Precision Geometric Measurement Instruments
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| Brand | Atometrics |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | FM9000 Series-9005 |
| Pricing | Upon Request |
| Operation Mode | Fully Automatic |
| Measurement Accuracy | ±1.5 µm |
| Encoder Resolution | 50 nm |
| Camera | 20 MP Monochrome CMOS |
| Illumination | Transmission Light, Ring Light, Movable Profile Light, Slit Ring Light |
| Brand | Atometrics |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Manufacturer |
| Product Origin | Domestic |
| Model | FMX Series |
| Operation Mode | Fully Automatic |
| Measurement Accuracy | ±1.5 µm |
| Encoder Resolution | 50 nm |
| Camera | 20 MP Monochrome CMOS |
| Illumination | Transmission Light, Ring Light, Movable Profile Light, Slit Ring Light |
| Brand | Atometrics |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | OEM/ODM Producer |
| Country of Origin | China |
| Model | WM300R |
| Pricing | Upon Request |
| Brand | Atometrics |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | OEM/ODM Manufacturer |
| Country of Origin | China |
| Model | WM300X |
| Pricing | Upon Request |
| Brand | Atometrics |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | OEM Manufacturer |
| Product Category | Domestic |
| Model | WPM Series |
| Pricing | Upon Request |
| Instrument Type | Non-Contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White-Light Interferometry |
| Vertical Resolution | 0.001 nm |
| Surface Topography Repeatability (PSI mode, 3×3 filter, 1M points, Sqj/� | 2): 0.03 nm |
| Step Height Accuracy (12 µm NIST-traceable step standard, n=50) | ±0.3% |
| XY Positional Repeatability | <0.19 µm |
| Maximum Vertical Scan Speed | 400 µm/s |
| Typical Vertical Scan Speed | 35 µm/s |
| Maximum Lateral Resolution | 0.19 µm |
| Multi-Layer Thin-Film Measurement Capability | Up to 10 layers |
| Roughness Standards Compliance | ISO 25178, ISO 4287, ISO 287 |
| Overlay Measurement Support | Custom algorithm-enabled |
| Bump & RDL Profile Reconstruction | Enabled via phase-resolved interferometric imaging |
| CMP Uniformity Analysis | Full-wafer die-level topography mapping with dishing/erosion quantification |
| Brand | Attocube Systems AG |
|---|---|
| Origin | Germany |
| Model | IDS3010 |
| Light Source | Single-frequency laser |
| Measurement Range | 0–5 m |
| Linear Measurement Accuracy | ±1 pm |
| Sampling Bandwidth | 10 MHz |
| Operating Environment | 10 mK, 1×10⁻¹⁰ mbar vacuum, up to 10 MGy radiation tolerance |
| Interface Options | HSSL, AquadB, CANopen, Profibus, EtherCAT |
| Probe Wavelengths | 650 nm (alignment), 1530 nm (measurement) |
| Probe Spot Sizes | 2 µm to 7.6 mm (depending on configuration) |
| Brand | Auniontech |
|---|---|
| Model | APA-220U / APA-40U / APA-33U |
| Type | Preloaded, Hysteresis-Free Amplified Piezoelectric Actuator |
| Stroke | 220 µm (APA-220U), 40 µm (APA-40U), 33 µm (APA-33U) |
| Stiffness | 0.34 N/µm (APA-220U), 7 N/µm (APA-40U), 2.2 N/µm (APA-33U) |
| Blocking Force | — (APA-220U), 250 N (APA-40U), 57 N (APA-33U) |
| Construction | Monolithic Flexure-Guided Design |
| Compliance | ISO 9001–certified manufacturing |
| Origin | Shanghai, China |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Model | Aut-S800 |
| Displacement Range | 100 mm (customizable) |
| Displacement Accuracy | ±1% FS |
| Displacement Resolution | 0.1% FS |
| Temperature Range | −20 to +85 °C |
| Temperature Accuracy | ±1 °C |
| Temperature Resolution | 0.1 °C |
| Center Wavelength | 1528–1568 nm (±0.1 nm) |
| Dimensions | Φ25 × 360 mm |
| Fiber Connector | FC/APC |
| Housing Material | Stainless Steel |
| Dual FBG Design | Yes |
| Temperature Compensation | Built-in |
| Network Topology | Series-compatible for FBG sensor arrays |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | HPI-3D |
| Pricing | Upon Request |
| Laser Type | Stabilized He–Ne |
| Wavelength Accuracy | ±0.005 ppm |
| Short-Term Stability | ±0.001 ppm |
| Long-Term Stability | ±0.001 ppm |
| Output Power | 900 µW |
| Maximum Linear Measurement Range | 80 m (with long-range adapter) |
| Max Velocity | ±7 m/s (standard), ±20 m/s (optional) |
| Base Resolution | 100 pm (single-pass), 50 pm (double-pass) |
| Vibration Bandwidth | Up to 100 kHz |
| Sampling Rate | Up to 100 kS/s |
| Environmental Compensation | Integrated wireless air temperature/humidity/pressure sensor + 3× material temperature sensors |
| Encoder Outputs | Configurable differential digital (up to 25 MHz) and analog outputs |
| Communication | USB 2.0, Bluetooth 5.0 |
| Software | Windows-based, FFT analysis, real-time alignment guidance, GLP-compliant data logging |
| Brand | Auniontech |
|---|---|
| Wavelengths | 1342 nm / 671 nm / 447 nm |
| Average Power | 4.5 W (1342 nm), 2 W (671 nm), 1.5 W (447 nm) |
| Pulse Width | 10–26 ns (model-dependent) |
| Pulse Energy | 300 µJ (1342 nm), 130 µJ (671 nm), 100 µJ (447 nm) |
| Repetition Rate | 1–50 kHz (1342 nm), 1–30 kHz (671 nm & 447 nm) |
| Beam Quality (M²) | <1.2 (1342 nm & 671 nm), <1.3 (447 nm) |
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Model | IMPRESS Series |
| Wavelength | 213 nm / 224 nm |
| Average Power | 150 mW (213 nm) / 300 mW (224 nm) |
| Pulse Width | 6–8 ns (213 nm) / <9 ns (224 nm) |
| Pulse Energy | 15 µJ (213 nm) / >30 µJ (224 nm) |
| Repetition Rate | 1–30 kHz (213 nm) / 0.1–30 kHz (224 nm) |
| Beam Quality (M²) | <1.6 (both) |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | IXION SLM Solid-State Laser System |
| Wavelength | 355 nm |
| Average Power | 2 W |
| Pulse Duration | 10–12 ns (typ.) |
| Pulse Energy | 200 µJ |
| Repetition Rate | 1–15 kHz |
| Beam Quality (M²) | < 1.3 |
| Spectral Bandwidth | < 60 MHz |
| Coherence Length | > 2.5 m |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Platform Options | MATRIQ or PXIe |
| Wavelength Range | 1527.605–1611.787 nm (C+L band) |
| Output Power | up to +16.5 dBm |
| Linewidth | <100 kHz |
| Tuning Resolution | 0.01 pm (1 MHz) |
| Polarization Extinction Ratio | >18 dB |
| Frequency Stability | ±0.3 GHz over 24 h |
| Power Stability | ±0.1 dB over 24 h |
| Interface | USB / Ethernet / Web-based control via COHESIONUI software |
| Output Connectors | FC/PC, FC/APC, SC/PC, SC/APC |
| Compliance | RoHS, CE |
| Brand | Auniontech |
|---|---|
| Model | MD |
| Measurement Principle | Frequency-Modulated Continuous-Wave (FMCW) Coherent Interferometry |
| Accuracy Class | Micrometer-Level Absolute Distance Measurement |
| Optical Architecture | Monolithic Silicon Photonic Integrated Chip with On-Chip Reference and Signal Interferometric Pathways |
| Beam Delivery | Coaxial Transceiver Design (Transmit and Receive Along Identical Optical Axis) |
| Target Compatibility | Universal — Opaque, Colored, Metallic, Non-Metallic, Semi-Transparent, and Transparent Surfaces |
| Environmental Immunity | Insensitive to Ambient Light, Surface Reflectivity, and Spectral Absorption Characteristics |
| Compliance Context | Designed for integration into ISO/IEC 17025-accredited metrology workstations and GLP/GMP-aligned industrial inspection systems |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | MOEWE Dual-Polygon Scanner |
| Instrument Category | Laser-Based 3D Scanning System |
| Optical Aperture | 30 mm |
| Max. Polygon Rotation Speed | 10,000–100,000 rpm |
| Scan Velocity (at focal plane) | >1,000 m/s |
| Beam Re-Direction Latency | <5 ns |
| Laser Power Handling | >1,000 W (average) |
| Control Architecture | Integrated FPGA + Dual ARM Processors |
| Real-Time Slicing Capability | Supports 2D, 2.5D, and 3D CAD model streaming |
| Laser Utilization Efficiency | Up to 60% (multi-scanner synchronized operation) |
| Brand | Auniontech |
|---|---|
| Model | MV-H Series |
| Measurement Principle | Heterodyne Laser Interferometry (Dual-Frequency He–Ne or 1310 nm Semiconductor Laser) |
| Displacement Noise Density | Down to 0.3 pm/√Hz |
| Maximum Velocity Range | Up to 4500 mm/s |
| Displacement Resolution | As low as 0.02 nm |
| Frequency Range | DC to 2.5 MHz |
| Optical Wavelength | 1310 nm |
| Laser Safety Class | I (IEC 60825-1) |
| IP Rating | IP67 |
| Operating Temperature | 0–50 °C |
| Weight | 180 g |
| Dimensions | 83.7 × 50 × 22 mm³ |
| Power Supply | 2–24 VDC, <4 W |
| Output Interface | Ethernet (Real-time Digital Output) |
| Lens Options | F14, F8.9, F28 (Standardized F-number designations for calibrated working distance and field-of-view) |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | Laser Interferometer-Based Deflectometry System |
| Pricing | Available Upon Request |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Model | LV-Portable Series |
| Measurement Range | 0.036–4 m |
| Operating Principle | Coherent Laser Interferometry (Heterodyne Detection) |
| Spot Size | <50 µm |
| Frequency Range | 0.1 Hz – 20 MHz |
| Displacement Resolution | ≤1 pm/√Hz |
| Power Supply | Integrated Rechargeable Li-ion Battery (Up to 4 h Runtime) |
| Data Interfaces | USB 2.0, Wi-Fi 802.11n |
| Display | Built-in 5.5″ TFT Touchscreen (1280×720) |
| Compliance | ISO 16063-11, ASTM E1876, IEC 61260 Class 1 |
| Software Platform | AunionVib Pro v4.2 (Supports FFT, Order Analysis, Modal Parameter Extraction, Time-Frequency Mapping, and GLP-compliant Audit Trail) |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Model | ULV-1310 |
| Laser Wavelength | 1310 nm |
| Output Power | <5 mW |
| Safety Class | Class I (IEC 60825-1) |
| Frequency Range | DC to 2.5 MHz |
| Displacement Noise Density | 5 pm/√Hz |
| Displacement Resolution | 1.28 nm |
| Max. Velocity Range | 4.5 m/s |
| Velocity Resolution | <0.1 µm/s |
| Frequency Accuracy | ±0.02% |
| Displacement Repeatability (>10 Hz) | 1 nm |
| Displacement Repeatability (<10 Hz) | 10 nm |
| Optical Working Distance | 20 mm – 500 mm (adjustable via manual focus lens) |
| Dynamic Range | >120 dB (velocity) |
| Sampling Rate | 5 MS/s (digital acquisition) |
| Signal Output | Ethernet (TCP/IP, UDP), digital quadrature |
| Power Supply | 12–24 V DC |
| Power Consumption | <4 W |
| Operating Temperature | 0–50 °C |
| Relative Humidity | 35–85% RH (non-condensing) |
| Housing Material | Anodized aluminum alloy |
| Dimensions | 83.7 × 50 × 22 mm |
| Weight | 180 g |
| Ambient Light Immunity | >60,000 lux |
| Compliance | ISO 18436-1 (vibration condition monitoring), ASTM E1876 (impulse excitation of vibration), GLP-ready data logging architecture |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | VFI |
| Pricing | Available Upon Request |
| Brand | JBO |
|---|---|
| Origin | Germany |
| Model | 0002 |
| Resolution | 0.01 mm |
| Measurement Range | Up to 50 mm (customizable) |
| Thread Compatibility | Right-hand & left-hand threads |
| Drive Mode | Motorized with constant-torque control |
| Data Output | Digital display + wireless transmission (eMCW protocol, i-stick receiver optional) |
| Probe Material | DLC-coated hardened steel, HV 0.05 > 5000 |
| Probe & Sleeve | Interchangeable modular system |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Contour Elite |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Measurement Principle | White-light Interferometry (WLI) based on proprietary Wyko® technology |
| Software Platform | Vision64® |
| Configuration Options | Contour Elite K (benchtop, enhanced stability), Contour Elite I (fully automated benchtop with integrated vibration isolation), Contour Elite X (floor-standing configuration with active or passive vibration isolation platform) |
| Compliance | Designed for GLP/GMP environments |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Contour-GT |
| Measurement Principle | White Light Interferometry (WLI) |
| Application Domain | R&D and Production QC/QA in Semiconductor, LED, Solar, Ophthalmic, and Medical Device Manufacturing |
| Compliance Framework | Supports ISO 25178-2:2012, ISO 4287, ASTM E1316, and GLP/GMP-aligned data integrity workflows |
| Software Platform | Bruker Vision64™ (64-bit, multi-threaded analysis engine) |
| Optical Resolution | Sub-micron lateral resolution |
| Vertical Resolution | <0.1 nm (typical) |
| Scan Range | Up to 10 mm vertical, 100 mm lateral (configurable with motorized stages) |
| Field of View | 0.1–10 mm² (objective-dependent) |
| Data Acquisition Speed | Up to 120 frames/sec (full-field WLI) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | ContourGT-I |
| Pricing | Available Upon Request |
| Type | Non-Contact 3D Optical Profilometer / Surface Roughness Analyzer |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | ContourGT-X |
| Pricing | Upon Request |
| Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-100 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Camera Resolution | 5 MP |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Interface | VisionXpress™ and Vision64® software platforms |
| Vibration Isolation | Integrated passive damping architecture |
| Z-axis Resolution | Sub-nanometer (independent of magnification) |
| Field of View | Maximum standard FOV among benchtop WLI systems |
| Surface Reflectivity Range | 0.05% to 100% |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-100 |
| Product Type | Non-contact Optical Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Field of View | Standard large FOV |
| Z-Axis Resolution | Magnification-independent |
| Vibration Isolation | Integrated high-stability passive isolation |
| Software Interface | Intuitive graphical user interface with pre-configured filters and analysis modules |
| Measurement Mode | Full-field 2D/3D topographic mapping |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ContourX-100 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Working Principle | White Light Interferometry (WLI) |
| Camera Resolution | 5 MP |
| Measurement Mode | USI (Universal Scanning Interferometry) |
| Surface Reflectivity Range | 0.05% to 100% |
| Form Factor | Benchtop System |
| Compliance | Designed for ISO 25178, ISO 4287, ASTM E1316, and GLP/GMP-aligned workflows |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-1000 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Optical Head | Tilt/Tip Adjustable |
| Automation Features | Auto-focus, Auto-illumination, Advanced Find Surface, Motorized Objective Turret & Stage |
| Software Platform | VisionXpress GUI with USI (Universal Scanning Interferometry) Adaptive Mode |
| Compliance | Designed for ISO 25178, ISO 4287, ASME B46.1, and ASTM E2903 surface metrology standards |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-1000 |
| Type | Non-contact 3D Optical Profilometer / Surface Roughness Analyzer |
| Principle | White Light Interferometry (WLI) |
| Optical Head | Motorized Tilt & Pitch Adjustment |
| Illumination | Dual-source (broadband white light) |
| Automation | Auto-focus, Auto-surface detection (Advanced Find Surface™), Adaptive USI mode |
| Calibration | Integrated self-calibrating laser reference |
| Vibration Isolation | Built-in active/passive vibration isolation platform |
| Software | VisionXpress™ with guided workflows and ISO-compliant analysis modules |
| Compliance | Fully supports ISO 25178 (areal surface texture), ISO 4287/4288 (profile roughness), ASTM E2926, and GLP/GMP data integrity requirements |