Electron Microscope
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| Brand | Phenom |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | Phenom ProX (Domestically Manufactured Variant) |
| Instrument Type | Desktop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| SEM Type | High-Resolution Field-Emission SEM |
| Secondary Electron Resolution | ≤6 nm |
| Maximum Magnification | 350,000× |
| Accelerating Voltage Range | 4.8–20.5 kV |
| Backscattered Electron Resolution | ≤6 nm |
| Sample Stage Capacity | Ø32 mm × H100 mm |
| Vacuum Mode | Standard & Charge Reduction Mode |
| Integrated Detector | Silicon Drift Detector (SDD) EDS |
| Software | Element Identification (EID) with Point, Line, and Area Mapping |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Type | Desktop SEM |
| Model | ProX |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron Resolution | <1.5 nm |
| Magnification Range | Up to 2,000,000× |
| Accelerating Voltage | 1–20 kV (continuously adjustable) |
| Maximum Sample Size | 100 × 100 mm |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom ProX SEM-EDS Integrated System |
| Instrument Type | Desktop Scanning Electron Microscope |
| Electron Source | CeB6 (Cerium Hexaboride) |
| Secondary Electron Resolution | 6 nm |
| Maximum Magnification | 350,000× |
| Accelerating Voltage | Basic modes: 2 kV, 5 kV, 10 kV, 15 kV, 20 kV |
| Advanced mode | continuously adjustable from 4.8 kV to 20.5 kV |
| Backscattered Electron Resolution | 6 nm |
| Standard Detector | High-sensitivity quadrant backscattered electron detector (BSE) with compositional and topographic imaging modes |
| Optional Detector | Secondary Electron Detector (SED), Mix mode imaging with adjustable SE/BSE ratio |
| EDS Detector | Silicon Drift Detector (SDD) |
| EDS Cooling | Peltier thermoelectric cooling (liquid-nitrogen-free) |
| Elemental Range | Boron (Z=5) to Americium (Z=95) |
| Vacuum Pump-down Time | <15 s |
| Filament Lifetime | ~3,000 hours |
| Optical Zoom | 20×–135× |
| Environmental Tolerance | No anti-vibration table required |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | ProX Desktop Scanning Electron Microscope |
| Instrument Type | Desktop SEM-EDS Integrated System |
| Electron Source | Cerium Hexaboride (CeB6) |
| Secondary Electron Image Resolution | 6 nm |
| Maximum Magnification | 350,000× |
| Accelerating Voltage | Basic Mode: 2 / 5 / 10 / 15 / 20 kV |
| Advanced Mode | 4.8–20.5 kV (continuous, for simultaneous imaging & EDS analysis) |
| Backscattered Electron Image Resolution | 6 nm |
| Standard Detectors | Backscattered Electron Detector (BSD), Energy-Dispersive X-ray Spectrometer (EDS) |
| Optional Detector | Secondary Electron Detector (SED) |
| Vacuum Modes | High Vacuum / Low Vacuum (for charge mitigation) |
| Optical Navigation Camera | Integrated Full-Color CCD Camera |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom ProX_1 |
| Instrument Type | Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron Resolution | 6 nm |
| Backscattered Electron Resolution | 8 nm |
| Magnification Range | Up to 350,000× |
| Accelerating Voltage | 4.8–20.5 kV |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Phenom ProX_2 |
| Instrument Type | Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron Resolution | ≤6 nm |
| Maximum Magnification | 350,000× |
| Accelerating Voltage Range | 4.8–20.5 kV |
| Backscattered Electron Resolution | ≤6 nm |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom Pure |
| Instrument Type | Desktop SEM |
| Electron Source | CeB6 (Cerium Hexaboride) |
| Secondary Electron Resolution | <10 nm |
| Maximum Magnification | 175,000× |
| Accelerating Voltages | 5 kV, 10 kV |
| Backscattered Electron Resolution | <10 nm |
| Vacuum Pump-down Time | <10 s |
| Imaging Time to First Image | ≤30 s |
| Optional Environmental Mode | Temperature-Controlled Stage for Liquid Samples |
| Upgrade Path | Compatible with Phenom Pro Series |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Type | Desktop SEM |
| Model | Pure |
| Electron Source | Cerium Hexaboride (CeB6) |
| Secondary Electron Resolution | 10 nm |
| Maximum Magnification | 175,000× |
| Accelerating Voltages | 5 kV and 10 kV |
| Backscattered Electron Resolution | 10 nm |
| Vacuum Pump-down Time | <15 s |
| Filament Lifetime | ~1,500 hours |
| Operating Environment | Standard laboratory or office floor (anti-vibration design) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom Pure |
| Instrument Type | Desktop SEM |
| Electron Source | Cerium Hexaboride (CeB6) |
| Secondary Electron Resolution | ≤10 nm |
| Backscattered Electron Resolution | ≤10 nm |
| Maximum Magnification | 175,000× |
| Accelerating Voltages | 5 kV, 10 kV |
| Vacuum Pump-Down Time | <15 s |
| CE-B6 Filament Lifetime | >1500 h |
| Detectors | Integrated BSE Detector, Optional SE Detector |
| Sample Chamber Dimensions | Ø 100 mm × 80 mm (H) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Product Type | Desktop SEM |
| Electron Source | Cerium Hexaboride (CeB6) |
| Secondary Electron Resolution | 10 nm |
| Maximum Magnification | 175,000× |
| Accelerating Voltages | 5 kV and 10 kV |
| Backscattered Electron (BSE) Resolution | 10 nm |
| Vacuum Pump-down Time | <15 s |
| CeB6 Filament Lifetime | ~1,500 hours |
| Operating Environment | Standard lab/office floor (anti-vibration design) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom Pure G7 Desktop SEM |
| Instrument Type | Desktop / Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron Resolution | <10 nm |
| Maximum Magnification | 175,000× |
| Accelerating Voltages | 2 kV / 5 kV / 10 kV |
| Backscattered Electron Resolution | <10 nm |
| Standard Detector | Quad-segment Backscattered Electron Detector (Topography & Composition Modes) |
| Optional Detector | Secondary Electron Detector (SED) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | SEM-AFM |
| Instrument Type | Benchtop SEM-AFM Integrated System |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Maximum Sample Dimensions | 21 mm × 11 mm × 8 mm |
| Sample Weight Limit | 100 g |
| Open-Loop Scan Range | 100 µm × 100 µm × 20 µm |
| Closed-Loop Scan Range | 80 µm × 80 µm × 16 µm |
| Spatial Resolution (XY/Z) | 0.2 nm × 0.2 nm / 0.04 nm |
| Compatible Modes | Topography, Roughness, CAFM, KPFM, FMM, PFM, EFM, Force–Distance (F–z), Current–Voltage (I–V) |
| Key | Brand: Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Product Type | Electron Microscope Accessory |
| Model | Temperature Controlled Sample Holder |
| Temperature Range | −25 °C to +50 °C (standard), optional −50 °C to +50 °C |
| Accuracy | ±1.5 °C |
| Resolution | 0.1 °C |
| Max Cooling Rate | 20 °C/min |
| Max Sample Dimensions | Ø25 mm × 5 mm |
| Operating Principle | Peltier-based thermoelectric control |
| Compliance | Designed for integration with Phenom desktop SEM platforms |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | Tensile Sample Holder |
| Pricing | Available Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Vacuum Sample Holder |
| Pricing | Upon Request |
| Dimensions | 70 × 60 × 20 mm (L×W×H) |
| Operating Vacuum Range | 10⁻¹–10⁻³ Pa |
| Optional Integrated Functions | Heating (RT to ≥100 °C, ±0.5 °C stability), In-Situ Charge/Discharge (0–30 V / 0–0.5 A), Mechanical Force Application (0–250 N with force curve logging) |
| Brand | Phenom |
|---|---|
| Country of Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | X-view Insert |
| Pricing | Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China-made) |
| Model | Phenom XL |
| Instrument Type | Desktop SEM |
| Electron Gun | Cerium Hexaboride (CeB6) |
| Secondary Electron Resolution | ≤8 nm |
| Maximum Magnification | 200,000× |
| Accelerating Voltage | 4.8–20.5 kV (continuously adjustable) |
| Backscattered Electron Resolution | ≤8 nm |
| Optical Microscope Magnification | 3–19× |
| Vacuum Pumping Time | <30 s |
| Standard Detector | High-Sensitivity Quad-SEG BSE Detector |
| Filament Lifetime | ~3,000 h |
| Sample Chamber Diameter | 100 mm |
| Optional Add-ons | EDS spectrometer, 3D roughness reconstruction, fiber/particle/porosity statistical analysis modules, in-situ tensile stage (2–1000 N, 0.1–15 mm/min) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | XL G3 |
| Instrument Type | Desktop SEM |
| Electron Source | CeB6 (Cerium Hexaboride) |
| Secondary Electron Resolution | 8 nm |
| Backscattered Electron Resolution | 8 nm |
| Magnification Range | 20×–200,000× |
| Accelerating Voltage | 4.8–20.5 kV |
| Maximum Sample Diameter | 100 mm |
| Vacuum Pumping Time | <30 s |
| Optical Navigation Lens | 3–19× |
| Detector | High-Sensitivity Quad-SEG BSE Detector |
| Filament Lifetime | ~3,000 h |
| Optional | EDS Detector Integration |
| Brand | Phenom (Thermo Scientific) |
|---|---|
| Origin | Netherlands |
| Instrument Type | Desktop SEM |
| Electron Source | CeB6 (Cerium Hexaboride) |
| Secondary Electron Resolution | <8 nm |
| Maximum Magnification | 200,000× |
| Accelerating Voltage Range | 4.8–20.5 kV |
| Backscattered Electron Resolution | <8 nm |
| Optional Detectors | EDS, Secondary Electron Detector |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported |
| Model | Phenom XL Sample Holder |
| Pricing | Available Upon Request |
| Brand | point electronic |
|---|---|
| Origin | Germany |
| Model | 3D Calibration Kit |
| Compliance | VDI/VDE 2656 |
| Software | microCal Calibration Suite |
| Compatibility | SEM, AFM, CLSM, 3D-SEM |
| Calibration Type | Geometric Metrology (X/Y/Z Scale, Shear, Coupling) |
| Traceability | NIST-traceable reference data provided |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Prime |
| Price Range | USD 135,000 – 205,000 |
| Instrument Type | Atomic Force Microscope (AFM)-Based Scanning Microwave Impedance Microscope |
| Positional Detection Noise | 0.01 nm |
| Scan Area | 20 µm × 20 µm (model-dependent) |
| Stage Travel Range | 100 µm × 100 µm × 10 µm |
| Brand | Quantum Design |
|---|---|
| Origin | USA |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | FusionScope |
| Instrument Type | Materials-Focused Hybrid AFM/SEM System |
| Positional Detection Noise | <50 pm @ 1 kHz |
| Maximum Sample Diameter | ≤20 mm |
| Maximum Sample Height | ≤20 mm |
| Sample Stage Travel Range | XY: 22 × 22 µm (closed-loop), Z: 15 µm |
| Brand | Quantum Design |
|---|---|
| Origin | USA |
| Manufacturer Type | Manufacturer |
| Origin Category | Imported |
| Model | FusionScope |
| Instrument Type | Floor-standing / Conventional Large-scale |
| Electron Gun Type | Thermal Field Emission |
| Magnification Range | 25× – 200,000× |
| Acceleration Voltage | 3.5 kV – 15 kV |
| Maximum Sample Diameter | 20 mm |
| Standard Detector System | In-chamber Secondary Electron (SE) Detector |
| AFM Scan Range (XY) | 22 × 22 µm (closed-loop) |
| AFM Z-Range | 15 µm |
| AFM Imaging Noise | <50 pm @ 1 kHz |
| AFM Probe Type | Self-sensing piezoresistive cantilever |
| AFM Modes | Contact, Dynamic (Tapping), FIRE, MFM, C-AFM, EFM |
| SEM Beam Current | 5 pA – 2.5 nA (typ. 300 pA) |
| Chamber Vacuum | 1–10 µTorr |
| Pump-down Time | <5 min |
| Sample Stage Tilt | −10° to +80° |
| Dimensions (W×D×H) | 690 × 835 × 1470 mm |
| Weight | 330 kg |
| Brand | Quantum Detectors |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CheeTah T3 EELS |
| Pricing | Available Upon Request |
| Brand | Quantum Detectors |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MERLIN T4 |
| Pricing | Upon Request |
| Brand | Quantum Detectors |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MerlinEM |
| Pricing | Available Upon Request |
| Detector Material | 500 µm thick silicon |
| Detector Type | Reverse-biased hybrid silicon diode array |
| Pixel Size | 55 × 55 µm |
| Active Area | 1R (single chip): 14 × 14 mm² |
| 4R/4S (quad-chip) | 28 × 28 mm² |
| Pixel Count | 1R: 256 × 256 |
| 4R/4S | 512 × 512 |
| Readout Noise | Effectively 0 e⁻ (threshold-based discrimination) |
| Signal-to-Noise Ratio (SNR) | 107:1 |
| Detective Quantum Efficiency (DQE) at 60 keV | 1.0 (zero frequency), 0.45 (Nyquist frequency) |
| Modulation Transfer Function (MTF) at 60 keV | >0.62 at Nyquist frequency (mode-dependent) |
| Frame Rate (full-frame, continuous) | 18,800 fps (1-bit), 3,600 fps (6-bit), 1,800 fps (12-bit), 800 fps (24-bit) |
| Region-of-Interest (ROI) readout | up to 7,200 fps (128 × 256, 6-bit), 14,400 fps (64 × 256, 6-bit) |
| Inter-frame gap time | 0 µs |
| Dynamic Range | Up to 24-bit per pixel (16,777,216 counts/pixel) |
| Trigger Interface | 3.3 V / 5 V TTL pulse or software-controlled via TCP/IP |
| Energy Range | 30–300 keV |
| Software Suite | 4D STEM acquisition platform, LabVIEW drivers, GM3 integration interface, native TCP/IP communication |
| Mounting Options | Side-insertion retractable or bottom-fixed configuration |
| Optional Integration | NanoMEGAS precession electron diffraction (PED) interface |
| Brand | Quantum Detectors |
|---|---|
| Origin | United Kingdom |
| Model | Quantum C100 |
| Frame Rate | 2000 fps (continuous) |
| Pixel Array | 2048 × 2048 |
| Readout | Fiber-optic coupled direct electron detection |
| Interface | GUI-controlled, open-format data export (TIFF, MRC, HDF5) |
| Compatibility | Optimized for 100 keV transmission electron microscopes |
| Regulatory Compliance | Designed for GLP/GMP-aligned workflows |
| Brand | Quantum Scale |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | Nano Tech 20 AFM |
| Instrument Type | Industrial-Grade |
| SPM Architecture | Modular & Multi-Functional |
| Positioning Noise | XY: 0.2 nm, Z: 0.05 nm |
| Sample Size Compatibility | Up to 300 mm (12-inch) wafers, downward-compatible |
| XY Stage Travel | 200 mm × 200 mm (customizable) |
| Z Scan Range | 10 µm |
| Imaging Modes | Contact, Tapping, Force Spectroscopy, Phase Imaging |
| Optional Upgrades | EFM, MFM, KPFM, PFM, Lateral Force Imaging |
| Optical Microscope | 6.3 MP color CMOS, 7.5×–50× zoom, 34 mm working distance, 1.5 µm optical resolution at 50×, coaxial LED illumination, parfocal design |
| Scan Speed | 0.1–20 Hz |
| Feedback Bandwidth | 500 kHz (dual-channel lock-in), 18-bit amplitude/phase resolution |
| Data Acquisition | 16-bit, 100 kHz multi-channel sampling |
| Environmental Options | Vacuum mode (7.3 Pa base pressure), inert gas enclosure (N₂/Ar), H₂O/O₂ monitoring, temperature-controlled stage (−100 °C to +150 °C, ±0.3 °C stability), active air-sound shielding, pneumatic vibration isolation platform |
| Brand | Quantum Scale |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | NanoTech 10 AFM |
| Instrument Type | Materials-Focused AFM |
| SPM Architecture | Modular & Multi-Functional |
| Closed-Loop Positioning Noise | XY = 0.2 nm, Z = 0.05 nm |
| Sample Dimensions | 25 mm × 10 mm |
| XY Scanner Travel Range | 12 mm × 12 mm |