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| Brand | Angstrom |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | ELS5000 |
| Pricing | Upon Request |
| Brand | Angstrom (USA) |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | LUMO |
| Pricing | Upon Request |
| Brand | Angstrom (USA) |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | RVL2000 |
| Pricing | Upon Request |
| Brand | Anasazi |
|---|---|
| Origin | USA |
| Model | EFT-60 |
| Operating Frequency | 60 MHz |
| Magnet Type | AlNiCo Permanent Magnet |
| Sample Form | Solid and Liquid (with appropriate probes) |
| Resolution (1H) | < 0.5 Hz |
| Sensitivity (1H) | < 0.001 mmol/L |
| Nuclei Supported | ¹H, ¹³C, ¹⁹F, ³¹P, ²³Na, ⁵⁹Co, ²⁹Si |
| Cryogen-Free Operation | Yes |
| Compliance | ASTM E2821, ISO/IEC 17025 (when operated under GLP conditions), FDA 21 CFR Part 11–ready software architecture |
| Brand | Anasazi |
|---|---|
| Origin | USA |
| Model | EFT-90 |
| Operating Frequency | 90 MHz |
| Sample Type | Solid & Liquid (with appropriate probes) |
| Magnet Type | AlNiCo permanent magnet |
| Resolution | < 0.5 Hz (for 1H at 90 MHz) |
| Sensitivity | < 0.001 mmol/L (for 1H) |
| Cooling | Zero-boil-off, helium-free operation |
| Compliance | Designed for GLP-compliant academic and industrial R&D environments |
| Software | EFT-NMR v5.x with full pulse sequence library and audit trail capability |
| Brand | Anasazi |
|---|---|
| Origin | USA |
| Model | EFT-60, EFT-90 |
| Operating Frequency | 60 MHz / 90 MHz |
| Sample Type | Liquid |
| Measurement Principle | Pulsed Fourier Transform NMR |
| Magnet Type | AlNiCo Permanent Magnet |
| Resolution (1H) | <0.5 Hz |
| Sensitivity | <0.001 mmol/L |
| Nuclei Supported | ¹H, ¹³C, ¹⁹F, ³¹P, ²³Na, ⁵⁹Co, ²⁹Si, and other quadrupolar/nuclear spin-½ nuclei |
| Compliance | ASTM E2874, ISO/IEC 17025-compatible operation, GLP-ready data audit trail |
| Brand | AML |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SEMETROL HERA-DLTS |
| Price Range | USD 120,000 – 280,000 |
| Instrument Class | Semiconductor Defect Characterization System |
| Brand | SEMERSUN |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SEMETROL HERA-DLTS |
| Price Range | USD $105,000 – $210,000 |
| Instrument Class | Semiconductor Defect Characterization System |
| Brand | SPECS |
|---|---|
| Origin | Germany |
| Model | Phoibos 190 ARPES System |
| Energy Analyzer | ASTRAIOS 190 hemispherical analyzer with 2D-CMOS detector |
| Angular Resolution | <0.1° |
| Energy Resolution | <1.5 meV (with 2D-CMOS) |
| Acceptance Angle | ±30° |
| Vacuum Base Pressure | <1×10⁻¹⁰ mbar |
| Sample Stage | Closed-cycle 6-axis cryogenic manipulator (base temperature <7 K) |
| UV Source | UVS300 plasma discharge He lamp + TMM304 monochromator (HeI α/β, HeII lines |
| Soft X-ray Source | u-FOCUS 600 micro-focused monochromated Al/Ag/Cr anode (Rolan circle radius 600 mm |
| Detector | 1920×1200 pixel CMOS sensor, 160 fps frame rate, dynamic range >1×10⁶ cps, single-channel noise <0.002 cps |
| Software | SPECS Prodigy Suite (acquisition, real-time k-space mapping, Fermi surface reconstruction, GLP-compliant audit trail) |
| Brand | PHI |
|---|---|
| Origin | Japan |
| Model | PHI 700 |
| Type | Scanning Auger Electron Spectrometer |
| Detection Principle | Auger Electron Spectroscopy (AES) |
| Spatial Resolution | <10 nm (typical) |
| Beam Energy Range | 1–20 keV (electron gun) |
| Depth Profiling Capability | Sub-nanometer to several micrometers |
| Energy Resolution | ≤0.3% (ΔE/E at E = 1 keV) |
| Imaging Magnification | Up to 500,000× |
| Vacuum System | Ultra-High Vacuum (UHV), ≤5×10⁻¹⁰ Torr base pressure |
| Sample Stage | High-precision motorized XYZ + tilt/rotation |
| Compliance | ASTM E1508, ISO 18115-2, USP <1057>, GLP/GMP-ready data audit trail |
| Brand | PhysTech |
|---|---|
| Origin | Germany |
| Model | FT1030 |
| Instrument Type | Deep-Level Transient Spectroscopy System |
| Operating Modes | C-DLTS, CC-DLTS, I-DLTS, DD-DLTS, Zerbst-DLTS, O-DLTS, FET-Analysis, MOS-Analysis, ITS, PITS, TSC/TSCAP, DLOS, C/V(T), I/V(T), Richardson Plot, Capture Cross-Section Analysis |
| Key Software Features | 28 simultaneous correlation functions per temperature scan, Fourier-DLTS (F-DLTS), Laplace-DLTS, multi-exponential transient fitting, isothermal transient spectroscopy (ITS), signal overlap deconvolution (temperature-scan & isothermal), automatic contact check, real-time capacitance compensation, three-terminal FET current transient acquisition |
| Cooling Compatibility | Liquid nitrogen, closed-cycle cryocoolers, and programmable temperature controllers (4 K – 500 K typical range) |
| Compliance | Designed for GLP/GMP-aligned semiconductor defect characterization workflows |
| Brand | Angstrom |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | LEED 800 |
| Pricing | Available Upon Request |
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