Optical Instruments
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| Brand | PerkinElmer |
|---|---|
| Model | PEL-Portable Liquid-Cooled Ceramic Xenon Light Source |
| Light Source Type | Xenon Arc Lamp |
| Cooling Method | Active Liquid Cooling |
| Spectral Range | 300–2500 nm |
| Illumination Mode | External Irradiation |
| Beam Delivery | Omnidirectional Mounting Interface |
| Origin | Beijing, China |
| Compliance | CE, RoHS, ISO 9001-certified Manufacturing |
| Brand | PerkinElmer |
|---|---|
| Model | PLS-ModuLED |
| Light Source Type | High-Power Tunable LED Array |
| Illumination Mode | External (Top-Down or Side-Illumination) |
| Wavelength Options | 455–460 nm (Blue), 520–525 nm (Green), 620–625 nm (Red), 2700–3000 K (Warm White), 5000–6000 K (Cool White) |
| Max. Single-LED Power | 20 W |
| Max. Single-LED Current | 1500 mA |
| Current Control Resolution | 0.4 mA |
| Absolute Current Accuracy | ±1 mA |
| Luminous Flux Range | 333–1530 lm (model-dependent) |
| Operating Modes | Continuous, Modulated (square-wave, frequency-tunable), and Single-Pulse (programmable pulse width & delay) |
| Brand | PerkinElmer (licensed from PerfectLight) |
|---|---|
| Model | PLS-MRRS |
| Temperature Range | Up to 800 °C |
| Pressure Range | Up to 3.0 MPa |
| Reactor Stages | Up to 4 cascaded units |
| Gas Inlets | 4 independent channels |
| Liquid Inlet | 1 precision syringe pump path |
| Preheating Temp | Up to 600 °C |
| Tubing Trace Heating | Up to 250 °C |
| Control Interface | 10.2″ touchscreen with embedded SCADA software |
| Safety Compliance | Dual hardware/software interlock, flame arrestors, leak detection, over-temp/over-pressure shutdown |
| Brand | PerkinElmer |
|---|---|
| Origin | USA |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Spotlight 400/400N |
| Pricing | Upon Request |
| Brand | PerkinElmer |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | Spotlight™ Aurora |
| Pricing | Available Upon Request |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | PF-10 |
| Price Range | USD 1,400 – 4,200 |
| Measurement Principle | Diffuse Illumination / 0° Viewing (d/0°) |
| Spectral Range | 400–700 nm (10 nm intervals) |
| Aperture | Ø30 mm |
| Compliance | JIS P 8148 (Type B), ISO 2469, ISO 2470, ISO 2471, TAPPI T525 |
| Colorimetric Systems | CIE XYZ, CIELAB (L*a*b*), CIELCH°, Yxy, HVC, YI, WH, WB, BR, ΔE*ab, ΔE00, ΔL*a*b*, ΔLCH°, ΔYI, ΔWH, ΔWB, ΔBR |
| Fluorescence Compensation | Dual-filter selectable mode (UV-included / UV-excluded) |
| Repeatability | ΔE*ab ≤ 0.02 (using STFI fluorescent reference paper and white calibration tile) |
| Dimensions | 370 × 450 × 410 mm (W × D × H) |
| Weight | 25 kg |
| Power Supply | AC 100–240 V, 50/60 Hz |
| Lamp | Pulsed Xenon Flash Lamp |
| Optional Accessories | Windows-compatible color management software, RS-232C interface cable, calibration verification kits |
| Brand | Phaseform |
|---|---|
| Origin | Germany |
| Type | Imported Optical Component |
| Mounting | Transmissive, Polarization-Insensitive |
| Operating Principle | Refractive Microfluidic MEMS-Based Phase Modulation |
| Zernike Mode Support | Up to 7th Radial Order (Open-Loop) |
| Wavelength Range | Visible Spectrum (400–700 nm) |
| Aperture | Standard Clear Pupil Diameter (Customizable) |
| Electrode Layout | Intra-Aperture Electrode Array |
| Compliance | ISO 10110-7 (Optical Surface Irregularity), RoHS, CE Marked |
| Software Interface | Phaseform DPP Control SDK (C++/Python), Compatible with Zemax OpticStudio & Code V Ray Tracing Environments |
| Brand | PhaseView |
|---|---|
| Origin | France |
| Model | Alpha |
| Scanning Module | High-Speed Laser Light-Sheet Scanner |
| Scanning Method | Remote Digital Focus |
| Optical Zoom | 10× |
| Excitation Wavelength Range | 375–785 nm |
| Objective | Standard 10× 0.25 NA Air Objective (Optional: 5×, 20×) |
| Detection Optics | Finite–Infinite Type, Air/Water-Dipping Lenses |
| Volumetric Scanning Modes | Motorized Sample Scan (25 fps), NeoScan Remote Focus (25 fps), ThunderScan Ultra-High-Speed Remote Focus (100 fps) |
| Compatible Detectors | Scientific sCMOS Cameras (Large-Format) |
| Sample Volume Capacity | Up to 10 mm × 10 mm × 10 mm |
| Illumination Geometry | Orthogonal Light-Sheet Excitation / Perpendicular Emission Detection |
| Brand | PhaseView |
|---|---|
| Origin | France |
| Model | Neoscan |
| Instrument Type | Point-Scanning Confocal Microscope |
| Z-Axis Scanning Method | Digital Remote Focusing Lens (Patented) |
| Scan Speed | 24 frames/sec |
| Z-Positioning Accuracy | ±1% |
| Z-Positioning Repeatability | ±0.3% |
| Compatibility | C-mount cameras and any microscope with video output interface (brightfield, fluorescence, upright, inverted) |
| Host Integration | Standalone add-on module — no motorized stage or piezo objective scanner required |
| Software Functions | 3D volume reconstruction, deconvolution, surface rendering, quantitative volumetric analysis |
| Brand | PhaseView |
|---|---|
| Origin | France |
| Model | SMARTSCAN |
| Laser Source | Digital Focus Actuation System |
| Compatibility | Finite & Infinity-Corrected Objectives (including water-immersion and oil-immersion) |
| Focus Range | 100 mm / M² (e.g., 1 mm for 10× objective) |
| Optical Module Dimensions | Ø40 mm × 40 mm (H) |
| Control Unit Dimensions | 150 mm (L) × 160 mm (W) × 40 mm (H) |
| Input Power | 12 V DC / 1 A, via 110–220 V AC adapter |
| Standard Cable Length | 1 m |
| Mounting Thread Options | M27×0.75, M25×0.75, WJ4/5″×1/36″ |
| Included Components | Digital Remote Focus Lens, Control Unit, Software Suite |
| Brand | PhaseView |
|---|---|
| Country of Origin | France |
| Model | Thunderscan |
| Instrument Type | Point-Scanning Confocal Microscope |
| Z-Axis Scanning Method | Digital Remote Focusing Lens |
| Scan Speed | Up to 100 frames/sec |
| Z-Step Accuracy | ±1% |
| Z-Step Reproducibility | ±0.3% |
| Microscope Compatibility | Universal C-mount video interface (supports brightfield, fluorescence, light-sheet microscopes) |
| Camera Interface | Standard C-mount |
| Included Components | Digital Remote Focus Lens Unit, Real-Time Control Electronics, Thunderscan Acquisition & 3D Processing Software Suite |
| Regulatory Compliance | CE-marked, compliant with IEC 61000-6-3 (EMC), IEC 62471 (Photobiological Safety) |
| Brand | Phasics |
|---|---|
| Origin | France |
| Model | High_resolution_Interferometer |
| Measurement Principle | Four-wave shearing interferometry |
| Spatial Resolution | 300 × 400 sampling points |
| Wavelength Range | 400–1100 nm |
| Dynamic Range | ±500 µm |
| Chromatic Correction | Achromatic design |
| Vibration Insensitivity | High (no reference optic required) |
| Output | Real-time Zernike coefficients, 3D wavefront map, MTF analysis |
| Compliance | Supports ISO 10110-5, ISO 21247, and ASTM E284 for optical surface characterization |
| Brand | Phasics |
|---|---|
| Model | KALEO |
| Measurement Principle | Quadriwave Lateral Shearing Interferometry (QLSI) |
| Wavelength Range | 365–3900 nm (UV to LWIR) |
| Sensor Options | SID4 UV / SID4 / SID4-HR / SID4-SWIR / SID4 SWIR-HR / SID4-DWIR / R-Cube |
| Aperture Compatibility | 8–130 mm (via expandable beam delivery) |
| Optical Configuration | Non-collimated, achromatic, alignment-free operation |
| Dynamic Range | >100 µm PV wavefront deviation |
| Phase Sensitivity | <1 nm RMS |
| Output Data | Wavefront map, MTF, PSF, Zernike coefficients, Strehl ratio, aberration decomposition |
| Brand | Phasics |
|---|---|
| Origin | France |
| Model | SID4 DWIR, SID4 LWIR-640, SID4 IR-MCT |
| Wavelength Range | 3–5 & 8–14 µm (DWIR), 8–14 µm (LWIR-640), 1.2–5.5 µm (IR-MCT) |
| Aperture Size | 10.88 × 8.16 mm² (DWIR), 16 × 12 mm² (LWIR-640), 9.60 × 7.68 mm² (IR-MCT) |
| Spatial Resolution | 68 µm (DWIR), 100 µm (LWIR-640), 60 µm (IR-MCT) |
| Phase Accuracy | 75 nm RMS (DWIR & LWIR-640), 3 nm RMS @ 3 µW/cm² (IR-MCT) |
| Sensitivity | 25 nm RMS (DWIR & LWIR-640), 3 nm RMS @ 3 µW/cm² (IR-MCT) |
| Dynamic Range | 300 µm |
| Frame Rate | 50 fps (DWIR), 24 fps (LWIR-640), 140 fps (IR-MCT) |
| Real-time Processing | 10 fps (DWIR & LWIR-640), 20 fps (IR-MCT) |
| Detector Technology | Cooled MCT (DWIR & IR-MCT), Uncooled Microbolometer (LWIR-640) |
| Dimensions (W×H×L) | 85 × 115 × 193 mm (DWIR), 96 × 110 × 90 mm (LWIR-640), 135 × 140 × 240 mm (IR-MCT) |
| Weight | ~1.6 kg (DWIR), ~0.85 kg (LWIR-640), ~3.5 kg (IR-MCT) |
| Brand | Phasics |
|---|---|
| Origin | France |
| Model | SID4 DWIR |
| Wavelength Range | 3–5 µm and 8–14 µm |
| Aperture | 13.44 × 10.08 mm² |
| Sampling Points | 160 × 120 |
| Spatial Resolution | 68 µm |
| Dynamic Range | ~100 µm |
| Accuracy | 75 nm RMS |
| Sensitivity | <25 nm RMS |
| Frame Rate | >50 fps |
| Processing Rate | 20 Hz |
| Dimensions | 85 × 116 × 179 mm |
| Weight | 1.6 kg |
| Brand | Phasics |
|---|---|
| Origin | France |
| Model | SID4 UV, SID4 HR, SID4 SWIR HR, SID4 DWIR |
| Spectral Range (SID4 HR) | 350–1100 nm |
| Phase Sampling Resolution | 416 × 360 pixels |
| Active Aperture | 9.98 × 8.64 mm² |
| Max. Acceptance NA | 0.8 |
| Peak-to-Valley Dynamic Range | 500 µm |
| Phase Sensitivity | < 2 nm RMS |
| Interface | USB 3.0 |
| Compliance | CE, RoHS |
| Software | QWLS 5.x (supports ASTM E2912, ISO 10110-5, ISO 21254, and GLP/GMP audit trail logging) |
| Brand | Phasics |
|---|---|
| Origin | France |
| Model | SID4 UV-HR |
| Aperture | 8.0 × 8.0 mm² |
| Spatial Resolution | 32 µm |
| Sampling Points | 250 × 250 |
| Wavelength Range | 190–400 nm |
| Dynamic Range | > 200 µm |
| Accuracy | 10 nm RMS |
| Sensitivity | 2 nm RMS @ 250 nm, 2 µJ/cm² |
| Frame Rate | 30 fps |
| Processing Frequency | 1 Hz (high-resolution mode) |
| Dimensions | 95 × 105 × 84 mm |
| Weight | 900 g |
| Brand | Phasics |
|---|---|
| Origin | France |
| Model | SID4 UV-HR |
| Wavelength Range | 190–400 nm |
| Aperture Size | 8.0 × 8.0 mm² |
| Spatial Resolution | 32 µm |
| Sampling Grid | 250 × 250 points |
| Phase Sensitivity (RMS) | 0.5 nm |
| Precision (RMS) | 10 nm |
| Frame Rate | >30 fps |
| Real-Time Processing Frequency | 1 fps |
| Dimensions (W×H×L) | 95 × 105 × 84 mm |
| Weight | 900 g |
| Brand | Phasics |
|---|---|
| Origin | France |
| Model | SID4 |
| Wavelength Range | 190–1100 nm (model-dependent) |
| Aperture Size | up to 13.44 × 10.08 mm² |
| Spatial Resolution | down to 29.6 µm |
| Sampling Points | up to 400 × 300 |
| Dynamic Range | >100 µm (up to >500 µm in HR variants) |
| Accuracy | as low as 10 nm RMS |
| Sensitivity | down to 0.5 nm RMS @ 250 nm |
| Frame Rate | up to >60 fps |
| Processing Frequency | up to 20 Hz |
| Dimensions | 44 × 33 × 57.5 mm (SID4-NIR) to 85 × 116 × 179 mm (SID4-DWIR) |
| Weight | 250 g to 1.6 kg |
| Brand | Phasics |
|---|---|
| Origin | France |
| Model | SID4 |
| Resolution | 400 × 300 phase pixels |
| Wavelength Range | Broadband, achromatic across full CCD spectral response (typically 350–1100 nm) |
| Beam Divergence Tolerance | High (supports divergent beams up to ±15° without relay optics) |
| Interface | USB 3.0 |
| Software Compatibility | Windows/Linux via native SDK and MATLAB/Python APIs |
| Brand | auniontech (Distributor) |
|---|---|
| Origin | France |
| Manufacturer Type | Authorized Distributor |
| Category | Imported Instrument |
| Model | SID4-Fast |
| Price | Contact for Quote |
| Brand | Phasics |
|---|---|
| Origin | France |
| Model | SID4-HR |
| Aperture | 8.9 × 11.8 mm² |
| Spatial Resolution | 29.6 µm |
| Sampling Points | 400 × 300 |
| Wavelength Range | 400–1100 nm |
| Dynamic Range | > 500 µm |
| Accuracy | 15 nm RMS |
| Sensitivity | < 2 nm RMS |
| Frame Rate | > 10 fps |
| Processing Frequency | 3 Hz (high-resolution mode) |
| Dimensions | 54 × 46 × 79 mm |
| Weight | 250 g |
| Brand | Phasics |
|---|---|
| Model | SID4-NIR |
| Wavelength Range | 1.5–1.6 µm |
| Sensor Format | 4.73 × 3.55 mm² |
| Spatial Resolution | 29.6 µm |
| Sampling Resolution | 160 × 120 pixels |
| Phase Resolution | < 11 nm RMS |
| Absolute Accuracy | 15 nm RMS |
| Frame Rate | > 60 fps (raw), > 10 fps (full-resolution real-time processing) |
| Interface | FireWire IEEE 1394b |
| Brand | Phasics |
|---|---|
| Origin | France |
| Model | SID4-NIR |
| Aperture | 3.6 × 4.8 mm² |
| Spatial Resolution | 29.6 µm |
| Sampling Points | 160 × 120 |
| Wavelength Range | 1.5–1.6 µm |
| Dynamic Range | > 200 µm |
| Accuracy | > 15 nm RMS |
| Sensitivity | < 1 nm RMS (low-gain mode) |
| Frame Rate | 60 fps |
| Processing Rate | 10 Hz (high-resolution mode) |
| Dimensions | 44 × 33 × 57.5 mm |
| Weight | 250 g |
| Brand | Phasics |
|---|---|
| Model | SID4-UHR |
| Wavelength Range | 400–1100 nm |
| Active Aperture | 15 × 15 mm² |
| Spatial Resolution | 29.6 µm |
| Phase Sampling Resolution | 512 × 512 (optional up to 666 × 666) |
| Phase Resolution | 2 nm RMS |
| Absolute Accuracy | 15 nm RMS |
| Frame Rate | 8 fps (raw data), 1 fps (full-resolution real-time processing) |
| Chromatic Correction | Achromatic, non-collimated beam compatible |
| Brand | Phasics |
|---|---|
| Model | SID4-UV-HR |
| Wavelength Range | 190–400 nm |
| Active Area | 13.8 × 10.88 mm² |
| Spatial Resolution | 38.88 µm |
| Sampling Resolution | 355 × 280 pixels |
| Phase Sensitivity | 1 nm RMS |
| Absolute Accuracy | 10 nm RMS |
| Frame Rate | 30 fps |
| Real-Time Processing Speed | >3 fps (full resolution) |
| Interface | CameraLink |
| Brand | Phasics |
|---|---|
| Origin | France |
| Model | SID4-V |
| Vacuum Compatibility | < 10⁻⁶ mbar |
| Wavelength Range | 400–1100 nm |
| Aperture | 4.73 × 3.55 mm² |
| Phase Sampling | 160 × 120 points (>19,000) |
| Spatial Resolution | 29.6 µm |
| Phase Accuracy | 15 nm RMS |
| Phase Sensitivity | <2 nm RMS |
| Dynamic Range | >100 µm |
| Frame Rate | ≥60 fps (acquisition), ≥7 Hz (full-resolution real-time processing) |
| Interface | Gigabit Ethernet |
| Dimensions | 54 × 46 × 75.3 mm |
| Weight | ~250 g |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom AFM-SEM |
| Instrument Type | Benchtop SEM-AFM Hybrid System |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Maximum Sample Dimensions | 21 mm × 11 mm × 8 mm |
| Scan Range (Open-Loop) | 100 µm × 100 µm × 20 µm |
| Scan Range (Closed-Loop) | 80 µm × 80 µm × 16 µm |
| Spatial Resolution | 0.2 nm (lateral) × 0.04 nm (vertical) |
| Sample Mass Limit | 100 g |
| Imaging Modes | Topography & Roughness, Conductive AFM (CAFM), Kelvin Probe Force Microscopy (KPFM), Magnetic Force Microscopy (MFM), Piezoresponse Force Microscopy (PFM), Electrostatic Force Microscopy (EFM), Force–Distance (F–z) Curves, Current–Voltage (I–V) Spectroscopy |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | AFM-in-Phenom XL |
| Instrument Type | Benchtop SEM-AFM Hybrid System |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Maximum Sample Dimensions | 21 mm × 11 mm × 8 mm |
| Sample Weight Limit | 100 g |
| Open-Loop Scan Range | 100 µm × 100 µm × 20 µm |
| Closed-Loop Scan Range | 80 µm × 80 µm × 16 µm |
| Spatial Resolution (XY/Z) | 0.2 nm × 0.2 nm / 0.04 nm |
| Compatible Modes | Topography, Roughness, CAFM, KPFM, FMM, PFM, EFM, Force-Distance (F-z), Current-Voltage (I-V) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom Ar-C |
| Instrument Type | Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB6) |
| Secondary Electron Resolution | 8 nm |
| Maximum Magnification | 200,000× |
| Accelerating Voltage Range | 4.8–20.5 kV |
| Backscattered Electron Resolution | 8 nm |