X-Ray Instruments
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| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Supermini200 |
| Instrument Type | Benchtop WDXRF Spectrometer |
| Excitation Source | Pd-anode X-ray tube (50 kV / 4 mA, 200 W) |
| Analyzed Elements | Total S, Total Cl, Total Si, Total Pb |
| Detection Limits | S: 0.15 ppm, Cl: 0.1 ppm, Si: 0.5 ppm, Pb: 0.2 ppm |
| Quantification Range | 0–99.99% |
| Optical Configuration | Single-wavelength excitation with automated multi-crystal changer (RX4, RX9, and others) |
| Sample Handling | 12-position automatic sample changer |
| Compliance Standards | GB/T 111140 (S), SH/T 6083 (Cl & Si), ASTM D5059 (Pb) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Benchtop |
| X-ray Tube Power | 200 W |
| Elemental Range | Na (11) to U (92) |
| Detector | Flow Proportional Counter (F-PC) and Scintillation Counter |
| Sample Handling | 12-position Automatic Sampler |
| Operating Atmosphere | Air, He, or Vacuum |
| Dimensions | 580(W) × 670(H) × 680(D) mm |
| Power Supply | 200–240 V, 10 A |
| Grounding Resistance | <30 Ω |
| Ambient Temperature | 10–40 °C |
| Relative Humidity | <80% RH |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Benchtop |
| X-ray Tube Power | 200 W |
| Target Material | Pd |
| Detector Types | Flow-proportional Counter (F-PC) and Scintillation Counter (SC) |
| Analytical Elements | Na (11) to U (92) |
| Configuration | Multi-channel WDXRF |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Ultima IV Series |
| Instrument Type | Powder X-ray Diffractometer |
| X-ray Generator Power | 3 kW |
| Goniometer | Horizontal Type |
| Minimum Angular Step | 0.0001° |
| Optical System | CBO Cross-Beam Optics (Patented) |
| Detector | D/teX-Ultra High-Speed Energy-Dispersive Detector |
| Optional Modules | In-Plane Geometry Unit, Small-Angle X-ray Scattering (SAXS) Module, Thin-Film Analysis Module, Micro-Beam Mapping Unit, XRD-DSC Simultaneous Measurement System |
| Software Suite | PDXL (with Rietveld), NANO-Solver, GXRR, and XRD Analysis Package |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | WDA-3650 |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Detector Configuration | High-sensitivity AD-Boron channel for boron analysis |
| Instrument Architecture | Hybrid scanning + fixed-channel (multi-channel) WD-XRF |
| Sample Compatibility | Up to 200 mm wafers and magnetic/optical disks |
| Automation | Fully automated daily calibration (AutoCal), C-to-C robotic handler compatible (optional), SECS/GEM interface support |
| Vacuum & Thermal Stability | Integrated vacuum stabilization and active cooling systems |
| Footprint | 1.12 m (W) × 1.45 m (H) × 0.89 m (D) |
| Mass | 600 kg |
| Power Supply | 3-phase 200 VAC 50/60 Hz, 30 A or single-phase 220–230 VAC 50/60 Hz, 40 A |
| Regulatory Compliance | Designed for GLP/GMP environments |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | XGT-5700 |
| Price Range | USD 42,000–70,000 (FOB) |
| Instrument Type | Scanning Micro-XRF |
| Analytical Element Range | Na (Z=11) to U (Z=92) |
| Primary Beam Diameter Options | 3 mm (standard), 100 µm, 10 µm |
| Primary Beam Filtration | Auto-switching for 3 mm beam (4 filters) |
| Secondary Beam Filtration | Motorized ON/OFF filter for enhanced sensitivity in regulated heavy metal analysis (e.g., Pb, Cd, Hg, Cr, Br) |
| Detector | Liquid-nitrogen-cooled, high-purity Si(Li) detector (3 L Dewar capacity) |
| Maximum Sample Dimensions | 350 × 400 × 40 mm |
| Stage Scan Range | Standard 100 × 100 mm |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Configuration | Floor-Standing |
| Detector | PILATUS200K Hybrid Pixel Array Detector |
| Detector Pixel Size | 172 µm |
| Dynamic Range | 1 × 10⁶ photons/pixel |
| Operating Temperature | Ambient (No Cryogenic Cooling Required) |
| X-ray Source Options | MicroMax003 (Cu or Mo), DualSource (Cu + Mo), MicroMax007HF, MicroMax007HF-DW, MultiMax9 |
| Goniometer Types | Partial χ, Fixed χ, Three-Axis AFC-Kappa, Four-Axis Kappa |
| Optional Accessories | Low-Temperature Device (e.g., Oxford Cryostream) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | XtaLAB Synergy |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Configuration | Floor-Standing |
| Power Stability | < 0.0001 (unitless, indicating angular reproducibility or beam stability per manufacturer specification) |
| Detector | HyPix-6000HE Photon-Counting Pixel Array Detector |
| Detector Active Area | 77.5 mm × 80.0 mm |
| Pixel Size | 100 µm × 100 µm |
| Cooling Method | Air-Cooled |
| Dynamic Range | Up to 31-bit equivalent |
| Readout Mode | Shutterless, 0-ms dead time |
| Goniometer | AFC-Kappa Four-Axis |
| X-ray Source Options | Microfocus Sealed-Tube (Cu/Mo), MM007HF Rotating Anode, FR-X High-Brilliance Rotating Anode |
| Anode Materials | Cu, Mo, or Dual Cu/Mo |
| Cryogenic Capability | Integrated Low-Temperature System (e.g., Oxford Instruments Cryostream-compatible) |
| Software Suite | CrysAlisPro (data collection & processing), AutoChem (automated structure solution and refinement) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | XtaLABmini |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Configuration | Benchtop |
| X-ray Source | Mo Kα, 600 W high-frequency generator |
| Goniometer Axes | χ fixed at 54°, Φ rotation: −360° to +360° about sample center axis, ω range: 2θ ± 90° (−60° to +120°), 2θ fixed at 30° |
| Sample Viewing | 70× CCD microscope with 50 mm camera-to-sample distance |
| Detector | CCD, active area Φ75 mm, pixel sizes 73.2 µm / 146.4 µm, resolution modes 1024 × 1024 / 512 × 512, readout times 2.24 s / 0.56 s, dark current 0.1 e⁻/pixel/s |
| Optional | Cryogenic sample stage (e.g., Oxford Instruments Cryostream-compatible) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus 400 |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Maximum Sample Diameter | 400 mm |
| Maximum Sample Thickness | 50 mm |
| Maximum Sample Mass | 30 kg |
| Measurement Spot Size | 0.5–30 mm (5-step motorized selection) |
| Compliance | SEMI, CE |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus II |
| Excitation Source | End-window Rh-target X-ray tube (3 kW or 4 kW) |
| High-voltage Generator | High-frequency inverter type |
| Max. Output | 60 kV / 150 mA (4 kW) |
| Stability | ±0.005% (against ±10% AC line fluctuation) |
| Cooling | Integrated water-cooling system |
| Sample Changer Capacity | Up to 48 positions |
| Sample Dimensions | Ø51 mm × 40 mm (H) |
| Analyzed Area | Up to Ø35 mm |
| Sample Rotation | 30 rpm |
| Primary Beam Filters | Al, Ti, Cu, Zr (4-position auto-switch) |
| Collimators | 6 automatic apertures (Ø35, 30, 20, 10, 1, 0.5 mm) |
| Divergence Slits | 3 types (standard, high-resolution, ultra-light-element option) |
| Receiving Slits | SC and F-PC compatible |
| Goniometer | Independent θ–2θ drive |
| Angular Range | SC: 5°–118°, F-PC: 13°–148° |
| Max. Scan Speed | 1400°/min (2θ) |
| Continuous Scan Rate | 0.1–240°/min |
| Crystal Changer | 10-position auto-exchange |
| Standard Crystals | LiF(200), Ge, PET, RX25 |
| Optional Crystals | LiF(220), RX4, RX9, RX35–RX80, RX61F, TAP |
| Vacuum System | Dual-chamber rapid evacuation (dual-pump configuration) |
| Detectors | SC scintillation counter (1000 kcps linearity) for heavy elements |
| Pulse Height Analyzer (PHA) | Auto-adjustment (PAS, Rigaku patent) |
| F-PC Anode Wire Cleaning | Automatic thermal cleaning (ACC, Rigaku patent) |
| Optional Accessories | He purge module (with baffle), temperature-controlled sample stage (36.5 °C), CCD-based micro-imaging (100 µm resolution, 0.5 mm micro-area analysis & mapping), r-θ sample stage (Rigaku patent) |
| Software | NEW SQX (qualitative ID, background subtraction, smoothing, peak deconvolution, calibration curve method per JIS, matrix correction, standardless quantification, EZ-scan templates, auto-aperture selection, precision testing, email reporting, multi-standard management) |
| Compliance | Designed for GLP/GMP environments |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | ZSX Primus IIInext |
| Instrument Type | Floor-standing |
| Instrument Kind | Scanning-type |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Scan Speed | 2400°/min |
| Detector Linear Count Rate | SC: 1800 kcps |
| FPC | 3000 kcps |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | ZSX Primus IV |
| Price Range | USD 210,000 – 280,000 (FOB Yokohama) |
| Instrument Type | Scanning WDXRF |
| X-ray Tube Power | 4 kW |
| Elemental Coverage | Beryllium (Be, Z=4) to Curium (Cm, Z=96) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus IV |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be to U |
| Scan Speed | 2400°/min |
| Detector Linear Range | SC 1800 kcps, FPC 3000 kcps |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus IVi |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Scan Speed | 2400°/min |
| Detector Linear Count Rate | SC: 1800 kcps |
| FPC | 3000 kcps |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be–U |
| Scan Speed | 2400°/min |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Origin | China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Model | RoHS II |
| Pricing | Available Upon Request |
| Brand | Stresstech Oy |
|---|---|
| Origin | Finland |
| Manufacturer Status | Authorized Distributor |
| Origin Category | Imported |
| Model | RollScan 300 |
| Price | Upon Request |
| Power Supply | 90–260 VAC, 49–61 Hz, Single-Phase |
| Inrush Current (Cold Start) | 40 A @ 115 VAC, 80 A @ 230 VAC |
| Power Consumption (Charging Battery) | 150 VA |
| Typical Operating Power | 100 VA |
| Magnetization Frequency Range | 1.0–1000 Hz |
| Magnetization Voltage Range | 0–16 V |
| Signal Analysis Filter Bands | 10–70 kHz, 70–200 kHz, 200–450 kHz |
| Channel Configuration | Single-Channel Standard (Multi-Channel Optional) |
| Sensor Interface | Detachable Pre-Amplified Probes |
| Compatible Materials | Ferritic steels, iron-based alloys, nickel-based superalloys, cobalt-based alloys |
| Signal Processing | Real-Time Digital Signal Processor (DSP) |
| Brand | SciAps |
|---|---|
| Origin | USA |
| Model | X-200 |
| Application | Handheld/Portable |
| Element Range | Pb, Hg, Cd, Br, Cr |
| Detector | 20 mm² Silicon Drift Detector (SDD), 135 eV FWHM resolution at 5.95 keV Mn Kα line |
| Excitation Source | Rh anode (6–40 kV, 200 µA) for alloy analysis |
| Weight | 1.5 kg (3.3 lbs) with battery |
| Display | 5-inch color capacitive touchscreen |
| Operating Temperature | −4 °C to +54 °C (25 °F to 130 °F) at 10% duty cycle |
| Certifications | CE, RoHS, US FDA Registered, Canada RED Act compliant |
| Brand | SciAps |
|---|---|
| Origin | USA |
| Model | X-550 |
| Detector | 20 mm² Silicon Drift Detector (SDD), 140 eV FWHM resolution at 5.95 keV Mn Kα |
| Excitation Source | Rh anode (40 kV / 200 µA for alloys |
| Elemental Range | Standard 32 elements (Mg–U), configurable per application |
| Sample Form | Solid, powdered, or coated surfaces (non-destructive) |
| Weight | 1.35 kg (2.98 lb) with battery |
| Dimensions | 216 × 241 × 61 mm (8.5 × 9.5 × 2.4 in) |
| Display | 2.7″ color capacitive touchscreen, sunlight-readable |
| Processor | 1.2 GHz quad-core ARM Cortex-A53 (64/32-bit), 2 GB LP-DDR3 RAM, 16 GB eMMC storage |
| Battery | Rechargeable Li-ion, hot-swappable (≤60 s swap time) |
| Regulatory Compliance | CE, RoHS, US FDA 21 CFR Part 820 registered, ISED Canada RED compliant |
| Operating Temperature | –4 °C to 54 °C (25 °F to 130 °F) at 10% duty cycle |
| Calibration Method | Fundamental Parameters (FP) with optional Compton normalization and empirical calibration |
| Filter Wheel | 4-position motorized filter wheel for beam optimization |
| Pulse Processor | 12-bit, 80 MSPS digitization rate, 8K-channel MCA, FPGA-based digital pulse shaping (20 ns – 24 µs peaking time) |
| Software | SciAps ProfileBuilder for library management and method development |
| Applications | Alloy PMI, geochemical exploration, environmental soil screening (EPA Method 6200), RoHS/Br/Cl compliance, catalyst analysis, precious metals assay, lead-based paint (HUD), and empirical custom analysis |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer | LANScientific |
| Type | Benchtop/Floor-Standing Hybrid |
| Configuration | Conventional ED-XRF System |
| Application Sector | Non-Ferrous Metals Recycling |
| Elemental Range | Al (13) to U (92) |
| Detection Limit | Sub-ppm to % level (matrix-dependent) |
| Safety Compliance | IEC 62495, GB/Z 25480, EN 61000-6-3 |
| Software | ScopeX Analyze v3.2 with Audit Trail & CFR Part 11 Ready Mode |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Type | Benchtop/Floor-Standing ED-XRF |
| Model | ScopeX 980CS / ScopeX 980CSR |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm (typical, matrix-dependent) |
| Energy Resolution | <125 eV at Mn Kα (5.89 keV) |
| Repeatability | ≤0.1% RSD (for major elements under optimized conditions) |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Sample Chamber | Dual-mode (air/vacuum) with motorized sample stage |
| Excitation Source | Rhodium-anode microfocus X-ray tube |
| Collimators | 5 mm, 3 mm, 1 mm, 0.5 mm (motorized auto-switching) |
| Filters | Multi-position filter wheel (Al, Cu, Ti, none) |
| Data Interface | USB 3.0, Wi-Fi 5 (802.11ac), Bluetooth 5.0 |
| Report Output | Customizable Excel/PDF templates with spectral overlays, logo embedding, and metadata fields |
| Safety Compliance | Fully shielded metal enclosure with interlocked vacuum door |
| Brand | Semicircle-Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM/ODM Producer |
| Model | DPAE-VSDD-Pro |
| Detection Area | 20 mm² / 30 mm² / 50 mm² (selectable) |
| Thickness | 450 µm |
| Energy Resolution | 125–140 eV FWHM @ 5.9 keV (⁵⁵Fe) |
| Peak Time | 1 µs (max cooling) |
| Count Rate Capability | up to 2,000 kcps |
| Peak-to-Background Ratio | 15,000:1 |
| Window Options | 1 µm graphene or 8 µm beryllium |
| Ultimate Vacuum | 10⁻⁷ Torr |
| Operating Temperature Range | 0–50 °C |
| Storage Conditions | –10–30 °C, 10–90% RH (non-condensing) |
| Power Supply | 4.5–9 VDC |
| Gain Stability | <20 ppm/°C |
| Interface Options | USB 2.0, RS-232, Ethernet |
| Cooling | Peltier-based, cryogen-free |
| Warranty | 12 months |
| Expected Service Life | 5–10 years under standard lab use |
| Brand | Semicircle-Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM Manufacturer |
| Model | TUB0011-CS1B/2B |
| Max Anode Voltage | 50 kV |
| Max Anode Current | 1 mA |
| Max Power | 50 W |
| Focal Spot Size | 1.0 × 1.0 mm (CS1B) / 0.1 × 0.1 mm (CS2B) |
| Filament Current | ≈1.7 A @ 50 kV/1 mA |
| Filament Voltage | ≈2.0 V |
| X-ray Exit Angle | 17° |
| Anode Target Materials | W, Rh, Mo, Ag, Cu (customizable) |
| Beryllium Window Thickness | 125 µm or 200 µm (selectable) |
| Electrical Configuration | Anode at positive high voltage, cathode grounded |
| Cooling Method | Forced-air cooling (>150 CFM), max housing temperature ≤55 °C |
| Weight | 2.5 kg |
| Brand | Haoyuan |
|---|---|
| Origin | Jilin, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | XAFS2300+ |
| X-ray Source Power (XAFS mode) | 3 kW |
| X-ray Source Power (XES mode) | 50 W |
| Monochromatic Photon Flux | > 2 × 10⁶ photons/sec (at 7–9 keV) |
| Minimum Detectable Elemental Concentration | ≥ 1 wt% |
| Tunable X-ray Absorption Energy Range | 4.5–25 keV |
| Energy Resolution | 0.5–3 eV |
| Energy Scale Drift Reproducibility | < 50 meV per measurement session |
| Monochromator Architecture | Spherical-bent crystal on high-precision Rowland-circle geometry |
| Detector | High-resolution silicon drift detector (SDD) |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | ALTRACE |
| Configuration | Benchtop/Floor-standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-purpose |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Detector | Silicon Drift Detector (SDD) |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Model | EDX-700HS |
| Element Range | Na (11) to U (92) |
| Detection Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV |
| Repeatability | 0.1% |
| Configuration | Benchtop / Floor-standing |
| Application Focus | Geological & Mineralogical Analysis |
| Primary Excitation | Rh anode X-ray tube (5–50 kV, 1–1000 µA) |
| Sample Chamber | Ø300 mm × H150 mm |
| Beam Spot Size | 50 µm φ (with polycapillary lens) |
| Detector | Liquid-nitrogen-cooled Si(Li) |
| CCD Imaging | Dual-magnification optical system |
| Filter Exchange | Automated 5-position primary filter changer |
| Quantitative Methods | Fundamental Parameters (FP), Thin-Film FP, Background-corrected FP (BG-FP) |
| Mapping | Simultaneous multi-element scanning imaging |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Model | EDX-720 |
| Element Range | Na (11) – U (92) |
| Detection Limit | 1 ppm |
| Quantitative Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV (at Mn Kα) |
| Repeatability | ±0.1% RSD |
| Configuration | Benchtop or Floor-Standing |
| Application Sector | Geological & Mineralogical Analysis |
| Compliance | Designed for ISO/IEC 17025-aligned laboratories |
| Instrument Condition | Factory-refurbished, fully recalibrated and performance-verified |
| Brand | Shimadzu |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (PRC) |
| Model | EDX-7200 |
| Configuration | Benchtop or Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Quantitative Concentration Range | 0.1 ppm – 100 wt% |
| Energy Resolution | ≤140 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD (for major elements under standardized conditions) |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | EDX-8100 |
| Configuration | Benchtop & Floor-Standing Options |
| Application Scope | General-Purpose Elemental Analysis |
| Elemental Range | C (Z=6) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV at Mn Kα |
| Repeatability | <0.1% RSD (Relative Standard Deviation) |