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| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer | Yes |
| Domestic Product | Yes |
| Model | UV-5500PC |
| Optical System | Dual-beam ratio-monitoring |
| Detector Type | Silicon photodiode |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.5 nm |
| Spectral Bandwidth | 2 nm |
| Stray Light | ≤0.05% T at 220 nm and 360 nm |
| Wavelength Scanning Mode | Automatic |
| Display | 128×64 dot-matrix LCD |
| Data Storage | 200 measurement sets and 200 calibration curves |
| Interface | USB port for PC connectivity |
| Software | Optional Metash SpectraScan Suite (GLP/GMP-compliant) |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | V-5100 |
| Price Range | USD 700–1,400 (FOB Shanghai) |
| Optical System | Single-beam |
| Detector Type | Silicon Photocell |
| Wavelength Range | 320–1000 nm |
| Wavelength Accuracy | ±2 nm |
| Spectral Bandwidth | 2 nm or 4 nm (selectable) |
| Stray Light | ≤0.1% T |
| Wavelength Scanning Mode | Automatic |
| Display | 128 × 64 dot-matrix LCD |
| Data Storage Capacity | 200 measurement sets & 200 calibration curves |
| Data Output | USB interface + parallel printer port |
| Lamp Type | Plug-in tungsten halogen lamp |
| Power Supply | AC 220 V ±10%, 50 Hz |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Model | UV-8000S |
| Optical System | Dual-Beam |
| Detector Type | Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.1 nm at D₂ line (656.1 nm), ±0.3 nm across full range |
| Wavelength Repeatability | ≤0.1 nm |
| Spectral Bandwidth | 0.5 / 1.0 / 2.0 / 4.0 / 5.0 nm (selectable) |
| Stray Light | ≤0.05% T |
| Display | 6-inch LED color LCD |
| Data Interface | USB port |
| Software | PC-based analytical software compliant with GLP/GMP data integrity requirements |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | UV-6100 |
| Price Range | USD 7,000–10,000 (FOB Shanghai) |
| Optical Design | Pseudo-Double-Beam Ratio-Monitoring System |
| Detector | Silicon Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Scanning Mode | Motorized Auto-Scanning |
| Spectral Bandwidth (SBW) | 1.8 nm |
| Wavelength Accuracy | ±0.1 nm at 656.1 nm (Hg line), ±0.3 nm across full range |
| Wavelength Repeatability | ≤0.1 nm |
| Stray Light | ≤0.05% T at 220 nm (NaI) and 340 nm (NaNO₂) |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer | Yes |
| Type | Domestic |
| Model | V-5800 |
| Instrument Architecture | Dual-beam |
| Detector Type | Silicon Photocell |
| Wavelength Range | 320–1100 nm |
| Automation Level | Automatic Wavelength Scanning |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ±0.5 nm |
| Wavelength Repeatability | ≤0.2 nm |
| Stray Light | ≤0.05% T |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Model | Q-6S |
| Optical System | Dual-Beam |
| Detector | Photomultiplier Tube (PMT) |
| Wavelength Range | 190–900 nm |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Repeatability | ≤0.1 nm |
| Spectral Bandwidth | 0.1–5.0 nm (continuously adjustable in 0.1 nm increments) |
| Stray Light | ≤0.005% T |
| Photometric Accuracy | ±0.3% T |
| Photometric Repeatability | ≤0.1% T |
| Baseline Drift | ≤0.0001 Abs/h |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Model | X-8DS |
| Optical System | Dual-Beam |
| Detector Type | Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Scanning Mode | Automatic |
| Spectral Bandwidth | 0.5 / 1.0 / 2.0 / 4.0 / 5.0 nm (5-step adjustable) |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Repeatability | ≤0.1 nm |
| Stray Light | ≤0.03% T |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | UV-6100A |
| Optical System | Dual-Beam Ratio-Monitoring |
| Detector Type | Silicon Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.1 nm @ 656.1 nm, ±0.3 nm across full range |
| Wavelength Repeatability | ≤0.1 nm |
| Spectral Bandwidth | 1 nm |
| Stray Light | ≤0.05% T |
| Automation Level | Automatic Wavelength Scanning |
| Display | 6-inch Full-Color LED LCD |
| Data Interface | USB port for PC connectivity |
| Software | GLP/GMP-compliant analytical software with audit trail, user management, and report generation |
| Structural Design | Suspended optical assembly mounted on 16-mm thick aerospace-grade aluminum optical base |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | UV-6100S |
| Optical System | Dual-Beam Ratio-Monitoring |
| Detector Type | Silicon Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.1 nm at 656.1 nm, ±0.3 nm across full range |
| Wavelength Repeatability | ≤0.1 nm |
| Spectral Bandwidth | 0.5 / 1.0 / 2.0 / 4.0 / 5.0 nm (selectable) |
| Stray Light | ≤0.05% T |
| Display | 6-inch full-color LED LCD |
| Data Interface | USB port for PC connectivity |
| Software | GLP/GMP-compliant analytical suite with audit trail, user management, and report generation |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Model | X-8 |
| Wavelength Range | 190–1100 nm |
| Optical System | Dual-beam |
| Detector Type | Silicon Photocell |
| Spectral Bandwidth | 1.8 nm |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Repeatability | ≤0.15 nm |
| Stray Light | ≤0.03%T |
| Photometric Repeatability | ≤0.1%T |
| Noise Level | ≤0.4%T |
| Display | 10-inch capacitive touchscreen (1024 × 600 resolution, <3 ms response time) |
| Data Interfaces | USB, Bluetooth, Wi-Fi (optional) |
| Lamp Type | Plug-in deuterium and tungsten lamps |
| Base Material | 20 mm machined aluminum optical bench |
| Compliance | GLP/GMP-aligned software architecture, audit-trail-ready user management |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic (China-made) |
| Model | UV-5100B |
| Optical System | Single-Beam |
| Detector Type | Photodiode Array |
| Wavelength Range | 190–1000 nm |
| Wavelength Accuracy | ±1 nm |
| Spectral Bandwidth | 2 nm |
| Stray Light | ≤0.05% T at 220 nm and 360 nm |
| Wavelength Scanning Mode | Automatic |
| Display | 128 × 64 Dot-Matrix LCD |
| Data Storage Capacity | 200 Sample Readings + 200 Calibration Curves |
| Data Protection | Power-Fail Memory Retention |
| Lamp Configuration | Dual-Lamp (Deuterium & Tungsten), Plug-and-Play D₂ Lamp Replacement |
| Interface | USB Data Output Port + Parallel Printer Port |
| Optional Software | Metash Quantitative Analysis Suite (Supports Absorbance, Concentration, Kinetics, and Multi-Point Calibration) |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer | Yes |
| Type | Domestic |
| Model | Q-8 |
| Optical Design | Dual-beam, dual-monochromator |
| Detector | Photomultiplier Tube (PMT) |
| Wavelength Range | 190–900 nm (extendable to 185 nm) |
| Wavelength Accuracy | ±0.2 nm |
| Wavelength Repeatability | ≤0.05 nm |
| Spectral Bandwidth | 1.8 nm |
| Stray Light | ≤0.00005% T |
| Photometric Accuracy | ±0.3% T |
| Photometric Repeatability | ≤0.1% T |
| Baseline Drift | ≤0.0001 Abs/h |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | X-8S |
| Optical System | Pseudo-Double-Beam |
| Detector Type | Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Repeatability | ≤0.15 nm |
| Spectral Bandwidth | 0.5 / 1.0 / 2.0 / 4.0 / 5.0 nm |
| Stray Light | ≤0.03%T |
| Display | 10-inch capacitive touchscreen (1024 × 600 resolution) |
| Data Interfaces | USB, Bluetooth, Wi-Fi (optional) |
| Compliance | GLP/GMP-ready software architecture |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | UV-6000PC |
| Optical System | Dual-beam ratio-monitoring |
| Detector Type | Silicon photodiode |
| Wavelength Range | 190–1100 nm |
| Wavelength Scanning Mode | Automatic |
| Spectral Bandwidth | 1.8 nm |
| Wavelength Accuracy | ±0.5 nm |
| Wavelength Repeatability | ≤0.2 nm |
| Stray Light | ≤0.05% T |
| Display | 6-inch full-color LED LCD |
| Data Interface | USB port |
| Software | PC-based analytical software with GLP/GMP-compliant audit trail |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Model | Q-5S |
| Optical System | Dual-Beam |
| Detector | Photomultiplier Tube (PMT) |
| Wavelength Range | 190–900 nm |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Repeatability | ≤0.1 nm |
| Spectral Bandwidth | 0.1–5.0 nm (continuously adjustable in 0.1 nm increments) |
| Stray Light | ≤0.01% T |
| Photometric Accuracy | ±0.3% T |
| Photometric Repeatability | ≤0.1% T |
| Baseline Drift | ≤0.0003 Abs/h |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Model | Q-8S |
| Optical Design | Dual-Beam with Dual Monochromator (Hybrid Czerny-Turner) |
| Detector | Photomultiplier Tube (PMT) |
| Wavelength Range | 190–900 nm (extendable to 185 nm) |
| Wavelength Accuracy | ±0.2 nm |
| Wavelength Repeatability | ≤0.05 nm |
| Spectral Bandwidth | 0.1–5.0 nm (continuously adjustable in 0.1 nm increments) |
| Stray Light | ≤0.00005% T |
| Photometric Accuracy | ±0.3% T |
| Photometric Repeatability | ≤0.1% T |
| Baseline Drift | ≤0.0001 Abs/h |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Model | X-9DS |
| Optical System | Dual-Beam |
| Detector Type | Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Scanning Mode | Automatic |
| Spectral Bandwidth | 0.1 / 0.2 / 0.5 / 1.0 / 2.0 / 4.0 nm |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Repeatability | ≤0.1 nm |
| Stray Light | ≤0.01%T |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | UV-9000 |
| Price Range | USD 9,800–13,900 (FOB Shanghai) |
| Optical Configuration | Dual-beam |
| Detector Type | Silicon Photocell |
| Wavelength Range | 190–900 nm (extendable to 1100 nm with optional tungsten-halogen source) |
| Wavelength Accuracy | ±0.1 nm at D₂ line (656.1 nm), ±0.3 nm across full range |
| Spectral Bandwidth | 2 nm |
| Stray Light | ≤0.01% T (at 220 nm and 340 nm) |
| Wavelength Scanning Mode | Motorized automatic wavelength drive |
| Display | 6-inch full-color LED TFT LCD |
| Data Interface | USB 2.0 |
| Software Compliance | GLP/GMP-ready with user authentication, audit trail, electronic signature support (21 CFR Part 11 compatible configuration available) |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer | Yes |
| Type | Domestic |
| Model | X-6DS |
| Optical System | Dual-beam |
| Detector | Photocell |
| Wavelength Range | 190–1100 nm |
| Wavelength Automation | Motorized |
| Spectral Bandwidth | 0.8 / 1.8 / 4.0 / 5.0 nm |
| Wavelength Accuracy | ±0.5 nm |
| Wavelength Repeatability | ≤0.2 nm |
| Stray Light | ≤0.05%T |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | UV-9000S |
| Optical System | Dual-beam |
| Detector Type | Photocell |
| Wavelength Range | 190–900 nm |
| Wavelength Scanning Mode | Automatic |
| Spectral Bandwidth | Selectable (0.1 / 0.2 / 0.5 / 1.0 / 2.0 / 4.0 nm) |
| Wavelength Accuracy | ±0.1 nm at D₂ line (656.1 nm), ±0.3 nm across full range |
| Stray Light | ≤0.05% T |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | V-5600(PC) |
| Instrument Architecture | Dual-Beam Ratio-Monitoring Optical System |
| Detector Type | Silicon Photocell |
| Wavelength Range | 320–1100 nm |
| Automation Level | Automatic Wavelength Scanning & Calibration |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ±0.5 nm |
| Stray Light | ≤0.05% T at 220 nm and 360 nm |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Model | X-6 |
| Optical Design | Pseudo-Double-Beam |
| Detector | Silicon Photodiode |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.5 nm |
| Wavelength Repeatability | ≤0.2 nm |
| Spectral Bandwidth | 1.8 nm |
| Stray Light | ≤0.05% T |
| Photometric Accuracy | ±0.3% T (0–100% T), ±0.002 A (0–0.5 A), ±0.004 A (0.5–1.0 A) |
| Photometric Repeatability | ≤0.15% T (0–100% T), ≤0.001 A (0–0.5 A), ≤0.002 A (0.5–1.0 A) |
| Baseline Drift | ±0.001 A/h at 500 nm |
| Baseline Flatness | ±0.002 A |
| Noise Level | ≤0.4% T |
| Photometric Range | 0–200% T, –3.0 to +3.0 A, 0–9999 C |
| Data Interfaces | USB port, USB flash drive support, optional Bluetooth module, A4 inkjet printer interface |
| Display | 7-inch high-resolution capacitive touchscreen |
| Light Sources | Imported long-life tungsten lamp and deuterium lamp |
| Dimensions | 505 × 375 × 190 mm |
| Weight | 15.5 kg |
| Power Supply | AC 220 V/50 Hz or 110 V/60 Hz |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | UV-5100 |
| Optical System | Single-beam |
| Detector Type | Photocell |
| Wavelength Range | 190–1000 nm |
| Wavelength Accuracy | ±2 nm |
| Wavelength Repeatability | ≤0.5 nm |
| Spectral Bandwidth | 2 nm or 4 nm (selectable) |
| Stray Light | ≤0.1% T |
| Wavelength Scanning Mode | Automatic |
| Data Storage Capacity | 200 measurement sets + 200 calibration curves |
| Display | 128 × 64 dot-matrix LCD |
| Lamp Configuration | Plug-in deuterium and tungsten lamps with flange-mount base |
| Interface | USB data output port + parallel printer port |
| Software Option | Metash Quantitative Analysis Software (optional) |
| Brand | Metash Instruments |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Model | X-7 |
| Optical System | Pseudo-Double-Beam |
| Detector | Silicon Photodiode |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.1 nm at D₂ line (656.1 nm), ±0.3 nm across full range |
| Wavelength Repeatability | ≤0.1 nm |
| Spectral Bandwidth | 1.8 nm |
| Stray Light | ≤0.03% T |
| Photometric Range | 0–200% Transmittance, –4.0 to +4.0 Absorbance, 0–9999 Concentration Units |
| Display | 10-inch capacitive multi-touch TFT LCD |
| Data Interface | USB 2.0 (for printer, flash drive, and PC connectivity) |
| Lamp Source | Imported long-life tungsten and deuterium lamps |
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