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| Brand | MCL Think Nano |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | MadPLL® |
| Price Range | USD $14,000 – $72,000 (based on configuration) |
| Positional Detection Noise | 0.15 nm RMS |
| Sample Diameter Limit | <15 mm |
| XY Scan Range (with compatible stages) | up to 200 µm |
| Z-Range (with Nano-OP30) | 30 µm (closed-loop), 100 µm (open-loop) |
| PLL Frequency Lock Range | 10–100 kHz |
| Phase Shift Resolution | <0.1° |
| Demodulation Bandwidth | 3 kHz |
| PCC Compensation Range | ±50 pF |
| Operating Systems | Windows 7/10/11 (32/64-bit), LabVIEW 2015+ compatible |
| Brand | MCL Think Nano |
|---|---|
| Origin | USA |
| Model | SPM-M Kit |
| Detection Noise | <0.15 nm RMS |
| Sample Size | <15 mm |
| XY Scan Range | 200 × 200 µm |
| Z Positioning | Nano-OP30 (closed-loop optional) |
| Controller | 3-Axis Nano-Drive® with PicoQ® sensors |
| Probe Options | Quartz tuning forks (5 included), Akiyama probe boards, tungsten tip etching compatibility |
| Software | AFMView™ with automated PLL control |
| Compliance | Designed for GLP/GMP-aligned research environments |
| Brand | MCL Think Nano |
|---|---|
| Origin | USA |
| Model | Tuning Forks |
| Center Frequency | 32.768 kHz |
| Oscillation Mode | Fundamental |
| Series Resistance (max.) | 30 kΩ |
| Tolerance (at 25 °C) | ±18 ppm |
| Operating Temperature Range | −10 °C to +60 °C |
| Frequency Stability Over Temperature | −0.038 ppm/°C |
| Drive Level | 10 µW |
| Shunt Capacitance (max.) | 1.7 pF |
| Motional Capacitance | 2.5 fF |
| Load Capacitance | 12.5 pF |
| Aging (max.) | ±3 ppm/year |
| Packaging | Pre-cleaned, “out-of-the-can” ready-to-mount configuration |
| Available Sizes | Medium and Large |
| Brand | MCL Think Nano |
|---|---|
| Origin | USA |
| Model | MadAFM™ |
| Instrument Type | Material-Grade AFM |
| Positional Detection Noise | <0.15 nm RMS |
| Max Sample Size | 50 mm × 50 mm × 40 mm |
| XY Sample Stage Travel | 25 mm |
| Z Focus & Head Travel | 50 mm |
| Closed-Loop Nanopositioner Range (XY) | 30/65/100 µm |
| Z Nanopositioner Range | 15/30 µm |
| Nanopositioner Resolution (30 µm range) | 0.03 nm |
| Nanopositioner Noise Floor (peak-to-peak) | 2.7 pm |
| Optical Alignment | 635 nm Class II laser + 1.6 MP coaxial CMOS camera |
| Software | AFMView®-OD (USB 2.0 interface, Windows 8.1/10/11) |
| Brand | MCL Think Nano |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MCL-NSOM |
| Instrument Type | Materials-Focused NSOM System |
| Positioning Noise | X-Y ≤ 0.15 nm RMS, Z = 35 pm RMS |
| Typical Imaging Bandwidth | 625 Hz |
| Sample Dimensions | Ø ≤ 15 mm, Thickness ≤ 5 mm |
| Sample Stage Travel Range | Ø ≤ 15 mm, Thickness ≤ 5 mm |
| XY Micropositioner Range | 25 mm |
| Z Lens Micropositioner Range | 50 mm |
| Fiber XYZ Micropositioner Range | 25 mm |
| Micropositioner Step Size | 95 nm |
| Piezo Nanopositioner Range (XYZ) | 200 µm × 200 µm × 30 µm |
| Piezo Resolution | 0.4 nm (XY), 0.06 nm (Z) |
| Piezo Step Size | 0.2 nm (XY), 0.03 nm (Z) |
| Excitation Source | 635 nm, 5 mW laser diode with fiber coupling |
| Objective | 20× oil immersion, 0.4 NA, infinity-corrected |
| Detection | Avalanche photodiode (200–1000 nm, 1 mm active area) |
| Alignment Camera | 0.3 MP CMOS |
| Feedback Mode | Shear-force |
| NSOM Modes | Illumination, Collection, Illumination+Collection, Reflection, Reflection+Collection |
| Control Software | AFMView™ and LabVIEW™-based automation suite |
| Controller Interfaces | USB 2.0, 20-bit DAC/ADC, 4-channel TTL I/O |
| Operating System Compatibility | Windows Vista/7/8/10 |
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