- All
- Favorite
- Popular
- Most rated
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Ultim Max |
| Detector Type | Tilting Insertion Mount |
| Energy Resolution | 127 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Count Rate | 1,500,000 cps |
| Elemental Detection Range | Be to Cf |
| Active Detector Area | 40–170 mm² |
| Window Type | Super-Atmospheric Thin Window (SATW) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecPharma |
| Compliance | FDA 21 CFR Part 11, EU Annex 11, GxP-aligned |
| Software Platform | AZtecLive-based |
| User Authentication | Integrated Windows Active Directory / LDAP |
| Audit Trail | Immutable, timestamped, user-attributed, inspector-accessible |
| Digital Signature | Enforced per action (acquisition, processing, reporting) |
| SOP Integration | Configurable acquisition profiles with version-controlled parameters |
| Real-time EDS Imaging | Elemental mapping with live spectral overlay comparison |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher S |
| Instrument Type | Materials-Focused AFM |
| Closed-Loop Noise (X,Y) | <0.06 nm |
| Closed-Loop Noise (Z) | <0.05 nm |
| Height Noise | <0.015 nm |
| Sample Diameter | <15 mm (standard), <7 mm (high-stability configuration) |
| XY Stage Travel Range | 180 mm × 180 mm |
| Imaging Speed | Up to 10–100× faster than conventional AFMs |
| Probe Compatibility | Supports ultra-small probes (e.g., 3 × 9 µm optical spot size, optional) |
| Environmental Flexibility | Upgradeable to Cypher ES (environmental control) and Cypher VRS (video-rate scanning) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecTEM |
| Instrument Type | EDS Software Platform |
| Compatibility | JEOL 200 kV & 300 kV Transmission Electron Microscopes equipped with JED EDS detectors |
| Key Features | Point-and-ID analysis, LineScan, Elemental Mapping (TruMap, QuantMap), Drift Correction (AutoLock), Real-time Dynamic Imaging (AZtecLive) |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | GetReal |
| Price Range | USD 13,500 – 68,000 |
| Instrument Type | AFM Calibration Module |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Model | alpha300 A |
| Instrument Type | Materials-Focused AFM |
| Position Detection Noise | ≤0.5 nm |
| Maximum Sample Diameter | 120 mm |
| Piezo Scanner Travel Range (X/Y) | ≤100 µm |
| Integrated Microscopy | Research-Grade Optical Microscope with Brightfield, Darkfield, Polarization & Fluorescence Capabilities |
| Scanning Technology | TrueScan™ Capacitive Feedback-Controlled Stage |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Ultim Max TLE |
| Instrument Type | Side-Insertion EDS Detector |
| Energy Resolution | 125 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Count Rate | >200,000 cps (Xplore TEM), up to 400,000 cps (Ultim Max TLE, quantitative mode) |
| Elemental Detection Range | Beryllium (Be) to Californium (Cf) |
| Active Detector Area | 80 mm² (Xplore TEM), 100 mm² (Ultim Max TLE) |
| Window Type | Windowless |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Matrix |
| Price Range | USD 320,000 – 385,000 |
| Instrument Type | Magnetic Force Microscope (MFM) Control System |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher ES EC-AFM |
| Price Range | USD 340,000 – 410,000 (FOB) |
| Instrument Type | Atomic Force Microscope (AFM), Materials-Focused |
| Position Detection Noise | 625 Hz (RMS, bandwidth-corrected) |
| Sample Dimensions | Ø < 15 mm, Thickness < 5 mm |
| XY Stage Scan Range | 180 µm × 180 µm (optical field of view), with full 180 mm × 180 mm motorized sample positioning area |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | C-Swift |
| CCD Camera Resolution | 1244 × 1024 |
| Maximum Frame Rate | 870 Hz |
| Spatial Resolution | 2 nm |
| Angular Resolution | < 0.05° |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Vero |
| Price | Upon Request |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Position Detection Noise | X&Y Sensor Noise < 60 pm, Z Sensor Noise < 50 pm |
| Sample Dimensions | Up to 15 mm in diameter, 7 mm in thickness |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | AZtecFeature |
| Instrument Type | Benchtop SEM-EDS System |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 1.0 nm @ 15 kV, WD = 4 mm |
| Magnification Range | 20–2,000× (low mag) |
| Accelerating Voltage | 1–30 kV |
| Backscattered Electron Resolution | 4 nm @ 30 kV (low-vacuum mode) |
| Detector Configuration | Up to four Ultim Max SDDs supported |
| Real-time Particle Counting Capacity | Up to 200,000 particles per sample |
| Data Acquisition & Quantification Engine | Tru-Q® automated elemental identification and quantification |
| Peak Deconvolution | Advanced sum-peak correction for high-count-rate accuracy |
| Software Architecture | Native 64-bit multithreaded processing |
| Compliance | ASTM E1588–10e1 (GSR), ISO 16232 (cleanliness), VDA 19.1, USP <788>, GLP/GMP-aligned audit trail support |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Unity |
| Mounting Type | Side-entry (inclined insertion) |
| Detector Architecture | Integrated Backscattered Electron (BSE) and Energy-Dispersive X-ray (EDS) Sensor Assembly |
| Positioning | Mounted directly beneath the objective lens pole piece |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Ultim Extreme |
| Instrument Type | Multi-Detector Configuration |
| Energy Resolution | 127 eV (Mn Kα) |
| Peak-to-Background Ratio | 20,000:1 |
| Maximum Count Rate | 500,000 cps |
| Elemental Detection Range | Li to Bi |
| Detector Active Area | 100 mm² |
| Window Type | Windowless |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | TKD |
| Price Range | USD 1,400 – 7,000 |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Model | Cypher VRS |
| Instrument Type | Material-Focused Atomic Force Microscope |
| XY Positional Noise | <60 pm |
| Z Positional Noise | <50 pm |
| Maximum Sample Diameter | ≤15 mm |
| Maximum Sample Thickness | ≤7 mm |
| Sample Stage Travel Range | 180 mm × 180 mm |
| Scan Speed | Up to 625 lines/sec |
| Frame Rate | >10 fps at 512×512 pixel resolution |
| Excitation Method | blueDrive™ Photothermal Actuation |
| Compliance | ASTM E2539, ISO/IEC 17025-compatible operation, GLP/GMP-ready data integrity architecture |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Xplore15 / Xplore30 |
| Detector Geometry | Tilting (Side-entry) |
| Energy Resolution | 129 eV @ 100,000 cps |
| Peak-to-Background Ratio | 20,000:1 |
| Maximum Count Rate | 1,000,000 cps |
| Elemental Detection Range | Boron (B) to Californium (Cf) |
| Active Crystal Area | 15 mm² or 30 mm² |
| Window Type | Super-Atmospheric Thin Window (SATW) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecWave |
| Detector Type | Wavelength Dispersive Spectrometer (WDS) with Integrated EDS Compatibility (Ultim Max) |
| Roland Circle Radius | 210 mm |
| Energy Resolution | <10 eV (Mn Kα, typical) |
| Detection Limit | <100 ppm (matrix-dependent) |
| Peak-to-Background Ratio | >10,000:1 (typical for major elements) |
| Optical Geometry | Focusing Johann-type spectrometer with bent crystals |
| Incident Slit | Motorized, variable width |
| Installation | Tilt-mounted for minimal working distance dependency |
| Software Platform | AZtecWave v4.x or later |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Symmetry S3 |
| CCD Camera Resolution | 1244 × 1024 pixels |
| Maximum Acquisition Speed | 870 Hz (≥5700 patterns per second at 156 × 128 binning) |
| Spatial Resolution | 2 nm |
| Angular Resolution | <0.1° |
| Optical System | Lensless fiber-optic coupling |
| Sensor | Custom EBSD-optimized CMOS |
| Pattern Distortion | <1 pixel (sub-pixel guaranteed) |
| Sensitivity | up to 1000 pps/nA |
| Fluorescent Screen Travel Range | ±22 mm motorized vertical adjustment |
| Collision Protection | Patented proximity sensor system |
| Optional FSD | 5-diode front-scatter detector system |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Xplore TEM |
| Instrument Type | Side-entry (tilt-compatible) EDS system for TEM |
| Energy Resolution | 125 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Input Count Rate | 200,000 cps |
| Elemental Detection Range | Beryllium (Be) to Californium (Cf) |
| Detector Active Area | 80 mm² |
| Window Type | Windowless (ultra-thin polymer support) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecBattery |
| Detector Compatibility | Ultim Max / Xplore / UltimExtreme EDS detectors |
| Maximum Field Count | 10,000 fields per sample |
| Max Particle Count | 200,000 particles per sample |
| Throughput | Up to 30,000 particles/hour |
| EDS Count Rate Capability | Up to 400 kcps |
| Effective Detector Area | Up to 170 mm² |
| Software-Enabled Capabilities | Automated particle detection, multi-threshold contrast segmentation, morphology-based filtering, Z-focus stabilization across large-area scans, cross-field particle reconstruction, customizable classification logic, ASTM/ISO-compliant reporting templates, FDA 21 CFR Part 11-ready audit trail (optional configuration) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Ultim Extreme Infinity ∞ |
| Quotation | Upon Request |
| Detector Type | Sidewall-Insertion (Side-Entry) |
| Energy Resolution | C Ka ≤ 46 eV @ 50,000 cps |
| Elemental Range | Li (Z=3) to Cf (Z=98) |
| Window Type | Windowless |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | blueDrive |
| Price Range | USD 13,500 – 68,000 |
| Instrument Type | AFM Accessory |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | OmniGIS II |
| Gas Port Configuration | Single-port, multi-source compatible |
| Gas Capacity | Up to 3 primary gas sources + 2 auxiliary gases |
| Control Architecture | Pressure-feedback regulated flow control |
| Vacuum Compatibility | Adaptive operation across wide chamber pressure range (10⁻⁷ mbar to 10⁻¹ mbar) |
| Integration | Designed for SEM and FIB platforms |
| Compliance | CE-marked |
| Software Interface | Native integration with AZtec GIS Control Suite (v5.0+) |
Show next