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| Brand | TESCAN |
|---|---|
| Origin | Czech Republic |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported Instrument |
| Model | TESCAN AMBER X |
| Price Range | USD 1.3–2.0 million |
| Brand | TESCAN |
|---|---|
| Origin | Czech Republic |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Floor-Standing SEM |
| Electron Source | Thermal Field-Emission Gun (TFEG) |
| Secondary Electron Resolution | 0.9 nm @ 15 kV |
| Magnification Range | 2× to 2,000,000× |
| Accelerating Voltage | 200 V – 30 kV (with deceleration mode down to 50 V) |
| Backscattered Electron Resolution | 2.0 nm @ 30 kV (in low-vacuum mode) |
| Brand | TESCAN |
|---|---|
| Origin | Czech Republic |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Floor-Standing SEM |
| Electron Source | Schottky Field-Emission Gun (FEG) |
| Secondary Electron Resolution | 0.6 nm @ 15 kV |
| Magnification Range | 2× to 2,000,000× |
| Accelerating Voltage | 0.2–30 kV (deceleration mode down to <50 V) |
| Backscattered Electron Resolution | 1.6 nm @ 15 kV |
| Brand | TESCAN |
|---|---|
| Origin | Czech Republic |
| Manufacturer | TESCAN ORSAY HOLDING a.s. |
| Type | Floor-Standing SEM |
| Electron Source | Schottky Field-Emission Gun |
| Secondary Electron Resolution | 1.0 nm @ 30 kV |
| Backscattered Electron Resolution | 2.0 nm @ 30 kV |
| Magnification Range | ×2 to ×1,000,000 |
| Accelerating Voltage | 50 V (decelerated mode) to 30 kV |
| Chamber Configuration | AMU (Advanced Macro-Utility) Ultra-Large Specimen Chamber |
| Compliance | CE, ISO 9001, IEC 61000-6-3/6-4 |
| Brand | TESCAN |
|---|---|
| Origin | Czech Republic |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Floor-standing SEM |
| Electron Source | Schottky Field Emission Gun |
| Secondary Electron Resolution | 1.0 nm @ 30 kV |
| Magnification Range | 2× to 1,000,000× |
| Accelerating Voltage | 50 V–30 kV (with beam deceleration mode) |
| Backscattered Electron Resolution | 2.0 nm @ 30 kV |
| Brand | TESCAN |
|---|---|
| Origin | Czech Republic |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | NanoSpace |
| Price Range | USD 1.9M – 3.2M |
| Main Chamber Base Pressure | 5 × 10⁻¹⁰ mbar |
| Bake-Out Temperature | Up to 120 °C |
| Sample Transfer Time (Atmosphere → UHV Main Chamber) | ≤30 min |
| Stage X/Y Travel Range | 100 mm ± 50 nm |
| BrightBeam e-Optics Resolution | <1.6 nm @ 12 mm WD, 0.5–30 keV, beam current: few pA to >350 nA |
| e-CLIPSE+ e-Optics Resolution | 5 nm @ 1 pA, 0.5–30 keV, beam current: 1 pA–2.5 µA @ 30 keV, FOV @ 10 keV: 1250 × 1250 µm (±10%) |
| DeepFIB Ga⁺ Source Resolution | 2.5 nm @ 1 pA, 250 V–30 keV, max ion current: 125 nA |
| PFIB Gas Field Ion Source (Xe⁺/O₂⁺/Ar⁺/He⁺/N⁺) | 25 nm @ 1 pA @ 3 keV, beam current up to 3.5 µA, FOV @ 10 keV: 1250 × 1250 µm (±10%), Si milling rate: 800 µm³/s |
| Veloce LMAIS (AuGe/AuSi/Bi) | 5 nm @ 1 pA, mass range: 14 (Si⁺) to 613 (AuSi⁺), 1–30 keV, max current: 50 nA |
| iVeloce Wien-filtered Gas Ion Source (Xe⁺/O₂⁺/Ar⁺/He⁺/N⁺) | 3–30 keV, max current: 1 µA, FOV @ 10 keV: 1250 × 1250 µm (±10%) |
| Brand | TESCAN |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | FIB/SEM Column Upgrade Service |
| Instrument Form Factor | Floor-Standing |
| Electron Source Type | Thermal Field Emission |
| Microscope Class | Ultra-High-Resolution Field-Emission SEM/FIB |
| Secondary Electron Imaging Resolution | ≤1.6 nm (Brightbeam), ≤5 nm (e-CLIPSE+), ≤2.5 nm (DeepFIB), ≤25 nm (PFIB), ≤5 nm (Veloce), ≤30 nm (iVeloce) |
| Accelerating Voltage Range | 0.5–30 keV (e-beam) |
| Backscattered Electron Imaging Resolution | Comparable to SE resolution under optimized conditions |
| Ion Beam Current Range | Up to 125 nA (DeepFIB), up to 3.5 µA (PFIB), up to 50 nA (Veloce), up to 1 µA (iVeloce) |
| Field of View (at 10 keV) | 1250 × 1250 µm (±10%) for e-CLIPSE+, PFIB, iVeloce |
| Brand | TESCAN |
|---|---|
| Origin | Czech Republic |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Category | Imported Instrument |
| Model | RISE Microscope |
| Electron Gun Type | Cold Field Emission |
| Secondary Electron Image Resolution | 1.0 nm @ 15 kV |
| Accelerating Voltage Range | 0.2–30 kV |
| Backscattered Electron Image Resolution | 1.0 nm @ 15 kV |
| Confocal Raman Spatial Resolution | 360 nm (with 532 nm laser) |
| Optical Architecture | Parallel-Axis Co-Localized SEM–Raman Design |
| Maximum Sample Chamber Capacity | Compatible with TESCAN’s Ultra-Large Chamber Platforms |
| Detector Compatibility | Full Integration with BSE, CL, EDS, and Other In-Chamber Detectors |
| Brand | TESCAN |
|---|---|
| Origin | Czech Republic |
| Manufacturer | TESCAN ORSAY HOLDING a.s. |
| Type | Imported High-Resolution Dual-Beam FIB-SEM |
| Model | TESCAN SOLARIS |
| Price Range | USD 1.3–2.0 million (FOB Europe) |
| Brand | TESCAN |
|---|---|
| Origin | Czech Republic |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Category | Imported Instrument |
| Model | TESCAN SOLARIS X |
| Price Range | USD 1.3M – 1.9M |
| Brand | TESCAN |
|---|---|
| Origin | Czech Republic |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported Instrument |
| Model | TENSOR |
| Pricing | Available Upon Request |
| Brand | TESCAN |
|---|---|
| Origin | Czech Republic |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Category | Imported |
| Model | TIMA-X FEG LMU/LMH |
| Electron Source | Cold Field Emission Gun (CFEG) |
| Secondary Electron Resolution | 1.2 nm @ 30 kV |
| Magnification Range | 1× to 1,000,000× |
| Accelerating Voltage | 0.2–30 kV |
| Backscattered Electron Resolution | 2.0 nm @ 15 kV |
| EDX Detector Configuration | Up to 4 Peltier-cooled Silicon Drift Detectors (SDD) |
| Sample Chamber | Large-volume, motorized multi-position stage accommodating up to seven 30 mm-diameter samples |
| Vacuum Mode | High Vacuum (standard), Low Vacuum (optional) |
| Platform Base | MIRA FEG SEM platform with differential pumping and gun isolation valve |
| Brand | TESCAN |
|---|---|
| Origin | Czech Republic |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Category | Imported Instrument |
| Model | TIMA-X |
| Electron Gun Type | Cold Field Emission |
| Secondary Electron Image Resolution | 1.2 nm @ 30 kV |
| Magnification Range | 1× to 1,000,000× |
| Accelerating Voltage | 0.2–30 kV |
| Backscattered Electron (BSE) Image Resolution | 2.0 nm @ 15 kV |
| Brand | TESCAN |
|---|---|
| Origin | Czech Republic |
| Manufacturer | TESCAN s.r.o. |
| Type | Imported Instrument |
| Model | TESCAN VEGA COMPACT |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 3.0 nm @ 30 kV |
| Magnification Range | 2× to 1,000,000× |
| Accelerating Voltage | 200 V – 30 kV (continuously adjustable) |
| Backscattered Electron Resolution | 3.5 nm @ 30 kV |
| Brand | TESCAN |
|---|---|
| Origin | Czech Republic |
| Manufacturer | TESCAN ORSAY HOLDING a.s. |
| Type | VEGA |
| Electron Source | Tungsten (W) Filament |
| Secondary Electron Resolution | 3.0 nm @ 30 kV |
| Magnification Range | 2× to 1,000,000× |
| Accelerating Voltage | 0.2–30 kV (continuously adjustable) |
| Backscattered Electron Resolution | 3.5 nm @ 30 kV |
| Brand | Thermo Fisher |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China-manufactured under Thermo Fisher global design & quality standards) |
| Model | Apreo ChemiSEM |
| Pricing | Available upon request |
| Brand | Thermo Fisher |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China-Made) |
| Model | Axia ChemiSEM |
| Pricing | Available Upon Request |
| Brand | Thermo Fisher |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Regional Classification | Domestic (China) |
| Model | Axia ChemiSEM |
| Pricing | Upon Request |
| Brand | Thermo Fisher |
|---|---|
| Origin | Netherlands |
| Model | Axia ChemiSEM |
| Instrument Type | Floor-standing Conventional SEM |
| Electron Source | Pre-aligned Tungsten Filament |
| Secondary Electron (SE) Resolution | 3.0 nm @ 30 kV (HV), 8.0 nm @ 3 kV (HV) |
| Backscattered Electron (BSE) Resolution | 7.0 nm @ 3 kV (HV, decelerated mode) |
| Magnification Range | 5× to 1,000,000× |
| Accelerating Voltage | 200 V – 30 kV |
| Probe Current | Up to 2 µA, continuously adjustable |
| Low Vacuum Mode | Up to 150 Pa |
| Working Distance for EDS | 10 mm |
| EDS Take-off Angle | 35° |
| Chamber Internal Width | 280 mm |
| Number of Ports | 10 |
| Stage | 5-axis motorized (X=120 mm, Y=120 mm, Z=55 mm, Tilt=–15° to +90°, Rotation=360° continuous) |
| Max Sample Dimensions | 240 × 280 × 128 mm³ |
| Max Sample Weight | 10 kg |
| Detectors | In-chamber IR navigation camera, Nav-Cam+™ color optical camera, ETD (Everhart-Thornley SE detector), retractable BSED, TrueSight X EDS with ChemiSEM technology |
| Control System | Windows 10 OS, 24″ LCD display (1920×1200), customizable GUI supporting quad-image real-time display, full Undo/Redo functionality |
| Brand | Thermo Fisher |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Axia ChemiSEM |
| Instrument Type | Floor-Standing Conventional SEM |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 3 nm @ 30 kV, 8 nm @ 3 kV |
| Accelerating Voltage | 0.2–30 kV |
| Backscattered Electron Imaging Capability | Integrated |
| Elemental Analysis Integration | On-platform EDS (Energy-Dispersive X-ray Spectroscopy) |
| Sample Weight Capacity | Up to 10 kg |
| Automation Level | Fully Automated Beam Alignment, Smart User Guidance, Undo Functionality |
| Compliance | Designed for GLP/GMP environments with audit-trail-ready software architecture |
| Brand | Thermo Fisher |
|---|---|
| Origin | Czech Republic |
| Model | Prisma E SEM |
| Instrument Type | Floor-standing SEM |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 3.0 nm @ 30 kV (SE), 8.0 nm @ 3 kV (SE) |
| Backscattered Electron Resolution | 4.0 nm @ 3 kV (BSE), 10 nm @ 3 kV (SE) |
| Accelerating Voltage | 200 V – 30 kV |
| Magnification Range | 5× – 1,000,000× |
| Low Vacuum Range | up to 130 Pa |
| ESEM Mode Pressure | up to 2600 Pa (H₂O), 4000 Pa (N₂) |
| Sample Chamber Width | 340 mm |
| Expandable Ports | 12 total, including 3 EDS ports (2 at 180° opposing positions) |
| Stage | 5-axis motorized eucentric stage (X=110 mm, Y=110 mm, Z=65 mm, T=–15° to 90°, R=360° continuous) |
| Standard Detectors | ETD (high-vacuum SE), LVD (low-vacuum SE), GSED (ESEM SE), IR CCD camera in chamber |
| Brand | Thermo Fisher Scientific |
|---|---|
| Origin | Czech Republic |
| Model | Apreo ChemiSEM |
| Instrument Type | Floor-standing High-Resolution FE-SEM |
| Electron Gun | Schottky Thermal Field Emission |
| Secondary Electron Resolution | 0.7 nm @ 30 kV |
| Backscattered Electron Resolution | 0.7 nm @ 30 kV |
| Magnification Range | 50× – 1,000,000× |
| Accelerating Voltage | 200 V – 30 kV |
| Landing Energy Range | 20 eV – 30 keV |
| Maximum Sample Size at 10 mm WD | 3 mm (min. mag. 29×) |
| Chamber Ports | 18 |
| Stage Travel | X = 110 mm, Y = 110 mm, Z = 65 mm, Tilt = −15° to +90°, Rotation = 360° continuous |
| Standard Detector System | Trinity In-lens Detection System (T1, T2, T3), TD, DBS |
| Optional Detectors | DBS-GAD, Low-Vacuum SE Detector, STEM 3+ Segmented Detector (BF/DF/HADF/HAADF), IR CCD, Thermo Scientific™ Nav-Cam™ Navigation Camera |
| Brand | Thermo Fisher |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | OEM Manufacturer |
| Regional Classification | Domestic (China) |
| Model | Apreo ChemiSEM |
| Quotation | Upon Request |
| Instrument Form Factor | Floor-Standing |
| Electron Source Type | Thermal Field-Emission Gun (TFEG) |
| Microscope Class | Ultra-High-Resolution Field-Emission SEM |
| Secondary Electron Resolution | 0.7 nm @ 30 kV |
| Magnification Range | 29× to 200,000× |
| Accelerating Voltage Range | 200 V – 30 kV |
| Backscattered Electron Resolution | 0.8 nm @ 1 kV |
| Brand | Thermo Fisher Scientific |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Regional Classification | Domestic Production |
| Model | Apreo |
| Instrument Type | Floor-Model High-Performance SEM |
| Electron Gun Type | Cold Field Emission (CFEG) |
| Microscope Class | Ultra-High-Resolution Field-Emission SEM |
| Secondary Electron Resolution | 1.0 nm at 1 kV (in-lens detection, no beam deceleration or monochromator) |
| Accelerating Voltage Range | 200 V – 30 kV |
| Backscattered Electron Resolution | ≤1.5 nm at 30 kV (T1 in-lens BSE detector) |
| Chamber Configuration | Triple EDS/WDS port capability |
| Vacuum System | Dual-mode (High Vacuum & Variable Pressure up to 500 Pa) |
| Software Platform | xT User Interface with SmartSCAN™, Drift Compensation Frame Integration (DCFI), and Charge Filtering Algorithms |
| Brand | Thermo Fisher Scientific |
|---|---|
| Origin | Imported |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Model | Aquilos 2 Cryo-FIB |
| Price Range | USD 1.3–2.0 million (FOB) |
| Brand | Thermo Fisher Scientific |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CleanConnect™ |
| Pricing | Upon Request |
| Brand | Thermo Fisher Scientific |
|---|---|
| Origin | Czech Republic |
| Model | Helios 5 DualBeam |
| Landing Voltage Range | 20 eV – 30 keV |
| SEM Resolution | Down to 0.6 nm @ 15–30 keV (depending on configuration) |
| FIB Current Range | 1 pA – 100 nA |
| Ion Acceleration Voltage | 500 V – 30 kV |
| Stage Travel | Up to 150 × 150 × 10 mm (X/Y/Z, model-dependent) |
| Automated TEM Lamella Preparation | Supported (via AutoTEM 5 software) |
| STEM Imaging Capability | Integrated (sub-nm resolution at 30 keV) |
| Compliance | Designed for GLP/GMP environments |
| Brand | Thermo Fisher Scientific |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic (China-manufactured) |
| Model | Helios 5 DualBeam FIB-SEM |
| Pricing | Upon Request |
| Brand | Thermo Fisher Scientific |
|---|---|
| Origin | Czech Republic |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported Instrument |
| Model | Helios 5 Laser PFIB |
| Price Range | USD 920,000 – 1,315,000 |
| Brand | Thermo Fisher Scientific |
|---|---|
| Origin | Czech Republic |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Helios NanoLab DualBeam™ |
| Price Range | USD 1.3M – 1.9M |