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| Brand | AML |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SEMETROL HERA-DLTS |
| Price Range | USD 120,000 – 280,000 |
| Instrument Class | Semiconductor Defect Characterization System |
| Brand | SEMERSUN |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SEMETROL HERA-DLTS |
| Price Range | USD $105,000 – $210,000 |
| Instrument Class | Semiconductor Defect Characterization System |
| Brand | PhysTech |
|---|---|
| Origin | Germany |
| Model | FT1030 |
| Instrument Type | Deep-Level Transient Spectroscopy System |
| Operating Modes | C-DLTS, CC-DLTS, I-DLTS, DD-DLTS, Zerbst-DLTS, O-DLTS, FET-Analysis, MOS-Analysis, ITS, PITS, TSC/TSCAP, DLOS, C/V(T), I/V(T), Richardson Plot, Capture Cross-Section Analysis |
| Key Software Features | 28 simultaneous correlation functions per temperature scan, Fourier-DLTS (F-DLTS), Laplace-DLTS, multi-exponential transient fitting, isothermal transient spectroscopy (ITS), signal overlap deconvolution (temperature-scan & isothermal), automatic contact check, real-time capacitance compensation, three-terminal FET current transient acquisition |
| Cooling Compatibility | Liquid nitrogen, closed-cycle cryocoolers, and programmable temperature controllers (4 K – 500 K typical range) |
| Compliance | Designed for GLP/GMP-aligned semiconductor defect characterization workflows |
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