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| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Ultim Max |
| Detector Type | Tilting Insertion Mount |
| Energy Resolution | 127 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Count Rate | 1,500,000 cps |
| Elemental Detection Range | Be to Cf |
| Active Detector Area | 40–170 mm² |
| Window Type | Super-Atmospheric Thin Window (SATW) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecPharma |
| Compliance | FDA 21 CFR Part 11, EU Annex 11, GxP-aligned |
| Software Platform | AZtecLive-based |
| User Authentication | Integrated Windows Active Directory / LDAP |
| Audit Trail | Immutable, timestamped, user-attributed, inspector-accessible |
| Digital Signature | Enforced per action (acquisition, processing, reporting) |
| SOP Integration | Configurable acquisition profiles with version-controlled parameters |
| Real-time EDS Imaging | Elemental mapping with live spectral overlay comparison |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | iXon 888 |
| Pixel Size | 13 µm |
| Sensor Type | Back-Illuminated Electron-Multiplying CCD |
| Quantum Efficiency | >95% (peak) |
| Cooling | Thermoelectric (−80 °C typical operating temperature) |
| Readout Modes | EMCCD and conventional CCD |
| Frame Rate | Up to 30 fps at full resolution (configurable via ROI and binning) |
| Interface | USB 3.0 |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | iXon Ultra 897 |
| Pixel Size | 16 µm |
| Readout Speed | 17 MHz (full frame) |
| Frame Rate | 56 fps (512 × 512), 595 fps (128 × 128 ROI) |
| Cooling | Thermoelectric to −100 °C |
| Quantum Efficiency | Extended back-illuminated response (EX2 technology) |
| Gain Calibration | RealGain™ and EMCAL™ |
| Interface | USB 2.0 with raw data access |
| Operating Modes | EMCCD and conventional CCD |
| Software Features | OptAcquire, iCam, Counting Conversion, Edge Suppression |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher S |
| Instrument Type | Materials-Focused AFM |
| Closed-Loop Noise (X,Y) | <0.06 nm |
| Closed-Loop Noise (Z) | <0.05 nm |
| Height Noise | <0.015 nm |
| Sample Diameter | <15 mm (standard), <7 mm (high-stability configuration) |
| XY Stage Travel Range | 180 mm × 180 mm |
| Imaging Speed | Up to 10–100× faster than conventional AFMs |
| Probe Compatibility | Supports ultra-small probes (e.g., 3 × 9 µm optical spot size, optional) |
| Environmental Flexibility | Upgradeable to Cypher ES (environmental control) and Cypher VRS (video-rate scanning) |
| Brand | Oxford Instruments |
|---|---|
| Country of Origin | Germany |
| Model | alpha300S |
| Detection Principle | Aperture-type Scanning Near-Field Optical Microscopy (SNOM) |
| Lateral Resolution | ~60 nm |
| Operating Modes | Transmission & Reflection |
| Compatible Detectors | High-sensitivity PMT & APD with overload protection |
| Integrated Spectroscopy | UHTS spectrometer compatible |
| Multimodal Capabilities | Combined AFM, Confocal Microscopy, and SNOM |
| Environmental Operation | Ambient air and liquid environments |
| Sample Preparation | Label-free, non-destructive, minimal preparation required |
| Upgrade Path | Optional integration with confocal Raman and near-field Raman imaging |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Sona 4.2B-6 |
| Image Resolution | 2048 × 2048 |
| Pixel Size | 6.5 µm × 6.5 µm |
| Sensor Dimensions | 13.3 mm × 13.3 mm |
| Onboard Memory | 1 GB |
| Readout Speed | 310 MHz |
| Dynamic Range | 34,000:1 |
| Quantum Efficiency | 95% |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | iDus |
| Effective Pixels | 1024 |
| Pixel Size | 25 µm |
| Cooling | TE-cooled to –100 °C (iDus 401/420), –95 °C (iDus 416), –90 °C (iDus 491/492) |
| Sensor Types | Back-illuminated deep-depletion CCD, front-illuminated CCD, InGaAs (1.7 µm & 2.2 µm cutoff) |
| Peak Quantum Efficiency | up to 95% (CCD), >85% (1.7 µm InGaAs), >70% (2.2 µm InGaAs) |
| Key Technology | UltraVac™ vacuum architecture, single fused-silica window, fringe suppression, open-electrode design (optional) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecTEM |
| Instrument Type | EDS Software Platform |
| Compatibility | JEOL 200 kV & 300 kV Transmission Electron Microscopes equipped with JED EDS detectors |
| Key Features | Point-and-ID analysis, LineScan, Elemental Mapping (TruMap, QuantMap), Drift Correction (AutoLock), Real-time Dynamic Imaging (AZtecLive) |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | C-RED New Space |
| Effective Pixels | 640 × 512 |
| Pixel Size | 15 µm |
| Full-Frame Frame Rate | 600 fps |
| Windowed Mode (32 × 4) | 32,066 fps |
| Read Noise | <30 e⁻ |
| Dynamic Range | 93 dB (True 16-bit mode) |
| Operating Temperature Range | -40 °C to +65 °C |
| Sensor Material | InGaAs (VGA array) |
| Cooling | Advanced passive/thermoelectric hybrid thermal management |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Newton |
| Sensor Pixel Size | 13.5 × 13.5 µm or 26 × 26 µm |
| Cooling | Thermoelectric (TE) to –100°C |
| Readout Speed | Multi-Megahertz (up to 3 MHz) |
| Quantum Efficiency | Up to 95% |
| Vacuum Technology | UltraVac™ |
| Sensor Architecture | EMCCD or conventional CCD |
| Spectral Acquisition Rate | >1600 spectra/sec (Newton 920) |
| Pixel Array Options | 1024 × 255, 2048 × 512, or 1600 × 400 |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Zyla 4.2 PLUS sCMOS |
| Image Resolution | 2048 × 2048 |
| Pixel Size | 6.5 µm |
| Sensor Area | 13 mm × 13 mm |
| Onboard Memory | 4 GB |
| Readout Speed | 540 MHz |
| Dynamic Range | 33,000:1 |
| Quantum Efficiency (QE) | 82% |
| Interface | USB 3.0 |
| Full-Frame Frame Rate | 53 fps |
| FCS ROI Frame Rate (2048 × 8) | 26,041 fps |
| Read Noise | < 1 e⁻ |
| Linearity | 99.8% |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | GetReal |
| Price Range | USD 13,500 – 68,000 |
| Instrument Type | AFM Calibration Module |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Model | alpha300 A |
| Instrument Type | Materials-Focused AFM |
| Position Detection Noise | ≤0.5 nm |
| Maximum Sample Diameter | 120 mm |
| Piezo Scanner Travel Range (X/Y) | ≤100 µm |
| Integrated Microscopy | Research-Grade Optical Microscope with Brightfield, Darkfield, Polarization & Fluorescence Capabilities |
| Scanning Technology | TrueScan™ Capacitive Feedback-Controlled Stage |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Ultim Max TLE |
| Instrument Type | Side-Insertion EDS Detector |
| Energy Resolution | 125 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Count Rate | >200,000 cps (Xplore TEM), up to 400,000 cps (Ultim Max TLE, quantitative mode) |
| Elemental Detection Range | Beryllium (Be) to Californium (Cf) |
| Active Detector Area | 80 mm² (Xplore TEM), 100 mm² (Ultim Max TLE) |
| Window Type | Windowless |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Matrix |
| Price Range | USD 320,000 – 385,000 |
| Instrument Type | Magnetic Force Microscope (MFM) Control System |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher ES EC-AFM |
| Price Range | USD 340,000 – 410,000 (FOB) |
| Instrument Type | Atomic Force Microscope (AFM), Materials-Focused |
| Position Detection Noise | 625 Hz (RMS, bandwidth-corrected) |
| Sample Dimensions | Ø < 15 mm, Thickness < 5 mm |
| XY Stage Scan Range | 180 µm × 180 µm (optical field of view), with full 180 mm × 180 mm motorized sample positioning area |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | C-Swift |
| CCD Camera Resolution | 1244 × 1024 |
| Maximum Frame Rate | 870 Hz |
| Spatial Resolution | 2 nm |
| Angular Resolution | < 0.05° |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Vero |
| Price | Upon Request |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Position Detection Noise | X&Y Sensor Noise < 60 pm, Z Sensor Noise < 50 pm |
| Sample Dimensions | Up to 15 mm in diameter, 7 mm in thickness |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Model | C-Blue One |
| Image Resolution | 0.5 MP (812 × 612), 1.7 MP (1608 × 1104), or 7.1 MP (3208 × 2200) |
| Pixel Size | 9 µm (0.5 MP & 1.7 MP variants), 4.5 µm (7.1 MP variant) |
| Sensor Diagonal | 9.6 mm (0.5 MP), 17.6 mm (1.7 MP & 7.1 MP) |
| Interface | CoaXPress 2.0 or SFP+ 10 GigE |
| Bit Depth | 14-bit |
| Quantum Efficiency | >70% @ peak (550–650 nm) |
| Read Noise | <1.5 e⁻ (typical, correlated double sampling) |
| Shutter Type | Global shutter |
| Compliance | GigE Vision v2.0, GenICam3 |
| Brand | Oxford Instruments |
|---|---|
| Origin | France |
| Model | C-RED One |
| Sensor Format | 320 × 256 |
| Pixel Size | 24 µm |
| Spectral Range | J/H/K bands (0.9–2.5 µm) |
| Readout Noise | Sub-electron |
| Max Frame Rate | 3500 fps (full frame) / 10 kHz (ROI) |
| Cooling | Integrated pulse-tube cryocooler to 90 K |
| Vacuum System | Sealed, autonomous regeneration |
| Vibration Reduction | 10× active suppression |
| Readout Modes | Global reset, rolling reset, single readout, CDS, multiple non-destructive reads (MDR) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | AZtecFeature |
| Instrument Type | Benchtop SEM-EDS System |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 1.0 nm @ 15 kV, WD = 4 mm |
| Magnification Range | 20–2,000× (low mag) |
| Accelerating Voltage | 1–30 kV |
| Backscattered Electron Resolution | 4 nm @ 30 kV (low-vacuum mode) |
| Detector Configuration | Up to four Ultim Max SDDs supported |
| Real-time Particle Counting Capacity | Up to 200,000 particles per sample |
| Data Acquisition & Quantification Engine | Tru-Q® automated elemental identification and quantification |
| Peak Deconvolution | Advanced sum-peak correction for high-count-rate accuracy |
| Software Architecture | Native 64-bit multithreaded processing |
| Compliance | ASTM E1588–10e1 (GSR), ISO 16232 (cleanliness), VDA 19.1, USP <788>, GLP/GMP-aligned audit trail support |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Marana 4.2B-11 |
| Image Resolution | 4.2 MP (2048 × 2048) |
| Pixel Size | 11 µm |
| Sensor Format | 22.5 mm × 22.5 mm (32 mm diagonal) |
| Readout Speed | 100 MHz (16-bit mode) |
| Dynamic Range | 53,000:1 |
| Quantum Efficiency | 95% @ peak (600 nm) |
| Cooling | -45 °C (thermo-electric vacuum-sealed) |
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