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| Brand | Otsuka |
|---|---|
| Origin | Japan |
| Model | ELSZ-2000 |
| Dispersion Method | Dry & Wet |
| Instrument Type | Laboratory Laser Particle Analyzer |
| Measurement Range | 0.1 nm – 10 µm |
| Repeatability | <5% |
| Measurement Time | 3 min |
| Zeta Potential Range | ±200 mV |
| Temperature Control | 0–90 °C (0.1 °C resolution) |
| Detection Principle | Electrophoretic Light Scattering (ELS), Dynamic Light Scattering (DLS), Static Light Scattering (SLS) |
| Laser Sources | Dual semiconductor lasers (660 nm, 30 mW & 70 mW) |
| Detector | High-sensitivity APD |
| Sample Compatibility | Liquid suspensions, planar solid surfaces (15 mm × 35 mm), high-concentration dispersions |
| Molecular Weight Range | 360 – 20,000,000 Da (Mw) |
| pH Titration Capability | 1–13, 0.1 µL resolution, triple independent syringe system |
| Brand | Otsuka Electronics |
|---|---|
| Origin | Japan |
| Model | OPTM |
| Measurement Principle | Spectral Interferometry |
| Optical Range | UV–NIR (e.g., 200–1100 nm) |
| Measurement Speed | <1 sec per point |
| Sample Stage | Motorized Auto XY Stage (standard) |
| Reflectance Accuracy | High-fidelity absolute reflectance measurement |
| Output Data | Film thickness (nm), refractive index (n), extinction coefficient (k) |
| Compliance | Designed for ISO/IEC 17025-aligned QC environments, supports GLP/GMP traceability workflows |
| Customization | Optional embedded probe head, fixed-stage configurations, user-defined measurement sequences |
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