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| Brand | Otsuka Electronics |
|---|---|
| Origin | Japan |
| Model | OPTM |
| Measurement Principle | Spectral Interferometry |
| Optical Range | UV–NIR (e.g., 200–1100 nm) |
| Measurement Speed | <1 sec per point |
| Sample Stage | Motorized Auto XY Stage (standard) |
| Reflectance Accuracy | High-fidelity absolute reflectance measurement |
| Output Data | Film thickness (nm), refractive index (n), extinction coefficient (k) |
| Compliance | Designed for ISO/IEC 17025-aligned QC environments, supports GLP/GMP traceability workflows |
| Customization | Optional embedded probe head, fixed-stage configurations, user-defined measurement sequences |
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