- All
- Favorite
- Popular
- Most rated
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher S |
| Instrument Type | Materials-Focused AFM |
| Closed-Loop Noise (X,Y) | <0.06 nm |
| Closed-Loop Noise (Z) | <0.05 nm |
| Height Noise | <0.015 nm |
| Sample Diameter | <15 mm (standard), <7 mm (high-stability configuration) |
| XY Stage Travel Range | 180 mm × 180 mm |
| Imaging Speed | Up to 10–100× faster than conventional AFMs |
| Probe Compatibility | Supports ultra-small probes (e.g., 3 × 9 µm optical spot size, optional) |
| Environmental Flexibility | Upgradeable to Cypher ES (environmental control) and Cypher VRS (video-rate scanning) |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | GetReal |
| Price Range | USD 13,500 – 68,000 |
| Instrument Type | AFM Calibration Module |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Model | alpha300 A |
| Instrument Type | Materials-Focused AFM |
| Position Detection Noise | ≤0.5 nm |
| Maximum Sample Diameter | 120 mm |
| Piezo Scanner Travel Range (X/Y) | ≤100 µm |
| Integrated Microscopy | Research-Grade Optical Microscope with Brightfield, Darkfield, Polarization & Fluorescence Capabilities |
| Scanning Technology | TrueScan™ Capacitive Feedback-Controlled Stage |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Matrix |
| Price Range | USD 320,000 – 385,000 |
| Instrument Type | Magnetic Force Microscope (MFM) Control System |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher ES EC-AFM |
| Price Range | USD 340,000 – 410,000 (FOB) |
| Instrument Type | Atomic Force Microscope (AFM), Materials-Focused |
| Position Detection Noise | 625 Hz (RMS, bandwidth-corrected) |
| Sample Dimensions | Ø < 15 mm, Thickness < 5 mm |
| XY Stage Scan Range | 180 µm × 180 µm (optical field of view), with full 180 mm × 180 mm motorized sample positioning area |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Vero |
| Price | Upon Request |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Position Detection Noise | X&Y Sensor Noise < 60 pm, Z Sensor Noise < 50 pm |
| Sample Dimensions | Up to 15 mm in diameter, 7 mm in thickness |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Model | Cypher VRS |
| Instrument Type | Material-Focused Atomic Force Microscope |
| XY Positional Noise | <60 pm |
| Z Positional Noise | <50 pm |
| Maximum Sample Diameter | ≤15 mm |
| Maximum Sample Thickness | ≤7 mm |
| Sample Stage Travel Range | 180 mm × 180 mm |
| Scan Speed | Up to 625 lines/sec |
| Frame Rate | >10 fps at 512×512 pixel resolution |
| Excitation Method | blueDrive™ Photothermal Actuation |
| Compliance | ASTM E2539, ISO/IEC 17025-compatible operation, GLP/GMP-ready data integrity architecture |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | blueDrive |
| Price Range | USD 13,500 – 68,000 |
| Instrument Type | AFM Accessory |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Jupiter Discovery AFM |
| Pricing | Available Upon Request |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | Cypher VRS1250 |
| Instrument Type | Materials-Focused Atomic Force Microscope |
| Position Detection Noise | X&Y < 60 pm |
| Sample Dimensions | Ø ≤ 15 mm, Thickness ≤ 7 mm |
| Stage Travel Range | 180 mm × 180 mm |
| Software | SmartScan |
| Environmental Compatibility | Fully compatible with Cypher ES environmental control system (temperature-controlled sample stage: –30 °C to +250 °C) |
| Excitation Method | blueDrive™ photothermal excitation |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Jupiter XR |
| Price Range | USD 320,000 – 385,000 |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Position Detection Noise | 35 pm |
| Maximum Sample Diameter | 210 mm |
| XY Stage Travel Range | 200 mm × 200 mm |
| Scan Range | Up to 100 μm (full closed-loop) |
| Imaging Speed | 5–20× faster than conventional large-sample AFMs |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Scanning Microwave Impedance Microscopy (sMIM) |
| Instrument Type | Scanning Probe Microscope |
| Application Domain | Nanoscale Electrical Characterization |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher ES Polymer Edition |
| Price Range | USD 420,000 – 700,000 (est.) |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science |
| Position Detection Noise | 625 Hz |
| Sample Dimensions | Ø < 15 mm, Thickness < 5 mm |
| Stage Travel Range | 180 mm × 180 mm |
| Environmental Control | Sealed fluid/gas chamber compatible |
| Temperature Control Range | 0–250 °C |
| Nanomechanical Capabilities | Integrated NanoMechPro toolkit (Force Modulation, Contact Resonance, and HarmoniX™) |
| Excitation Method | blueDrive photothermal excitation for tapping mode |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MFP-3D |
| Price Range | USD 135,000 – 205,000 (FOB) |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Z-Axis Positioning Noise | < 0.06 nm (RMS, in air) |
| X/Y Closed-Loop Scanning Noise | < 0.5 nm (RMS) |
| Sample Diameter | ≤ 80 mm |
| Sample Thickness | ≤ 25 mm |
| Visual Field of View | 200 mm × 200 mm (XY stage travel with optical alignment) |
Show next