Rigaku
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| Brand | Rigaku |
|---|---|
| Origin | USA |
| Distributor Type | Authorized Distributor |
| Import Status | Imported |
| Model | PDF-4+ |
| Pricing | Available Upon Request |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | 2991F2 |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Configuration | Floor-Standing |
| X-ray Target | Cu |
| Max. Tube Voltage/Current | 30 kV / 5 mA |
| Cooling | Air-Cooled |
| Angular Range | 2θ = 0°–110°, θ = −10°–60° |
| Angular Resolution | 30 arcseconds (total system accuracy) |
| Detector | 2-inch Scintillation Counter |
| Output | Analog Signal |
| Time Constants | 0.1 s / 0.4 s (switchable) |
| Beam Shielding | 1 mm Pb-lined metal enclosure |
| Dimensions (per shield) | 580 mm (W) × 730 mm (D) × 530 mm (H) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | AZX 400 |
| Sample Capacity | Ø400 mm × 50 mm thickness × 30 kg max |
| Elemental Range | Ta, Cu, Ru, Pt, Mn |
| Repeatability | 0.12% RSD |
| Configuration | Floor-standing WD-XRF system |
| Application Focus | Semiconductor metrology, sputtering target QC, magnetic disk analysis, multilayer thin-film characterization |
| Compliance | Designed for ISO/IEC 17025-compliant labs |
| Brand | Rigaku |
|---|---|
| Origin | Beijing, China |
| Model | Clayquan II |
| Compatibility | Windows XP/Vista/2003/7 (Chinese), Microsoft Office 2003/2007 |
| Output Format | .xls |
| Standards Compliance | SY/T 5160–2010, SY/T 5477–2003, SY/T 5163–2010 |
| Mineral Coverage | Smectite (S), Illite/Smectite mixed-layer (I/S), Illite (It), Kaolinite (Kao), Chlorite (C), Chlorite/Smectite mixed-layer (C/S), Palygorskite (Pa), Vermiculite (V), Illite/Vermiculite mixed-layer (I/V), Pyrophyllite (Py), Talc (Ta), Serpentine (Se) |
| Mixed-layer ratio calculation | Supported for I/S, I/V, C/S |
| Quantitative method | Reference Intensity Ratio (RIR) with internal standard correction and peak deconvolution |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | D/max RAPID |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-Standing |
| X-ray Source Options | 3 kW Sealed-Tube or 18 kW Rotating-Anode Anode |
| Detector | Large-Area Cylindrical 2D Imaging Plate (IP), 466 mm × 256 mm |
| Angular Range | –60° to +144° 2θ |
| Beam Conditioning | Incident-Beam Monochromator |
| Collimators | 800, 300, 100, 50, 30 µm (optional 10 µm) |
| Compliance | Designed for ISO/IEC 17025-compliant laboratories |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | D/max-2600/PC |
| X-ray Generator Power | 9 kW |
| Goniometer Type | Vertical or Horizontal Wide-Angle |
| Minimum Step Angle | 0.0001° |
| Variable Aperture Slit | Programmed |
| Optical Configurations | Focusing and Parallel Beam (Switchable) |
| Monochromator | High-Efficiency Graphite |
| Detector | D/teX-Ultra (Energy Resolution <20%) |
| Automation | Fully Automated Alignment & Calibration |
| Software Suite | Comprehensive XRD Analysis Package |
| Sample Types | Powder, Bulk, Thin Film, Micro-region, Trace |
| Environmental Capabilities | In-situ HT/VT/LT, Humidity, Electrochemical, Magnetic Field |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | DSC-XRD |
| Configuration | θ–θ goniometer geometry |
| Coupling Type | Synchronized in-situ DSC–XRD |
| Atmosphere Control | Programmable gas environment (N₂, Ar, air, O₂) |
| Temperature Range | RT to 1200 °C (DSC sensor dependent) |
| X-ray Source | Cu Kα (standard), optional Mo or Co anodes |
| Detector | High-speed 1D/2D pixel array detector (e.g., HyPix-400) |
| Data Synchronization | Sub-second temporal alignment of thermal and diffraction signals |
| Key | Brand: Rigaku |
|---|---|
| Origin | Japan |
| Model | DSC8231 |
| Temperature Range (Standard) | RT to 1100 °C |
| Temperature Range (High-Temp Option) | RT to 1500 °C |
| Sample Observation Range | Ambient to 1000 °C |
| Furnace Configuration | Horizontal dual-compartment |
| Balance Type | Horizontal differential triple-coil balance |
| Control Modes | Stepwise Isothermal Analysis (SIA), Constant Rate Control (CRC), Sample-Controlled TG (SCTG) |
| Dimensions (Core Unit) | 350 × 310 × 669 mm (W × H × D) |
| Weight (Core Unit) | 28 kg |
| Power Supply | 1Ø, AC 100–120 V / 200–240 V, 50/60 Hz, 15 A |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | DSC |
| Temperature Range | Ambient to 1500 °C |
| Manufacturer Status | Authorized Distributor (Non-OEM) |
| Origin Category | Imported Instrument |
| Model | DSC8271 |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | DSC |
| Temperature Range | −170 °C to 725 °C |
| Configuration | Imported System |
| Distribution Model | Authorized Distributor |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | DSCvesta2 |
| Temperature Range | –180 to 725 °C (atmospheric: RT to 600 °C |
| mechanical cooling | –95 to 725 °C) |
| Heating/Cooling Rate | up to 100 °C/min |
| Gas Flow Range | 0–250 mL/min (resolution: 1 mL/min) |
| Heat Flow Range | ±1000 mW |
| Noise Level | < 0.05 µW |
| Baseline Repeatability (–70 to 300 °C) | ≤ 10 µW |
| Enthalpy Sensitivity | 0.1 µW |
| Sensor Type | Heat-Flow-Type Metallic Sensor with vestaeye® Self-Diagnostic Function |
| Furnace Material | Pure Silver or Pure Platinum |
| Calibration Standards | ≥5 Certified Reference Materials (including Indium, Zinc, Tin, Bismuth, Lead) |
| Software Features | Dual-data logging (raw + corrected), LIMS integration support, export to Word, Excel, JPG, PDF |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Micro-Z |
| Instrument Type | Scanning WDXRF |
| X-ray Tube Power | 40 W |
| Elemental Range | S (Sulfur) |
| Compliance | ASTM D2622, ISO 20884, JIS K 2541-7 |
| Cooling | Air-cooled (no water or gas required) |
| Power Supply | 220 V AC, 2 A |
| Sample Preparation | None required |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Micro-Z Cl |
| Instrument Type | Benchtop |
| Excitation Mode | Single-Wavelength |
| Analyte | Total Chlorine |
| X-ray Tube Power | 80 W |
| Detection Limit | 0.11 ppm |
| Quantification Range | 0–5 wt% |
| Analysis Time | 300 s |
| Vacuum Requirement | Yes (gas-free operation) |
| Compliance | SH/T 0977, ASTM D7536 |
| Operating Environment | 10–40 °C, <80% RH |
| Dimensions (W×D×H) | 45 × 41 × 43 cm |
| Weight | 40 kg |
| Power Supply | AC 200–240 V |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Micro-Z ULS |
| Detection Principle | Wavelength Dispersive X-ray Fluorescence (WDXRF) |
| Detection Limit | 0.2 ppm |
| Measurement Range | 0–5 wt% |
| Analysis Time | < 300 s |
| Excitation Source Power | 80 W |
| Vacuum Requirement | Yes (gas-free operation) |
| Power Supply | AC 200–240 V, 200 W |
| Operating Environment | 10–40 °C, RH < 80 % |
| Dimensions (W×D×H) | 45 × 41 × 43 cm |
| Weight | 40 kg |
| Compliance Standards | ASTM D2622, GB/T 11140, SH/T 0842 |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Mini-Z |
| Detection Principle | Wavelength Dispersive X-Ray Fluorescence (WDXRF) |
| Sample Throughput | 6-position automated sample changer |
| Power Requirement | 220 V AC, 2 A |
| Dimensions | 640 × 580 × 580 mm (W × D × H) |
| Weight | 65 kg |
| Detection Limit for S | 0.3 ppm |
| Precision (S at 10 ppm in gasoline) | σ = 0.17 ppm |
| S Quantification Range | 1 ppm – 4 wt% |
| Compliant Standards | ASTM D2622, ISO 20884, JIS K2541-7 |
| Cooling | Air-cooled (no water or gas required) |
| Operation Interface | Touchscreen control panel |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | MiniFlex 600 |
| Instrument Type | Benchtop Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| Power Output | 600 W |
| Dimensions (W×H×D) | 560 × 700 × 395 mm |
| Weight | ~80 kg |
| Safety | Interlocked X-ray shutter with automatic beam cutoff during sample loading |
| Detector | Compatible with D/teX Ultra2 high-speed 1D array detector |
| Optional Accessories | Monochromator (Kβ suppression), Rotating Sample Stage, Air/Moisture-Sensitive Sample Stage, 6-Position Auto-Sampler |
| Software Suite | PDXL (Qualitative & Quantitative Analysis), ICDD PDF-4+ Database Integration, Dust Quantification Module (for occupational hygiene applications), Multi-Scan Acquisition, Rietveld Refinement (optional module) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Miniflex 600 |
| X-ray Tube Power | 600 W |
| Dimensions (W×H×D) | 560 × 700 × 395 mm |
| Weight | 80 kg |
| Goniometer Accuracy | ±0.01° 2θ |
| Safety | Interlocked X-ray shutter with automatic beam cutoff during sample loading |
| Detector | Standard scintillation counter |
| Sample Stage | Manual stage standard |
| Software Suite | PDXL (with ICDD PDF-4+ database), Qualitative & Quantitative Analysis modules, Multi-scan acquisition, Dust-specific quantification (e.g., respirable crystalline silica per ISO 16258-1, NIOSH 7500) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | MiniFlex600 |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | 0.0001 kW |
| Dimensions | 560 W × 460 D × 700 H mm |
| Detector Type | Advanced Semiconductor Detector |
| Software Suite | PDXL (Phase Identification, Quantitative Analysis, Rietveld Refinement, Crystal Structure Visualization) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | NANOPIX |
| Instrument Type | Integrated SAXS/WAXS Scattering System |
| Measurement Range (q) | 0.02 – 5.0 nm⁻¹ (corresponding to real-space d-spacing: 0.16 – 288 nm) |
| Beam Size | Ø70 µm |
| Sample Requirement | ≥ few mg (solid), ≥ few µL (liquid) |
| Data Acquisition Time | As low as <60 s per frame (depending on flux, sample scattering power, and detector integration time) |
| X-ray Source | MM007HF microfocus rotating anode or FR-X sealed-tube source |
| Beam Conditioning | Selectable pinhole collimation (1-, 2-, or 3-pinhole configurations) |
| Sample Stages | GI-SAXS/WAXS stage, cryo/variable-temperature stage (−150 °C to +400 °C), vacuum-compatible stage, tensile stage, multi-axis goniometer |
| Detector | HyPix-3000 or HyPix-6000 hybrid pixel array detector (2D) |
| Brand | Rigaku |
|---|---|
| Origin | USA |
| Model | NEX CG II |
| Element Range | Na (11) to U (92) |
| Detection Limits (typical for petroleum) | Si 1.1 ppm, P 0.8 ppm, S 0.5 ppm, Cl 0.4 ppm, Mn 0.9 ppm, Fe 0.7 ppm, Pb 0.7 ppm |
| Concentration Range | 0.11 ppm – 10% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability | 0.05% RSD |
| Detector | Silicon Drift Detector (SDD) with Peltier cooling |
| Excitation Source | Pd anode X-ray tube, max 50 kV / 50 W |
| Polarization Optics | 5-position polarized secondary target assembly |
| Geometry | Cartesian 3D configuration (X-ray tube → polarizer → sample → detector) |
| Sample Volume | 5 mL |
| Autosampler | 15-position carousel |
| Calibration Method | Compton scattering C/H ratio correction |
| Data Output | USB 2.0 and Ethernet (RJ-45), CSV/PDF export |
| Dimensions | 463 × 492 × 382 mm (W×D×H) |
| Power | AC 200–240 V, 50/60 Hz, 1.6 A |
| Operating Environment | 18–28 °C, RH <75% non-condensing, vibration-free, non-corrosive atmosphere |
| Brand | Rigaku |
|---|---|
| Origin | USA |
| Model | NEX DE |
| Detection Range | Na to U |
| Sample Volume | 5 mL |
| Analysis Time | 30–900 s (standard: 300 s) |
| Compliance | ASTM D4294, ASTM D8252, ASTM D6481, GB/T 17040 |
| Excitation Filtration | Multi-layer composite filters |
| Operating Temperature | 10–35 °C |
| Relative Humidity | <80% RH (non-condensing) |
| Data Output | USB + Ethernet |
| Software | QuantEZ |
| Key | Brand: Rigaku |
|---|---|
| Origin | USA |
| Model | NEX QC |
| Detection Principle | Energy-Dispersive X-Ray Fluorescence (EDXRF) |
| Analyte | Total Sulfur |
| Detection Limit | 5 ppm |
| Measurement Range | 0–10 wt% |
| Sample Volume | 5 mL |
| Analysis Time | 1–999 s (default 300 s) |
| Calibration Method | Compton Scattering C/H Ratio Correction |
| Data Output | USB + Ethernet |
| Environmental Requirements | RH < 85% (no condensation), vibration-free, non-corrosive atmosphere |
| Compliance Standards | ASTM D4294, GB/T 17040 |
| Brand | Rigaku |
|---|---|
| Origin | USA |
| Model | NEX QC+ |
| Detection Principle | Energy-Dispersive X-ray Fluorescence (EDXRF) |
| Detection Limit | 2.3 ppm for S |
| Measurement Range | 0–10 wt% S |
| Accuracy (Relative Error) | ±0.0001 |
| Analysis Time | < 3 min (configurable from 1–999 s) |
| Sample Volume | < 5 mL |
| Elemental Range | Na (11) to U (92) |
| Compliance | ASTM D4294, GB/T 17040 |
| Portability | Handheld / Field-Deployable |
| Environmental Operating Range | 15–35 °C, RH < 85% (non-condensing) |
| Data Interface | USB + Ethernet |
| Matrix Correction | Compton Scattering C/H Ratio Normalization |
| Filtration | Multi-layer Composite Primary Beam Filters |
| Safety | Zero hazardous waste generation (no gas, liquid or solid effluent) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Simultix 14 |
| Element Range | Be (4) to U (92) |
| Simultaneous Channels | Up to 40 |
| Detection Limit | 0.0001% |
| Analytical Range | 0.0001% – 100% |
| Footprint | 1 m² |
| Light Element Capability | Be, B, C, N, O, F |
| Vacuum Control | APC (Automatic Pressure Control) |
| Sample Changer Options | ASC8 (standard), ASC20/50/100 (optional) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Simultix 15 |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Analytical Element Range | Be (4) to U (92) |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Detector Configuration | Simultaneous Multi-channel (Standard 30 channels, upgradable to 40) |
| Optional Features | XRD Channel, Curved Crystal Optics, Automatic Pressure Control (APC), Background Measurement (BG), Compton Scattering Ratio Calibration, Unattended Operation with 48-position ASC |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Simultix15 |
| Instrument Type | Simultaneous Multi-Channel WDXRF |
| X-ray Tube Power | 4 kW |
| Elemental Range | Beryllium (Be, Z=4) to Uranium (U, Z=92) |
| Simultaneous Channels | Up to 40 elements |
| Detector System | High-speed pulse-height-analyzed proportional counters with background subtraction circuitry |
| Vacuum System | Dual-stage vacuum pump with auto-stabilized vacuum control |
| Software | Multi-tasking, multi-window FP (Fundamental Parameters) quantification software with Chinese GUI (localized for operator interface only) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Powder X-ray Diffractometer |
| Model | SmartLab |
| X-ray Source | 3 kW or 9 kW sealed-tube generator |
| Anode Materials | Cu, Cr, Fe, Co, Ni, Mo, Ag, Au (selectable) |
| Goniometer Radius | 300 mm |
| Detector | HyPix-3000 2D pixel array detector |
| Optics | CBO-Auto (automated beam optics switching) and CBO-μ (high-resolution micro-beam optics) |
| Primary Source | PhotonMax high-brilliance X-ray tube |
| Software | SmartLab Studio II (with in-situ analysis modules) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Powder X-ray Diffractometer |
| Model | SmartLab SE |
| X-ray Generator Power | 3 kW |
| Goniometer Radius Options | 185 mm (standard), 285 mm (optional), 280 mm (TTR configuration) |
| Optical Configurations | Automated切换 between Bragg-Brentano (focused beam) and parallel-beam geometries |
| Detector | Rigaku HyPix-400 or equivalent high-speed 2D photon-counting detector |
| Safety Enclosure | Interlocked, fail-safe shutter-equipped X-ray housing |
| Goniometer Orientation | Horizontal |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| X-ray Generator Power | 3 kW |
| Goniometer Type | Horizontal |
| Goniometer Radius | 300 mm |
| Programmable Variable Slit | Yes |
| Minimum Step Size | 0.0001° |
| Optical System | CBO Cross-Beam Optics (Patented by Rigaku) |
| Detectors | D/teX Ultra250 (0D/1D mode), HyPix-400 Semiconductor Array Detector (0D/1D/2D mode) |
| Software | SmartLab Studio II |
| Sample Viewing | Integrated Video Observation System |
| Compliance | Designed for ASTM E975, ISO 17892-12, and JIS Z 8821 applications |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | SmartLab Series |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| X-ray Generator Power | 3 kW standard, optional 9 kW rotating anode |
| Goniometer Minimum Step | 0.0001° (1/10,000°) |
| Angular Accuracy | Dual optical encoder, direct-on-axis positioning |
| Optical System | CBO Cross-Beam Optics (patented) |
| Detector Options | D/teX-Ultra high-speed energy-discriminating detector (energy resolution <20%), PILATUS 100K/R 2D pixel array detector |
| Software | SmartLab Guidance (patented intelligent measurement & analysis platform) |
| Optional Modules | SAXS/Ultra-SAXS, thin-film analysis (including In-Plane geometry), micro-area mapping (CBO-F optics), monochromated Kα₁ beam optics |