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| Brand | AMETEK Princeton Applied Research |
|---|---|
| Origin | USA |
| Model | 4200A-SCS |
| DC I-V Range | 10 aA – 1 A, 0.2 µV – 210 V |
| C-V Frequency Range | 1 kHz – 10 MHz, ±30 V DC Bias |
| Pulsed I-V | ±40 V (80 V p-p), ±800 mA, 200 MSa/s, 5 ns Resolution |
| Compliance | ASTM F2679, ISO/IEC 17025, FDA 21 CFR Part 11 (with optional audit trail module) |
| Brand | SENTECH |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | SpectraRay/4 |
| Spectral Range | Configurable per instrument integration (e.g., 190–1700 nm) |
| Spot Size | Instrument-dependent (typically 10–100 µm) |
| Incidence Angle | Adjustable (40°–90°, motorized goniometer support) |
| Measurement Speed | Up to 100 ms per spectrum (full spectral acquisition) |
| Single-Measurement Time | < 5 s (typical auto-alignment + acquisition + fit) |
| Sample Size Compatibility | Up to Ø300 mm wafers or custom substrates |
| Spectral Resolution | ≤ 1 nm (dependent on spectrometer configuration) |
| Thickness Measurement Accuracy | Sub-nanometer for single-layer SiO₂ on Si (calibration traceable to NIST standards) |
| Repeatability | ≤ ±0.05 nm (1σ, over 24 h, controlled environment) |
| Direct Reflectance Accuracy | ±0.2% absolute reflectance (NIST-traceable calibration source) |
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