Electron Microscope
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| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | LiteScope |
| Instrument Type | Atomic Force Microscope |
| Sample Dimensions | 21 mm × 11 mm × 8 mm |
| Closed-Loop Scan Range | 80 µm × 80 µm × 16 µm |
| Compatibility | Thermo Fisher, TESCAN, Zeiss, Hitachi, JEOL SEM platforms (custom integration available) |
| Measurement Modes | Contact/Non-contact AFM, Phase Imaging, Energy Dissipation Mapping, C-AFM, KPFM, EFM, STM, MFM, PFM, Force–Distance (F–z), Current–Voltage (I–V), CPEM Correlative Analysis |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom MAPS |
| Type | Automated Multimodal Mapping & Stitching Software for Desktop SEM |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Manufacturer |
| Origin Category | Imported |
| Model | Metallurgical Mount Sample Holder |
| Price | Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Manufacturer |
| Origin Category | Imported |
| Model | Micro Electronics Insert |
| Price | Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Thermo Fisher Scientific (Phenom brand) |
| Type | Desktop SEM |
| Electron Source | Schottky Field-Emission |
| Imaging Modes | Secondary Electron (SE) & Backscattered Electron (BSE) |
| SE Resolution | ≤2.5 nm @ 15 kV |
| BSE Resolution | ≤2.5 nm @ 15 kV |
| Max Magnification | 1,000,000× |
| Vacuum Cycle Time | <15 s |
| Sample Compatibility | Conductive & Non-conductive (uncoated), Magnetic |
| Navigation | Integrated Color Optical Microscope with Panoramic View |
| Stage | Motorized XYZ Stage with Auto-Align |
| Vibration Isolation | Built-in 27-Element Passive Damping System |
| Maintenance | Field-Emission Source Lifetime >2,000 h |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Product Type | Desktop Scanning Electron Microscope (SEM) |
| Model | ParticleX Li-Battery |
| Electron Source | CeB6 (Cerium Hexaboride) |
| Secondary Electron Resolution | 8 nm |
| Maximum Magnification | 200,000× |
| Acceleration Voltage Range | Standard Modes: 2 kV, 5 kV, 10 kV, 15 kV, 20 kV |
| Advanced Mode | Continuously Adjustable from 4.8 kV to 20.5 kV |
| Backscattered Electron Resolution | 8 nm |
| Standard Detectors | Backscattered Electron Detector (BSE), Energy Dispersive X-ray Spectrometer (EDS) |
| Optional Detector | Secondary Electron Detector (SED) |
| Sample Stage | Motorized 100 × 100 mm XY Stage |
| Vacuum System | Triple-chamber Separated Design, Pump-down Time < 60 s |
| Filament Lifetime | > 3000 h (CeB6, Warranty Guaranteed) |
| Compliance | ASTM E1508, ISO 16700, USP <1086>, GLP/GMP-Aligned Data Integrity Framework |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Product Type | Desktop Scanning Electron Microscope (SEM) |
| Model | ParticleX |
| Electron Source | Cerium Hexaboride (CeB6) |
| Maximum Magnification | 200,000× |
| Accelerating Voltage | Standard Modes: 2 kV, 5 kV, 10 kV, 15 kV, 20 kV |
| Advanced Mode | Continuously Adjustable from 4.8 kV to 20.5 kV |
| Backscattered Electron (BSE) Image Resolution | ≤ 8 nm |
| Standard Detectors | High-Sensitivity Quad-BSE Detector, Energy-Dispersive X-ray Spectrometer (EDS) |
| Optional Detector | Secondary Electron (SE) Detector |
| Vacuum Pumping Time | < 30 s |
| Lamp Lifetime | ~3,000 h |
| Operating Environment | Standard Lab or Office (Active Vibration Isolation Integrated) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Import Status | Imported |
| Model | ParticleX Battery |
| Instrument Type | Benchtop Scanning Electron Microscope (SEM) |
| Electron Source | Cerium Hexaboride (CeB6) |
| Secondary Electron Resolution | 8 nm |
| Maximum Magnification | 200,000× |
| Acceleration Voltage Range | Standard Modes: 2, 5, 10, 15, 20 kV |
| Advanced Mode | Continuously Adjustable from 4.8 kV to 20.5 kV |
| Backscattered Electron Resolution | 8 nm |
| Maximum Sample Capacity | Up to four 47 mm diameter filter membranes simultaneously |
| Standard Detectors | Backscattered Electron Detector (BSE), Energy-Dispersive X-ray Spectrometer (EDS) |
| Optional Detector | Secondary Electron Detector (SED) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Category | Imported Instrument |
| Model | ParticleX Battery |
| Instrument Type | Benchtop Scanning Electron Microscope (SEM) |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron Resolution | 8 nm |
| Maximum Magnification | 200,000× |
| Accelerating Voltage Range | Standard Modes: 2 kV, 5 kV, 10 kV, 15 kV, 20 kV |
| Advanced Mode | Continuously Adjustable from 4.8 kV to 20.5 kV |
| Backscattered Electron Resolution | 8 nm |
| Standard Detectors | Backscattered Electron Detector (BSE), Energy-Dispersive X-ray Spectrometer (EDS) |
| Optional Detector | Secondary Electron Detector (SED) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | ParticleX Steel |
| Instrument Type | Benchtop Scanning Electron Microscope |
| Electron Source | Cerium Hexaboride (CeB6) |
| Secondary Electron Resolution | 8 nm |
| Maximum Magnification | 200,000× |
| Accelerating Voltage Range | Standard Modes: 2 kV, 5 kV, 10 kV, 15 kV, 20 kV |
| Advanced Mode | Continuously Adjustable from 4.8 kV to 20.5 kV |
| Backscattered Electron Resolution | 8 nm |
| Standard Detectors | Backscattered Electron Detector (BSE), Energy-Dispersive X-ray Spectrometer (EDS) |
| Optional Detector | Secondary Electron Detector (SED) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | ParticleX Steel Inclusion |
| Instrument Type | Benchtop Scanning Electron Microscope (SEM) |
| Electron Source | Cerium Hexaboride (CeB6) |
| SEM Class | Entry-level Field-Emission Equivalent |
| Secondary Electron Resolution | 8 nm |
| Backscattered Electron Resolution | 8 nm |
| Maximum Magnification | 200,000× |
| Accelerating Voltage Range | Standard Modes: 2, 5, 10, 15, 20 kV |
| Advanced Mode | Continuously Adjustable from 4.8 kV to 20.5 kV |
| Standard Detectors | Backscattered Electron Detector (BSE), Energy-Dispersive X-ray Spectrometer (EDS) |
| Optional Detector | Secondary Electron Detector (SED) |
| Vacuum System | Triple-chamber Separated Architecture |
| Pump-down Time | ≤30 s |
| Stage | High-Precision Motorized Stage |
| Compliance | ASTM E2109, ISO 4967, USP <788>, GB/T 10561 |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Manufacturer |
| Origin Category | Imported |
| Model | ParticleX TC |
| Instrument Type | Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron Resolution | 8 nm |
| Maximum Magnification | 200,000× |
| Acceleration Voltage | Standard Modes: 2 kV, 5 kV, 10 kV, 15 kV, 20 kV |
| Advanced Mode | Continuously Adjustable from 4.8 kV to 20.5 kV |
| Backscattered Electron (BSE) Resolution | 8 nm |
| Max Sample Capacity | Up to four 47 mm diameter filter membranes simultaneously |
| Standard Detector Configuration | Backscattered Electron Detector (BSE), Energy-Dispersive X-ray Spectrometer (EDS) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Thermo Fisher Scientific (Phenom brand) |
| Import Category | Imported Instrument |
| Model | ParticleX TC Automotive Cleanliness |
| Instrument Type | Benchtop Scanning Electron Microscope (SEM) |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron (SE) Resolution | 8 nm |
| Maximum Magnification | 200,000× |
| Accelerating Voltage Range | Standard Modes: 2 kV, 5 kV, 10 kV, 15 kV, 20 kV |
| Advanced Mode | Continuously Adjustable from 4.8 kV to 20.5 kV |
| Backscattered Electron (BSE) Resolution | 8 nm |
| Max Sample Capacity | Up to four 47 mm diameter filter membranes simultaneously |
| Standard Detectors | BSE Detector, Energy-Dispersive X-ray Spectrometer (EDS) |
| Optional Detector | Secondary Electron Detector (SED) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Type | Desktop SEM |
| Electron Source | Schottky Field-Emission |
| Resolution (SE & BSE) | 1.5 nm @ 1 kV |
| Maximum Magnification | 2,000,000× |
| Accelerating Voltage Range | 1–20 kV |
| Integrated EDS Capability | Yes |
| Vacuum Pumping Time | <15 s |
| Vibration Isolation | 27 Independent Passive Damping Units |
| Sample Chamber | Fully Enclosed with Internal Vacuum Lock |
| Conductive Coating Not Required | Yes |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Type | Desktop SEM |
| Electron Source | Schottky Field-Emission |
| Resolution (SE & BSE) | 1.5 nm @ 1 kV |
| Maximum Magnification | 2,000,000× |
| Accelerating Voltage Range | 1–20 kV |
| Integrated EDS Capability | Yes |
| Vacuum Pumping Time | <15 s |
| Vibration Isolation | 27 independent passive damping units |
| Sample Stage | Motorized, fully automated |
| Optical Navigation | Integrated color optical microscope with panoramic overview |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Type | Desktop SEM |
| Electron Source | Schottky Field-Emission |
| Resolution (SE & BSE) | 1.5 nm |
| Maximum Magnification | 2,000,000× |
| Accelerating Voltage Range | 1–20 kV |
| Integrated EDS Capability | Yes |
| Vacuum Pumping Time | ≤15 s |
| Vibration Isolation | 27 Independent Passive Damping Units |
| Sample Stage | Motorized, Fully Automated |
| Optical Navigation | Integrated Color Optical Microscope |
| Conductive Coating Not Required | Yes |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom Pharos G2 |
| Instrument Type | Desktop/Compact FE-SEM |
| Electron Source | Schottky Field Emission Gun (FEG) |
| SEM Class | High-Resolution Field-Emission SEM |
| Secondary Electron (SE) Resolution | ≤1.5 nm |
| Backscattered Electron (BSE) Resolution | ≤1.5 nm |
| Magnification Range | 10× to 2,000,000× |
| Accelerating Voltage | 1 kV – 20 kV |
| Standard Detectors | In-lens SE Detector, Solid-State BSE Detector |
| Optional Detector | Energy-Dispersive X-ray Spectrometer (EDS) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Pharos STEM |
| Pricing | Available Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Pharos STEM |
| Accelerating Voltage | 20 kV |
| Resolution | ≤ 1 nm |
| Sample Holder | Standard 3 mm TEM grid clamp |
| Imaging Modes | Bright-Field (BF), Dark-Field (DF), High-Angle Annular Dark-Field (HAADF), User-Defined Detector Segmentation |
| Vacuum Levels | 0.1, 10, and 60 Pa |
| Imaging Time (Sample-to-Image) | < 40 s |
| Working Distance | Fixed for optimal STEM performance |
| Detector Configuration | 11-segment annular STEM detector with fully configurable quadrant/group selection |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Phenom Pharos-STEM |
| Price | Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Pharos-STEM |
| Pricing | Available Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Pro |
| Instrument Type | Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron Resolution | <6 nm @ 10 kV |
| Maximum Magnification | 350,000× |
| Accelerating Voltage Range | 4.8–20.5 kV |
| Backscattered Electron Resolution | <6 nm @ 10 kV |
| Vacuum Pumping Time | <15 s |
| Imaging Time | <30 s |
| Detector Configuration | Quadrant BSE Detector + SED + Optional SE/BSE Mix Mode |
| Navigation | Integrated 27–160× Color Optical Microscope |
| Sample Stage | Motorized, Fully Automated |
| Software Output Formats | JPEG, TIFF, PNG (up to 7680×4800 px) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom Pro |
| Instrument Type | Desktop SEM |
| Electron Source | CeB6 (Cerium Hexaboride) |
| Secondary Electron Resolution | 6 nm |
| Backscattered Electron Resolution | 6 nm |
| Magnification | Up to 350,000× |
| Accelerating Voltage | 4.8–20.5 kV |
| Vacuum Pump-down Time | <15 s |
| Filament Lifetime | >1,500 h |
| Imaging Modes | SE, BSE, and Real-time SE/BSE Mixed Imaging |
| Upgrade Path | Compatible with Phenom ProX EDS integration |
| Brand | Phenom (Thermo Fisher Scientific) |
|---|---|
| Origin | Netherlands |
| Instrument Type | Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron Resolution | ≤6 nm |
| Maximum Magnification | 350,000× |
| Accelerating Voltage | 4.8–20.5 kV (continuously adjustable) |
| Backscattered Electron Resolution | ≤6 nm |
| Vacuum System | Integrated turbomolecular pump (15 s pump-down to operational vacuum) |
| Sample Chamber Dimensions | Ø32 mm × H100 mm |
| Optical Navigation Camera | Integrated full-color CCD |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Phenom Pro_2 |
| Instrument Type | Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron Resolution | 6 nm |
| Maximum Magnification | 350,000× |
| Accelerating Voltage Range | 4.8–20.5 kV |
| Backscattered Electron Resolution | 8 nm |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Type | Desktop SEM |
| Model | Phenom Pro_3 |
| Electron Source | CeB₆ (Cerium Hexaboride) |
| Secondary Electron Resolution | ≤6 nm |
| Backscattered Electron Resolution | ≤6 nm |
| Magnification Range | 20× to 350,000× |
| Accelerating Voltage | 4.8–20.5 kV |
| Vacuum Pump-down Time | <15 s |
| Filament Lifetime | >1,500 h |
| Detector Options | Integrated SE + BSE detectors (simultaneous acquisition) |
| Optional Capabilities | Real-time SE/BSE mixed imaging, EDS-ready upgrade path (to Phenom ProX), Hydrogel-compatible dynamic observation mode |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Phenom Pro_4 |
| Instrument Type | Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron (SE) Resolution | 8 nm at 20 kV |
| Backscattered Electron (BSE) Resolution | 8 nm at 20 kV |
| Magnification Range | 20× to 200,000× |
| Accelerating Voltage | 4.8–20.5 kV |
| Detector | Integrated SE and BSE detectors |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Type | Desktop SEM |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Secondary Electron Resolution | 6 nm |
| Maximum Magnification | 350,000× |
| Accelerating Voltage Range | 4.8–20.5 kV |
| Backscattered Electron Resolution | 6 nm |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom ProX |
| Instrument Type | Desktop SEM |
| Electron Source | CeB6 (Cerium Hexaboride) |
| Secondary Electron Resolution | 6 nm |
| Maximum Magnification | 350,000× |
| Accelerating Voltage | Basic Modes: 2 / 5 / 10 / 15 / 20 kV |
| Advanced Mode | Continuously Adjustable from 4.8–20.5 kV (for simultaneous imaging & EDS analysis) |
| Backscattered Electron Resolution | 6 nm |
| Vacuum Pump-down Time | <15 s |
| Elemental Analysis Range | B (Z=5) to Am (Z=95) |
| Detector | Silicon Drift Detector (SDD) |
| Cooling | Peltier (cryogen-free) |
| Optional Modules | Automated Particle Analysis, Inclusion Analysis, Fiber Morphology Statistics, 3D Roughness Reconstruction, High-Magnification Stitching |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | ProX |
| Instrument Type | Desktop SEM |
| Electron Source | CeB6 (Cerium Hexaboride) |
| Secondary Electron Resolution | 6 nm |
| Maximum Magnification | 350,000× |
| Accelerating Voltage Range | 4.8–20.5 kV |
| Backscattered Electron Resolution | 6 nm |
| EDS Detector | Silicon Drift Detector (SDD) |
| Cooling | Peltier (liquid-nitrogen-free) |
| Vacuum Pump-down Time | <15 s |
| Elemental Analysis Range | B (5) to Am (95) |
| Operating Environment | Standard lab/office/facility (no anti-vibration table required) |