Empowering Scientific Discovery

Hongteng Quantum Technology (Shenzhen) Co., Ltd.

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BrandaixACCT
OriginGermany
ModelTF Analyzer 1000
Voltage Range±12 V (expandable to ±10 kV)
Frequency Range0.01 Hz – 1 kHz
Fatigue Test Frequencyup to 50 kHz
Minimum Pulse Width20 µs
Output Impedance50 Ω
Max Capacitive Load100 nF
Output Current±50 mA
Current Amplification Range1 nA – 1 A
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BrandaixACCT
OriginGermany
ModelTF Analyzer 2000E
Voltage Range±25 V (extendable to ±10 kV)
Hysteresis Frequency0.001 Hz – 5 kHz
Minimum Pulse Width2 µs
Rise Time≤1 µs
Current Measurement Range1 pA – 1 A
Max Capacitive Load1 µF
Peak Output Current±1 A
Module OptionsFE (Ferroelectric), MR (Magnetoresistive), RX (Relaxation Current), DR (Dielectric Retention)
Channel Count256-channel automated testing capability
Operating SystemWindows 7 embedded
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BrandaixACCT
OriginGermany
ModelTF Analyzer 3000E
Voltage Range±25 V (extendable to ±10 kV)
Hysteresis Frequencyup to 1 MHz (High-Speed FE Module)
Minimum Pulse Width50 ns
Minimum Rise Time10 ns
Maximum Fatigue Frequency16 MHz
Current Amplification Range1 pA to 1 A
Max Load Capacitance1 nF
Peak Output Current±1 A
Software PlatformaixPlorer v5.x (Windows 7/10 compatible)
ComplianceASTM D991, IEC 62047-18, ISO/IEC 17025-ready architecture
ModularityFE, MR, RX, DR modules
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BrandaixACCT
OriginGermany
ModelTF Analyzer 3000E
Voltage Range±25 V (extendable to ±10 kV)
Dynamic Hysteresis Frequencyup to 1 MHz (High-Speed FE Module)
Minimum Pulse Width50 ns
Minimum Rise Time10 ns
Maximum Fatigue Frequency16 MHz
Current Amplification Range1 pA – 1 A
Max Capacitive Load1 nF
Output Current Peak±1 A
Software PlatformaixPlorer v7.x (Windows 7-based)
ComplianceASTM D991, IEC 62047-18, ISO/IEC 17025-ready architecture
Channel Count256-channel automated testing capability
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BrandWEP
OriginGermany
ModelCVP21
Measurement PrincipleElectrochemical Capacitance–Voltage (ECV) Profiling
Carrier Concentration Range1×10¹¹ cm⁻³ to 1×10²¹ cm⁻³
Depth ResolutionDown to ≤1 nm
Compatible SubstratesConductive & insulating
Wafer Size Support4×2 mm² to 200 mm (8″)
Material CompatibilitySi, Ge, SiC, GaAs, InP, GaN, AlGaN, InGaN, AlInN, ZnO, CdTe, HgCdTe, and multicomponent III–V/II–VI compounds
Automation LevelFully automated with real-time corrosion monitoring, auto-load/unload, dry-in/dry-out capability
SoftwareIntegrated ECV Control Suite with GLP-compliant audit trail, measurement recipe management, and camera-assisted process visualization
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BrandToho
OriginJapan
ModelSB1000
Temperature Range80 K – 700 K
Measurement PrincipleDifferential Thermoelectric Voltage Detection
Probe Configuration2-probe and 4-probe options
Sample EnvironmentHigh-vacuum compatible (integrated vacuum chamber)
Controller TypeDigital, microprocessor-based Seebeck coefficient controller
Cooling MethodLiquid nitrogen cryostat (for low-T) or heated stage (for high-T)
Data AcquisitionReal-time transient thermovoltage sampling with statistical averaging
Software InterfacePC-based control and analysis (Windows OS)
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BrandToho
OriginJapan
ModelECVpro+
Carrier Concentration Range1×10¹¹ to 1×10²¹ cm⁻³
Depth Resolutiondown to ≤1 nm
Sample CompatibilitySi, Ge, SiC, GaAs, InP, GaN, AlGaN, InGaN, AlInN, ZnO, CdTe, HgCdTe, and other III–V, II–VI, IV–IV, and ternary/quaternary compound semiconductors
Automation LevelFully automated electrochemical etching and C–V scanning
ComplianceDesigned for GLP/GMP-aligned R&D and process development environments
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BrandSumitomo
OriginJapan
Manufacturer TypeAuthorized Distributor
Origin CategoryImported
ModelSAW-20US
Price RangeUSD 1,050,000 – 1,210,000
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