ZEISS
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| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | PRISMO Series |
| Configuration | Bridge-type |
| Operation Mode | Automatic |
| Application Class | Shop-floor & Laboratory |
| Measurement Range | 700 × 1000 × 500 mm to 1600 × 4200 × 1000 mm |
| Volumetric Accuracy | (0.5 + L/500) µm |
| Maximum Scanning Speed | 1 m/s |
| Standard Operating Temperature | 18–20 °C |
| Thermal Stability | Glass-ceramic scale encoders |
| Structural Material | Industrial ceramic bridge and Z-axis |
| Bearing System | ZEISS Quadrapod air-bearing guidance on all axes |
| Dynamic Compensation | Computer-Aided Accuracy (CAA) real-time error correction |
| Compliance | ISO 10360, VDI/VDE 2627 Class 3 (for PRISMO verity), GLP/GMP-ready software architecture |
| Brand | ZEISS |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | RIMA Spatial Biology Solution |
| Pricing | Upon Request |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Sigma 360 |
| Wafer Handling | Full 200 mm (8-inch) diameter |
| Imaging Mode | Field Emission Scanning Electron Microscopy (FE-SEM) |
| Primary Application | Semiconductor Process Defect Inspection & CD Metrology |
| Vacuum System | Differential pumping with cold trap |
| Stage Type | Motorized polar-coordinate stage with collision-avoidance logic |
| Detector Configuration | In-lens EsB, SE2, and STEM-in-SEM options |
| Operating Voltage Range | 0.1–30 kV |
| Resolution | ≤1.0 nm @ 1 kV (in-lens SE mode) |
| Software Platform | SmartSEM Engineering Edition with wafer map navigation and recipe-driven automation |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Sigma 360 |
| Instrument Type | Floor-standing High-Resolution FE-SEM |
| Electron Source | Thermal Field Emission Gun (TFEG) |
| Secondary Electron Resolution | 0.9 nm @ 15 kV, 1.3 nm @ 1 kV |
| Magnification Range | 10× – 1,000,000× |
| Accelerating Voltage | 0.02 – 30 kV |
| Maximum Sample Diameter | ≤ 179 mm |
| Stage | 5-Axis Motorized Eucentric Stage |
| Standard Detectors | In-Lens SE Detector, Everhart-Thornley SE Detector, Solid-State Backscattered Electron (BSE) Detector |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model Series | SIGMA |
| Instrument Type | Desktop SEM |
| Electron Gun Type | Cold Field Emission |
| Microscope Class | High-Resolution Field Emission SEM |
| Secondary Electron (SE) Image Resolution | 1.0 nm @ 1 kV, 0.8 nm @ 3 kV |
| Maximum Magnification | 1,000,000× |
| Accelerating Voltage Range | 0.02–30 kV |
| Backscattered Electron (BSE) Image Resolution | 3.0 nm @ 30 kV |
| Working Distance for Analysis | 8.5 mm |
| Tilt Angle for EDS Collection | 35° |
| Variable Pressure Mode | Yes (C2D & VP-SE Detectors) |
| In-Lens SE/BSE Dual Detection | Yes |
| STEM-in-SEM Capability | Yes (aSTEM Detector Optional) |
| EDS Integration | SmartEDX (Si(Li)/SDD, Nitride Window Optimized for Light Elements) |
| RISE Integration | Yes (Fully Integrated Confocal Raman Imaging) |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | SIGMA |
| Detector Options | InLens SE, ETSE, aBSD, Sense BSD |
| EDS Geometry | Optimized for High-Solid-Angle Collection |
| Operating Modes | NanoVP Lite, High-Resolution SEM, Low-Voltage Imaging, In-Situ Compatible |
| Vacuum System | Differential Pumping with Dual-Stage Turbo-Molecular Pumps |
| Stage | Motorized 5-Axis Precision Stage (±0.1 µm repeatability) |
| Beam Control | Gemini II Electron Optics with Active Stigmator and Auto-Alignment |
| Software Platform | SmartSEM with GLP/GMP-Compliant Audit Trail (21 CFR Part 11 Ready) |
| Compliance | ISO 14644-1 Class 5 Cleanroom-Compatible Design, CE Marked, RoHS Compliant |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Smartproof 5 |
| Wavelength | 405 nm |
| Lateral Resolution (XY) | 120 nm |
| Z-Axis Minimum Step Size | 1 nm |
| Imaging Speed | >50 fps (2048 × 2048 resolution) |
| Objective Range | 2.5×–100× |
| Maximum Height Scan Range | 5 mm |
| Stage Travel | 150 mm × 150 mm |
| Software | Smartproof 5 Application Software |
| Surface Metrology Compliance | ISO 4287 (profile roughness), ISO 25178 (areal roughness) |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Smartproof 5 |
| Wavelength | 405 nm |
| Lateral Resolution (XY) | 120 nm |
| Z-Axis Minimum Step Size | 1 nm |
| Imaging Speed | >50 fps (2048 × 2048 resolution) |
| Objective Magnification Range | 2.5×–100× |
| Maximum Height Scan Range | 5 mm |
| Stage Travel | 150 mm × 150 mm |
| Software | Smartproof 5 Application Suite |
| Surface Roughness Standards Compliance | ISO 4287 (2D), ISO 25178 (3D) |
| Illumination | Tri-color LED (RGB) for True-Color Surface Rendering |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Smartzoom 5 |
| Type | 3D Digital Microscope |
| Compliance | CE, ISO 9001 certified manufacturing |
| Optical System | Infinity-corrected optics with motorized zoom and focus |
| Max. Magnification | Up to 1,200× (combined optical + digital) |
| Working Distance | Adjustable up to 110 mm |
| Image Sensor | High-resolution CMOS, ≥5 MP |
| Illumination | Integrated coaxial and ring LED (adjustable intensity, flicker-free) |
| Stage Travel | 130 mm × 100 mm (motorized optional) |
| Software Platform | ZEISS ZEN Core with GLP-compliant audit trail, report generation, and measurement traceability |
| Data Export | TIFF, PNG, JPEG, CSV, PDF, ZEN project files |
| Connectivity | USB 3.0, HDMI, Gigabit Ethernet |
| Environmental Rating | Designed for ISO Class 5–7 cleanroom-adjacent lab and production floor use |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Smartzoom 5 |
| Zoom Range | 10×–1,011× (with three interchangeable objectives) |
| Illumination | Integrated segmented LED ring light with objective-mounted power contact |
| Safety | Motorized collision avoidance (objective-sample and objective-hand detection) |
| Software | ZEISS ZEN Core with macro recording, real-time image enhancement (HDR, noise reduction, sharpening, image stabilization), GLP-compliant audit trail, user permission management, Word report export |
| Compliance | Designed for ISO/IEC 17025, ASTM E2928, USP <1118>, and FDA 21 CFR Part 11–ready workflows |
| Brand | Zeiss |
|---|---|
| Origin | Germany |
| Model | Smartzoom 5 |
| Type | Automated Digital Stereo Microscope with Integrated Imaging Engine |
| Optical Configuration | Reflected and Transmitted Light Capable |
| Zoom Range | 10×–2022× Continuous Magnification (including digital zoom) |
| Core Optics | Motorized Zoom Objective with Coaxial Illumination & Panoramic Imaging Capability |
| Compliance | Designed for ISO/IEC 17025, ASTM E2904, and GLP/GMP-aligned workflows |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Smartzoom 5 |
| Manufacturer | Carl Zeiss AG |
| Distribution Channel | Authorized Distributor (Imported) |
| Price | USD 102,000 (FOB Hamburg, ex. VAT & shipping) |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | ZEISS Spectrum |
| Configuration | Bridge-type CMM |
| Operation Mode | Fully Automatic |
| Application Class | Shop-floor CMM |
| Measurement Method | Contact-based (Tactile) |
| Measurement Volume Range | 500 × 500 × 600 mm to 1000 × 1600 × 600 mm |
| Maximum Permissible Error (MPE<sub>E</sub>) | 1.9 + L/250 µm |
| Standard Operating Temperature | +17 °C to +35 °C |
| Probe Compatibility | ZEISS XDT direct, ZEISS VAST XXT direct, ZEISS VAST XT gold (Spectrum plus), ZEISS RDS-C5 with CAA, ZEISS RDS-C with CAA |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Stemi 2000-C |
| Total Magnification Range | 1.95×–250× |
| Working Distance | up to 286 mm |
| Field of View Diameter (at lowest magnification) | 35 mm |
| Illumination | 8 V, 20 W halogen cold light source (optional: 12 V/75 W, 15 V/150 W, 24 V/250 W) |
| Optical System | ICCS (Integrated Contrast Correction System) |
| Ergonomic Design | modular, open-architecture platform compliant with human factors engineering standards |
| Upgrade Path | fully compatible with digital imaging modules (C-mount cameras, USB/CMOS sensors, image analysis software suites) |
| Service Life Expectancy | ≥60 years (per ZEISS mechanical and optical longevity specifications) |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Stemi 305 |
| Total Magnification | 8×–40× (optional 4×–200×) |
| Zoom Ratio | 5:1 |
| Field Diameter | 23 mm |
| Working Distance | 110 mm (upgradable to 185 mm) |
| Illumination | Integrated LED (reflected & transmitted) |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Stemi 305 |
| Total Magnification | 8×–40× (optional 4×–200×) |
| Zoom Ratio | 5:1 |
| Illumination | Integrated White LED (Reflected & Transmitted) |
| Digital Imaging | Compatible with ZEISS Axiocam Cameras & Labscope Wi-Fi Imaging Platform |
| Compliance | CE, ISO 9001, EN 61000-6-3/6-4 |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Stemi 355 |
| Total Magnification Range | 7.2×–40× (up to 200× with optional eyepieces and auxiliary lenses) |
| Zoom Ratio | 5.5:1 |
| Field of View Diameter | up to 64 mm |
| Working Distance | up to 185 mm |
| Objective Type | Greenough-type stereoscopic optical system |
| Illumination | Integrated LED illumination with selectable modes — near-vertical incident light, dual-side reflected light, ring light, transmitted light, and mixed illumination |
| Depth of Field | Optimized for high-resolution stereo imaging across zoom range |
| Numerical Aperture (NA) | 0.082 |
| Resolution | 489 lp/mm (at maximum magnification and optimal focus) |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Stemi 508 Greenough 8:1 |
| Zoom Ratio | 8:1 (0.63×–5.0×) |
| Standard Magnification Range (with 10× eyepieces, no auxiliary lens) | 6.3×–50× |
| Extended Magnification Range (with interchangeable objectives & eyepieces) | 1.9×–250× |
| Working Distance | 35–287 mm |
| Resolution (Rayleigh criterion, test target) | up to 450 lp/mm (g = 2.2 µm) |
| Minimum Resolvable Structure | 1.1 µm |
| Maximum Field Diameter | 122.7 mm |
| Eyepiece Field Number | 23 mm |
| Interpupillary Distance Adjustment | 55–75 mm |
| Viewing Angle | 35° |
| Optional Imaging Ports | 100% beam split (Stemi 508 doc) or 50/50 permanent beam splitter (Stemi 508 trino), both with replaceable 0.5× C-mount adapter (60NC type) |
| Base Compatibility | M-series mechanical base (M and M LED variants), including integrated LED illumination electronics, fiber-optic coupling interfaces (2× M8), transmission stage interface (Ø84 mm), polarizer mounting interface (Ø45 mm), and central aperture (40 mm) |
| Stand Load Capacity | 5 kg |
| Focusing Stand Travel | 360 mm height / 190 mm vertical lift |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Stemi 508 |
| Total Magnification Range | 6.3×–250× |
| Zoom Ratio | 8:1 |
| Working Distance | 286 mm |
| Objective Type | Apochromatic Zoom Optical System |
| Illumination | Integrated LED |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Stemi 508 |
| Magnification Range | 6.3×–50× |
| Zoom Ratio | 8:1 |
| Field of View | up to 36 mm |
| Working Distance | 287 mm |
| Optical Correction | Apochromatic Zoom Body & Front Objective |
| Detented Zoom Positions | 10 |
| Illumination | Integrated LED System (Reflected, Transmitted, and Mixed Lighting) |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SteREO Discovery |
| Pricing | Upon Request |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Status | Authorized Distributor |
| Product Origin | Imported |
| Model | SteREO Discovery.V12 |
| Price | Upon Request |
| Total Magnification Range | 12×–375× |
| Working Distance | 81 mm |
| Vertical Travel | 340 mm |
| Maximum Field Diameter (at lowest magnification) | 25 mm |
| Focusing Resolution | 350 nm |
| Field of View (Actual) | 2.3–28.8 mm |
| Illumination | 15 V / 150 W Halogen or 24 V / 250 W Halogen Cold Light Source |
| Expandability | Compatible with digital cameras, CCD/CMOS imaging modules, and quantitative image analysis software suites |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | SteREO Discovery.V20 |
| Total Magnification Range | 4.7×–1312.5× |
| Zoom Ratio | 20:1 |
| Working Distance | 10–253 mm |
| Vertical Travel | 340 mm |
| Focusing Resolution | 350 nm |
| Field of View | 0.18–48.7 mm |
| Illumination | 15 V/150 W or 24 V/250 W Cold Light Source |
| Automation | SyCop System Controller + H.I.P. Human Interface Panel |
| Optical Design | CMO (Common Main Objective) Telecentric Path |
| Anti-Glare Optics | ZEISS Proprietary Technology |
| Structural Architecture | Modular, Open-Frame, Ergonomically Optimized |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | SteREO Discovery.V8 |
| Total Magnification Range | 3×–300× |
| Zoom Ratio | 1:8 |
| Optical Design | Common Main Objective (CMO) |
| Ergonomic Design | Yes |
| Illumination Options | Reflected, Transmitted, Oblique, Ring Light, Polarized |
| Imaging Compatibility | Digital Camera, C-Mount Adapter, Image Analysis Software |
| Working Distance | Up to 110 mm (at lowest magnification) |
| Field of View | Up to 74 mm (at 3×) |
| Compliance | ISO 9001, CE, RoHS |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | SteREO Lumar.V12 |
| Maximum Resolution | 1000 LP/mm |
| Maximum Magnification | 345× |
| Working Distance | Extended (optimized for in vivo specimen handling) |
| Fluorescence Objective NA | High numerical aperture (designed for bright, low-magnification fluorescence imaging) |
| Control Interface | Integrated LCD touchscreen |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | SUPRA 1540 |
| Operational Age | 10 Years |
| Resolution | 2 nm @ 15 kV, 3 nm @ 1 kV |
| Magnification Range | 12× to 2,000,000× |
| Accelerating Voltage | 20 V – 30 kV (continuously adjustable) |
| Probe Current | 5 pA – 20 nA (optional extended range: 12 pA – 100 nA) |
| Chamber Dimensions | Ø330 mm × 270 mm (H) |
| Stage Motion | 5-axis motorized eucentric stage (X = 130 mm, Y = 130 mm, Z = 50 mm, Tilt = –3° to +70°, Rotation = 360° continuous) |
| Control System | SmartSEM software suite on Windows 7 platform, compatible with mouse, keyboard, and dedicated hardware control panel |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | GEMINI SUPRA 40 VP |
| Resolution | 1.3 nm @ 15 kV, 2.1 nm @ 1 kV, 5.0 nm @ 0.1 kV (Standard Mode) |
| Magnification Range | 12× – 900,000× |
| Accelerating Voltage | 0.02 – 30 kV |
| Beam Current | 4 pA – 10 nA (optional up to 20 nA) |
| Electron Source | Thermal Field Emission Gun (TFEG) |
| Detector Configuration | In-lens SE, ETSE, VPSE, STEM-in-SEM, and integrated Energy Dispersive X-ray Spectrometer (EDS) |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Configuration | SUPRA 40VP + Oxford X-MaxN EDS + Symmetry EBSD |
| Operating Hours | ~6 years |
| Resolution | 1.0 nm @ 20 kV (SE), 2.0 nm @ 30 kV (VP mode) |
| Acceleration Voltage | 0.1–30 kV |
| Vacuum Mode Range | 2–133 Pa (variable pressure, 1 Pa step) |
| Probe Current | 4 pA–10 nA (up to 20 nA optional) |
| Chamber Dimensions | Ø330 mm × H270 mm |
| Stage Motion | 5-axis motorized (X/Y ±130 mm, Z 0–50 mm, Tilt −3° to +70°) |
| Magnification | 12×–900,000× |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | T-SCAN |
| Measurement Volume | Up to 35 m³ |
| Depth of Field | ±50 mm |
| Laser Line Width | 125 mm |
| Working Distance | 150 mm (nominal) |
| Laser Line Frequency | up to 330 Hz |
| Point Acquisition Rate | 210,000 pts/sec |
| Average Point Spacing | 0.075 mm |
| Resolution per Scan Line | 1312 points |
| Laser Type | Diode |
| Wavelength | 658 nm |
| Laser Class | 2M |
| Scanner Weight | 1100 g |
| Scanner Dimensions | 300 × 170 × 150 mm |
| Standard Cable Length (Scanner–PC) | 10 m |
| Software Platform | ZEISS colin3D |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | VersaXRM 615 & VersaXRM 730 |
| Resolution | 500 nm (VersaXRM 615), 450 nm (VersaXRM 730) |
| Minimum Voxel Size | 40 nm |
| Imaging Modes | Absorption, Phase Contrast, Diffraction Contrast |
| In Situ Capability | 4D Dynamic Imaging |
| AI-Enhanced Reconstruction | ART Advanced Reconstruction Toolbox |
| Fast Scan Mode | Sub-60-second 3D scan |
| Compliance | Fully compatible with GLP/GMP workflows and ASTM E1441, ISO 15787, and USP <1089> for non-destructive 3D characterization |