LANScientific
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| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | FRINGE |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Benchtop |
| Power Supply | Standard 220 V AC, 50/60 Hz (cooling integrated |
| Detector | Digital Pulse Processing Counter (DPPC), ≥1×10⁷ counts per second (CPS), energy-dispersive capability enabled |
| Optical Geometry | Bragg–Brentano θ–2θ reflection mode with fixed divergence slit, Soller slits, anti-scatter slit, and receiving slit |
| Sample Stage | Motorized goniometer with ±0.001° angular reproducibility |
| Software | CrystalX — automated phase identification, quantitative Rietveld refinement, crystallinity index calculation, and elemental spectral overlay (EDS-compatible) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | FRINGE EVS |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Benchtop |
| Power Rating | kW-class (water-cooled) |
| Detector | DPPS High-Resolution Energy-Dispersive Detector |
| Cooling System | Integrated Closed-Loop Water Circulation |
| Safety | Interlocked Sample Chamber with Auto-Shutdown, Full Enclosure During Operation |
| Optical Path | Integrated Soller Slit (Fixed, No Moving Parts) |
| Software | CrystalX™ Automated Phase Identification & Quantification Suite |
| Compliance | Designed for GLP/GMP-aligned workflows |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | INSIGHT PCB & Wafer Edition |
| Pricing | Available Upon Request |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Regional Category | Domestic |
| Model | AOA Series |
| Pricing | Upon Request |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Region Category | Domestic (China) |
| Model | INSIGHT Hardware & Sanitaryware Edition |
| Price Range | USD 14,000 – 28,000 |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Country of Origin | Domestic (China) |
| Model | INSIGHT |
| Price | Upon Request |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | PeDX G7 |
| Application | Handheld/Portable |
| Instrument Type | Conventional EDXRF |
| Industry-Specific Use | Non-Ferrous Metals |
| Elemental Range | Al (13) to U (92) |
| Detection Limit | ppm-level quantification |
| Form Factor | Portable handheld spectrometer |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | PeDX OIL |
| Form Factor | Handheld / Portable |
| Instrument Type | Conventional EDXRF Spectrometer |
| Application Scope | General-Purpose Petrochemical Analysis |
| Elemental Range | Mg to U |
| Quantification Range | 1 ppm – 99.99% (for S and key wear metals/additives) |
| Energy Resolution | <136 eV (at Mn Kα) |
| Repeatability (RSD) | ≤0.1% for sulfur in stable matrix conditions |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Regional Classification | Domestic |
| Model | SHINE Geochemistry Edition (Minerals & Rocks) |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Transmission |
| X-ray Source | Microfocus Tube with Collimator |
| Detector | CCD-based 2D Detector |
| Sample Form | Loose Powder (≈20 mg) |
| Sample Handling | Vibration-assisted Random Orientation |
| Data Output | Full 2θ Diffraction Pattern |
| Connectivity | USB / Bluetooth / Wi-Fi |
| Environmental Rating | IP54 (Dust- and Splash-Resistant) |
| Radiation Safety | Fully Shielded, Zero Leakage During Operation |
| Compliance | Meets GB/T 15445–2021 (Chinese Standard for Portable XRD), Designed per IEC 61010-1 Safety Requirements |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | SHINE Research Edition |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Transmission-mode |
| Detection | CCD-based 2D detector |
| Sample Form | Loose powder (no pressing required) |
| Sample Mass | ~20 mg per analysis |
| Data Output | Full-pattern XRD + simultaneous XRF elemental data |
| Connectivity | USB / Bluetooth / Wi-Fi |
| Enclosure | IP65-rated ruggedized portable case |
| Radiation Safety | Fully shielded |
| Software | Integrated phase identification & quantitative Rietveld refinement engine |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic (China) |
| Model | SuperSEM N10 |
| Instrument Type | Benchtop SEM |
| Electron Source | Tungsten Filament |
| SEM Class | Entry-Level Tungsten-Filament SEM |
| Max Sample Diameter | 90 mm |
| Max Sample Thickness | 40 mm |
| Stage Travel | X: 25 mm, Y: 25 mm, Z: 30 mm |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | Domestic (China) |
| Model | SuperSEM N10eV |
| Instrument Type | Desktop / Benchtop SEM |
| Electron Gun Type | Tungsten Filament |
| Microscope Class | Entry-Level Tungsten-Filament SEM |
| Maximum Sample Dimensions | 90 mm (diameter) × 40 mm (thickness) |
| Stage Travel Range | X: 25 mm, Y: 25 mm, Z: 30 mm |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Region Classification | Domestic (China) |
| Model | SuperSEM N10eX |
| Instrument Type | Desktop SEM |
| Electron Source | Tungsten Filament |
| SEM Class | Entry-Level Tungsten-Filament SEM |
| Maximum Sample Diameter | 90 mm |
| Maximum Sample Thickness | 40 mm |
| Stage Travel | X: 25 mm, Y: 25 mm, Z: 30 mm |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Category | Domestic (China) |
| Model | SuperSEM N10XL |
| Instrument Type | Desktop SEM |
| Electron Source | Tungsten Filament |
| SEM Class | Entry-Level Tungsten-Filament SEM |
| Sample Chamber Size | Up to 100 × 100 mm |
| Detector Configuration | Secondary Electron Detector (SED), Quadrant Backscattered Electron Detector (BSE), Integrated Silicon Drift Detector (SDD)-based EDS System |
| Real-Time Imaging Mode | Video-rate BSE + EDS spectral acquisition |
| Software Features | Auto-focus, Auto-stigmation, Auto-contrast/brightness, Large-area Stitching, Live EDS Mapping, Real-time Spectral Overlay |
| Power Requirement | Standard AC 220 V, 50 Hz |
| Footprint | < 0.8 m² |
| Brand | LANScientific |
|---|---|
| Model | TrueX 760 |
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Portable EDXRF Spectrometer |
| Application Domain | Soil & Environmental Field Screening |
| Regulatory Scope | RCRA Metals, EPA Priority Pollutants, ISO 12847, ASTM D6359, USP <232>/<233> (for elemental impurities in environmental matrices) |
| Detection Range | Elements from Mg (Z=12) to U (Z=92) |
| Typical Detection Limits | 1–10 mg/kg (ppm) for heavy metals (Pb, As, Cd, Cr, Hg, Ni, Cu, Zn) in soil matrices |
| Sample Form | Solid, powder, slurry filtrate, filter membrane, thin film, bulk sediment |
| Measurement Principle | Energy-Dispersive X-Ray Fluorescence (EDXRF) with Peltier-cooled Si-PIN or SDD detector |
| Operating Mode | Direct-field analysis without sample preparation |
| Compliance | GLP-compliant data logging, audit trail ready, 21 CFR Part 11 optional configuration |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | TrueX 800 |
| Application | Handheld / Portable |
| Instrument Type | Conventional EDXRF |
| Industry-Specific Use | Non-Ferrous & Ferrous Alloys |
| Elemental Range | Mg to U |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD for major elements |
| Detector | Si-PIN Semiconductor Detector |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Regional Classification | Domestic |
| Model | TrueX 900 |
| Price Range | USD $14,000–$42,000 |
| Application | Handheld/Portable |
| Instrument Type | Conventional EDXRF |
| Industry-Specific Use | Geological & Mineral Exploration |
| Elemental Range | Mg (12) to U (92) |
| Detection Limit | ppm-level quantification |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | TrueX 960 |
| Application | Handheld / Portable |
| Instrument Type | Conventional |
| Industry Use | General-Purpose |
| Elemental Range | Mg to U |
| Quantitative Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV |
| Repeatability | 0.1% |
| Detector | High-Resolution Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | TrueX800 |
| Application | Handheld / Portable |
| Instrument Type | Standard EDXRF |
| Industry Use | General-Purpose |
| Elemental Range | Mg to U |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV |
| Repeatability | ±0.1% RSD |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Total Reflection XRF (TXRF) |
| Configuration | Portable / Field-Deployable |
| Sample Forms | Liquids, Suspensions, Solid Thin Films, Particulates |
| Primary Application Domains | Environmental Monitoring (Soil & Atmospheric Aerosols), Regulatory Compliance Screening, Trace Element Analysis |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic (China) |
| Model | TX3000 |
| Application | Field-Portable |
| Instrument Type | Total Reflection X-Ray Fluorescence (TXRF) |
| Industry-Specific Use | Soil & Atmospheric Analysis |
| Sample Forms | Liquid, Suspension, Solid, Particulate Deposits |
| Detection Principle | Grazing-Incidence Excitation with Multilayer Monochromator |
| Key Elements | Cr, Pb, As, Cd, Hg, Ni, Cu, Zn (expandable to ~30 elements) |
| Minimum Sample Volume | <10 µL (liquid) or <100 ng (solid deposit) |
| Detection Limits | Sub-pg to low-pg range for most metals (e.g., 0.1–5 pg for transition metals under optimized conditions) |
| Radiation Safety | Compliant with GBZ 126–2011 and IEC 62495 |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | Domestic (China) |
| Model | TX3000 |
| Instrument Type | Portable |
| Detection Principle | Total-Reflection X-Ray Fluorescence (TXRF) |
| Sample Form | Liquids, Suspensions, Filtered Water Extracts |
| Key Elements | Cr, Pb, Cd, As, Hg, Ni, Cu, Zn (expandable to ~30 elements) |
| Detection Limit | Sub-pg to low-pg range per element (matrix-dependent) |
| Excitation Source | Pd-target microfocus X-ray tube |
| Optics | Multilayer monochromator + grazing-incidence beam path |
| Detector | Peltier-cooled silicon drift detector (SDD) |
| Software | LANScientific TXRF Suite v4.x with calibration libraries, spectral deconvolution, and quantitative algorithms |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | TX3000 |
| Application | Field-Portable |
| Instrument Type | Total-Reflection X-Ray Fluorescence (TXRF) |
| Industry-Specific Use | Soil & Atmospheric Environmental Monitoring |
| Sample Form Compatibility | Liquid, Suspension, Solid, Filter-Collected Particulates |
| Detection Principle | Grazing-Incidence Excitation with Multilayer Monochromator and Silicon Drift Detector (SDD) |
| Key Performance | Sub-pg Absolute Detection Limits for Heavy Metals (e.g., Cr, Pb, As, Cd, Hg, Ni, Cu, Zn), Simultaneous Multi-Element Quantification (up to 30 elements), Minimal Sample Requirement (<10 µL liquid or <1 mg solid) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | OEM Producer |
| Instrument Type | Handheld LIBS Analyzer |
| Model | LIBS 800 |
| Compliance | CE, RoHS, FDA 21 CFR Part 11 (Software Mode), ISO/IEC 17025–compatible workflow support |
| Laser Class | 3B (IEC 60825-1:2014) |
| Weight | 1.65 kg |
| Spectral Range | 190–950 nm |
| Optical Resolution | ≤0.1 nm (FWHM) |
| Detection Limits | Sub-ppm to % level (matrix-dependent) |
| Analysis Time | <2 s per measurement |
| Sample Interaction | Non-contact, micro-destructive (crater diameter <100 µm) |
| Power Supply | Rechargeable Li-ion battery (≥8 h continuous operation) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | PeDX OIL+ / PeDX OIL C3 |
| Form Factor | Handheld / Portable |
| Instrument Type | Benchtop-Portable Hybrid EDXRF Spectrometer |
| Industry-Specific Design | Petroleum & Lubricants Quality Control |
| Compliance | ASTM D4294–22, ISO 8754:2003, IP 561, EN ISO 20884:2020 |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | ScopeX 800 |
| Configuration | Benchtop (non-vacuum) |
| Detector | High-resolution silicon drift detector (SDD), Peltier-cooled |
| Software | LANScientific XRF Analysis Suite v3.2 |
| Compliance | GB18871-2002, GBZ115-2002 |
| Sample Chamber | Sealed metal enclosure with interlocked safety shutter |
| Analysis Modes | Fundamental Parameters (FP), Calibration Curve, Empirical Matrix Correction |
| Report Export | PDF, Excel, CSV, XML |
| User Management | Role-based access control (Admin, Operator, Viewer) |
| Data Audit Trail | GLP-compliant timestamped logs |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | ScopeX 980 |
| Form Factor | Benchtop/Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Detector | High-Resolution Silicon Drift Detector (SDD), Peltier-cooled, <125 eV Mn-Kα resolution |
| Excitation Source | Rhodium-target micro-focus X-ray tube, adjustable voltage (up to 50 kV) and current (up to 1 mA) |
| Safety Compliance | GB18871-2002, GBZ115-2002 |
| Software | LANScientific XRF Analysis Suite v4.2 with FP + Calibration Curve quantification engines |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | ScopeX G59 |
| Form Factor | Benchtop / Floor-Standing |
| Instrument Type | Conventional ED-XRF Spectrometer |
| Industry-Specific Use | Non-Ferrous Metals & Precious Metals |
| Elemental Range | Na (11) – U (92) |
| Detection Limit for Ag/Cu | ≤10 ppm |
| Quantitative Accuracy | ±0.001% for Au (i.e., 99.999 wt% Au with 10 ppm total impurities) |
| Analysis Time | 5–120 s per measurement |
| Detector | Large-Area Silicon Drift Detector (SDD) |
| Excitation Source | Rhodium (Rh) anode X-ray tube |
| Software | LANScientific XRF Analysis Suite (FP + Calibration Curve hybrid quantification) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Region of Origin | Domestic (China) |
| Model | ScopeX PC3 |
| Price | USD 1.00 |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Country of Origin | Domestic (China) |
| Model | ScopeX PC5 |
| Price | Upon Request |