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| Brand | EDAX |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | XLNCE SMX-BEN |
| Quotation | Upon Request |
| Energy Resolution | See Technical Datasheet |
| Peak-to-Background Ratio | See Technical Datasheet |
| Maximum Count Rate | See Technical Datasheet |
| Detector Active Area | See Technical Datasheet |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | DigiView |
| Pricing | Upon Request |
| CCD Resolution | 1392 × 1040 pixels |
| Readout Speeds | 20 MHz / 40 MHz |
| Angular Resolution | < 0.1° |
| Quantum Efficiency | > 62% @ 500 nm |
| Bit Depth | 12-bit digital output |
| Read Noise | < 8 e⁻ @ 20 MHz |
| Exposure Time Range | Up to 15 minutes |
| Cooling | Single-stage Peltier (fanless) |
| Interface | Gigabit Ethernet |
| Gain Control Range | 0–35 dB (fully adjustable) |
| Vacuum Compatibility | Bellows-mounted for in-chamber operation |
| Optional Feature | Integrated Fore-Scatter Detector (FSD) |
| Software Integration | Fully compatible with EDAX TEAM™ EBSD analysis suite |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Octane Elite |
| Energy Resolution | 125 eV (Mn Kα) / 123 eV (optimized configuration) |
| Peak-to-Background Ratio | Not specified |
| Maximum Output Count Rate | 400,000 cps |
| Detector Active Area | 30 mm² (Octane Elite Plus) or 70 mm² (Octane Elite Super) |
| Window Material | Silicon Nitride (Si₃N₄) |
| Vacuum Compatibility | Fully sealed ultra-high vacuum detector housing |
| Integration | Compatible with SEM, FIB-SEM, and TEM platforms |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Octane Elect |
| Energy Resolution | 127 eV |
| Maximum Count Rate | 400,000 cps |
| Detector Active Area | 30 mm² or 70 mm² |
| Window Material | Silicon Nitride (Si₃N₄) |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Velocity Super |
| Maximum Acquisition Speed | 4500 points/sec |
| Orientation Resolution | < 0.1° |
| Image Resolution (during high-speed acquisition) | 120 × 120 pixels |
| Detector Type | High-sensitivity, low-noise CMOS |
| Calibration Algorithm | Triplet-band confidence-based indexing |
| EDS-EBSD Synchronization | Yes, with compatible EDAX EDS detectors |
| Compliance | Designed for ASTM E112, ISO 11937, and ASTM E2627-compliant microstructural quantification workflows |
| Software Integration | OIM Analysis™ v9+ with GLP-compliant audit trail and 21 CFR Part 11-ready data handling |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Hikari XP |
| Angular Resolution | < 0.1° |
| Maximum Pattern Indexing Rate | up to 1400 points/sec |
| Beam Current Compatibility | down to 100 pA |
| Accelerating Voltage Compatibility | down to 5 kV |
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