Empowering Scientific Discovery

Shanghai Renhe Scientific Instrument Co., Ltd.

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BrandGFM
Country of OriginGermany
Model3D Step Height & Surface Defect Profilometer
Measurement PrincipleLaser Stripe Phase Projection with DSP-Based Real-Time Image Processing
Measurement Range (X/Y/Z)13 × 8 × 5 mm
Measurement Uncertainty(2 + L/1000) µm (L in µm)
Vertical Resolution1 µm
Working Distance107 mm
Scan Time per Frame3 s
Point Cloud Density360,000 points/frame
Operating Temperature5–40 °C
Light SourceBlue LED
Optical PathHigh-Angle Illumination Design
SoftwareDedicated Scratch & Step Analysis Suite with Polynomial/Gaussian/Mean Filtering
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