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| Brand | Ekspla |
|---|---|
| Origin | Imported (Lithuania) |
| Model | SFG FS |
| Tuning Range (IR) | 2.3–10 μm (4300–1000 cm⁻¹) |
| Visible Beam | 532 nm, <2 cm⁻¹ linewidth, ~1 mJ pulse energy, 20–30 ps pulse duration |
| SFG Output Range | 432–505 nm |
| Spectral Resolution | <6 cm⁻¹ |
| Detection Sensitivity | ~10 photons/shot |
| Acquisition Rate | 10 Hz |
| Polarization Purity | >1:100 (linear, selectable) |
| IR Pulse Energy | 200–20 μJ |
| Brand | Ekspla |
|---|---|
| Origin | Lithuania |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | SFG |
| Price | Upon Request |
| IR Tuning Range | 2.3–10 µm (4300–1000 cm⁻¹) |
| Spectral Resolution | < 6 cm⁻¹ |
| Detection Sensitivity | ~10 photons/shot |
| Acquisition Rate | 10 Hz |
| VIS Beam | 532 nm, < 2 cm⁻¹ linewidth, ~1 mJ pulse energy, 20–30 ps pulse duration, linear polarization (>100:1 extinction ratio) |
| IR Beam | 2.3–10 µm tuning, < 6 cm⁻¹ linewidth, linear polarization (>100:1), 20–200 µJ pulse energy |
| SFG Output Wavelength | 432–505 nm (with 532 nm VIS pump) |
| Optional Extension | Up to 16 µm (625 cm⁻¹) IR coverage |
| Brand | Ekspla |
|---|---|
| Origin | Lithuania (EU) |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | SFG PS |
| Price | Upon Request |
| Spectral Range | 625–4300 cm⁻¹ |
| Spectral Resolution | <6 cm⁻¹ (optional <2 cm⁻¹) |
| Pulse Duration | 29 ± 5 ps |
| Repetition Rate | 50 Hz |
| IR Tuning Range | 2.3–10 µm (optionally up to 16 µm) |
| VIS Wavelength | 532 nm (optional 1064 nm or tunable 420–680 nm) |
| Beam Geometry | Co-propagating, non-collinear (optional collinear) |
| Incidence Angles | Fixed (~60° VIS, ~55° IR |
| Polarization Control | Motorized s/p selection for IR, VIS, and SFG (purity > 1:100) |
| Detection | Time-gated photomultiplier tube (PMT) |
| Laser Source | Diode-pumped mode-locked Nd:YAG (PL2231 series) |
| OPG System | PG501-DFG (standard) or PG511-DFG (high-resolution) |
| Sample Compartment | Vertically oriented, customizable, compatible with Langmuir-Blodgett troughs, temperature/humidity cells, and in situ reaction chambers |
| Brand | LaVision GmbH |
|---|---|
| Origin | Germany |
| Model | TR-PLIF |
| Laser Repetition Rate | ≥1 kHz |
| Excitation Source | Frequency-Doubled Nd:YAG (532 nm), Pumped by High-Repetition-Rate YAG Laser |
| Detection | Intensified CCD or sCMOS Camera with Sub-Microsecond Gating |
| Temporal Resolution | <100 ns (adjustable via optical delay and camera gating) |
| Spatial Resolution | ≤50 µm (system-limited, dependent on optics and pixel binning) |
| Spectral Bandwidth | Tunable via narrowband interference filters (FWHM ≈ 1–5 nm) |
| Compliance | CE Marked, RoHS Compliant |
| Brand | Ekspla |
|---|---|
| Origin | Lithuania |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported Instrument |
| Model | CARS |
| Instrument Type | Confocal Micro-Raman Spectrometer |
| Spectral Range | 740–4000 cm⁻¹ |
| Spectral Resolution | 1 cm⁻¹ |
| Spatial Resolution | 0.5 µm |
| Minimum Wavenumber | 740 cm⁻¹ |
| Spectral Reproducibility | ±1% |
| Brand | LaVision GmbH |
|---|---|
| Origin | Germany |
| Model | FlameMaster Raman |
| Instrument Type | Grating-Based Raman Spectrometer |
| Spectral Range | 300–800 nm |
| Spectral Resolution | 1 cm⁻¹ |
| Spatial Resolution | 1 mm |
| Minimum Wavenumber Shift | 10 cm⁻¹ |
| Spectral Reproducibility | ±0.15 cm⁻¹ |
| Brand | Ekspla |
|---|---|
| Origin | Lithuania |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | T-FIBER |
| Pricing | Upon Request |
| Brand | LaVision GmbH |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | FluidMaster-Multi Phase |
| Wavelength Accuracy | ±2.0 nm |
| Spectral Bandwidth (Slit) | 1.5–20 nm |
| Optical Resolution | 1.0 nm |
| Sensitivity | 1% |
| Dispersive Elements | Grating and Interference Filters |
| Brand | Ekspla |
|---|---|
| Origin | Imported (Lithuania) |
| Model | THz-TDS |
| Pump Laser | Mode-locked Ti:Sapphire, 760–840 nm, >60 mW avg. power, pulse width <50 fs (optional 20 fs), rep rate 50–100 MHz |
| THz Bandwidth | 0.1–3 THz (3.3–100 cm⁻¹) |
| Spectral Resolution | >15 GHz (corresponding to >70 ps time-domain scan window) |
| Dynamic Range | >1000:1 (electric field amplitude at 0.6 THz) |
| THz Emitter & Detector | LT-GaAs photoconductive antennas with integrated hyperhemispherical Si lenses, mounted on precision X-Y stages |
| Delay Line | Motorized optical delay line, max. scan range 300 ps (extendable) |
| Detection | Lock-in amplified electro-optic or photoconductive sampling |
| Polarization | Linear, configurable for horizontal/vertical THz polarization |
| Incidence Angle for Reflection | Adjustable 30°–50° |
| Imaging Resolution | ~1 mm (raster-scanned 2D transmission/reflection mapping) |
| Software | Real-time acquisition, FFT-based spectral extraction, transmission/reflection coefficient calculation, raw data export (.txt, .mat), source code available for customization |
| Compliance | Designed for GLP-compliant lab environments |
| Key | Brand: Ekspla |
|---|---|
| Origin | Imported (Lithuania) |
| Model | Ekspla-THz |
| Spectral Range | 0.1–3 THz |
| Temporal Resolution | <1 ps |
| Emitter Substrate | Low-Temperature-Grown GaAs (LT-GaAs) |
| Integrated Optics | Hyper-spherical high-resistivity silicon lens |
| Pump Laser Requirement | <150 fs pulses, 800 nm central wavelength |
| Detection Bandwidth (FWHM) | >700 GHz |
| Typical Output Power | >10 µW (with 100 mW Ti:Sapphire laser) |
| Compliance | Designed for ASTM E2964-compliant THz-TDS configurations |
| Software Interface | Compatible with LabVIEW, MATLAB, and Python-based acquisition frameworks |
| Brand | Ekspla |
|---|---|
| Model | Fast Scan |
| Spectral Range | 0.2–3.5 THz (6–116 cm⁻¹) |
| Spectral Resolution (Fast Mode) | 10 GHz |
| Spectral Resolution (Fast/Slow Hybrid Mode) | 5 GHz |
| Acquisition Rate | 10 spectra/s |
| SNR | >10⁶:1 @ 0.4 THz |
| Origin | Lithuania |
| Import Status | Imported Instrument |
| Distributor Type | Authorized General Distributor |
| Category | Terahertz Time-Domain Spectroscopy (THz-TDS) System |
| Brand | LaVision GmbH |
|---|---|
| Origin | Germany |
| Model | FluidMaster-Thermal |
| Dispersion Unit | Grating and Interference Filters |
| Slit Width (Spectral Bandpass) | 1.5 nm – 20 nm |
| Spectral Resolution | 1.0 nm |
| Sensitivity | 1% |
| Wavelength Accuracy | ±2.0 nm |
| Brand | Ekspla |
|---|---|
| Origin | Lithuania |
| Model | T-SPEC |
| Spectral Bandwidth | up to 4.5 THz |
| Dynamic Range | >70 dB at 0.4 THz |
| Acquisition Rate | up to 10 spectra/sec |
| Spectral Resolution | down to 2.5 GHz |
| Delay Line | Bearing-Free Optical Delay Stage |
| Operation Modes | Transmission & Reflection |
| Imaging Capability | High-Spatial-Resolution THz Imaging |
| Control | Fully Computer-Controlled via Dedicated Software |
| Brand | Ekspla |
|---|---|
| Origin | Imported (Lithuania) |
| Model | THz-1000 |
| Wavelength Compatibility | 1030 nm and shorter (optimized for 1000 nm pump) |
| Emitter Material | Low-Temperature-Grown GaBiAs |
| Detector Material | GaBiAs Epitaxial Layer |
| Spectral Range | 0.2–5 THz |
| Emitter Antenna | Coplanar Hertzian dipole, 70 µm arm width, 20 µm photosensitive gap |
| Detector Electron Mobility | ~5000 cm²/V·s |
| Detector Carrier Lifetime | < 0.5 ps |
| Integrated Optics | Hemispherical high-resistivity silicon lens (Ø15 mm) |
| Bias Voltage Range (Emitter) | Adjustable DC bias (typ. 0–30 V) |
| THz Power Conversion Efficiency | 7×10⁻⁴ |
| Detector Mounting | In-plane micro-positioning optomechanical holder with SMA RF output |
| Compliance | Designed for ultrafast laser-driven THz time-domain spectroscopy (TDS) systems |
| Brand | Metrolux |
|---|---|
| Origin | Germany |
| Model | ML6500 |
| Wavelength Range | 115–230 nm (single lamp), 115–320 nm (dual lamp: D₂ + Xe) |
| Spectral Resolution | < 1 nm FWHM at 160 nm |
| Wavelength Reproducibility | < 0.1 nm (validated at 121.5 nm and 160 nm) |
| Operating Pressure | < 1×10⁻⁵ mbar |
| Transmittance Accuracy | < ±0.3% |
| Reflectance Accuracy | < ±0.5% |
| Out-of-Band Transmittance | < 0.1% |
| Scattered Reflectance (157 nm) | > 0.001% |
| Diffuse Reflectance (157 nm, 1 mm aperture) | < 5% |
| Scattered Reflectance (157 nm, 1 mm aperture) | < 5% |
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