Chemical Analysis Instruments
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| Brand | Sigray |
|---|---|
| Origin | Shanghai, China |
| Model | AttoMap-310 |
| Spatial Resolution (with high-res optics) | 3–5 µm |
| Detection Sensitivity | sub-ppm (relative), femtogram-level (absolute) |
| Incident Angle Range | 3° to 90° (0.01° step) |
| X-ray Source | Patented microfocus source with up to 5 selectable anode targets (e.g., Si, Cr, Cu, Rh, Mo, W, Au, Ti, Ag) |
| Max Power / Voltage | 50 W / 20–45 kVp |
| X-ray Optics | Dual-parabolic grazing-incidence mirrors, ~80% transmission efficiency, 1:1 default magnification |
| Detector | Silicon Drift Detector (SDD), energy resolution <129 eV (Mn-Kα) |
| Vacuum Chamber | <10⁻⁴ Torr |
| Sample Stage Travel | 100 × 100 mm |
| Light Element Detection Limit | Down to boron (B), quantitative for C, N, O at <1% wt. |
| Brand | Sigray |
|---|---|
| Origin | USA |
| Model | QuantumLeap-V210 |
| Energy Range | 1.7–10 keV |
| XAS Modes | Transmission |
| XANES Resolution | ≤0.7 eV |
| EXAFS Resolution | <10 eV |
| Beam Spot Size | 100 µm (diameter) |
| Vacuum Level | <10⁻⁵ Torr |
| X-ray Source | Patented Multi-Target Microfocus Source (W & Mo anodes, 300 W, 20–50 kV) |
| Focusing Optics | Dual-Parabolic Capillary Lens (Pt-coated, ~80% transmission, 1:1 magnification) |
| Analyzer Crystals | HAPG/HOPG, Ge(111), Ge(220), Ge(400) |
| Detector | Spatially Resolved Photon-Counting Detector |
| Sample Capacity | Up to 16 × 3 mm diameter samples |
| Dimensions | 107 cm W × 241 cm H × 191 cm D |
| Brand | SilcoTek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | SilcoNert-2000 |
| Pricing | Upon Request |
| Coating Material | Hydrogenated Amorphous Silicon with Surface Alkylation |
| Deposition Method | Thermal Chemical Vapor Deposition (Non-Plasma) |
| Max Operating Temperature | 450°C (inert), 400°C (oxidizing) |
| Substrate Compatibility | Stainless Steel Alloys, Ceramics, Glass, Titanium, Specialty Metals |
| Max Dimension | 78 in (198 cm) |
| Geometry Flexibility | Full 3D Conformality |
| Thickness Range | 100–500 nm |
| Contact Angle (Hydrophobicity) | ≥65° |
| pH Stability Range | 0–8 |
| Patent Numbers | US 6,444,326 & US 6,511,760 |
| Brand | SilcoTek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | SilcoNert2000 |
| Pricing | Available Upon Request |
| Brand | Hefei Kejing |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (PRC) |
| Model | Si Crystal Substrate |
| Pricing | Upon Request |
| Doping Type | B- or P-doped (p-type) / N-doped (n-type) |
| Resistivity | 10⁻³ – 40 Ω·cm |
| EPD (Etch Pit Density) | ≤100 cm⁻² |
| Oxygen Content | ≤1.8 × 10¹⁸ cm⁻³ |
| Carbon Content | ≤5 × 10¹⁶ cm⁻³ |
| Crystal Orientation | <100>, <110>, or <111> ± 0.5° (custom orientations available) |
| Standard Dimensions | Ø25.4 mm × 0.30 mm, Ø50.8 mm × 0.50 mm, Ø76.2 mm × 0.50 mm, Ø101.6 mm × 0.60 mm |
| Surface Roughness | Ra < 0.1 nm (10 Å) |
| Optional Surface Modifications | Thermal SiO₂ layer (thickness customizable), or pre-fabricated multilayer stacks: Si/SiO₂/Ti/Pt |
| Packaging | Individual wafers in Class 100 cleanroom bags |
| Brand | Hefei Kejing |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic |
| Model | Si-Ge (2 wt% Ge) |
| Conductivity Type | P-type |
| Resistivity | 7–8 Ω·cm |
| Surface Finish | Single-side polished |
| Standard Orientation | <100> |
| Standard Dimensions | Ø100 mm × 0.5 mm |
| Packaging | Class 1000 Cleanroom / Class 100 Clean Bag |
| Customization | Available for orientation, diameter, thickness, and double-side polish upon request |
| Brand | Silios |
|---|---|
| Origin | France |
| Model | TOUCAN Mosaic |
| Spectral Range | 420–870 nm |
| Spectral Bands | 10 |
| FWHM | 30–50 nm |
| Sensor | CMOS |
| Resolution (RAW) | 2048 × 2048 |
| Spectral Image Resolution | 512 × 512 |
| Pixel Pitch | 5.5 µm |
| Frame Rate | 65 Hz (native), 20 Hz (with COLOR-SHADES Lab software) |
| Exposure Time | 100 µs – 5 s |
| Bit Depth | 10-bit |
| Interface | USB 3.0 |
| Lens Mount | CS-mount (C-mount compatible via adapter) |
| Dimensions | 52 × 63 × 40 mm |
| Weight | <180 g |
| Technology | COLOR-SHADES mosaic filter array |
| Brand | Hefei Kejing |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | Ag-Foil |
| Thickness Range | 0.01–1 mm (custom-cut available) |
| Packaging | Vacuum-sealed in Class 100 cleanroom bags, stored and shipped from Class 1000 cleanroom environment |
| Pricing | USD 0.50–500.00 per piece (volume-dependent) |
| Brand | China Innovation Instrument |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | SinCell-100 |
| Pricing | Available Upon Request |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SIR |
| Pricing | Available Upon Request |
| Wavelength Ranges | SIR-1700: 400–1700 nm |
| SIR-2600 | 0.9–2.6 µm |
| SIR-3400 | 1–3.4 µm |
| SIR-5000 | 2–5 µm |
| SIR-6500 | 3.0–6.5 µm |
| Interface | USB 2.0 |
| Software | Integrated control and spectral analysis suite |
| Brand | ISOTOPX |
|---|---|
| Origin | United Kingdom |
| Model | SIRIX |
| Instrument Type | Stable Gas Isotope Ratio Mass Spectrometer |
| Resolution | >500 (10% valley) |
| Mass Resolving Power (MRP) | >5000 |
| Faraday Current Range | 1×10⁻⁷ A to <1×10⁻¹⁷ A |
| δ¹³C Precision for 48CO₂/44CO₂ | <10 ppm in 100 min |
| ATONA® Amplifier Drift | <1 ppm over 40 h |
| Background Noise | Extremely low |
| Ion Optics | 27 cm radius, 90° magnetic sector |
| Flight Tube | Large-diameter, reflection-free design |
| Detector Configuration | Up to 9 independently driven Faraday cups |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | SIS-5100 |
| Pricing | Upon Request |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM Manufacturer |
| Country of Origin | China |
| Model | AAS6000 |
| Instrument Type | Flame Atomic Absorption Spectrometer |
| Wavelength Range | 190–900 nm |
| Spectral Bandwidth | 0.1 / 0.2 / 0.4 / 0.7 / 1.4 nm (auto-switching) |
| Grating | 1800 lines/mm, blaze wavelength 230 nm |
| Wavelength Accuracy | ±0.25 nm |
| Wavelength Repeatability | < 0.10 nm |
| Resolution | < 0.3 nm |
| Characteristic Concentration (Cu) | < 0.025 µg/mL per 1% absorption |
| Detection Limit (Cu) | < 0.006 µg/mL |
| Precision (Cu) | < 0.8% RSD |
| Baseline Stability | 0.003 Abs (static), 0.004 Abs (dynamic) |
| Background Correction | D₂ lamp + Self-absorption (up to 1 A) |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | AAS9000 |
| Instrument Type | Integrated Flame/GF AAS |
| Monochromator | Czerny-Turner with 1800 lines/mm grating, 230 nm blaze |
| Optical System | Double-beam |
| Detector | Solid-state CCD array |
| Background Correction | D₂ lamp + Self-absorption (AAS) |
| Wavelength Range | 190–900 nm |
| Wavelength Accuracy | ±0.25 nm |
| Wavelength Repeatability | < 0.05 nm |
| Spectral Bandwidth | 0.1/0.2/0.4/0.7/1.4 nm (auto-switchable) |
| Flame Cu Detection Limit | < 0.006 µg/mL |
| GF Cd Detection Limit | ≤ 1.0 pg |
| Flame Cu Precision (RSD) | < 0.8% |
| GF Cd Precision (RSD) | ≤ 2% (auto-injection), ≤ 5% (manual) |
| Temperature Control Range (GF) | Room temp – 3000 °C |
| Max GF Ramp Rate | 3000 °C/s |
| Safety Compliance | Integrated gas leak, flame status, cooling water flow, and graphite furnace temperature monitoring per IEC 61010-1 |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | EDX 3200S PLUS C |
| Form Factor | Benchtop/Floor-Standing |
| Application Domain | Food Safety Testing |
| Elemental Range | S to U |
| Quantification Range | 0.03 ppm – 99.99% |
| Energy Resolution | ≤125 eV (FWHM at Mn Kα) |
| Repeatability | <10% RSD (at 0.2 mg/kg Cd) |
| Detector | FAST-SDD (Silicon Drift Detector with Fast Pulse Processing) |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | EDX-V |
| Form Factor | Benchtop/Floor-standing |
| Instrument Type | Conventional EDXRF |
| Application Scope | General-purpose coating & thin-film analysis |
| Compliance | ASTM B568, ISO 3497, DIN EN ISO 3497, IPC-4552 (ENIG), IPC-4556 (ENEPIG) |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | EDX2000H |
| Form Factor | Benchtop / Floor-Standing |
| Application Type | General-Purpose |
| Elemental Range | S (16) – U (92) |
| Quantification Range | 0.1 ppm – 99.99 wt% |
| Energy Resolution | ≤125 eV (Mn Kα) |
| Repeatability | ≤0.05% RSD (for major elements >96 wt%) |
| Detector | Si-PIN Semiconductor Detector |
| Operating Temperature | 15–30 °C |
| Sample Chamber Dimensions | 460 × 298 × 98 mm |
| Instrument Dimensions | 550 × 410 × 320 mm |
| Weight | 45 kg |
| Power Supply | AC 220 V ±5 V, recommended with line conditioner |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | EDX3000 |
| Form Factor | Benchtop/Floor-standing |
| Application Type | General-purpose |
| Elemental Range | S (16) to U (92) |
| Quantitative Range | 1 ppm – 99.9 wt% |
| Energy Resolution | 125 eV (at Mn Kα) |
| Repeatability | ≤0.05% RSD (for major elements >96 wt%) |
| Detector | Si-PIN semiconductor detector |
| Brand | Skyray Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM Manufacturer |
| Regional Category | Domestic (China) |
| Model | ICP 2060T (Petrochemical-Optimized) |
| Instrument Type | Sequential Scanning ICP-OES |
| Detection Limit | 0.5–10 ppb |
| Precision (RSD) | ≤1.5% |
| Long-Term Stability (2 h) | ≤2.0% |
| Wavelength Range | 190–500 nm (with 3600 l/mm grating) |
| Optical Resolution | ≤0.008 nm |
| Brand | Skyray Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Category | Domestic |
| Model | ICP-3000 |
| Instrument Type | Full-Spectrum Direct-Reading |
| Detection Limits | Zn 213.856 nm: 0.47 µg/L |
| Ni 231.604 nm | 1.73 µg/L |
| Mn 257.61 nm | 0.18 µg/L |
| Cr 267.716 nm | 1.18 µg/L |
| Cu 324.754 nm | 1.1 µg/L |
| Ba 445.403 nm | 0.1 µg/L |
| Precision (RSD) | <0.5% |
| Long-Term Stability (2 h RSD) | <1.0% |
| Wavelength Range | 165–900 nm |
| Optical Resolution | 6.8 pm @ 200 nm |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Line | ICP-MS 2000 Series |
| Mass Analyzer Type | Quadrupole Mass Spectrometer |
| Intended Use | Laboratory-Based Elemental Analysis |
| Regulatory Compliance | Meets or exceeds GB/T 35791–2018 (Chinese National Standard for ICP-MS Performance Verification) |
| Software Platform | Windows 2000/XP/Vista/7 (32-bit & 64-bit) Compatible Control System |
| Sample Introduction | Integrated Peltier-Cooled Glass Cyclonic Spray Chamber (–20 °C to +20 °C), One-Piece Quartz Concentric Torch, Open-Access Nebulizer Assembly |
| Vacuum Interface | Dual-Conical Interface with Removable Sampling Cone (1.1 mm orifice) and High-Salt/High-Sensitivity Skimmer Cone Options (0.75 mm standard) |
| Ion Optics | Asymmetrically Mounted Extraction & Deflection Lenses, ETP Dual-Mode Detector (Analog/Digital Switching), Computer-Controlled Auto-Tuning |
| Automation | 250-Position Autosampler (Ethernet-Controlled, Positioning Accuracy < 500 µm) |
| RF Generator | Solid-State Frequency-Tunable Generator with Cold Plasma Mode, Collision/Reaction Cell Mode, and Standard Mode Support |
| Collision/Reaction Cell | Hexapole-Based, H₂/He Mixed-Gas KED Mode Enabled |
| Detection Modes | Full-Scan, Peak-Hopping, Time-Resolved Analysis (TRA) |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Regional Classification | Domestic (China) |
| Model | ICP2060T |
| Price Range | USD 70,000 – 100,000 |
| Brand | Skyray Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM Manufacturer |
| Instrument Type | Full-Spectrum Simultaneous ICP-OES |
| Detection Limit | 1–10 µg/L (ppb) for most elements |
| Precision (Short-Term) | RSD < 0.5% |
| Stability (2-hr) | RSD < 1.0% |
| Wavelength Range | 165–900 nm |
| Optical Resolution | < 0.0068 nm @ 200 nm |
| Brand | Skyray Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | AFS200 |
| Instrument Type | Dual-Channel Atomic Fluorescence Spectrometer |
| Element Coverage | As, Sb, Bi, Hg, Se, Te, Pb, Sn, Ge, Zn, Cd (11 elements) |
| Detection Limit (DL) | As/Sb/Bi ≤ 0.01 ng/mL |
| Precision (RSD) | ≤ 1% |
| Linear Dynamic Range | > 3 orders of magnitude |
| Gas Control | Integrated solenoid valve manifold (AFS200N/P) or dual-channel Mass Flow Controller (MFC), resolution 1 mL/min (AFS200T/S) |
| Hydride Generation | Discontinuous flow with dual peristaltic pumps (N/T) or sequential injection combined with peristaltic pump (P/S) |
| Atomizer | Shielded quartz tube with low-temperature flame ignition |
| Optical System | Non-dispersive design with high-efficiency photomultiplier tube (PMT) detection |
| Software | Proprietary Windows-based AFS workstation with GLP-compliant audit trail, auto-calibration, and report generation |
| Brand | Skyray Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | AFS200T |
| Pricing | Available upon Request |
| Brand | Skyray Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Domestic (China) |
| Model | CS-188 |
| Pricing | Upon Request |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | EDX 3000 PLUS |
| Form Factor | Benchtop |
| Application Scope | General-Purpose |
| Elemental Range | S (16) to U (92) |
| Detection Limit | ppm-level |
| Quantification Range | 0.0001 wt% to 99.99 wt% |
| Energy Resolution | 125 eV (at Mn Kα) |
| Detector | FAST-SDD (25 mm² active area) |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | EDX 3200S PLUS |
| Configuration | Benchtop/Floor-standing |
| Industry Application | Energy & Petrochemicals |
| Energy Resolution | 125 eV |
| Detector | FAST-SDD |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | EDX 4500 |
| Form Factor | Benchtop/Floor-standing |
| Application Type | General-purpose |
| Elemental Range | Na (11) to U (92) |
| Quantitative Range | 0.1 ppm – 99.99% (matrix- and element-dependent) |
| Energy Resolution | ≤125 eV at Mn Kα |
| Detector | FAST-SDD (Silicon Drift Detector) |
| Brand | Skyray Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | EDX 4500A |
| Configuration | Benchtop/Floor-standing |
| Application Scope | General-purpose Inorganic Elemental Analysis |
| Automation | 23-position Automatic Sample Changer Integrated |
| Light Element Capability | Optimized for Na–Cl (Z = 11–17) via Intelligent Vacuum System |
| Regulatory Context | Compliant with ISO 8258 (control charting), ASTM E1621 (XRF for metals), and GB/T 176–2017 (cement analysis) |