LANScientific
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| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | LabStation-5 |
| Instrument Type | Powder X-ray Diffractometer |
| Instrument Configuration | Floor-standing |
| Detector | High-Performance Photon-Counting (HPC) Pixelated Detector |
| Goniometer | θ/θ Closed-Loop Drive System |
| Optical Geometry | Switchable Bragg-Brentano & Parallel-Beam Configurations |
| Sample Stage | Modular, Tool-Free Quick-Release Sample Holder System |
| Diffractometer Radius | ≥300 mm |
| Beam Path Architecture | Non-Coplanar Arm Design |
| Slit System | Motorized Variable Aperture |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Regional Classification | Domestic (PRC) |
| Model | LIBS 3000 |
| Instrument Type | Online |
| Pricing | Upon Request |
| Key | Value Format: None |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | LIBS 5000 |
| Instrument Type | Online |
| Pricing | Upon Request |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Handheld |
| Model | LIBS 810 |
| Compliance | CE, RoHS, FDA 21 CFR Part 11 (software audit trail enabled) |
| Laser Class | 3B (IEC 60825-1 compliant) |
| Weight | 1.65 kg |
| Detection Principle | Pulsed Nd:YAG laser-induced plasma emission spectroscopy |
| Elemental Coverage | Mg, Al, Si, Fe, Cu, Zn, Mn, Ti, Cr, Ni, Pb, Sn, and other metallic elements (Z ≥ 12) |
| Typical LOD | 1–50 ppm for major alloying elements (matrix-dependent) |
| Spectral Resolution | < 0.1 nm (FWHM at 300–800 nm range) |
| Analysis Time | ≤ 2 s per measurement |
| Sample Form Compatibility | Solid metals (polished or as-received), alloys, scrap, coatings, welds |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Handheld |
| Model | LIBS 820C |
| Compliance | CE, RoHS, FDA 21 CFR Part 11 (Software Audit Trail Enabled) |
| Laser Class | 3B Pulsed Nd:YAG (1064 nm, <10 ns pulse width, ≤50 mJ/pulse) |
| Weight | 1.7 kg |
| Detection Elements | C, Si, Mn, Cr, Ni, Mo, V, Nb, Ti, Al, Cu, Co, W, B, Be, Li, P, S, N, Fe (matrix) |
| Typical Carbon LOD | 25–50 ppm (steel matrix, Ar purge) |
| Spectral Resolution | ≤0.1 nm (FWHM @ 247.8 nm C I line) |
| Analysis Time | ≤3 s per measurement |
| Sample Interface | Non-contact, micro-ablation spot size: 50–100 µm |
| Power Supply | Rechargeable Li-ion battery (≥8 h continuous operation) |
| Environmental Rating | IP54 |
| Operating Temperature | −10 °C to 50 °C |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | PeDX 980 / 980S / 980CS |
| Application Form Factor | Handheld / Portable |
| Instrument Type | General-Purpose ED-XRF |
| Elemental Analysis Range | Br, Cr, Pb, Hg, Cd, Cl |
| Quantitative Detection Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD (for major elements under standardized conditions) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Country of Origin | Domestic (China) |
| Model | PeDX RAMAN |
| Application | Handheld / Portable |
| Instrument Type | Conventional |
| Industry Use | General Purpose |
| Elemental Analysis Range | Mg–U |
| Quantitative Range | 1 ppm – 99.99% |
| Energy Resolution | 145 eV |
| Repeatability | 0.1% |
| Detector | High-Performance Silicon Drift Detector (SDD) with Peltier cooling |
| Dual-Mode Capability | Simultaneous Raman Spectroscopy & Energy-Dispersive X-ray Fluorescence (ED-XRF) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | RA 200 |
| Instrument Type | Portable/Handheld Raman Spectrometer |
| Spectral Range | 200–3000 cm⁻¹ |
| Spectral Resolution | <6 cm⁻¹ |
| Spatial Resolution | Micron-level |
| Minimum Wavenumber | 150 cm⁻¹ |
| Spectral Reproducibility | ≤ ±0.15 cm⁻¹ |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | ROCKSY |
| Configuration | Benchtop/Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Design | Geological & Mineralogical Analysis |
| Elemental Range | Na (11) – U (92) |
| Quantitative Range | 0.1 ppm – 99.99 wt% |
| Detection Geometry | Top-View (Vertical Illumination) |
| Detector | High-Resolution Silicon Drift Detector (SDD) |
| Vacuum Capability | Integrated Intelligent Vacuum System |
| Portability | Field-Deployable with Onboard Battery |
| Software | ROCKSY Smart Analysis Suite (Real-Time Visualization, Report Automation, GLP-Compliant Data Logging) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX 860CS |
| Form Factor | Benchtop/Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose with Copper Alloy Optimization |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm (for typical matrix elements under optimized conditions) |
| Detector | High-Resolution Silicon Drift Detector (SDD), Peltier-cooled, ≥140 eV Mn-Kα resolution |
| Vacuum System | Integrated Automatic Vacuum Pump |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Origin Category | Domestic |
| Model | ScopeX 980Quartz |
| Configuration | Benchtop/Floor-standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-purpose with Quartz Sand Optimization |
| Elemental Analysis Range | Na (11) to U (92) |
| Detection Limit | 1 ppm (for matrix-matched standards) |
| Energy Resolution | <125 eV at Mn Kα |
| Repeatability | ≤0.1% RSD (for major oxides at ≥1 wt%) |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX CSA 600 |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose Regulatory Compliance Analysis |
| Elemental Range | Mg to U (Z = 12–92) |
| Detection Limit | 1 ppm (for Cd, Pb, Hg, Cr, Br, Cl under optimized conditions) |
| Energy Resolution | <125 eV at Mn Kα (5.89 keV) |
| Repeatability | ≤0.1% RSD (for homogeneous reference materials, n=10) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX CSA 660 |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF Spectrometer |
| Application Scope | General-Purpose Regulatory Screening |
| Elemental Range | Mg to U |
| Detection Limit | 1 ppm (for Cd, Pb, Hg, Cr, Br, Cl in polymer matrices) |
| Energy Resolution | <125 eV at Mn Kα |
| Repeatability | ≤0.1% RSD (for 100 s counting time on homogeneous standards) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX CSA 660F |
| Configuration | Benchtop / Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose Elemental Analysis |
| Elemental Range | Mg (12) to U (92) |
| Detection Limit | 1 ppm (for typical matrixes) |
| Energy Resolution | <125 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD (for homogeneous standards) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Origin Category | Domestic |
| Model | ScopeX Industrial Silicon Analyzer |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm |
| Energy Resolution | <125 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Origin Category | Domestic |
| Model | ScopeX |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-purpose |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm |
| Energy Resolution | <125 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Regional Classification | Domestic |
| Model | ScopeX |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm |
| Energy Resolution | <125 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic |
| Model | ScopeX Al₂O₃ Powder Analyzer |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm |
| Energy Resolution | <125 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX ED-XRF |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Design | Geological & Mineralogical Applications |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | Sub-ppm to % level (matrix-dependent) |
| Light Element Capability | Optimized for Mg, Al, Si, P, S via vacuum-assisted low-energy excitation |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Collimators | 5 mm, 3 mm, 1 mm, 0.5 mm (motorized auto-switching) |
| Filters | Multiple primary beam filters (software-selectable) |
| Sample Chamber | Large-volume, multi-geometry compatible (solid, powder, liquid, thin film, irregular shapes) |
| Data Interfaces | USB 3.0, Wi-Fi 5 (802.11ac), Bluetooth 5.0 |
| Report Output | Customizable EXCEL, PDF with spectral overlays, logo insertion, and metadata fields |
| Safety Compliance | Fully shielded metal enclosure with interlocked door, radiation leakage <1 µSv/h — compliant with GB18871-2002 and GBZ115-2002 |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic |
| Model | ScopeX Cement CaO Analyzer |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Design | Non-Ferrous Metals & Construction Materials |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | ppm-level |
| Sample Compatibility | Solid, Powder, Pellet, Liquid, Thin Film |
| Regulatory Compliance | GB18871-2002, GBZ115-2002 |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic |
| Model | ScopeX Cement Clinker Analyzer |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm (for matrix-dependent elements) |
| Energy Resolution | <125 eV at Mn Kα |
| Repeatability | ≤0.1% RSD (for major elements under optimized conditions) |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic (China) |
| Model | ScopeX Ceramic & Silicate Analyzer |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Application | Non-Ferrous Metals & Inorganic Materials |
| Elemental Range | Na (11) – U (92) |
| Detection Limit | down to sub-ppm level for selected elements |
| Sample Compatibility | Solid, Powder, Liquid, Thin Film, Coating |
| Excitation Source | Low-Energy X-ray Tube with Intelligent Vacuum System |
| Detector | Peltier-Cooled Silicon Drift Detector (SDD) |
| Collimators | 5 mm, 3 mm, 1 mm, 0.5 mm (motorized auto-switching) |
| Filters | Multiple programmable primary beam filters |
| Data Interfaces | USB 3.0, Wi-Fi 5 (802.11ac), Bluetooth 5.0 |
| Software Output Formats | Customizable Excel, PDF, CSV, Spectral Image (PNG/SVG) |
| Regulatory Compliance | GB18871-2002, GBZ115-2002, IEC 61000-6-3 EMC |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic (China) |
| Model | ScopeX Iron Ore Analyzer |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm (typical, matrix-dependent) |
| Energy Resolution | <125 eV at Mn Kα |
| Repeatability | ≤0.1% RSD (for major elements under controlled conditions) |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX Limestone Analyzer |
| Price Range | USD $13,500 – $40,500 (FOB) |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Design | Geological & Mineralogical Applications |
| Elemental Coverage | Na (Sodium) to U (Uranium) |
| Detection Limit | Sub-ppm to % level (matrix-dependent) |
| Sample Compatibility | Solid, Powder, Pellet, Liquid, Thin Film |
| Regulatory Compliance | GB18871-2002, GBZ115-2002 |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic |
| Model | ScopeX Mn-Fe Alloy Analyzer |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm (for selected elements under optimized conditions) |
| Energy Resolution | <125 eV at Mn Kα (5.89 keV) |
| Repeatability | ≤0.1% RSD (for major alloying elements at ≥1 wt%) |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX Refractory Materials Analyzer |
| Form Factor | Benchtop |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Application | Non-Ferrous Metals & Refractories |
| Elemental Range | Na (11) – U (92) |
| Detection Limit | down to ppm level |
| Light Element Capability | Enhanced Si, P, S, Al, Mg via low-energy X-ray excitation + intelligent vacuum system |
| Collimators | 5 mm, 3 mm, 1 mm, 0.5 mm (motorized auto-switching) |
| Filters | Multiple filter sets (software-selectable) |
| Detector | Peltier-cooled silicon drift detector (SDD) |
| Sample Chamber | Large-volume, multi-geometry compatible (solid, powder, liquid, thin film, irregular shapes) |
| Data Interface | USB 3.0, Wi-Fi 802.11ac, Bluetooth 5.0 |
| Report Output | Customizable Excel/PDF reports with logo, spectral overlays, and sample metadata |
| Safety Compliance | Fully shielded metal enclosure with interlocked safety door |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Benchtop/Free-Standing ED-XRF Spectrometer |
| Application Field | Non-Ferrous Metals & Precious Metals |
| Elemental Range | Al (13) to U (92) |
| Detection Limit for Ag/Cu | ≤10 ppm |
| Quantitative Accuracy | ±0.001% for Au (99.999 wt%) |
| Detector | Large-Area Silicon Drift Detector (SDD) |
| Excitation Geometry | Vertical Beam Path Configuration |
| Compliance | ASTM E1621, ISO 8256, GB/T 17724–2022, RoHS Directive 2011/65/EU |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX G59 |
| Configuration | Benchtop |
| Instrument Type | Conventional ED-XRF Spectrometer |
| Industry-Specific Application | Non-Ferrous Metals (Precious Metals) |
| Elemental Range | Al (13) to U (92) |
| Detection Limit | ≤10 ppm for Ag and Cu |
| Quantitative Accuracy | ±0.001% for Au in AU99999-grade material |
| Detector | Large-Area Silicon Drift Detector (SDD) |
| Optical Geometry | Vertical Beam Path |
| Sample Chamber | Extra-Large, Accommodates Irregular & High-Volume Specimens |
| Excitation Source | Rhodium Anode Microfocus X-ray Tube |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Regional Classification | Domestic |
| Model | ScopeX G59 |
| Configuration | Benchtop/Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Application | Non-Ferrous Metals (Precious Metals) |
| Elemental Range | Al (13) to U (92) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Regional Classification | Domestic |
| Model | ScopeX PG6 |
| Form Factor | Benchtop/Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Application | Non-Ferrous Metals |
| Elemental Range | Al (13) to U (92) |
| Detection Limit | ppm-level |