Optical Instruments
Filter
Showing 2851–2880 of 7843 results
| Origin | Russia |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | HCL-10U |
| Core Technology | Gas Discharge Laser System |
| Wavelength | 325 nm (UV) |
| Output Power | 10.0 mW |
| Beam Mode | TEM₀₀ |
| Polarization Ratio | 100:1 |
| Beam Diameter | ~0.65 mm (typ.) |
| Divergence | <1.5 mrad (full angle) |
| Coherence Length | >30 cm |
| Warm-up Time | <15 min |
| Operating Voltage | 220 V AC, 50/60 Hz |
| Cooling | Forced-air |
| Lifetime | ≥5,000 hours (typ.) |
| Key | Output Power ≥ 40 mW |
|---|---|
| Mode | Multimode |
| Operating Voltage | 3.5–4 kV |
| Operating Current | 15 mA |
| Wavelength | 632.8 nm |
| Origin | Tianjin, China |
| Manufacturer Type | Distributor |
| Domestic Product | Yes |
| Pricing | Upon Request |
| Brand | HengaoDe |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | H30896 |
| Pricing | Upon Request |
| Measurement Range | 520–1070 hPa (380–800 mmHg |
| Accuracy | ±0.4 hPa |
| Operating Temperature | 0–40 °C |
| Relative Humidity | ≤90% RH |
| Power Supply | AC 220 V ±10%, 50 Hz or DC +5 V/1 A and ±12 V/1 A |
| Interface | RS-232 serial port, 1200 baud rate |
| Overload Capacity | 400–1400 hPa |
| Power Consumption | ≤20 W |
| Brand | HengaoDe |
|---|---|
| Model | HAD-17889 |
| Origin | Beijing, China |
| Measuring Range | 1000–2000 °C |
| Operating Temperature | 0–70 °C |
| Accuracy | ±1% of full scale |
| Repeatability | ±0.3% |
| Response Time | ≤0.1 s |
| Spectral Band | 0.4–1.1 µm |
| Distance-to-Spot Ratio | 120:1 |
| Measurement Distance | 0.5 m to infinity |
| Emissivity Adjustment | 0.001–1.000 (user-selectable) |
| Data Storage Capacity | 2001 temperature records |
| Output Interface | RS-232C (9600 baud) |
| Power Supply | 2 × AA rechargeable batteries |
| Weight | <0.65 kg |
| Battery Life | >50 hours continuous operation |
| Brand | HePu |
|---|---|
| Origin | Shandong, China |
| Model Series | WGZ-1C, WGZ-2C, WGZ-3C, WGZ-200C |
| Minimum Display Resolution | 0.001 NTU (WGZ-3C) / 0.01 NTU (WGZ-1C, WGZ-2C, WGZ-200C) |
| Measurement Range | 0–20 NTU (WGZ-1C), 0–200 NTU (WGZ-2C, WGZ-3C, WGZ-200C), 0–2000 NTU (WGZ-200C dual-channel) |
| Linearity Error | ±2% F.S. |
| Sample Flow Rate | 400–1000 mL/min |
| Inlet Pressure | 0.05–0.2 MPa |
| Operating Temperature | 4–40 °C |
| Output Signal | 4–20 mA (optional 0–10 mA), max. load 500 Ω |
| Housing | ABS plastic, wall-mounted split-type design |
| Key Features | Online continuous measurement, integrated flow stabilizer & de-foaming unit, high-intensity long-life light source, automatic range switching, upper/lower limit alarm (audible & visual), built-in self-diagnostic function, color compensation algorithm, real-time turbidity display |
| Brand | HESSE |
|---|---|
| Origin | Germany |
| Model | EM301-M17 |
| Total Magnification | 30× |
| Eyepiece | 20× |
| Objective | 20× |
| Maximum Temperature | 1700 °C |
| Heating Rate | 0–80 °C/min |
| Optional Ultra-Low Heating Rate | 0.1 K/h |
| Sample Chamber Dimensions | 80 cm × 200 cm |
| Power Supply | 220 V / 50 Hz, 1500 W |
| Sample Size Limit | 3 mm × 3 mm × 3 mm |
| Illumination | High-Stability LED System |
| Atmosphere Options | Ambient Air (Standard), Inert Gas (Optional) |
| Image Processing | Real-Time Digital Acquisition & Quantitative Morphometric Analysis |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CDPP-I |
| Price | USD 1,420 (FOB) |
| Wavelength | 515 nm LED |
| Range | 0–10 ppm ClO₂ |
| Resolution | 0.01 ppm (0–6 ppm), 0.1 ppm (6–10 ppm) |
| Accuracy | ±2% of reading (0–6 ppm), ±10% of reading (6–10 ppm) |
| Sample Volume | 3 mL (cuvette capacity: 5 mL) |
| Response Time | ≤3 seconds |
| Power Supply | 4 × AAA alkaline batteries |
| IP Rating | IP67 |
| Compliance | EPA Method 4500-ClO₂ D (20th ed.), CE Marked |
| Dimensions (L×W×H) | 17 × 7 × 5 cm |
| Kit Includes | DPD reagent (100 tests), four reusable quartz cuvettes, rugged carry case |
| Origin | USA |
|---|---|
| Manufacturer Type | Distributor |
| Origin Category | Imported |
| Model | CPP-1 |
| Price | USD 1,420 (est.) |
| Wavelength | 515 nm |
| Range | 0–10 ppm Cl₂ |
| Resolution | 0.01 ppm (0–6 ppm), 0.1 ppm (6–10 ppm) |
| Accuracy | ±2% of reading (0–6 ppm), ±10% of reading (6–10 ppm) |
| Sample Volume | 3 mL |
| Ingress Protection | IP67 |
| Compliance | EPA Method 334.0 (for free chlorine), CE Marked |
| Dimensions (L×W×H) | 17 × 7 × 5 cm |
| Included Accessories | 4 cuvettes, carrying case |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Micro 100 |
| Pricing | Upon Request |
| Brand | Auniontech |
|---|---|
| Model | HiCAM Fluo |
| Sensor Resolution | 1280 × 1024 pixels |
| Max Frame Rate | 4000 fps |
| Minimum Gating Width | 40 ns (FWHM) |
| Pixel Size | 6.6 × 6.6 µm |
| Cooling | Peltier-cooled Gen III Image Intensifier |
| Interface | CoaXPress v2.0 |
| Minimum Exposure Time | 2 µs |
| Gating Repetition Rate | up to 100 kHz |
| Noise Reduction | >100× vs. non-cooled intensified cameras |
| Brand | Duma Optronics |
|---|---|
| Origin | Israel |
| Model | EAC-HR |
| Aperture Diameter | 62 mm |
| Angular Resolution | 0.01 arcsec (0.1 µrad) |
| Field of View | 20′ (H) / 40′ (H) |
| Accuracy | ±1.0 arcsec |
| CCD Sensor | 1/2″ (1/3″ optional) |
| Light Source | 638 nm LED (Class 2, IEC 60825-1) |
| Focus Range | 30 cm to ∞ with boresight retention ±5 arcsec |
| Objective Thread | M67×0.75 mm |
| Collimation Mirror | Ø64 mm, mass 280 g, mounting thread Ø16 mm |
| Interface | USB 2.0, RS232, TCP/IP |
| Operating System | Windows 7 (32/64-bit) |
| Software | Native GUI + ActiveX SDK for integration |
| Brand | TOP (TP) |
|---|---|
| Origin | Tianjin, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | GY-6 |
| Power Rating | 200 W |
| Spectral Output | Intense UV and Visible Continuum + Characteristic Mercury Emission Lines (e.g., 253.7 nm, 365 nm, 404.7 nm, 435.8 nm, 546.1 nm, 577–579 nm) |
| Lamp Geometry | Spherical Arc Tube |
| Operating Position | Universal (Horizontal/Vertical) |
| Rated Lifetime | ≥1,000 hours (at rated power, with proper cooling) |
| Cooling Requirement | Forced-air or water-cooled fixture recommended |
| Brand | Easysensor |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | Planar Optode Analyzer (Model 02) |
| Imaging Resolution | 5472 × 3678 pixels |
| Lens | 20 MP Color CCD |
| Excitation/Emission Range | 400–500 nm |
| Brand | HighFinesse |
|---|---|
| Origin | Germany |
| Model | LSA |
| Wavelength Range | 350–1100 nm (standard), 200–1100 nm (UV option) |
| Measurement Accuracy | ±5 pm @ 633 nm |
| Sensitivity | 5 nJ @ 633 nm |
| Maximum Spectral Range in High-Resolution Mode | λ/30 |
| Spectral Finesse | 30,000 (single-mode fiber), 15,000 (50 µm multimode fiber) |
| First-Order Calibration Accuracy | ±1 nm |
| Relative Linewidth Measurement Accuracy | ±5 × 10⁻⁶ (single-mode fiber) |
| Repetition Rate | up to 100 Hz |
| Light Source Compatibility | CW and pulsed lasers, gas ion lamps, superluminescent diodes (SLDs), laser diodes (LDs), and light-emitting diodes (LEDs) |
| Brand | HighFinesse |
|---|---|
| Origin | Germany |
| Model | Lynceus 640 |
| Sensor Type | InGaAs Focal Plane Array |
| Spectral Range | 0.9–1.7 µm |
| Resolution | 640 × 512 pixels |
| Pixel Size | 30 × 30 µm |
| Frame Rate | 50 fps (full frame, global shutter) |
| A/D Resolution | 14 bit |
| Dynamic Range | 60 dB (1600:1, low gain) |
| Exposure Time | 40 µs – 40 ms |
| Nonlinearity | < 2% |
| Gain Options | 0.77 / 14.38 µV/e⁻ (25 °C) |
| Cooling | Passive (uncooled) |
| Interface | USB 2.0 (power + data) |
| Lens Mount | C-mount |
| Operating Temperature | 0–50 °C, non-condensing humidity |
| Dimensions | 89 × 63 × 78 mm |
| Weight | 380 g |
| Brand | HighFinesse |
|---|---|
| Origin | Germany |
| Model | WS8 |
| Spectral Range | 192–11,000 nm |
| Absolute Accuracy | ≤2 MHz (typ. @ 420–1100 nm) |
| Resolution | ≤200 kHz |
| Max. Measurement Rate | 76 kHz |
| Calibration | Internal (UV–VIS–IR), External (IR-III) |
| Operating Principle | Non-scanning Fizeau interferometer with passive thermal/pressure compensation |
| Brand | HIKVISION |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | AM1160 |
| Imaging Sensor | 12 MP CMOS |
| Illumination | Adjustable LED (Brightfield Episcopic/Oblique, Darkfield Episcopic/Oblique, Mixed, Transmitted) |
| 3D Imaging Capability | Yes |
| Depth of Field Synthesis | Up to 30 mm |
| Magnification Range | 30×–6000× |
| Motorized Axes | XYZ (dual Z: upper & lower), XY translation stage |
| Objective Turret | 4-position fully motorized |
| Operating System | Windows 10 preinstalled on integrated industrial PC (12th Gen Intel Core processor) |
| Key Software Functions | Real-time auto-focus, 2D/3D panoramic stitching, AI-assisted 3D surface reconstruction, multi-mode metrology (length, angle, area, roughness profile, step height), image/video capture, HDR enhancement, split-screen viewing |
| Brand | Hinds Instruments |
|---|---|
| Origin | USA |
| Model | 150AT |
| Retardation Range | 0.005–120+ nm (standard), up to 300+ nm (optional) |
| Retardation Resolution / Repeatability | 0.001 nm / ±0.008 nm (high-precision option) or 0.01 nm / ±0.015 nm (wide-range option) |
| Angular Resolution / Repeatability | 0.01° / ±0.05° (standard) or ±0.07° (wide-range) |
| Measurement Speed | up to 100 points per second (pps), scan time dependent on XY stage parameters |
| Spot Size | 1–3 mm native |
| Light Source Wavelength | 632.8 nm (HeNe, standard) |
| Modulation Frequency | 50 kHz or 50/60 kHz (PEMLabs™ Photoelastic Modulator) |
| Demodulation Method | Signaloc™ Lock-in Amplifier or waveform capture card |
| Measurement Units | nm (retardation), ° (fast-axis angle) |
| Dimensions (H×W×D) | 910 × 415 × 700 mm |
| Compliance | Designed for ISO/IEC 17025-aligned laboratories |
| Brand | Hinds Instruments |
|---|---|
| Origin | USA |
| Model | Mueller_Polarimeter_150XT |
| Component Category | Optical Component |
| Measurement Principle | Photoelastic Modulator (PEM)-based Full Mueller Matrix Polarimetry |
| Acquisition Speed | < 1 second per full 4×4 Mueller matrix |
| Output | 16-element Mueller matrix, linear/circular retardance, diattenuation, depolarization, optical rotation |
| Software | Exicor™ v5.x with real-time visualization and export (CSV, HDF5, MATLAB-compatible) |
| Brand | Hinds Instruments |
|---|---|
| Origin | USA |
| Model | PEM-1000 |
| Wavelength Range | 400–700 nm (expandable to 130 nm – 18 µm) |
| Stokes Parameter Accuracy | <1% |
| Stokes Parameter Sensitivity | 0.0001 |
| Measurement Rate | up to 100 complete Stokes vector sets per second (400 individual Stokes parameter values) |
| Detector Sensitivity | sub-pW optical power detection |
| Compliance | Designed for ISO/IEC 17025-aligned optical metrology labs |
| Brand | Hinds Instruments |
|---|---|
| Origin | USA |
| Model | DV-193 |
| Wavelength Range | 180–200 nm (optimized at 193 nm) |
| Measurement Principle | Dual-PEM Modulated Photoelastic Polarimetry |
| Stokes Parameter Acquisition Rate | >100 Hz |
| Accuracy (180–200 nm) | ±1% |
| Sensitivity | <0.0005 |
| Repeatability (3σ, 180–200 nm) | ≤0.01 |
| Repeatability (3σ, 200–400 nm) | ≤0.0035 |
| PEM Resonant Frequency | 37–100 kHz |
| Compliance | ASTM E284, ISO 15382, USP <857>, GLP/GMP-ready data audit trail |
| Brand | Hinds Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | PolSNAP |
| Pricing | Available Upon Request |
| Sampling Rate | 2000 samples/s |
| Stokes Parameter Accuracy | <1% |
| Repeatability | ±0.06% |
| Form Factor | Handheld (≤120 × 85 × 45 mm) |
| Interface | USB 3.0 |
| Spectral Range | 400–1100 nm (standard broadband configuration) |
| Output | Full 4-element Stokes vector (S₀, S₁, S₂, S₃) in real time |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Type | Atomic Force Microscope (AFM) |
| Model | AFM100 |
| Instrument Category | Materials-Grade AFM |
| Position Detection Noise | 0.03 nm |
| Maximum Sample Diameter | ≤35 mm |
| Maximum Sample Thickness | ≤10 mm |
| Sample Stage Travel Range | 5 mm |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Science Corporation |
| Product Type | Atomic Force Microscope (AFM) Controller |
| Model | AFM5000II / RealTune®II |
| Compliance | Designed for ISO/IEC 17025-compliant labs |
| Software Architecture | Windows-based real-time control platform with audit trail capability |
| Control Resolution | Sub-nanometer positioning accuracy |
| Vibration Noise Floor | < 0.1 nm RMS (in closed-loop mode) |
| Sample Stage Travel Range | X/Y: ±25 µm, Z: ±5 µm |
| GUI Framework | Qt-based modular interface with tabbed workflow navigation |
| 3D Rendering Engine | OpenGL-accelerated volumetric reconstruction |
| Data Format | HDF5-compliant binary + metadata-rich XML header |
| Regulatory Alignment | Supports FDA 21 CFR Part 11 electronic signature and ALCOA+ data integrity principles |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | AFM5500M II |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Position Detection Noise | ≤ 0.04 nm (High-Resolution Mode) |
| Sample Diameter | ≤ 100 mm |
| Sample Thickness | ≤ 20 mm |
| XY Stage Travel Range | 100 mm × 100 mm |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Type | Imported Equipment |
| Model | ArBlade5000 |
| Price Range | USD 135,000 – 270,000 (FOB Japan) |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Lamp Type | Xenon Arc Lamp |
| Power Rating | 150 W |
| Lifetime | ≥1,000 hours |
| Compatible Models | F-4500, F-2700, F-4600, F-7000 |
| Mounting Configuration | Internal Illumination (In-Spectrometer Housing) |
| Part Number | 250-1600 |
| Import Status | Genuine Imported Component |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | HF5000 |
| Accelerating Voltage | Up to 200 kV |
| Magnification | TEM (×200–×4,000,000), STEM (×20–×4,000,000) |
| HAADF-STEM Resolution | 0.78 Å |
| EDS Solid Angle | Up to 2.0 sr (dual-windowless silicon drift detectors) |
| Imaging Modes | TEM, STEM, SEM, Selected-Area Electron Diffraction (SAED), Convergent-Beam Electron Diffraction (CBED) |
| Brand | Hitachi High-Tech |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Technologies Corporation |
| Product Type | Imported Desktop SEM |
| Model | FlexSEM 1000 II |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 4.0 nm @ 20 kV (High Vacuum), 15.0 nm @ 1 kV (High Vacuum) |
| Backscattered Electron Resolution | 5.0 nm @ 20 kV (Low Vacuum) |
| Magnification Range | 6×–300,000× (Film Equivalent), 16×–800,000× (Display) |
| Accelerating Voltage | 0.3–20 kV |
| EDS Detector | 30 mm² Silicon Drift Detector (SDD), Nitrogen-free |
| Dimensions (Main Unit) | 450 mm (W) × 640 mm (D) |
| Power Interface | Standard IEC C13 Socket |
| System Architecture | Modular Main Unit + Detachable Power Supply Unit |
| Brand | Hitachi High-Technologies |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Technologies Corporation |
| Type | Imported |
| Model | MC1000 |
| Pricing | Upon Request |
| Max Sample Diameter | 60 mm |
| Max Sample Height | 20 mm |
| Control Interface | LCD Touchscreen |
| Memory Function | Yes |
| Optional Accessories | Thick/Large Sample Holder Kit |