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| Brand | Pyreos |
|---|---|
| Origin | United Kingdom |
| Model | PYR-TP Series (Thin-Film PZT) |
| Detector Material | Lead Zirconate Titanate (PZT) Ferroelectric Film |
| Film Thickness | 1 µm |
| Spectral Range | 1.2–20 µm |
| Detectivity (D*) | >1 × 10⁹ cm·√Hz/W @ 10 Hz (typ.), ~3.5 × 10⁸ cm·√Hz/W @ 10 Hz (1 mm × 1 mm element) |
| Responsivity | Up to 150,000 V/W @ 500 K, 10 Hz |
| Noise Equivalent Power (NEP) | ~0.4 mV·√Hz/W |
| Response Time | <5 ms (bandwidth up to 3.3 kHz) |
| Curie Temperature | ~600 °C |
| Operating Temperature Range | –40 °C to +85 °C (uncooled) |
| Pixel Configurations | Single-point, 128×1, 128×2, 512×1 linear arrays |
| Active Area Options | 150 µm × 150 µm to 3 mm × 2 mm |
| Filter Integration | Optional integrated linear variable filters (LVF) for NIR: 1.3–3.2 µm |
| MIR/FIR | 2–20 µm |
| Compliance | RoHS, REACH, ISO 9001-manufactured |
| Brand | Moxtek |
|---|---|
| Origin | USA |
| Model | Monoblock |
| Tube Type | Metal-Ceramic |
| Target Materials | Ag, W, Pd, Rh |
| Operating Voltage Range | 10–50 kV |
| Current Range | 0–0.2 mA |
| Max Output Power | 10 W |
| Focal Spot Size | 400 µm |
| Stability | < 1.0% RSD |
| Beryllium Window Thickness | 0.25 mm |
| Max Input Power | 20 W |
| Operating Temperature | −10 °C to +50 °C |
| Storage Temperature | −40 °C to +60 °C |
| Weight | 500 g |
| Compliance | RoHS, CE (per IEC 61010-1), FDA 21 CFR Part 1020.40 (X-ray equipment) |
| Brand | Moxtek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | TUB00046 |
| Voltage Range | ±4–40 kV |
| Current Range | 0–100 µA |
| Max Power Output | 4 W |
| Anode Target Options | Tungsten (W), Rhodium (Rh), Copper (Cu) |
| Focal Spot Size | 300 µm |
| HV Cable Length Options | 1–11.5 inches |
| Warranty | 12 months |
| Brand | StellarNet |
|---|---|
| Origin | USA |
| Model | Blue-Wave |
| Spectral Range | 280–900 nm |
| Detector Type | CCD |
| Optical Resolution | 0.75–6 nm (FWHM) |
| Sensitivity | 100 photons/count at 400 nm |
| Signal-to-Noise Ratio | 1000:1 (full well) |
| Dynamic Range | 2000:1 (6 decades) |
| Stray Light | 0.02% at 435 nm |
| Brand | Andor |
|---|---|
| Origin | United Kingdom |
| Model | SR-750 |
| Focal Length | 500 mm |
| F/# | F/9.7 |
| Wavelength Range | 300–500 nm |
| Spectral Resolution | 0.02 nm @ 2400 grooves/mm, 300 nm |
| Wavelength Accuracy | ±0.03 nm |
| Wavelength Repeatability | ±10 pm |
| Stray Light Suppression | ≤2.6×10⁻⁵ |
| Grating Size | 68 mm × 68 mm |
| Dispersion | 2.6 nm/mm (at 300 nm, 2400 g/mm) |
| Slit Input Options | 1 or 2 |
| Detector Output Ports | 1 or 2 CCD ports + optional slit output |
| 焦平面尺寸 | 28 mm × 14 mm |
| Grating Turret | 3-position, fully documented per unit |
| Brand | SRS/Stanford Research Systems |
|---|---|
| Origin | USA |
| Model | DS345 |
| Frequency Range | 1 µHz to 30.2 MHz |
| Frequency Resolution | 1 µHz |
| Waveforms | Sine, Square, Ramp, Triangle, Noise |
| Modulation Types | AM, FM, Phase Modulation, Burst, Linear/Logarithmic Sweep |
| Arbitrary Waveform Memory | 16,300 points |
| Sample Rate | 40 MSa/s |
| Reference Input | 10 MHz |
| Optional Interfaces | RS-232, GPIB |
| Brand | ARS |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Helitran Series |
| Pricing | Available Upon Request |
| Temperature Range | 2 K – 350 K (with He-4) or 77 K – 350 K (with LN₂) |
| Cooling Method | Open-cycle helium or liquid nitrogen cryogen flow |
| Control System | Integrated temperature sensor and resistive heater subsystem |
| Vacuum Enclosure | Included with radiation shield |
| Sample Mounting | Modular sample stage options available |
| Brand | Andor |
|---|---|
| Origin | Israel |
| Model | SR193i |
| Application Systems | Transmission & Reflection Spectroscopy |
| Grating Configuration | Dual-grating turret |
| Spectral Resolution | 0.21 nm @ 1200 g/mm, 500 nm |
| Dispersion | 2.6 nm/mm |
| Wavelength Range | 200–1100 nm |
| F/# | 3.6 |
| Wavelength Accuracy | ±0.2 nm |
| Stray Light | 1.5 × 10⁻⁴ |
| Focal Length | 193 mm |
| Imaging Optics | Aplanatic toroidal mirrors |
| Spectral Reproducibility | ±75 pm |
| Grating Turret | RFID-enabled, quick-release dual-grating turret |
| Detector Compatibility | Dual-output port for simultaneous CCD/EMCCD or sCMOS detector coupling |
| Slit Output Option | Configurable monochromator mode |
| Microscope Integration | C-mount and SM1-threaded interfaces compliant |
| Origin | Taiwan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Domestic Product Classification | Yes |
| Model | MK350N Premium |
| Price Range | USD 2,800 – 7,000 |
| Brand | WITec |
|---|---|
| Origin | Germany |
| Model | Alpha 300S |
| Spectral Range | 90–9000 cm⁻¹ |
| Spectral Resolution | ≤0.2 cm⁻¹ |
| Spatial Resolution | Lateral 350 nm, Axial 800 nm |
| Minimum Wavenumber | 10 cm⁻¹ |
| Spectral Reproducibility | ≤±0.02 cm⁻¹ |
| Brand | Andor |
|---|---|
| Origin | United Kingdom |
| Model | SR-163 |
| Optical Design | Czerny-Turner |
| Focal Length | 163 mm |
| F/# | f/3.6 |
| Wavelength Range | 300–500 nm |
| Spectral Resolution | 0.08 nm @ 2400 grooves/mm, 300 nm |
| Wavelength Accuracy | ±0.25 nm |
| Wavelength Repeatability | ±0.05 nm |
| Stray Light | ≤0.3% T |
| Dispersion | 2.0 nm/mm (with specified grating) |
| Entrance Slit Options | Multiple fixed and adjustable slit widths |
| Grating Mount | Dual-grating turret (standard), up to 3 gratings optional |
| Detector Compatibility | Full integration with Andor CCD, ICCD, and EMCCD cameras |
| Imaging Plane Dimensions | 28 mm × 10 mm |
| Grating Size | 40 mm × 40 mm |
| Coupling Options | SMA fiber port, kinematic flange, motorized shutter, dynamic slit, silver-coated optics (SR-163-SIL variant) |
| Brand | Spectral Industries |
|---|---|
| Origin | Netherlands |
| Model | SPECTRAL LIBS |
| Type | Online, Integrated |
| Spectrometer | IRIS Echelle (UV/Deep-UV & NIR) |
| Laser | Actively Q-Switched Nanosecond Pulsed |
| Spectral Range | 180–800 nm & 880–1100 nm (N₂-purged option for DUV) |
| Resolution | 0.1–0.45 nm (@ 180–800 nm, 25 µm slit) |
| F/# | f/2 |
| Delay Jitter | <10 ns |
| Working Distance | 50–500 mm (customizable) |
| Spot Size | ≤100 µm |
| Detector | Deep-UV-enhanced CMOS, Integration Time: 28 µs – 30 s |
| Stage | Motorized 3-Axis Translation (50 × 50 mm travel) |
| Software | Full Hardware Control + MATLAB-Based Data Processing & Visualization |
| Brand | ARS |
|---|---|
| Origin | USA |
| Model | Displex Series |
| Type | Two-Stage & Single-Stage Cryocoolers |
| Cooling Principle | Gifford-McMahon (GM) Cycle |
| Operating Voltage | 110 V / 60 Hz (performance reduced ~20% at 220 V / 50 Hz) |
| Compliance | Designed for integration with spectroscopic, magneto-optical, and quantum transport measurement systems |
| Key | Two-stage models reach ≤4.2 K |
| Key | Refrigeration power ranges from 40 mW @ 2 K (DE-202-1.7) to 210 W @ 150 K (DE-110) |
| Key | Typical base temperature stability: ±10 mK over 24 h (with optional PID-controlled heater & calibrated RuO₂ sensor) |
| Key | Vacuum-compatible stainless-steel cold head, all-metal seals, ISO-KF 63 vacuum flange standard |
| Key | Integrated temperature controller with 4-wire RTD/RuO₂ input, programmable ramp rates, and setpoint hold function |
| Brand | Andor |
|---|---|
| Origin | United Kingdom |
| Model | SR-303i |
| Application Systems | Transmission & Reflectance Spectroscopy |
| Grating Turret | Triple-grating (motorized) |
| Spectral Resolution | 0.08 nm @ 2400 g/mm, 300 nm |
| Dispersion | 2.2 nm/mm |
| Wavelength Range | 303–800 nm |
| F-number | F/4 |
| Wavelength Accuracy | ±0.04 nm |
| Stray Light Rejection | ≤0.3% T (typical), <2.2×10⁻⁵ (peak-to-valley) |
| Focal Length | 303 mm |
| Image Plane Dimensions | 28 mm × 14 mm |
| Slit Width Range | Motorized dynamic slit, up to 12 mm |
| Weight | 20 kg |
| Dimensions (L×W×H) | 394 × 238 × 208 mm |
| Brand | Andor |
|---|---|
| Origin | United Kingdom |
| Detector Types | PMT (185–900 nm), Si Photodiode (200–1100 nm), InGaAs (800–1900 nm), PbS (800–2900 nm), InSb (1–5.5 µm), MCT (2–12 µm) |
| Power Supply | High-Voltage PMT Driver |
| Data Acquisition | Single-Photon Counting Module & Analog Digitizer |
| Accessories | Sample Chambers, Filter Wheels, Fiber-Optic Coupling Kits |
| Brand | Andor |
|---|---|
| Origin | United Kingdom |
| Model | SR303i |
| Spectral Range | 303–800 nm |
| F/# | F/4 |
| Wavelength Accuracy | ±0.04 nm |
| Wavelength Repeatability | ±0.004 nm |
| Spectral Resolution | 0.08 nm @ 2400 grooves/mm, 300 nm |
| Dispersion | 2.2 nm/mm |
| Stray Light Suppression | ≤2.2×10⁻⁵ |
| Grating Configuration | Triple-grating turret |
| Input/Output Ports | Configurable (1 or 2 CCD outputs, motorized slit) |
| 焦平面尺寸 | 28 mm × 14 mm |
| Grating Size | 68 mm × 68 mm |
| Slit Width | Dynamic, up to 12 mm |
| Brand | Andor |
|---|---|
| Origin | United Kingdom |
| Model | SR193i |
| Spectral Range | 200–1100 nm |
| F/# | 3.6 |
| Spectral Resolution | 0.21 nm @ 1200 g/mm, 500 nm |
| Dispersion | 2.6 nm/mm |
| Wavelength Accuracy | ±0.2 nm |
| Stray Light | 1.5 × 10⁻⁴ |
| Grating Configuration | Dual-grating turret with RFID-enabled auto-identification |
| Optical Design | Imaging-corrected with toroidal mirrors |
| Detector Interfaces | Dual-output ports for simultaneous UV–NIR CCD/EMCCD/ICCD and InGaAs array or single-point detectors |
| Optional Coating | Silver-coated optics for enhanced NIR/SWIR throughput |
| Interface | USB 2.0, plug-and-play |
| Software Integration | Micro-Manager SDK-compatible spectral acquisition and analysis suite |
| Brand | Andor |
|---|---|
| Origin | United Kingdom |
| Model | SR-500i |
| Spectral Resolution | 0.05 nm |
| Wavelength Range | 180 nm – IR |
| Dispersion | 1.44 nm/mm |
| F/# | f/6.5 |
| Wavelength Accuracy | ±0.04 nm |
| Stray Light | 2.6 × 10⁻⁵ |
| Grating Configuration | Triple-grating turret |
| Focal Length | 500 mm |
| Entrance/Exit Ports | Up to 2 input and 2 output ports |
| Image Plane Dimensions | 28 mm × 14 mm |
| Physical Dimensions | 550 mm × 343 mm × 206.5 mm |
| Brand | ZOLIX |
|---|---|
| Origin | Beijing, China |
| Model | Omni-iSpecT Fiber-Coupled Raman Spectroscopy System |
| Laser Options | 532 nm (100 mW), 785 nm (350 mW) |
| Raman Shift Range | 200–4000 cm⁻¹ (532 nm) |
| Spectral Resolution | <10 cm⁻¹ (typical, @50 µm slit) |
| CCD Detector | Back-illuminated deep-depletion CCD, 2000 × 256 pixels, 15 µm pixel size, -60 °C cooling, read noise <5 e⁻/pixel |
| Probe Working Distance | 3 mm / 7 mm (standard), customizable |
| Operating Temperature | 0–325 °C (customizable up to 400 °C) |
| Max Pressure Rating | 6000 psi |
| Probe Material | Hard-anodized aluminum + 316 stainless steel |
| Sealing | Perfluoroelastomer (FFKM) O-rings standard |
| Fiber Core | 100/100 µm (standard), SMA/MPO/10 mm cylindrical interface |
| Optical Throughput | F/1.8 (532 nm), F/2.3 (785 nm) |
| Grating | 1800 l/mm VPH (532 nm), 1200 l/mm VPH (785 nm) |
| Weight | 5.0 kg (spectrometer), 5.8 kg (full system) |
| Brand | Teledyne Judson |
|---|---|
| Wavelength Range | 0.8–2.6 µm |
| Cutoff Wavelength Options | 1.9 µm, 2.2 µm, 2.4 µm, 2.6 µm |
| Cooling Options | Single- to Quad-Stage Thermoelectric (TE) Coolers |
| Detector Type | Extended-InGaAs Photodiode |
| Operating Temperature Range | –40 °C to +60 °C (uncooled) |
| Responsivity | Up to 1.8 A/W @ 1.55 µm (typical, dependent on cutoff) |
| Rise Time | <10 ns (standard TO-8 package, bias-dependent) |
| Active Area Diameter | 0.3 mm to 5.0 mm (model-dependent) |
| Package Types | TO-8, TO-46, 14-pin DIP, and custom hermetic housings |
| Brand | Moxtek |
|---|---|
| Origin | USA |
| Model | XPIN-BT |
| Active Area | 6 mm² or 13 mm² |
| Silicon Thickness | 625 µm |
| Beryllium Window Thickness | 8 µm or 25 µm |
| Collimator Materials | Tungsten / Cobalt / Titanium / Aluminum |
| Energy Resolution (FWHM) | < 170 eV (6 mm²), < 230 eV (13 mm²) |
| Peak-to-Background Ratio | 3600:1 @ 1 keV (6 mm², typical), 3000:1 @ 1 keV (13 mm², typical) |
| Origin | Imported |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Model | NeoSpectra Micro |
| Price | USD 1,400 (FOB) |
| Wavelength Range | 1250–2500 nm |
| Optical Resolution (FWHM @ 1550 nm) | 8 nm or 16 nm |
| SNR (2-s scan, 16-nm res.) | 1000:1 @ 2050 nm |
| Operating Temperature | −5 to +40 °C |
| Wavelength Accuracy | ±1.5 nm @ 1400 nm (<40 °C) |
| Wavelength Repeatability | ±0.1 nm @ 1400 nm, 0.5 A.U., 16-nm res. |
| PSD Sensitivity Threshold | > max PSD/10 |
| Configuration | Reflectance (Rx) or Transmission (Tx) compatible |
| Brand | ZOLIX |
|---|---|
| Model | Lifetime Aging Test System |
| Type | Integrated Automated OLED Degradation Monitoring Platform |
| Origin | Beijing, China |
| Power Supply | 5 kW / 380 V AC |
| Temperature Range Options | −40 °C to 150 °C, −20 °C to 150 °C, or 0 °C to 150 °C |
| Heating Rate | 2–4 °C/min (nonlinear, no-load) |
| Cooling Rate | 0.7–1.0 °C/min (nonlinear, no-load) |
| Temp. Resolution | ±0.01 °C |
| Humidity Range | 20–98% RH (within 25–85 °C) |
| Humidity Resolution | ±0.1% RH |
| Temp. Uniformity | ±2.0 °C |
| Temp. Stability | ±0.5 °C |
| Humidity Stability | ±2.0% RH |
| Humidity Deviation | ±3% RH (at >75% RH) |
| Channel Configurations | Up to 128 independent current/voltage monitoring channels |
| Control Interface | Touchscreen HMI with programmable temperature/humidity profiles |
| Compliance | Designed for GLP-aligned operational traceability and ASTM D7602-22 (Standard Practice for Accelerated Aging of Organic Light-Emitting Diode Devices) support |
| Brand | Teledyne Judson |
|---|---|
| Type | Mercury Cadmium Telluride (HgCdTe) Detector |
| Detector Architecture | Photovoltaic (PV) and Photoconductive (PC) |
| Spectral Range (PV) | 0.5–5.5 µm (cutoff options: 2.8 µm, 5.0 µm, 5.5 µm) |
| Spectral Range (PC) | 2–26 µm (cutoff options: 5 µm, 12 µm, 26 µm) |
| Cooling Requirement | Liquid nitrogen (77 K) or thermoelectric (TE) stabilization |
| Active Area Options | 0.1 × 0.1 mm to 2 × 2 mm |
| ROIC Compatibility | Available with integrated preamplifiers and hybridized readout ICs for focal plane array (FPA) integration |
| Compliance | RoHS-compliant packaging |
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