ZEISS
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| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Axioscope 5, Axiolab 5 |
| Microscope Type | Upright Biological & Materials Microscope |
| Optical Design | Infinity-corrected, Modular, Encoded |
| Compliance | ISO 9001-certified manufacturing |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Axioscope 5 |
| Configuration Type | Upright/Inverted Integrated Platform |
| Illumination Source | Colibri 3 LED Fluorescence System (UV, Blue, Green, Red) |
| Observation Head | Binocular |
| Camera Compatibility | Axiocam 202 mono / Axiocam 208 color |
| Software Options | ZEN Core, ZEN Blue, ZEN Intellesis, Labscope |
| Compliance | ISO 9001 certified manufacturing |
| Brand | Zeiss |
|---|---|
| Origin | Germany |
| Model | Axioscope 5Pol |
| Optical System | IC2S Infinity-Corrected |
| Field Number | 23 |
| Illumination | 10 W White LED (Transmitted) / 12 V, 100 W Halogen (Reflected) |
| Observation Modes | Transmitted Light — Brightfield, Polarized Light, Conoscopy, Phase Contrast |
| Reflected Light Turret | Encoded 2-/4-/6-position |
| Objective Turret | Encoded 6-position, Centering-Adjustable |
| Stage | 170 mm or 190 mm Diameter, 360° Rotatable with 0.1° Precision and 45° Indexing |
| Maximum Sample Height | 110 mm |
| Polarizer | Fixed or Rotatable, Heat-Resistant Module for HBO 103 Lamp |
| Analyzer | 360° Rotatable with 0.1° Graduation |
| Lambda/Full-Wave Retardation Plate | Fixed or Rotatable |
| Circular Polarization System | Available for Transmitted Light |
| Software | ZEN Core and LabScribe |
| Features | Integrated Capture Button, Auto-Intensity Management, ECO Sleep Mode (15 min Inactivity), Real-Time Extended Depth of Focus, Panoramic Image Stitching, Automatic Scale Bar Recognition |
| Compliance | Designed for ISO 9001-aligned manufacturing |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Axiovert 40MAT |
| Optical System | ICCS (Improved Contrast and Color Correction System) |
| Objective Lenses | 5×, 10×, 20×, 50×, 100× (optional: 1.25×, 2.5×, 150×) |
| Eyepieces | 10×/23 mm field number |
| Nosepiece | 4-position or 5-position brightfield/darkfield turret |
| Illumination | 12 V / 100 W halogen lamp with reflector bowl |
| Observation Modes | Reflected-light: brightfield, ADF (Advanced Darkfield), polarized light, DIC (Differential Interference Contrast), fluorescence |
| Transmitted-light | brightfield, ADF, polarized light, phase contrast |
| Ergonomic Design | FEM-optimized stand with ACR (Automatic Component Recognition) encoding |
| Lifetime Expectancy | ≥60 years (structural and optical longevity under standard laboratory conditions) |
| Compliance | Designed and manufactured in accordance with ISO 9001-certified production processes at ZEISS Oberkochen, Germany |
| Digital Integration | Compatible with high-resolution digital cameras, motorized scanning stages, heating stages (up to 1200 °C), and ZEN imaging & analysis software suite |
| Brand | Zeiss |
|---|---|
| Origin | Germany |
| Model | Axiovert 5 Digital |
| Configuration | Integrated digital imaging system with built-in camera and touchscreen interface |
| Optical System | IC2S-corrected optics (achromatic and contrast-optimized) |
| Objective Turret | Encoded 6-position |
| Filter Turret | Encoded 6-position |
| Illumination | Encoded transmitted-light and fluorescence illumination with intensity management |
| Imaging Mode | OSD (On-Screen Display) — direct monitor output without PC |
| AI Module | LabScope AI for automated confluence analysis and cell counting |
| Sample Clearance | Up to 220 mm height |
| Eco Mode | Power-saving operational profile |
| Compliance | Designed for GLP-compliant workflows |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Status | Authorized Distributor |
| Origin Category | Imported |
| Model | Axiovert 5 |
| Price Range | USD 32,000 – 64,000 |
| Type | Inverted Microscope |
| Image Analysis System Included | Yes |
| Total Magnification Range | 50×–1000× |
| Eyepieces | 10×/23 mm field number |
| Objective Lenses | 5×, 10×, 20×, 50×, 100× (optional: 1.25×, 2.5×, 40×, 150×) |
| Optical System | ICCS (Improved Contrast and Color Stability) |
| Frame Design | FEM-optimized rigid stand |
| Objective Turret | Research-grade 5-position brightfield/darkfield turret |
| Illumination | 12 V / 100 W halogen lamp with elliptical reflector bowl |
| Accessories | Eyepiece graticule, stage micrometer, interference and neutral density filters |
| Digital Integration | Compatible with high-resolution CCD/CMOS cameras and ZEN imaging software suite |
| Optional Modules | Motorized XY scanning stage, heated stage (up to 1200 °C), motorized focus drive, encoded Z-axis |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | AxioVert 5/7 |
| Type | Inverted Biological Microscope with SmartControl Box (AxioVert 5) / Semi-Motorized Encoded Inverted Microscope with Motorized Z-Axis (AxioVert 7) |
| Optical System | IC2S Achromatic-Fluorite Dual-Corrected Optics |
| Objective Turret | 6-position Encoded (HDIC) |
| Filter Turret | 6-position Encoded |
| Illumination | Integrated High-Power LED Transmitted-Light Source with Intensity Management |
| Fluorescence Excitation Recognition | Automatic Encoding for epi- and trans-illumination |
| Imaging Interface | OSD Mode (Direct Monitor Output, No PC Required) |
| Software Modules | Labscope A for Reproducible Cell Confluence & Counting |
| Power Management | Eco Mode (Auto-Shutdown after 15 min Idle) |
| Maximum Sample Height Clearance | 220 mm |
| AxioVert 7 Additional Features | Motorized Z-Axis for Autofocus, Extended Depth-of-Field (EDF) Stacking, and Panorama Stitching |
| Brand | ZEISS |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Manufacturer |
| Origin Category | Domestic |
| Model | BOSELLO MAX |
| Quotation | Upon Request |
| Detector Type | Flat-Panel Detector (FPD) |
| Scan Mode | Translation-Rotation (TR) |
| Inspection Volume | 1700 × 1700 × 2200 mm to 2600 × 2600 × 2600 mm |
| Sample Weight Capacity | 80 – 250 kg |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model Series | BOSELLO |
| Detector Type | High-Resolution CMOS Semiconductor Sensor |
| Scan Mode | Translation-Rotation (TR) |
| Accuracy | Nanometer-Level |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Celldiscoverer 7 |
| Type | Integrated Inverted Microscope System with Environmental Control and Automated Imaging |
| Compliance | CE-marked, ISO 13485–compatible design, GLP/GMP-ready workflow architecture |
| Software Platform | ZEN Connect (v3.7+), supports FDA 21 CFR Part 11–compliant audit trails and electronic signatures |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | COMET L3 |
| Pricing | Available Upon Request |
| Measurement Principle | Structured Light (Blue LED) |
| Resolution | Up to 5 Mpx (2448 × 2050) |
| Point Distance | 50–250 µm (configurable by measurement volume) |
| Scan Speed | 1.5–2 s per frame |
| Measurement Volumes | 100 mm³ / 200 mm³ / 400 mm³ |
| Software | COMETplus (Windows-based, multi-core optimized) |
| Accessories | COMETrotary (single-axis motorized turntable, 30 kg capacity), COMETdual rotary (dual-axis tilt+rotate, 20 kg capacity) |
| Compliance | Designed for ISO/IEC 17025-aligned metrology workflows, supports traceable calibration and GLP/GMP documentation protocols |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | COMET L3D |
| Price Range | USD 14,000 – 70,000 |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | COMET L3D |
| Pricing | Available Upon Request |
| Measurement Principle | Structured Light Triangulation (Blue LED) |
| Resolution | Up to 5 MP (2448 × 2050 px) |
| Point Distance | 50–250 µm (configurable by measurement volume) |
| Acquisition Time | 1.5–2 s per scan |
| Measurement Volumes | 100 mm³ / 200 mm³ / 400 mm³ variants |
| Software | COMETplus v8.x (Windows-based, multi-core optimized) |
| Automation Support | COMETrotary (single-axis motorized turntable, ≤30 kg), COMETdual rotary (dual-axis tilt+rotate, ≤20 kg) |
| Compliance | ISO 10360-7, VDI/VDE 2634 Part 2, supports GLP/GMP audit trails via optional reporting modules |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | COMET5 1.4M |
| Effective Resolution | 1360 × 1024 pixels |
| Pixel Size | 1360 × 1024 |
| Measurement Volume Ranges (mm³) | 46×34×50 / 110×82×70 / 220×164×140 / 444×330×250 / 890×660×500 |
| 3D Point Spacing | 50 / 100 / 200 / 400 / 800 µm |
| Minimum Acquisition Time | 0.6 s |
| Interface | CAN bus + Gigabit Ethernet |
| Software Platform | COMETplus v8.x (64-bit Windows OS compatible) |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | COMET5 2.0 |
| Camera Resolution | 1600 × 1200 pixels |
| Measurement Volumes (L×W×H) | 85×65×60 mm³ to 800×600×500 mm³ |
| 3D Point Spacing | 55–500 µm (configurable per field-of-view) |
| Acquisition Time | ≤ 0.6 s per scan |
| Interface | CAN bus + Gigabit Ethernet |
| Software Platform | COMETplus v8.x (64-bit, Windows 10/11) |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Crossbeam 330 DualBeam SEM/FIB |
| Configuration | Integrated electron column + gallium liquid metal ion source (LMIS) FIB column |
| Vacuum system | Differential pumping with cold trap and turbomolecular pumps |
| Stage | Motorized 5-axis precision stage with ±90° tilt, 360° rotation, sub-micron repeatability |
| Detector suite | In-lens SE, ETSE, STEM, BSE, EDS-compatible |
| Optional integration | X-ray tomography (XRM) correlation module |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Crossbeam 350 |
| Configuration | Standard Chamber (18 ports) |
| Electron Optics | Gemini I with Tandem Decel |
| FIB Source | Liquid Metal Ga⁺ |
| Max FIB Current | 100 nA |
| SEM Resolution | ≤1.4 nm @ 1 kV (Tandem Decel) |
| Chamber Dimensions | Ø220 mm × H220 mm |
| Stage Travel | X/Y = 100 mm, Z = 40 mm |
| Detector Options | Inlens SE, Inlens EsB, VPSE, Inlens Duo |
| Software Platform | ZEISS Atlas 5 (3D Tomography & EDS Integration) |
| Compliance | Fully compatible with ASTM E1558, ISO/IEC 17025 workflows, GLP/GMP audit-ready data traceability (via Atlas 5 metadata logging) |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Crossbeam 550 |
| Configuration | Fully Integrated FIB-SEM Platform with Gemini II Electron Optics and High-Current Ga⁺ Focused Ion Beam |
| Maximum Ion Beam Current | 100 nA |
| Resolution (SE, 1 kV, Tandem Decel) | ≤1.4 nm |
| Sample Chamber Options | Standard (18 ports) or Extended (22 ports) |
| X/Y Stage Travel | 100 mm (standard chamber) or 153 mm (extended chamber) |
| Inlens EsB Detector Depth Sensitivity | <3 nm |
| EDS Integration | Full 3D Tomography-Compatible Energy-Dispersive Spectroscopy Module |
| Software Platform | ZEISS Atlas 5 for Automated 3D FIB-SEM Tomography and Correlative Analysis |
| Compliance | Designed for GLP/GMP environments |
| Brand | ZEISS |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | Crossbeam 550 Samplefab |
| Pricing | Upon Request |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Instrument Type | Floor-standing DualBeam System |
| Electron Source | Thermal Field Emission Gun |
| Secondary Electron Resolution | 0.9 nm @ 15 kV (Crossbeam 550), 1.0 nm @ 15 kV (Crossbeam 340) |
| Magnification Range | 12× – 2,000,000× (SEM mode) |
| Acceleration Voltage | 0.02–30 kV (SEM), 0.5–30 kV (FIB) |
| Backscattered Electron Resolution | Not specified |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | ZEISS Cryo-Correlative Workflow Solution |
| Instrument Form Factor | Floor-standing / Conventional Large-scale |
| Electron Source | Cold Field Emission Gun |
| Secondary Electron Resolution | Not Specified |
| Magnification Range | Not Specified |
| Accelerating Voltage | Not Specified |
| Backscattered Electron Resolution | Not Specified |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Elyra 7 |
| Category | Imported Instrument |
| Distribution Type | Authorized Distributor |
| Pricing | Available Upon Request |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | EVO |
| Pricing | Upon Request |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | EVO |
| Pricing | Available Upon Request |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | EVO10 |
| Instrument Type | Floor-Standing SEM |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 3 nm at 30 kV |
| Magnification Range | 10× to 1,000,000× |
| Accelerating Voltage | 0.2–30 kV |
| Maximum Sample Dimensions | Ø220 mm × 100 mm (H) |
| Stage Travel | X = 80 mm, Y = 100 mm, Z = 35 mm |
| Standard Detectors | Everhart-Thornley Secondary Electron Detector (SED), Solid-State Backscattered Electron Detector (BSE) |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model Range | Full-Series Gratings |
| Application System | Universal |
| Grating Configuration | Dual-Grating Mounting |
| Spectral Resolution | 0.5 nm (at 10 µm slit width) |
| Dispersion | 16 nm/mm |
| Wavelength Range | 190–1100 nm |
| Wavelength Accuracy | ±0.1 nm |
| F-number | F/4 |
| Stray Light | ≤0.1% T |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Instrument Type | Floor-standing / Conventional Large-format SEM |
| Model | Gemini |
| Key Features | High-efficiency in-lens detection |
| Sample compatibility | Conductive & non-conductive, magnetic & non-magnetic, bulk & coated specimens |
| Compliance | Designed for ISO/IEC 17025-compliant labs |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Instrument Type | Floor-standing SEM |
| Electron Gun | Cold Field Emission (CFEG) |
| Secondary Electron Resolution | 0.5 nm @ 15 kV, 0.8 nm @ 1 kV (with Tandem Decel) |
| Magnification Range | 50× – 2,000,000× |
| Accelerating Voltage | 0.02 – 30 kV |
| Backscattered Electron Resolution | 1.0 nm @ 1 kV (ESB detector) |
| Detector Configuration | In-lens SE, ET-SE, optional ESB, aSTEM-4, EDS, EBSD, CL |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | GOM ATOS Q |
| Measurement Principle | Fringe Projection Stereophotogrammetry with Dual-Camera Triangulation |
| Typical Point Accuracy | ≤ 2 µm (system-dependent, per ISO 10360-8) |
| Field of View Options | 150 × 120 mm to 1000 × 800 mm |
| Resolution | Up to 2.5 million measured points per scan |
| Software Platform | GOM Inspect Professional (v2023+), compliant with ISO 17025 traceability workflows |
| Compliance | Supports ASTM E2924, ISO 14253-1, VDI/VDE 2634 Part 2, and GLP/GMP-aligned audit trails (21 CFR Part 11 ready via optional GOM Inspect Enterprise) |
| Brand | ZEISS |
|---|---|
| Model | GOM Scan 1 |
| Measurement Principle | Structured Blue-Light Fringe Projection |
| Sensor Type | Dual-Camera Stereo Vision System |
| Point Resolution (MV100) | 0.037 mm |
| Point Resolution (MV200) | 0.060 mm |
| Point Resolution (MV400) | 0.129 mm |
| Single-Scan Point Count | 6 million points |
| Measurement Volumes | MV100 (100 × 65 mm²), MV200 (200 × 125 mm²), MV400 (400 × 250 mm²) |
| Working Distance | 400–500 mm |
| Light Source | High-Stability Blue LED |
| Weight | ~2.5 kg |
| Dimensions | 290 × 215 × 80 mm³ |
| Interface | USB 3.0 |
| OS Compatibility | Windows 10 |
| Software | GOM Inspect Suite (included) |