Empowering Scientific Discovery

AMETEK China

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BrandTaylor Hobson
OriginUnited Kingdom
ModelPGI Freeform
Measurement PrincipleContact Stylus Profilometry with Radial & Grating-Scan Modes
Vertical Range28 mm
Vertical Resolution0.8 nm
Tilt Capability±50°
Form Error Accuracy<150 nm PV
Motion ArchitectureFEA-Optimized Ultra-Stiff Mechanical Axes
ComplianceISO 10360, ISO 1101, ISO 16610, ISO 25178 (Part 2, Part 601–607), ASTM E1155, USP <1059>, GLP/GMP-ready audit trail support in software
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