Thermal Conductivity Analyzer
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| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | DZDR-S |
| Price Range | USD 5,600–9,800 (based on configuration) |
| Instrument Type | Transient Plane Source (TPS) Method |
| Sample Throughput | Single sample per test |
| Test Environment | Ambient temperature (20–25 °C), optionally up to 130 °C with heated stage (optional) |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Accuracy | ±3% |
| Repeatability | ≤3% |
| Measurement Time | 5–160 s (user-configurable) |
| Probe Options | 7.5 mm, 15 mm, and 50 mm diameter dual-spiral sensors |
| Sample Compatibility | Solids (bulk, film, coating), powders (with dedicated container), gels, pastes, liquids, foams, and insulating materials |
| Minimum Sample Dimensions | ≥2× probe diameter in length/width, ≥0.5× probe diameter in thickness |
| Power Supply | AC 220 V, <500 W |
| Data Acquisition | High-resolution imported ADC chipset |
| Control Core | ARM-based embedded microprocessor |
| Compliance | Designed to support ASTM D5470, ISO 22007-2, and GB/T 10295 test protocols |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | DZDR-S |
| Instrument Type | Transient Plane Source (TPS) Method |
| Sample Throughput | Single sample per test |
| Test Environment | Ambient temperature (20–30 °C) |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Accuracy | ±3% |
| Sample Forms | Liquids, powders, thin films, gels, pastes, metals, and bulk solids |
| Probe Options | 7.5 mm, 15 mm, and 50 mm diameter dual-spiral probes |
| Measurement Duration | 5–160 s (user-configurable) |
| Repeatability | ≤3% |
| Operating Temperature Range | 20–130 °C |
| Power Supply | AC 220 V, <500 W |
| Minimum Sample Dimensions | ≥15×15×3.75 mm (for 7.5 mm probe), ≥30×30×7.5 mm (for 15 mm probe), ≥50×50×7.5 mm (for 50 mm probe) |
| Optional Accessories | Powder test cell, liquid test cup, custom probe/sample holder configurations |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Transient Plane Source (TPS) Method |
| Sample Throughput | Single-sample mode |
| Operating Environment | Ambient temperature (20–30 °C) |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Accuracy | ±3% |
| Repeatability | ≤3% |
| Sample Forms | Liquids, powders, solids (including metals), gels, pastes, thin films, coatings, and insulating materials |
| Probe Options | 7.5 mm, 15 mm, and 50 mm diameter (standard) |
| Measurement Duration | 5–160 s (user-configurable) |
| Temperature Range | Room temperature to 130 °C |
| Power Supply | AC 220 V, <500 W |
| Minimum Sample Dimensions | ≥15×15×3.75 mm (for 7.5 mm probe), ≥30×30×7.5 mm (for 15 mm probe), ≥50×50×7.5 mm (for 50 mm probe) |
| Powder Test Kit | Included (customizable container set) |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Transient Plane Source (TPS) Method |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Measurement Time | 5–160 s |
| Sample Forms | Solid, Liquid, Powder, Paste, Gel, Thin Film, Coating, Foam, Metallic & Composite Materials |
| Operating Temperature | Ambient to 130 °C |
| Probe Diameters | 7.5 mm, 15 mm, 50 mm (optional) |
| Accuracy | ±3% |
| Repeatability | ≤3% |
| Power Supply | AC 220 V, <500 W |
| Sample Dimensions (min.) | 15×15×3.75 mm (for 7.5 mm probe) |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Transient Plane Source Method |
| Sample Throughput | Single sample per test |
| Test Environment | Ambient temperature (standard) |
| optional range | −40 °C to 300 °C |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Accuracy | ±3% |
| Repeatability | ≤3% |
| Sample Forms | Liquids, metals, pastes, gels, coatings, thin films, powders, insulating materials, composites |
| Probe Options | 7.5 mm, 15 mm, and 50 mm diameter sensors |
| Minimum Sample Dimensions | ≥15×15×3.75 mm (7.5 mm probe), ≥30×30×7.5 mm (15 mm probe), ≥50×50×7.5 mm (50 mm probe) |
| Test Duration | 5–160 s |
| Power Supply | AC 220 V, <500 W |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | DZDR-S |
| Instrument Principle | Transient Plane Source (TPS) Method |
| Sample Throughput | Multiple samples per session |
| Test Environment | Ambient temperature (RT to 130 °C) |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Accuracy | ±3% |
| Repeatability | ≤3% |
| Dimensions (L×W×H) | 440 × 390 × 220 mm |
| Sample Forms | Gels, liquids, powders, coatings, thin films, bulk solids, foams, composites |
| Probe Options | 7.5 mm, 15 mm, and 50 mm diameter probes (standard and customizable) |
| Measurement Time | 5–160 s |
| Power Supply | AC 220 V, <500 W |
| Minimum Sample Dimensions | ≥7.5×7.5×3.75 mm (for 7.5 mm probe), ≥15×15×7.5 mm (for 15 mm probe), ≥50×50×7.5 mm (for 50 mm probe) |
| Optional Accessories | Powder test cell, liquid test cup, custom probe fixtures |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | DZDR-S |
| Instrument Principle | Transient Plane Source (TPS) Method |
| Sample Throughput | Single sample per test |
| Test Environment | Ambient temperature (20–30 °C) |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Accuracy | ±3% |
| Repeatability | ≤3% |
| Measurement Time | 5–160 s (user-configurable) |
| Probe Options | 7.5 mm, 15 mm, and 50 mm diameter (standard and customizable) |
| Sample Geometry Requirements | Minimum planar dimension ≥2× probe diameter |
| Sample Forms Supported | Solid blocks, powders (with optional container), pastes, gels, liquids, granules, coatings, thin films, and thermal insulation materials |
| Power Supply | AC 220 V, <500 W |
| Control Interface | Color TFT LCD with capacitive touchscreen |
| Data Acquisition | High-resolution imported ADC chip |
| Core Processor | ARM-based embedded microcontroller |
| Compliance | Designed to support ASTM D7984, ISO 22007-2, and GLP-aligned data integrity practices |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Country of Origin | China |
| Model | DZDR-S |
| Instrument Type | Transient Plane Source (TPS) Method |
| Sample Throughput | Single sample per test |
| Test Environment | Ambient temperature (standard) |
| optional range | −40 °C to 300 °C |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Accuracy | ±3% |
| Repeatability | ≤3% |
| Sample Forms | Solids (bulk, granular, coated, thin-film), metals, liquids, pastes, gels, powders, and insulating materials |
| Probe Options | 7.5 mm (No. 1), 15 mm (No. 2), 50 mm (No. 3) |
| Measurement Time | 5–160 s |
| Power Supply | AC 220 V |
| Max. Power Consumption | <500 W |
| Minimum Sample Dimensions | ≥15×15×3.75 mm (No. 1), ≥30×30×7.5 mm (No. 2), ≥50×50×7.5 mm (No. 3) |
| Powder Test Kit | Optional custom container included |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | DZDR-S |
| Instrument Type | Transient Plane Source Method |
| Sample Throughput | Single sample per test |
| Test Environment | Ambient temperature |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Accuracy | ±3% |
| Dimensions (L×W×H) | 440 × 390 × 220 mm |
| Repeatability | ≤3% |
| Sample Forms | Solids (bulk, granular, paste, film, coating), powders, liquids, gels, foams, and insulating materials |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Country of Origin | China |
| Model | DZDR-S |
| Instrument Type | Transient Plane Source (TPS) Method |
| Sample Throughput | Single sample per test |
| Test Environment | Ambient temperature (20–25°C) |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Accuracy | ±3% |
| Dimensions (L×W×H) | 440 × 390 × 220 mm |
| Sample Forms | Solids (bulk, film, coating), powders, liquids, gels, pastes, metallic and non-metallic materials |
| Temperature Range | Room temperature to 130°C (optional heating module) |
| Probe Options | 7.5 mm, 15 mm, and 50 mm diameter dual-spiral TPS sensors |
| Measurement Time | 5–160 s (user-configurable) |
| Repeatability | ≤3% |
| Power Supply | AC 220 V, <500 W |
| Minimum Sample Dimensions | ≥15×15×3.75 mm (for 7.5 mm probe), ≥30×30×7.5 mm (for 15 mm probe), ≥50×50×7.5 mm (for 50 mm probe) |
| Powder Test Kit | Included (customizable vessel available) |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | DZDR-S |
| Instrument Type | Transient Plane Source (TPS) Method |
| Sample Throughput | Single sample per test |
| Test Environment | Ambient temperature |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Accuracy | ±3% |
| Repeatability | ≤3% |
| Temperature Range | 25–130 °C (optional extension: −40 to 300 °C) |
| Sample Forms | Liquids, thin films, coatings, metals, bulk solids, powders, gels, and insulating materials |
| Probe Diameters | 7.5 mm, 15 mm, 50 mm (modular) |
| Measurement Duration | 5–160 s (user-configurable) |
| Power Supply | AC 220 V, <500 W |
| Sample Dimensions (min.) | 15×15×3.75 mm (for 7.5-mm probe), 30×30×7.5 mm (for 15-mm probe), 50×50×7.5 mm (for 50-mm probe) |
| Optional Accessories | Powder test cell kit |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Transient Plane Source (TPS) Method |
| Sample Capacity | Single sample per test |
| Test Environment | Ambient temperature (20–30 °C) |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Accuracy | ±3% |
| Repeatability | ≤3% |
| Sample Forms | Solids (bulk, film, coating), powders, liquids, pastes, gels, metals, and insulating materials |
| Probe Options | 7.5 mm, 15 mm, and 50 mm diameter (standard) |
| Sample Dimensions (min.) | 15×15×3.75 mm (for 7.5 mm probe), 30×30×7.5 mm (for 15 mm probe), 50×50×7.5 mm (for 50 mm probe) |
| Measurement Duration | 5–160 s (user-configurable) |
| Power Supply | AC 220 V, <500 W |
| Data Acquisition | High-resolution imported ADC chip |
| Control System | ARM-based microprocessor architecture |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | DZDR-S |
| Instrument Principle | Transient Plane Source (TPS) Method |
| Sample Throughput | Single sample per test |
| Test Environment | Ambient temperature (20–30 °C) |
| Dimensions (L×W×H) | 390 mm × 455 mm × 200 mm |
| Accuracy | ±3% |
| Thermal Conductivity Range | 0.005–300 W/(m·K) |
| Repeatability | ≤3% |
| Atmosphere Requirement | None |
| Sample Forms | Solids, powders, liquids |
| Probe Options | Dual-probe configuration (7.5 mm and 15 mm diameter) |
| Max Sample Temperature | 130 °C |
| Measurement Duration | 5–160 s |
| Power Supply | AC 220 V |
| Max Power Consumption | <500 W |
| Max Sample Temperature Rise | <15 °C |
| Probe Power | <1 W (7.5 mm), <20 W (15 mm) |
| Minimum Sample Size | ≥7.5 mm × 7.5 mm × 7.5 mm (for 7.5 mm probe) |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Country of Origin | China |
| Model | DZDR-S |
| Instrument Type | Transient Plane Source (TPS) Method |
| Sample Throughput | Single sample per test |
| Test Environment | Ambient temperature (standard) |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Accuracy | ±3% |
| Repeatability | ≤3% |
| Sample Forms | Solid blocks, pastes, granular solids, gels, liquids, powders, coatings, thin films, and thermal insulation materials |
| Probe Diameters | 7.5 mm (Probe #1), 15 mm (Probe #2), 50 mm (Probe #3, optional/customizable) |
| Sample Dimensions (min.) | ≥15×15×3.75 mm (Probe #1), ≥30×30×7.5 mm (Probe #2), ≥50×50×7.5 mm (Probe #3) |
| Measurement Duration | 5–160 s (user-configurable) |
| Power Supply | AC 220 V, <500 W |
| Data Acquisition | Integrated high-resolution ADC chip |
| Control Core | ARM-based microprocessor |
| Interface | Color TFT touchscreen, embedded HMI |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | DZDR-S |
| Instrument Principle | Transient Plane Source (TPS) Method |
| Sample Throughput | Multiple sequential tests |
| Test Environment | Ambient temperature (RT) to 130 °C |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Dimensions (L×W×H) | 440 × 390 × 220 mm |
| Sample Forms | Solids (bulk, granular, pasty), powders, liquids, gels, coatings, thin films, and insulating materials |
| Probe Options | 7.5 mm, 15 mm, and 50 mm diameter dual-spiral sensors |
| Accuracy | ±3% |
| Repeatability | ≤3% |
| Measurement Duration | 5–160 s (user-configurable) |
| Power Supply | AC 220 V, <500 W |
| Data Acquisition | High-resolution imported ADC chip |
| Control Core | ARM-based embedded microprocessor |
| Interface | Color TFT LCD touchscreen |
| Compliance | Designed for ASTM D7984, ISO 22007-2, and GB/T 32064–2015 alignment |
| Software Features | Automated calibration, real-time curve fitting, GLP-compliant data logging, CSV/PDF report export |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Instrument Type | Transient Plane Source (TPS) Method |
| Sample Throughput | Single sample per test |
| Test Environment | Ambient temperature (RT–130 °C) |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Accuracy | ±3% |
| Repeatability | ≤3% |
| Sample Forms | Solids (bulk, film, coating), powders, liquids, pastes, gels, metals, and thin films |
| Probe Options | 7.5 mm, 15 mm, and 50 mm diameter (standard and customizable) |
| Measurement Time | 5–160 s (user-configurable) |
| Power Supply | AC 220 V, <500 W |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | DZDR-S |
| Instrument Type | Transient Plane Source (TPS) Method |
| Sample Throughput | Single sample per test |
| Test Environment | Ambient temperature (standard) |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Accuracy | ±3% |
| Repeatability | ≤3% |
| Sample Forms | Solids (bulk, granular, coated, thin-film), powders, liquids, pastes, gels, and metallic specimens |
| Probe Options | 7.5 mm (No. 1), 15 mm (No. 2), 50 mm (No. 3, optional/customizable) |
| Minimum Sample Dimensions | ≥15×15×3.75 mm (No. 1), ≥30×30×7.5 mm (No. 2), ≥50×50×7.5 mm (No. 3) |
| Test Duration | 5–160 s (user-configurable) |
| Power Supply | AC 220 V, <500 W |
| Onboard Controller | ARM-based microprocessor |
| Data Acquisition | High-resolution integrated ADC chip |
| Probe Design | Dual-helix sensor geometry with proprietary thermal response modeling |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Transient Plane Source Method |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Accuracy | ±3% |
| Repeatability | ≤3% |
| Measurement Time | 5–160 s |
| Sample Forms | Solid blocks, pastes, granules, gels, liquids, powders, coatings, thin films |
| Probe Diameters | 7.5 mm, 15 mm, 50 mm (optional) |
| Sample Dimensions (min.) | 15×15×3.75 mm (for 7.5 mm probe), 30×30×7.5 mm (for 15 mm probe), 50×50×7.5 mm (for 50 mm probe) |
| Operating Temperature | Ambient to 130 °C |
| Power Supply | AC 220 V, <500 W |
| Dimensions (L×W×H) | 440×390×220 mm |
| Compliance | Designed for ISO 22007-2, ASTM D5470, and GB/T 32064–2015 conformance |
| Software | Embedded ARM-based control system with real-time data acquisition, GLP-compliant audit trail, and exportable CSV/Excel reports |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Category | Domestic |
| Model | DZDR-S |
| Price Range | USD 5,600–9,800 (based on configuration) |
| Measurement Principle | Transient Plane Source (TPS) Method |
| Sample Throughput | Single sample per test |
| Test Environment | Ambient temperature (20–30 °C) |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Accuracy | ±3% |
| Repeatability | ≤3% |
| Sample Forms | Solids, liquids, powders, pastes, gels, metals, coatings, thin films, and thermal insulation materials |
| Probe Options | 7.5 mm (No. 1), 15 mm (No. 2), 50 mm (No. 3, optional/customizable) |
| Sample Dimensions (min.) | 15×15×3.75 mm (for No. 1 probe), 30×30×7.5 mm (for No. 2), 50×50×7.5 mm (for No. 3) |
| Measurement Duration | 5–160 s (user-configurable) |
| Operating Temperature Range | 20–130 °C |
| Power Supply | AC 220 V, <500 W |
| Data Acquisition | High-resolution integrated ADC chip |
| Interface | Color TFT LCD touchscreen |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Transient Plane Source (TPS) Method |
| Sample Throughput | Single sample per test |
| Test Environment | Ambient temperature (20–30 °C) |
| Thermal Conductivity Range | 0.0001–300 W/(m·K) |
| Accuracy | ±3% |
| Sample Forms | Liquids, powders, solids, pastes, metals, gels, coatings, thin films, and insulating materials |
| Probe Options | 7.5 mm, 15 mm, and 50 mm diameter dual-spiral probes |
| Measurement Time | 5–160 s (user-configurable) |
| Repeatability | ≤3% |
| Operating Temperature Range | 20–130 °C |
| Power Supply | AC 220 V, <500 W |
| Sample Dimensions (min.) | 15×15×3.75 mm (for 7.5 mm probe), 30×30×7.5 mm (for 15 mm probe), 50×50×7.5 mm (for 50 mm probe) |
| Optional Accessories | Liquid test cell, powder test capsule, custom probe fixtures |
| Brand | Nanjing Dazhan |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | DZDR-S |
| Instrument Principle | Transient Plane Source (TPS) Method |
| Sample Throughput | Single sample per test |
| Test Environment | Ambient pressure |
| Thermal Conductivity Range | 0.001–300 W/(m·K) |
| Accuracy | ±3% |
| Brand | Netzsch |
|---|---|
| Origin | Germany |
| Model | GHP456 Titan |
| Measurement Principle | Guarded Hot Plate Method |
| Applicable Standards | ISO 8302, DIN EN 12667, DIN EN 12939, DIN EN 13163, ASTM C177, GB 10294 |
| Temperature Range | −160 °C to 600 °C |
| Sample Dimensions | 300 mm × 300 mm (max thickness 100 mm) |
| Thermal Conductivity Range | 0–2 W/(m·K) |
| Accuracy | ±2% |
| Repeatability | ±1% |
| Vacuum Capability | Yes |
| Control Sensors | 29 Pt-100 resistance thermometers |
| Footprint (L×W×H) | 3000 mm × 1500 mm × 2000 mm |
| Operating Environment | Ambient temperature laboratory conditions |
| Sample Throughput | Multi-sample sequential testing supported |
| Brand | NETZSCH |
|---|---|
| Origin | Germany |
| Model | HFM 446 L Lambda |
| Measurement Principle | Heat Flow Method (ASTM C518, ISO 8301, DIN EN 12667) |
| Cold/Hot Plate Temperature Range | –20 °C to +90 °C |
| Temperature Setpoints | Up to 10 independent points |
| Sample Dimensions (L×W×H) | 600 mm × 600 mm × 200 mm (max) |
| Thermal Conductivity Range | 0.002 – 2.0 W/(m·K) |
| Thermal Resistance Range | 0.05 – 8.0 m²·K/W |
| Accuracy | ±1% (relative to NIST-traceable reference materials) |
| Repeatability | ≤0.5% (RSD, under controlled ambient and sample conditioning) |
| Applied Sample Pressure Range | 0 – 5 kPa (motorized, programmable load control) |
| Thickness Resolution | <1 µm (integrated high-precision micrometer displacement sensor) |
| Integrated Peltier Cooling System | Yes |
| Optional Modules | Specific Heat Capacity (Cp) measurement via dual-plate calorimetry mode |
| Overall Dimensions (L×W×H) | 1000 mm × 1000 mm × 1500 mm |
| Compliance | Fully compatible with GLP/GMP data integrity requirements |
| Brand | NETZSCH |
|---|---|
| Origin | Germany |
| Instrument Type | Heat Flow Meter (HFM) |
| Model | HFM 446 M Lambda |
| Dimensions (L×W×H) | 500 mm × 500 mm × 500 mm (sample chamber footprint) |
| Temperature Range (Hot/Cold Plate) | –20 °C to +90 °C |
| Temperature Points | Up to 10 programmable setpoints |
| Sample Size | Up to 300 mm × 300 mm × 100 mm (L×W×H) |
| Thermal Resistance Range | 0.05 to 8.0 m²·K/W |
| Thermal Conductivity Range | 0.002 to 2.0 W/(m·K) |
| Accuracy | ±1% |
| Repeatability | 0.5% |
| Maximum Sample Load Pressure | 21 kPa |
| Compliance | ASTM C518, ISO 8301, DIN EN 12667, GB/T 10294 |
| Brand | Netzsch |
|---|---|
| Origin | Germany |
| Instrument Type | Heat Flow Method |
| Dimensions (L×W×H) | 490 mm × 300 mm × 390 mm |
| Accuracy | ±1% |
| Thermal Conductivity Range | 0.002 – 2.0 W/(m·K) |
| Repeatability | 0.5% |
| Cold/Hot Plate Temperature Range | −20 °C to +90 °C |
| Temperature Setpoints | 10 |
| Sample Size Max | 200 mm × 200 mm × 50 mm |
| Thermal Resistance Range | 0.05 – 8.0 m²·K/W |
| Maximum Sample Load | 21 kPa |
| Optional Features | SMART MODE, Specific Heat Measurement Module, High-Conductivity Extension Kit |
| Brand | Netzsch |
|---|---|
| Origin | Germany |
| Model | LFA 427 |
| Measurement Principle | Laser Flash Method (LFM) |
| Temperature Range | –120 °C to 2800 °C (depending on furnace configuration) |
| Laser Source | Nd:Glass, energy-adjustable pulse |
| Thermal Conductivity Range | 0.1–2000 W/(m·K) |
| Accuracy | ±3% |
| Repeatability | ±2% |
| Vacuum Level | ≤10⁻⁵ mbar |
| Sample Dimensions | Square: 8×8 mm, 10×10 mm |
| Circular | Ø6, Ø10, Ø12.7, Ø20 mm |
| Thickness | 0.1–6 mm |
| Sample Types | Solids, powders, thin films, liquids (with specialized holders) |
| Furnace Options | Dual-furnace capability |
| Pulse Control | Software-adjustable pulse width |
| Key Technology | PulseMapping™ |
| Atmosphere Control | Vacuum, inert (Ar, N₂), or reactive gases (e.g., O₂, CO₂) |
| Sample Holders | Graphite, alumina, silicon carbide |
| Dimensions (L×W×H) | 800 mm × 800 mm × 1900 mm |
| Brand | Netzsch |
|---|---|
| Origin | Germany |
| Model | LFA 467 HyperFlash HT |
| Measurement Principle | Laser Flash Method (LFA) |
| Temperature Range | RT to 1250 °C |
| Thermal Conductivity Range | 0.1 – 4000 W/(m·K) |
| Accuracy | ±3% |
| Repeatability | ±2% |
| Pulse Source | Adjustable-energy xenon lamp, pulse width <2 µs |
| Detection Rate | up to 2 MHz |
| Sample Forms | Solid, liquid, powder, thin film |
| Atmosphere Options | Inert or oxidative (vacuum-tight chamber) |
| Dimensions (L×W×H) | 600 mm × 500 mm × 600 mm |
| Sample Capacity | Up to 4 positions with independent thermocouples |
| Compliance | ASTM E1461, ASTM E2585, ISO 22007-4, ISO 18755, ISO 13826, DIN EN 821-2, DIN 30905, DIN EN 1159-2 |
| Brand | Netzsch |
|---|---|
| Origin | Germany |
| Model | LFA 467 HyperFlash Laser |
| Measurement Principle | Laser Flash Method (ASTM E1461, ISO 13826, DIN EN 821-2) |
| Temperature Range | −100 °C to 500 °C (single furnace) |
| Light Source | Adjustable-energy Xenon Flash Lamp (max. 10 J/pulse) |
| Detection | Non-contact IR Detector with ZoomOptics™ |
| Data Acquisition Rate | Up to 2 MHz |
| Sample Capacity | 16-position Automated Sample Changer |
| Sample Diameter | 6–25.4 mm (including square) |
| Sample Thickness | 0.01–6 mm (thickness limit depends on thermal diffusivity) |
| Thermal Diffusivity Range | 0.01–1000 mm²/s |
| Thermal Conductivity Range | <0.1–2000 W/(m·K) |
| Atmosphere Options | Inert, oxidizing, static/dynamic, vacuum-compatible |
| Cooling | Integrated Auto-refill Liquid Nitrogen System for Detector & Furnace |
| Brand | Netzsch |
|---|---|
| Origin | Germany |
| Model | LFA 717 HyperFlash |
| Measurement Principle | Laser Flash Method (LFA) |
| Temperature Range | -100 °C to 500 °C |
| Thermal Conductivity Range | 0.1 – 4000 W/(m·K) |
| Accuracy | ±3% |
| Repeatability | ±2% |
| Sample Forms | Solid, Liquid, Powder, Thin Film |
| Atmosphere Options | Inert or Oxidizing |
| Sample Capacity | Up to 16 positions with automated carousel |
| Dimensions (L×W×H) | 600 mm × 500 mm × 600 mm |
| Data Acquisition Rate | 2 MHz |
| Compliance Standards | ASTM E1461, ASTM E2585, ISO 22007-4, ISO 18755, ISO 13826, DIN EN 821-2, DIN 30905, DIN EN 1159-2 |
| Brand | NETZSCH |
|---|---|
| Origin | Germany |
| Model | NanoTR |
| Measurement Principle | Laser-based Thermal Reflectance (Time-Domain Thermoreflectance, TDTR) |
| Instrument Type | Thin-Film Thermal Conductivity Analyzer |
| Temperature Range | Ambient (RT) to 300 °C (optional heating stage) |
| Sample Dimensions | 10 × 10 mm to 20 × 20 mm |
| Film Thickness Range | 30 nm to 20 µm (dependent on material and measurement mode) |
| Thermal Diffusivity Range | 0.01 to 1000 mm²/s |
| Thermal Conductivity Range | 0.1 to 2000 W/(m·K) |
| Accuracy | ±5% |
| Repeatability | ±5% |
| Pulse Width | 1 ns |
| Probe Beam Diameter | 100 µm |
| Pump Laser Power | 100 mW |
| Measurement Modes | RF (Rear-Heating/Forward-Detection) and FF (Front-Heating/Forward-Detection) |
| Footprint (L×W×H) | 600 mm × 500 mm × 700 mm |
| Compliance | ISO 13826, ASTM E1461 (adapted for thin-film extension), NIST-traceable calibration protocols |