Precision Geometric Measurement Instruments
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| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | ContourX-200 |
| Pricing | Upon Request |
| Vertical Resolution | < 0.1 nm |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ContourX-200 |
| Measurement Principle | White Light Interferometry (WLI) |
| Camera Resolution | 5 MP |
| XY Stage | Motorized |
| Z-Axis Resolution | Sub-nanometer |
| Field of View | Large, Magnification-Independent |
| Compliance Standards | ISO 25178, ISO 4287, ASME B46.1 |
| Software Platform | VisionXpress™ and Vision64 |
| Surface Reflectivity Range | 0.05% – 100% |
| Sensor Array | 1200 × 1000 pixels |
| Measurement Mode | Universal Scanning Interferometry (USI) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | ContourX-200 |
| Pricing | Upon Request |
| Instrument Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Vertical Resolution | Sub-nanometer |
| Surface Reflectivity Range | 0.05% – 100% |
| Field of View | Standard Large FOV |
| Vibration Isolation | Integrated Passive Damping System |
| Compliance Standards | ISO 25178, ISO 4287, ASME B46.1 |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-200 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Working Principle | White Light Interferometry (WLI) |
| Camera Resolution | 5 MP |
| Field of View | Standard Large FOV |
| Z-Axis Resolution | Sub-nanometer |
| Compliance Standards | ISO 25178, ISO 4287, ASME B46.1 |
| Software Platform | Vision64® and VisionXpress™ |
| Motion Control | Motorized XY Stage |
| Surface Reflectivity Range | 0.05% – 100% |
| Application Scope | Precision Machined Surfaces, Thin Films, Semiconductors, Ophthalmic Lenses, Medical Devices, MEMS, Tribology |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ContourX-200 |
| Product Type | Non-contact Optical Profilometer / Surface Roughness Analyzer |
| Measurement Principle | White Light Interferometry (WLI) |
| Vertical Resolution | Sub-nanometer (typical < 0.1 nm RMS noise) |
| Lateral Resolution | Diffraction-limited, dependent on objective magnification (e.g., 0.49 µm at 50×) |
| Camera | 5 MP high-speed CMOS sensor |
| Stage | Motorized XY stage with 100 mm × 100 mm travel |
| Field of View | Up to 4.8 mm × 3.6 mm (with 2.5× objective), scalable via 5×–100× objectives |
| Compliance | Fully supports ISO 25178-2, ISO 4287, ASME B46.1, and NIST-traceable calibration protocols |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | ContourX-500 |
| Pricing | Upon Request |
| Instrument Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Key Features | Encoder-equipped XY stage, motorized auto-tilting optical head, auto-brightness adjustment, USI universal scanning mode, pneumatic vibration isolation base, magnification-independent Z-resolution |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ContourX-500 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White-Light Interferometry |
| Category | Precision Geometric Measurement Instrument |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-500 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Working Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Automation Features | Motorized XY Stage with Encoders, Programmable Auto-Tilt Optical Head, Auto-Brightness Control, Pneumatic Vibration Isolation Base |
| Software Platform | VisionXpress™ and Vision64® |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Dektak Pro |
| Type | Contact Stylus Profilometer |
| Operating Principle | Mechanical Stylus Scanning (Tactile Profilometry) |
| Category | Precision Geometric Measurement Instrument |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | Dektak Pro |
| Measurement Repeatability | 4 Å |
| Accuracy | ±1% |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force Range | 0.03–15 mg |
| Scan Length | 55 mm |
| Step Height Repeatability | 4 Å |
| Vertical Resolution | 1 Å |
| Maximum Sample Size | 200 mm |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dektak Pro |
| Price | Upon Request |
| Maximum Scan Length | 55 mm |
| Step Height Repeatability | < 2% |
| Vertical Resolution | 0.1 nm |
| Maximum Sample Size | 200 mm |
| Measurement Principle | Contact Stylus Profilometry |
| Force Range (Standard LIS 3) | 1–15 mg |
| Optional Low-Force Mode (N-Lite+) | 0.03–15 mg |
| Stylus Tip Radius Options | 50 nm – 25 µm |
| HAR Tip Geometry | 200 µm × 20 µm |
| XY Stage Options | Manual 100 mm (4″), Motorized 150 mm (6″), Motorized Encoded 200 mm (8″) |
| R-Theta Stage | Manual or Motorized, Continuous 360° Rotation |
| Field of View (Vertical Digital Zoom) | 0.275–2.2 mm |
| Brand | Bruker |
|---|---|
| Origin | Malaysia |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dektak Pro |
| Measurement Principle | Contact Stylus Profilometry |
| Probe Normal Force | 0.03–15 mg (with N-Lite+ sensor) or 1–15 mg (standard LIS 3) |
| Scan Length | 55 mm (2") or 200 mm (8") with scan stitching capability |
| Step Height Repeatability | 4 Å, 1σ (on ≤1 μm certified step standard) |
| Vertical Resolution | 1 Å (at 6.55 μm vertical range) |
| Vertical Range | 1 mm |
| Maximum Data Points per Scan | 120,000 |
| Sample Thickness Capacity | up to 50 mm |
| Maximum Wafer Size | 200 mm (8") |
| XY Stage Options | Manual 100 mm (4"), Motorized 150 mm (6"), Encoder-equipped Motorized 200 mm (8") |
| Tip Radius Options | 50 nm – 25 μm |
| High-Aspect-Ratio (HAR) Tip | 200 μm × 20 μm |
| Field of View | 0.275–2.2 mm (via selectable optics) |
| Operating Temperature | 20–25°C |
| Relative Humidity | ≤80%, non-condensing |
| Input Voltage | 100–240 VAC, 50–60 Hz |
| Dimensions (Instrument) | 455 × 550 × 370 mm (W×D×H) |
| Weight | 34 kg |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dektak XT |
| Measurement Principle | Capacitive Transduction |
| Vertical Repeatability | ≤ 5 Å |
| Vertical Resolution | 1 Å |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force | 15 µN |
| Scan Length | 55 mm (2-inch) |
| Maximum Sample Size | 50 mm |
| Operating Temperature | 10–30 °C |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | DEKTAK XT |
| Measurement Principle | Contact Stylus Profilometry |
| Vertical Resolution | 1 Å |
| Step Height Repeatability | <4 Å |
| Vertical Measurement Range | Up to 1 mm |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force | 15 µN (adjustable) |
| Scan Length | 55 mm (2-inch stage travel) |
| Maximum Sample Size | 50 mm diameter |
| Accuracy | ±1% of measured value |
| Horizontal Positioning Resolution | 10 nm |
| Data Acquisition Speed | 40% faster than previous generation |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | Dektak XT |
| Measurement Principle | Capacitive Sensing |
| Measurement Capability | 2D Surface Topography Profiling |
| Vertical Accuracy | ±1 Å |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force | 15 µN |
| Scan Length | 55 mm (2 inch) |
| Step Height Repeatability | <5 Å |
| Vertical Resolution | 1 Å |
| Maximum Sample Size | 50 mm |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | XT |
| Measurement Principle | Capacitive |
| Measurement Modes | 2D Surface Profiling (standard), Optional 3D Profiling & Advanced Data Analysis |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force Range | 1–15 mg (LIS3 sensor) |
| Scan Length | 55 mm (2 in) |
| Step Height Repeatability | <5 Å (1σ on 0.1 µm step) |
| Vertical Scan Range | 1 mm |
| Vertical Resolution | 1 Å (within 6.55 µm full-scale range) |
| Maximum Sample Thickness | 50 mm |
| Wafer Compatibility | Up to 200 mm (8 in) |
| X/Y Stage Options | Manual (100 × 100 mm, 4 in) or Motorized (150 × 150 mm, 6 in), both with manual leveling and 360° continuous rotation |
| Optical View | Integrated true-color HD camera, FOV 1–4 mm |
| Data Points per Scan | Up to 120,000 |
| Software Platform | Vision64 (64-bit parallel processing), includes stress measurement, cantilever deflection, stitching, and 3D analysis modules (optional) |
| Operating Environment | 20–25 °C, ≤80% RH (non-condensing) |
| Power | 100–240 VAC, 50–60 Hz |
| System Dimensions (W×D×H) | 455 × 550 × 370 mm |
| Weight | 34 kg (excl. isolation enclosure) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | Dektak XT |
| Price Range | USD 55,000–68,000 (FOB Hamburg) |
| Vertical Measurement Repeatability | <5 Å |
| Vertical Resolution | 1 Å |
| Accuracy | ±1% of measured step height |
| Tip Radius | 50 nm – 25 µm |
| Normal Force Range | 0.3–15 mg (adjustable in 0.1 mg increments) |
| Maximum Scan Length | 55 mm (2-inch stage travel) |
| Maximum Sample Diameter | 50 mm |
| Vertical Measurement Range | Up to 1 mm |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | Dektak XT-10th |
| Measurement Principle | Capacitive Probe Sensing |
| Measurement Capability | 2D Surface Topography Profiling |
| Vertical Accuracy | ±1 Å |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force | 15 µN |
| Scan Length | 55 mm (2 in) |
| Step Height Repeatability | < 5 Å |
| Vertical Resolution | 1 Å |
| Maximum Sample Size | 50 mm |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | Dektak XTL |
| Measurement Principle | Capacitive Sensing |
| Measurement Capability | 2D Surface Profilometry (Optional 3D) |
| Accuracy | ±0.5% |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force Range | 0.3–15 mg |
| Scan Length | 55 µm |
| Step Height Repeatability | 5 Å (1σ, on 1 µm step) |
| Vertical Resolution | Up to 1 Å (within 6.55 µm vertical range) |
| Maximum Sample Size | 300 mm diameter |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dektak XTL |
| Price Range | USD 95,000 – 135,000 (FOB Hamburg) |
| Measurement Principle | Capacitive Transduction |
| Measurement Capability | 2D Surface Profiling (Optional 3D Reconstruction) |
| Accuracy | ±0.5% of measured step height |
| Probe Tip Radius | 50 nm – 25 µm (interchangeable stylus options) |
| Normal Force Range | 0.3 – 15 mg (motorized force control) |
| Maximum Scan Length | 55 µm (standard) |
| Step Height Repeatability | 5 Å (1σ) on 1 µm step |
| Vertical Resolution | ≤1 Å (at full 6.55 µm vertical range) |
| Maximum Sample Size | Ø300 mm (flat wafers or rectangular substrates up to 300 × 300 mm) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dektak XTL |
| Pricing | Available Upon Request |
| Measurement Principle | Capacitive Transduction |
| Measurement Capability | 2D Surface Topography (Optional 3D Reconstruction) |
| Accuracy | ±0.5% of measured step height |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force Range | 0.3–15 mg |
| Maximum Scan Length | 55 µm |
| Step Height Repeatability | 5 Å (1σ, on 1 µm step) |
| Vertical Resolution | Up to 1 Å (within 6.55 µm vertical range) |
| Maximum Sample Size | 300 mm diameter |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | GT-X |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White-light Interferometry |
| Mounting Configuration | Floor-standing, Integrated Granite Vibration-Isolation Base |
| Measurement Mode | Fully Automated, Motorized Scanning Head with Auto-tilt Optimization |
| Illumination Source | Dual High-brightness Long-life LED |
| Calibration Method | Metrology-grade Laser Self-calibration |
| Vertical Resolution | Sub-nanometer (RMS repeatability ≤ 0.004 nm) |
| Software Interface | Modular, Role-based GUI (Engineering Lab Mode / Production Floor Mode) |
| Compliance Framework | Designed for GLP/GMP environments |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | NP Flex |
| Product Type | Non-Contact Profilometer / Surface Roughness Analyzer |
| Measurement Principle | White-Light Interferometry (WLI) |
| Maximum Measurement Volume | Up to 300° Angular Access |
| Vertical Resolution | Sub-nanometer |
| Field of View | Full-Area (2D/3D) Acquisition |
| Sample Compatibility | Large, Freeform, and Asymmetric Components |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | NPFLEX 3D |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White-Light Interferometry |
| Vertical Resolution | Sub-nanometer |
| Measurement Mode | Full-field 3D Topography |
| Sample Flexibility | Large-format, Angled, and Complex-Geometry Samples |
| Optional Modules | Tilted Measurement Head, Through-Transmissive Media (TTM) Module, Folded-Objective Lens |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | NPFLEX-1000 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Sample Stage Travel | 300 mm X-Y |
| Bridge Architecture | Open龙门-style rigid bridge |
| Objective Options | Motorized turret with multiple magnification objectives |
| Auto-Focus & Auto-Illumination | Integrated “Advanced Surface Find™” |
| Vibration Isolation | Built-in active/passive isolation system |
| Reflectivity Range | 0.05% – 100% |
| Maximum Surface Slope | ±70° |
| Vertical Resolution | Sub-nanometer (typical) |
| Lateral Resolution | Diffraction-limited (~0.3–1.2 µm, dependent on objective) |
| Compliance | Designed for ISO 25178, ISO 4287/4288, ASME B46.1, and ASTM E2922 standards |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | NPFLEX-1000 |
| Measurement Principle | White Light Interferometry (WLI) |
| Type | Non-contact 3D Surface Profilometer / Roughness Analyzer |
| Sample Stage Travel | 300 mm X-Y |
| Design | Floor-standing Open-bridge Configuration |
| Software Platform | VisionXpress™ with Adaptive USI Mode and One-click Advanced Surface Find™ |
| Compliance | Designed for ISO 25178, ISO 4287, ASTM E1392, and USP <1058> analytical instrument qualification frameworks |
| Brand | Camtek |
|---|---|
| Origin | Israel |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Falcon 800 |
| Pricing | Available Upon Request |
| Brand | Camtek |
|---|---|
| Origin | Israel |
| Model | Falcon600 |
| Category | Precision Geometric Measurement Instrument / Profilometer |
| Application Scope | Semiconductor Wafer-Level and Advanced Packaging Inspection |
| Maximum Wafer Size | 300 mm (unmounted or framed) |
| Detection Capability | 2D & 3D Defect Detection and Metrology |
| Target Structures | Stacked Die, 3D IC, SiP, Flip-Chip, Fine-Pitch Wire Bonds |
| Brand | CHOTEST |
|---|---|
| Origin | Guangdong, China |
| Model | CHT Series |
| Construction | Granite Base Frame |
| Motion System | Precision Servo-Controlled Linear Guides (X/Y/Z) |
| Optical System | Motorized Zoom Lens with Programmable Illumination (Surface/Transmitted/Coaxial) |
| Measurement Principle | High-Resolution Digital Image Metrology Based on Sub-Pixel Edge Detection and Geometric Feature Fitting |
| Software Certification | PTB-Validated Algorithm Engine |
| Compliance Framework | Supports ISO 10360-7, ISO 1101, ASME Y14.5, GD&T Standards, and FDA 21 CFR Part 11 Audit Trail Requirements for Measurement Data Integrity |
| Brand | Chotest |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China) |
| Model | Earth Series |
| Pricing | Available Upon Request |