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| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ContourX-200 |
| Product Type | Non-contact Optical Profilometer / Surface Roughness Analyzer |
| Measurement Principle | White Light Interferometry (WLI) |
| Vertical Resolution | Sub-nanometer (typical < 0.1 nm RMS noise) |
| Lateral Resolution | Diffraction-limited, dependent on objective magnification (e.g., 0.49 µm at 50×) |
| Camera | 5 MP high-speed CMOS sensor |
| Stage | Motorized XY stage with 100 mm × 100 mm travel |
| Field of View | Up to 4.8 mm × 3.6 mm (with 2.5× objective), scalable via 5×–100× objectives |
| Compliance | Fully supports ISO 25178-2, ISO 4287, ASME B46.1, and NIST-traceable calibration protocols |
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