LANScientific
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| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | TrueX 1000 |
| Application | Field-Portable |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Use | Cultural Heritage & Archaeological Science |
| Elemental Range | Mg (12) to U (92) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Country of Origin | Domestic (China) |
| Model | LIBS 830C |
| Instrument Type | Handheld |
| Technology | Laser-Induced Breakdown Spectroscopy (LIBS) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Category | Atmospheric Heavy Metal Analyzer |
| Model | AOA 200 |
| Measurement Principle | X-ray Fluorescence (XRF) Spectrometry combined with β-ray Absorption and Automated Airborne Particulate Enrichment |
| Measurement Range | Heavy Metals: 0–100 µg/m³ |
| PM₂.₅/PM₁₀ Mass Concentration | 0–10 mg/m³ |
| Detection Limits | Heavy Metals: sub-ng/m³ level (1-hour sampling at 16.7 L/min) |
| Particulate Matter | <1 µg/m³ (24-hour average) |
| Filter Cartridge Lifetime | ~30 days under continuous hourly sampling mode |
| Operating Temperature | −40 °C to +50 °C |
| Operating Humidity | 0–90 %RH (non-condensing) |
| Ambient Pressure Range | 86–116 kPa |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM Manufacturer |
| Product Category | Domestic |
| Model | AOA 200CEMS |
| Instrument Type | Continuous Emission Monitoring System (CEMS) |
| Measurement Principle | Heated Extractive Sampling + Isokinetic Particulate Sampling + Energy-Dispersive X-Ray Fluorescence (ED-XRF) |
| Target Analytes | Pb, Cr, Cd, As, Hg, Ni, Zn, Cu, Mn, Sb (as particulate-bound species) |
| Sampling Interval | Programmable (default 15 min) |
| Data Output Interfaces | RS232/RS485, USB, GPRS, ADSL, Ethernet |
| Radiation Safety | Fully Shielded ED-XRF Module with <0.1 µSv/h external dose rate |
| QC Protocol | Internal Standard Element Monitoring for Drift Correction |
| Compliance Framework | Designed to support EPA Method 29 / ISO 14956 / HJ 657–2013 / HJ 93–2013 alignment |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Model | FRINGE C1600 |
| Regulatory Classification | Domestic (China) |
| Key Features | θ–2θ coupled goniometer with single-axis drive |
| Compliance | Designed for ISO/IEC 17025-aligned lab environments |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Model | FRINGE CLASS |
| Power Supply | As specified in technical documentation |
| Detector | Proportional Counter (≥500 kcps count rate) |
| Geometry | Bragg–Brentano θ–2θ reflection mode |
| Cooling System | Integrated water recirculation cooling |
| Compliance | CE-marked, compliant with IEC 61000-6-3 (EMC) and IEC 61000-6-4 (emission standards) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | FRINGE D200 |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Benchtop |
| Power Rating | kW-class (air-cooled or integrated water-cooling system) |
| Detector | Xeye2D 2D hybrid pixel array detector |
| Goniometer | High-precision vertical θ–θ configuration |
| Software | CrystalX automated phase analysis suite |
| Sample Compatibility | Powders, bulk solids, thin films, liquids |
| Safety | Interlocked sample chamber, automatic beam shutter, real-time door status feedback |
| Optional Accessories | High-temperature stage, cryo-stage, humidity-controlled cell |
| Compliance | Designed to meet IEC 61010-1 (safety), ISO 17025 operational readiness guidelines, and GLP-aligned data integrity practices |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg-Brentano θ–2θ reflection mode |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ counts per second (CPS) |
| Power | kW-class microfocus X-ray source (exact rating per configuration) |
| Compliance | CE-marked, IEC 61000-6-3/6-4, IEC 62471 (LED/X-ray safety) |
| Sample Handling | Motorized sample stage with integrated Soller collimator, air-spring assisted large-window hinged door |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg–Brentano θ–2θ reflection |
| Detector | Digital Pulse Processing Counter (DPPC) |
| Maximum Count Rate | ≥1 × 10⁷ counts per second (CPS) |
| Sample Forms | Powders, bulk solids, thin films |
| Software | CrystalX™ automated phase identification & quantification suite |
| Compliance | Designed for GLP-compliant workflows |
| Safety | Interlocked sample chamber with auto-shutdown, real-time door status feedback, full enclosure during operation |
| Optical Path | Integrated fixed Soller slits, divergence slit, anti-scatter slit, receiving slit |
| Power Supply | High-voltage generator rated for kW-class operation (exact rating model-specific |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg–Brentano θ–2θ reflection |
| Power Rating | kW-class (rated for continuous operation) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ counts per second (CPS) |
| Optical Configuration | Integrated Soller slits, fixed divergence slit, anti-scatter slit, receiving slit |
| Sample Stage | Motorized goniometer with precision angular encoder |
| Safety Compliance | Interlocked sample chamber, automatic beam shutter activation upon door opening, real-time chamber status feedback on GUI |
| Software Platform | CrystalX — automated phase identification, quantitative Rietveld refinement, crystallinity index calculation, PDF-4+ database integration |
| Regulatory Alignment | Designed to support GLP-compliant workflows |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg-Brentano θ–2θ Reflection |
| Detector | Digital Pulse Processing Counter (DPPC) |
| Count Rate Capacity | ≥1 × 10⁷ counts per second (CPS) |
| Sample Stage | Fixed-center goniometer with integrated Soller slits |
| Power Supply | kW-class microfocus X-ray source (exact rating specified in technical documentation) |
| Compliance | CE-marked for laboratory use |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | FRINGE EV |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | kW-class (integrated sealed X-ray tube) |
| Geometry | Bragg–Brentano reflection (θs–θd) |
| Detector | High-sensitivity scintillation or silicon-strip detector (configurable) |
| Sample Stage | Motorized goniometer with ±0.001° angular resolution |
| Software Platform | CrystalX v3.x (with ICDD PDF-4+ database integration) |
| Compliance | CE, RoHS, IEC 61000-6-3/6-4, EN 62471 (UV/soft X-ray safety) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | FRINGE EV |
| Instrument Type | Powder X-ray Diffractometer |
| Power | kW-class (rated for continuous operation in desktop configuration) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ counts per second (CPS) |
| Geometry | Bragg–Brentano θ–2θ reflection mode |
| Sample Stage | Motorized goniometer with fixed center-of-rotation |
| Slit System | Integrated Soller collimators (no moving adjustment parts) |
| Safety | Interlocked sample chamber with auto-shutdown, door-closed status indicator |
| Software | CrystalX — automated phase identification, quantitative Rietveld refinement, crystallinity index calculation, and EDS-enabled hybrid XRD/EDS data correlation |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | FRINGE EV Pharmaceutical Crystal Diffractometer |
| Instrument Type | Benchtop Powder X-ray Diffractometer |
| Power Rating | kW-class (rated for high-flux operation) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ cps count rate |
| Optical Configuration | Integrated fixed Soller collimator, θs–θd reflection geometry |
| Safety | Interlocked fully enclosed sample chamber with auto-shutdown, real-time door status feedback |
| Software | CrystalX — automated phase identification, quantitative Rietveld refinement, crystallinity index calculation, and EDS-enabled hybrid data acquisition |
| Compliance | Designed to support GLP/GMP-aligned workflows |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | FRINGE EV |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | kW-class (rated for continuous high-intensity operation) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ counts per second (CPS) |
| Optical Configuration | Integrated Soller collimator (fixed, no moving parts) |
| Geometry | Bragg–Brentano θ–2θ reflection mode |
| Safety | Interlocked sample chamber with automatic beam shutter, real-time door status feedback in GUI |
| Software | CrystalX — automated phase identification, quantitative Rietveld refinement, crystallinity index calculation, and energy-dispersive spectral overlay |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | FRINGE EV |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | kW-class (air-cooled, sealed-tube source) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ cps |
| Optical Configuration | Integrated Soller slits, fixed divergence geometry |
| Sample Geometry | Bragg–Brentano θ–2θ reflection mode |
| Safety Compliance | Interlocked sample chamber with auto-shutdown, full enclosure when closed |
| Software | CrystalX — automated phase identification, quantitative Rietveld refinement, crystallinity index calculation, EDS-enabled hybrid XRD/EDS data acquisition |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | FRINGE EV |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | kW-class (rated for continuous high-intensity operation) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ counts per second (CPS) |
| Optical Configuration | Integrated fixed Soller slits, θ–2θ reflection geometry |
| Safety Compliance | Interlocked sample chamber with automatic beam shutter, full enclosure when closed |
| Software | CrystalX — automated phase identification, quantitative Rietveld refinement, crystallinity calculation, and EDS-enabled hybrid data acquisition |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg–Brentano θ–2θ reflection mode |
| Power Supply | kW-class integrated X-ray source (exact rating per configuration) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1 × 10⁷ counts per second (CPS) |
| Sample Stage | Fixed-height goniometer with air-spring assisted large-window lift door |
| Software | CrystalX™ automated phase identification & quantification suite |
| Compliance | Designed for GLP-compliant labs |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | FRINGE EV |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | kW-class (typical operational range: 1.2–2.4 kW, configurable per application requirements) |
| Detector | DPPC (Digital Pulse Processing Counter Detector), Count Rate ≥ 1 × 10⁷ cps |
| Optical Configuration | Integrated fixed Soller slits, Bragg–Brentano θ–2θ reflection geometry |
| Safety Compliance | Interlocked sample chamber with automatic beam shutdown, real-time door status feedback in GUI |
| Software Platform | CrystalX™ v3.2+ with automated phase identification, Rietveld refinement, quantitative phase analysis (QPA), crystallinity index calculation, and alumina polymorph transformation ratio reporting (α-, γ-, δ-, θ-, κ-, χ-Al₂O₃) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg-Brentano θ–2θ reflection mode |
| Power | kW-class sealed-tube X-ray source (rated output ≥ 1.8 kW) |
| Detector | Digital Pulse Processing Counter (DPPC), count rate capacity ≥ 1×10⁷ cps |
| Sample Stage | Motorized goniometer with integrated Soller slits, fixed divergence slit, anti-scatter slit, and receiving slit |
| Compliance | CE-marked, IEC 61010-1 safety certified, radiation-shielded enclosure with interlocked safety door and real-time chamber status feedback |
| Software | CrystalX™ v3.x — automated phase identification (ICDD PDF-4+ database), quantitative Rietveld refinement, crystallinity index calculation (e.g., Lc, La, graphitization degree via (002) peak FWHM & d-spacing), energy-dispersive spectroscopy (EDS) co-acquisition support |
| Sample Forms | Powders, solid blocks, thin films, coatings |
| Dimensions | 620 × 540 × 480 mm (W × D × H) |
| weight | ~95 kg |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg-Brentano θ–2θ reflection mode |
| Power | kW-class microfocus X-ray source (rated output ≥ 1.2 kW) |
| Detector | Digital Pulse Processing Counter (DPPC) with throughput ≥ 1×10⁷ counts per second (CPS) |
| Slit System | Integrated fixed Soller slits (no moving adjustable components) |
| Sample Stage | Motorized goniometer with ±0.001° angular reproducibility |
| Safety | Interlocked full-enclosure sample chamber with real-time door status monitoring and automatic beam shutdown |
| Software | CrystalX™ automated phase identification & quantification suite with Rietveld refinement, crystallinity index calculation, and ASTM E1426-compliant data reporting |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg–Brentano reflection (θs–θd) |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ cps |
| Power | kW-class (integrated high-power microfocus X-ray source) |
| Compliance | CE-marked, IEC 61000-6-3/6-4, EN 62471 (UV/X-ray safety) |
| Sample Stage | Motorized goniometer with air-spring assisted large-window lift door |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg-Brentano θ–2θ reflection mode |
| Power Supply | kW-class integrated X-ray source (rated output ≥ 1.2 kW) |
| Detector | Digital Pulse Processing Counter (DPPC), count rate ≥ 1×10⁷ cps |
| Sample Stage | Precision goniometer with fixed θs–θd alignment |
| Optical Path | Integrated Soller slits (no moving adjustment parts), anti-scatter slit, receiving slit |
| Software | CrystalX™ v3.2 — automated phase identification, Rietveld quantitative analysis, crystallinity index calculation, PDF-4+ database integration |
| Compliance | Designed to meet ISO 17025 laboratory requirements |
| Safety | Interlocked full-enclosure sample chamber with auto-shutdown on door opening, real-time status feedback on HMI |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | FRINGE Series |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | kW-class (Integrated High-Intensity X-ray Source) |
| Detector | DPPC (Digital Pulse Processing Counter Detector), ≥1×10⁷ cps |
| Optical Configuration | Fixed integrated Soller slits, θ–2θ reflection geometry (Bragg–Brentano), air-spring assisted large-window safety door |
| Software | CrystalX™ — automated phase identification, quantitative Rietveld refinement, crystallinity calculation, and EDXRF co-acquisition capability |
| Compliance | Designed to meet ISO 17025 laboratory requirements |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Applicable Standard | SH/T 1827–2019 |
| Measurement Principle | X-ray Diffraction (XRD) with Whole-Pattern Fitting |
| Sample Form | Granular or Powdered Polyolefins (PE, PP), Injection-Molded or Compression-Molded Specimens (α- and β+α-phase) |
| Detector | High-Resolution Scintillation Detector |
| Goniometer Architecture | θ–2θ Coupled Drive System (Single-Axis Motorized) |
| Cooling | Integrated Water-Circulation Cooling (Real-Time Monitoring of Temperature, Flow Rate & Velocity) |
| Software | CrystalX — Automated Crystallinity Quantification (DOC Calculation), ASTM/ISO-Compatible Data Export, Audit Trail & User Access Control |
| Safety | Interlocked Sample Chamber, Automatic X-ray Shutoff, Visual Closure Confirmation |
| Optical Component | Monolithic Soller Slit (Fixed, No Moving Parts) |
| Mobility | Designed for Benchtop and Mobile Lab Integration |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Category | Atmospheric Heavy Metal Analyzer |
| Model | GaOA |
| Measurement Principle | X-ray Fluorescence (XRF) Spectrometry |
| Measurement Range | 0–100 µg/m³ |
| Detection Limit | 1 ng/m³ (1-hour sampling at 16.7 L/min) |
| Filter Tape Replacement Interval | One roll lasts ~30 days under hourly sampling |
| Operating Temperature | −40 °C to +50 °C |
| Operating Relative Humidity | 0–90% RH (non-condensing) |
| Ambient Pressure Range | 80–106 kPa |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Origin Category | Domestic |
| Model | In-flowX |
| Form Factor | Benchtop/Floor-standing |
| Instrument Type | Conventional ED-XRF Spectrometer |
| Measurement Principle | Energy Dispersive X-Ray Fluorescence (ED-XRF) |
| Detection Range | ppm to wt% |
| Compliance Framework | Designed for GLP/GMP-aligned process monitoring environments |
| Communication Protocols | RS485, TCP/IP |
| Enclosure Rating | IP65 |
| Sample Interface | Flow-through liquid cell with automated sampling loop |
| Core Functionalities | Automated sampling, real-time spectral acquisition, multi-element quantification, auto-calibration, self-cleaning cycle, threshold-based alarm triggering |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Model Series | INSIGHT 300 / INSIGHT 330 / INSIGHT 360 |
| Measurement Principle | Energy-Dispersive X-Ray Fluorescence (ED-XRF) |
| Geometry | Upright (Top-Down) Configuration |
| Detector Type | High-Resolution Silicon Drift Detector (SDD) |
| Spot Size Options | Multiple Motorized Collimators (100 µm to 1 mm) |
| Sample Chamber | C-Shaped Open Design |
| Focus System | Auto-Focus with Live Video Imaging & Crosshair Overlay |
| Software | Fully Integrated ED-XRF Analysis Suite with GLP/GMP-Compliant Audit Trail |
| Compliance | ASTM B568, ISO 3497, ISO 20876, IPC-4552A, USP <232>/<233>, FDA 21 CFR Part 11 Ready |
| Optional Automation | Programmable XY Stage with Pattern Recognition and Multi-Point Routine Support |
| Safety | Interlocked Cabinet, <1 µSv/h Leakage Radiation |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM Manufacturer |
| Region of Origin | Domestic (China) |
| Model | INSIGHT 500R |
| Elemental Range | Na (Sodium) to Fm (Fermium) |
| Sample Chamber Dimensions | 564 mm × 540 mm × 150 mm (L×W×H) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Domestic/Imported | Domestic |
| Model | IP68 |
| Application | Handheld / Submersible |
| Instrument Type | Conventional Energy Dispersive X-Ray Fluorescence (ED-XRF) Spectrometer |
| Ingress Protection Rating | IP68 |
| Operational Depth | Up to 10 m underwater |
| Measurement Mode | In-situ, non-destructive elemental analysis |
| Data Transmission | Real-time wireless telemetry to surface control unit |