X-Ray Instruments
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| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Configuration | Benchtop/Floor-standing |
| Elemental Range | Al (13) to U (92) |
| Intended Use | Electronics Industry Applications |
| Compliance | Designed for ISO/IEC 17025-aligned QA/QC workflows |
| Condition | Factory-refurbished with full functional validation |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | EDX-LE |
| Configuration | Benchtop / Floor-standing |
| Detection Principle | Energy Dispersive X-Ray Fluorescence (EDXRF) |
| Sample Forms | Solid, Liquid, Powder |
| Elemental Range | Al (13) to U (92) |
| Sample Chamber Dimensions | Max. W370 mm × D320 mm × H155 mm |
| Detector | Peltier-cooled Si-PIN Semiconductor Detector |
| Primary Beam Filters | 5-position automatic filter changer + OPEN position |
| Analysis Modes | Screening, Qualitative, Quantitative |
| Regulatory Compliance Focus | RoHS Directive (EU 2011/65/EU), ELV Directive (2000/53/EC), China RoHS II (SJ/T 11364-2014) |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | EDX-LE Plus |
| Configuration | Benchtop/Floor-standing |
| Industry Application | Electronics |
| Elemental Range | Al (Z=13) to U (Z=92) |
| Detection Limit | 0.1 ppm |
| Quantitative Range | 0.1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD (at 100 s counting time, for Cr in stainless steel standard) |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | EPMA-1720 Series |
| Pricing | Available upon Request |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Model | EPMA-1720 |
| Analytical Range | Be (4) to U (92) |
| Electron Source | Tungsten (W) filament and Cerium Hexaboride (CeB₆) filament |
| Secondary Electron Image Resolution | 6 nm (W), 5 nm (CeB₆) |
| X-ray Take-off Angle | 52.5° |
| Spectrometer Type | Full-focusing Wavelength Dispersive Spectrometer (WDS) |
| Detector Configuration | High-sensitivity, high-resolution WDS system |
| Compliance | Designed for ISO/IEC 17025-compliant laboratories |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer | Shimadzu Corporation |
| Type | Imported Instrument |
| Model | EPMA-8050G |
| Pricing | Available Upon Request |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Model | EPMA-8050G |
| Beam Current Range | Up to 1 µA |
| Secondary Electron Resolution | 3 nm at 30 kV |
| X-ray Take-off Angle | 52.5° |
| X-ray Spectrometer | Five-channel, high-sensitivity, high-resolution WDS with full-focus crystals |
| X-ray Element Coverage | Be (4) to U (92) |
| Emission Source | High-brightness Schottky field-emission gun |
| Vacuum Architecture | Dual-stage orifice differential pumping system with ultra-high vacuum (UHV) electron gun chamber |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | LAB CENTER XRF-1800 |
| Pricing | Available Upon Request |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | MXF-2400 |
| Pricing | Available Upon Request |
| Brand | Shimadzu |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Regional Category | Domestic |
| Model | MXF-N3 Plus |
| Price Range | USD 210,000 – 280,000 |
| Instrument Type | Simultaneous Multi-Channel |
| X-ray Tube Power | 3 kW |
| Elemental Range | Na (11) to U (92) |
| Brand | Moxtek |
|---|---|
| Origin | USA |
| Model | XPIN-BT |
| Active Area | 6 mm² or 13 mm² |
| Silicon Thickness | 450 µm or 625 µm |
| Beryllium Window Thickness | 8 µm or 25 µm |
| Collimator Materials | Tungsten / Cobalt / Titanium / Aluminum |
| Energy Resolution (FWHM @ Mn Kα) | ≤170 eV (6 mm²), ≤230 eV (13 mm²) |
| Peak-to-Background Ratio @ 1 keV | 3600:1 (6 mm², typical), 3000:1 (13 mm², typical) |
| Brand | Moxtek |
|---|---|
| Origin | USA |
| Model | XPIN-XT |
| Active Area | 6 mm² or 13 mm² |
| Silicon Thickness | 450 µm or 625 µm |
| Beryllium Window Thickness | 8 µm or 25 µm |
| Collimator Materials | Tungsten / Cobalt / Titanium / Aluminum |
| Energy Resolution (FWHM @ Mn Kα) | < 170 eV (6 mm²), < 230 eV (13 mm²) |
| Peak-to-Background Ratio @ 1 keV | 3600:1 (6 mm², typical), 3000:1 (13 mm², typical) |
| Brand | Sichuan Xinxianda |
|---|---|
| Origin | Sichuan, China |
| Model | CIT-2000SMP |
| Detector Type | Proportional Counter |
| Excitation Source | ²³⁸Pu Radioisotope |
| Energy Resolution | 15–20% (at 5.9 keV) |
| Detection Limit | 10⁻³ µg/g |
| Measurement Time | 0.5–5 min per sample |
| Operating Temperature | 0–50 °C |
| Power Consumption | ≤5 W |
| Weight | 3 kg |
| Dimensions | 30 × 20 × 13 cm |
| Elemental Range | Ca, Fe, Ti, Mn, Cu, Pb, Zn, Ni, Sn, Bi, Mo |
| Multichannel Analyzer | 512-channel |
| Sample Form | Solid (bulk or powder) |
| Compliance | CE-marked for field-deployable instrumentation |
| Software Interface | Standalone microcontroller with LCD display and onboard data storage |
| Brand | Sichuan Xinxianda |
|---|---|
| Origin | Sichuan, China |
| Model | CIT-3000SM |
| Form Factor | Benchtop/Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | Universal (Industrial & Laboratory) |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99% (matrix-dependent) |
| Energy Resolution | < 110 eV (with SDD or FAST-SDD detector) |
| Repeatability (RSD) | < 0.1% |
| Detector | Silicon Drift Detector (SDD) or FAST-SDD |
| High Voltage Supply | 0–50 kV (adjustable), 0–1 mA (adjustable) |
| Measurement Time | 100–300 s |
| Sample Mass | 3–8 g |
| Vacuum Level | ≤ 10⁻² Pa (stable for ≥30 min) |
| Dimensions | 480 × 420 × 660 mm (D×W×H) |
| Weight | 70 kg |
| Brand | Sichuan Xinxianda |
|---|---|
| Origin | Sichuan, China |
| Model | CIT-3000SMP |
| Detector | Si(Li) semiconductor, Peltier-cooled |
| Energy Resolution | ≤150 eV (Mn Kα, 5.9 keV) |
| Analytical Range | 2–30 keV |
| Elements Analyzed | S to U (Z = 16–92) |
| Detection Limits | Cd/Cr/Hg/Br ≤ 1 ppm, Pb ≤ 2 ppm |
| Precision | RSD ≤ 0.08% (standard deviation) |
| Measurement Time | < 200 s |
| Power Consumption | 4 W |
| Weight | 1.75 kg |
| Battery Life | ≥ 8 h (full-load operation) |
| Operating System | Embedded Chinese GUI on integrated PDA |
| Connectivity | Bluetooth v4.0, GPS module |
| Safety Indicators | Dual-color LED (green = power on, red = X-ray emission) |
| Sample Forms | Solid blocks, powders, pressed pellets |
| Compliance | IEC 61010-1, IEC 62471 (LED safety), RoHS-compliant construction |
| Data Storage | Internal flash memory (≥ 16 GB) |
| Brand | Sigray |
|---|---|
| Origin | Shanghai, China |
| Model | AttoMap-310 |
| Spatial Resolution (with high-res optics) | 3–5 µm |
| Detection Sensitivity | sub-ppm (relative), femtogram-level (absolute) |
| Incident Angle Range | 3° to 90° (0.01° step) |
| X-ray Source | Patented microfocus source with up to 5 selectable anode targets (e.g., Si, Cr, Cu, Rh, Mo, W, Au, Ti, Ag) |
| Max Power / Voltage | 50 W / 20–45 kVp |
| X-ray Optics | Dual-parabolic grazing-incidence mirrors, ~80% transmission efficiency, 1:1 default magnification |
| Detector | Silicon Drift Detector (SDD), energy resolution <129 eV (Mn-Kα) |
| Vacuum Chamber | <10⁻⁴ Torr |
| Sample Stage Travel | 100 × 100 mm |
| Light Element Detection Limit | Down to boron (B), quantitative for C, N, O at <1% wt. |
| Brand | Sigray |
|---|---|
| Origin | USA |
| Model | QuantumLeap-V210 |
| Energy Range | 1.7–10 keV |
| XAS Modes | Transmission |
| XANES Resolution | ≤0.7 eV |
| EXAFS Resolution | <10 eV |
| Beam Spot Size | 100 µm (diameter) |
| Vacuum Level | <10⁻⁵ Torr |
| X-ray Source | Patented Multi-Target Microfocus Source (W & Mo anodes, 300 W, 20–50 kV) |
| Focusing Optics | Dual-Parabolic Capillary Lens (Pt-coated, ~80% transmission, 1:1 magnification) |
| Analyzer Crystals | HAPG/HOPG, Ge(111), Ge(220), Ge(400) |
| Detector | Spatially Resolved Photon-Counting Detector |
| Sample Capacity | Up to 16 × 3 mm diameter samples |
| Dimensions | 107 cm W × 241 cm H × 191 cm D |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | EDX 3200S PLUS C |
| Form Factor | Benchtop/Floor-Standing |
| Application Domain | Food Safety Testing |
| Elemental Range | S to U |
| Quantification Range | 0.03 ppm – 99.99% |
| Energy Resolution | ≤125 eV (FWHM at Mn Kα) |
| Repeatability | <10% RSD (at 0.2 mg/kg Cd) |
| Detector | FAST-SDD (Silicon Drift Detector with Fast Pulse Processing) |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | EDX-V |
| Form Factor | Benchtop/Floor-standing |
| Instrument Type | Conventional EDXRF |
| Application Scope | General-purpose coating & thin-film analysis |
| Compliance | ASTM B568, ISO 3497, DIN EN ISO 3497, IPC-4552 (ENIG), IPC-4556 (ENEPIG) |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | EDX2000H |
| Form Factor | Benchtop / Floor-Standing |
| Application Type | General-Purpose |
| Elemental Range | S (16) – U (92) |
| Quantification Range | 0.1 ppm – 99.99 wt% |
| Energy Resolution | ≤125 eV (Mn Kα) |
| Repeatability | ≤0.05% RSD (for major elements >96 wt%) |
| Detector | Si-PIN Semiconductor Detector |
| Operating Temperature | 15–30 °C |
| Sample Chamber Dimensions | 460 × 298 × 98 mm |
| Instrument Dimensions | 550 × 410 × 320 mm |
| Weight | 45 kg |
| Power Supply | AC 220 V ±5 V, recommended with line conditioner |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | EDX3000 |
| Form Factor | Benchtop/Floor-standing |
| Application Type | General-purpose |
| Elemental Range | S (16) to U (92) |
| Quantitative Range | 1 ppm – 99.9 wt% |
| Energy Resolution | 125 eV (at Mn Kα) |
| Repeatability | ≤0.05% RSD (for major elements >96 wt%) |
| Detector | Si-PIN semiconductor detector |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | EDX 3000 PLUS |
| Form Factor | Benchtop |
| Application Scope | General-Purpose |
| Elemental Range | S (16) to U (92) |
| Detection Limit | ppm-level |
| Quantification Range | 0.0001 wt% to 99.99 wt% |
| Energy Resolution | 125 eV (at Mn Kα) |
| Detector | FAST-SDD (25 mm² active area) |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | EDX 3200S PLUS |
| Configuration | Benchtop/Floor-standing |
| Industry Application | Energy & Petrochemicals |
| Energy Resolution | 125 eV |
| Detector | FAST-SDD |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | EDX 4500 |
| Form Factor | Benchtop/Floor-standing |
| Application Type | General-purpose |
| Elemental Range | Na (11) to U (92) |
| Quantitative Range | 0.1 ppm – 99.99% (matrix- and element-dependent) |
| Energy Resolution | ≤125 eV at Mn Kα |
| Detector | FAST-SDD (Silicon Drift Detector) |
| Brand | Skyray Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | EDX 4500A |
| Configuration | Benchtop/Floor-standing |
| Application Scope | General-purpose Inorganic Elemental Analysis |
| Automation | 23-position Automatic Sample Changer Integrated |
| Light Element Capability | Optimized for Na–Cl (Z = 11–17) via Intelligent Vacuum System |
| Regulatory Context | Compliant with ISO 8258 (control charting), ASTM E1621 (XRF for metals), and GB/T 176–2017 (cement analysis) |
| Brand | Skyray Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM Manufacturer |
| Product Type | Benchtop/ Floor-Standing ED-XRF Spectrometer |
| Model | EDX 4500H |
| Element Range | Na–U |
| Concentration Range | 0.1 ppm – 99.99 wt% |
| Energy Resolution | 125 eV (Mn Kα) |
| Repeatability | RSD ≤ 0.05% for major elements (>96 wt%) |
| Detector | FAST-SDD (Silicon Drift Detector) |
| Tube Voltage | 5–50 kV |
| Tube Current | 50–1000 µA |
| Measurement Time | 30–200 s |
| Sample Chamber Dimensions | 320 × 100 mm |
| Instrument Dimensions | 660 × 510 × 350 mm |
| Weight | 65 kg |
| Operating Environment | 15–30 °C, 35–70% RH |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | EDX 600 PLUS |
| Configuration | Benchtop / Floor-Standing |
| Application Type | General-Purpose |
| Elemental Range | S (16) to U (92) |
| Quantitative Range | 0.1% – 99.9% |
| Energy Resolution | ≤125 eV (Mn Kα) |
| Repeatability | <5% RSD |
| Detector | FAST-SDD (Silicon Drift Detector) |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Domestic (PRC) |
| Model | EDX-T |
| Pricing | Available upon Request |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Type | Benchtop/Stand-Alone ED-XRF |
| Model | EDX1800B |
| Element Range | S (16) to U (92) |
| Detection Limit | 1 ppm |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | 125 eV (at Mn Kα) |
| Repeatability | ≤0.05% RSD (for major elements >96 wt%) |
| Detector | Si-PIN Semiconductor Detector |
| Dimensions (W×D×H) | 550 × 416 × 333 mm |
| Sample Chamber | 460 × 298 × 98 mm |
| Weight | 45 kg |
| Operating Temperature | 15–30 °C |
| Power Supply | AC 220 V ±5 V |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | EDX1800BS |
| Form Factor | Benchtop |
| Application Scope | General-Purpose |
| Elemental Range | S (16) to U (92) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | 125 eV (Mn Kα) |
| Repeatability | ≤0.05% RSD (for major elements >96 wt%) |
| Detector | FAST-SDD (Silicon Drift Detector) |
| Power Supply | AC 220 V ±5 V |
| Operating Temperature | 15–30 °C |
| Dimensions (W×D×H) | 550 × 416 × 333 mm |
| Sample Chamber Size | 460 × 298 × 98 mm |
| Weight | 45 kg |