized Platform |
| Illumination Source | Metal Halide Lamp / High-Power LED |
| Control Software | Dual-Mode Intelligent Suite (Beginner & Advanced Modes) |
| Vibration Isolation Table | 1.2 × 1.2 m Dedicated Anti-Vibration Platform |
| XY Stage Drive | Precision Motorized Linear Actuation |
| Brand | NanoMagnetics |
|---|---|
| Origin | United Kingdom |
| Model | ezAFM |
| Instrument Type | Material-Grade AFM |
| Position Detection Noise | 75 fm/√Hz |
| Maximum Sample Dimensions | 10 × 10 × 5 mm |
| XY Stage Travel Range | 38 × 38 mm |
| Scan Areas | 120 × 120 × 40 µm (Z resolution: 0.2 nm) or 40 × 40 × 4 µm (Z resolution: 0.02 nm) |
| Lateral Resolution | 16 nm (large scan) / 5 nm (high-res scan) |
| Optical View System | Full HD CCD, 2 µm resolution, 390 × 230 µm FOV, 2516 × 1960 pixels, 30 fps |
| Controller | 24-bit ADC/DAC, FPGA/DSP-based digital feedback |
| Standard Imaging Modes | Contact, Tapping, Phase, LFM, MFM |
| Extended Modes (ezAFM+) | EFM, KPFM, C-AFM, SSRM, PRFM, FMM, nanomechanical mapping, liquid-phase, vacuum-compatible configurations |
| Brand | NanoMEGAS |
|---|---|
| Origin | Belgium |
| Model | ADT-3D |
| Compatible TEM Voltage | 120–300 kV |
| Compatible Sources | LaB6, W, FEG |
| Minimum Crystal Size (Organic) | ~100 nm |
| Minimum Crystal Size (Inorganic) | ~20 nm |
| Tilt Range (Cell Parameter Determination) | −15° to +15°, 1° step |
| Recommended Tilt Range (Structure Solution) | −45° to +45°, 1° step or continuous rotation (MicroED) |
| Data Acquisition Modes | Manual or automated PED |
| Detector Compatibility | CCD cameras ≥1k × 1k resolution |
| Sample Holder Support | Single-tilt, tomography, cryo holders |
| Output | 3D reciprocal space reconstruction, unit cell parameters (2–5% error), space group assignment, integrated 3D reflection intensities |
| Compliance | Fully compatible with standard TEM workflows under GLP-aligned data handling practices |
| Brand | NanoMEGAS |
|---|---|
| Origin | Belgium |
| Model | ASTAR® |
| Compatibility | 120–300 kV TEM (including Cs-corrected FEG-TEM) |
| Spatial Resolution | 1–4 nm (FEG-TEM), <10 nm (LaB₆ TEM) |
| Acquisition Speed | Up to >1000 fps (with direct electron detectors) |
| PED Tilt Angle Range | 0.2°–2.5° |
| Output Data Types | Orientation Maps, Phase Maps, Correlation Index, Confidence Index, Virtual BF/DF Images, Grain Boundary Networks, Pole Figures, Strain-Compatible Integration (with TopSPIN) |
| Compliance | Fully compatible with GLP/GMP workflows requiring audit trails |
| Brand | NanoMEGAS |
|---|---|
| Origin | Imported (Non-China) |
| Manufacturer Type | Authorized Distributor |
| Model | DigiSTAR |
| Pricing | Upon Request |
| Brand | NanoMEGAS |
|---|---|
| Origin | Belgium |
| Model | TopSPIN STRAIN |
| Application | Automated High-Resolution Strain Mapping in Scanning Transmission Electron Microscopy (STEM) using 4D Scanning Precession Electron Diffraction (4D-SPED) |
| Spatial Resolution | 2–3 nm (FEG-TEM) |
| Strain Sensitivity | < 2 × 10⁻⁴ |
| Typical Acquisition Time | 5–10 min (150 × 150 pixels) |
| Pixel Dwell Time | 10–40 ms |
| Strain Quantification Accuracy | ±0.02% (at 200 kV FEG-TEM) |
| Analysis Engine | AppFive proprietary algorithm |
| Output Modalities | Point, line, and 2D strain tensor maps (εₓₓ, ε_zz, ε_xz), orientation/phase/strain/STEM co-registration |
| Brand | Nanonics |
|---|---|
| Origin | Israel |
| Model | Academia |
| Instrument Type | Materials-Focused AFM |
| Primary Technique | Combined Scanning Probe Microscopy (SPM) with Integrated Near-Field Optical & Raman Capabilities |
| Scan Range | XY = 70 µm, Z = 5 µm (optional 10 µm scanner) |
| Positional Resolution | <1 nm (70 µm scanner), <0.1 nm (10 µm scanner) |
| Max Sample Size | 15 mm × 15 mm |
| Detection Method | Optical Beam Deflection |
| Operational Modes | Contact, Non-Contact, Tapping |
| Probe Compatibility | Nanonics glass probes, electro-thermal probes, NanoFountainPen™, and standard commercial SPM cantilevers |
| Software Platform | LabVIEW-based modular architecture with user-customizable modules |
| Compliance Ready | Designed for GLP/GMP-aligned workflows |