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| Brand | Das-Nano |
|---|---|
| Origin | USA |
| Model | ONYX-1 |
| Instrument Type | Room-Temperature Hall Effect System |
| Current Source Range | 20 mA |
| Measurement Principle | Microwave Reflectometry-Based Carrier Profiling |
| Applicable Mobility Range | 100–3000 cm²/V·s |
| Sample Compatibility | Monolayer to multilayer graphene, graphene oxide, PEDOT:PSS, CNT dispersions, MoS₂, h-BN, ALD-ZnO, GaN-on-SiC epiwafers, spin-coated photoresists, powders, and inkjet-printed films |
| Brand | Makeway |
|---|---|
| Origin | Japan |
| Model | 1600 |
| Instrument Type | Temperature-Variable Hall Effect Tester (Microwave-Based, Non-Contact) |
| Operating Frequency | 10 GHz |
| Current Source Range | 20 mA (for auxiliary calibration & optional DC bias) |
| Sample Diameter Support | 4–8 inch wafers |
| Carrier Mobility Range | 100–3000 cm²/V·s |
| Measurement Modes | Single-Point & Area Mapping |
| Compliance | Designed for ISO/IEC 17025-aligned lab environments |
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