Energy Dispersive X-Ray Fluorescence Spectrometer
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| Brand | PULUODY |
|---|---|
| Origin | Shaanxi, China |
| Model | PCS-3A |
| Application | Handheld/Portable |
| Element Detection Range | C₅–Cₙ organic compounds |
| Quantification Range | 1–2000 (unitless relative scale) |
| Energy Resolution | 0.01 FU (Fluorescence Unit) |
| Repeatability | ≥99% |
| Detector Type | X-ray-excited ultraviolet fluorescence (XUVF) detector |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | QuanX |
| Configuration | Benchtop or Floor-Standing |
| Detector Options | Liquid-Nitrogen-Cooled or Electrically Cooled Si(Li) Detector |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | Typically sub-ppm to 100% w/w |
| Compliance | Designed for ISO/IEC 17025-compliant laboratories |
| Brand | Raykol |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | JP500 |
| Application Form Factor | Handheld / Portable |
| Industry Use | General-Purpose |
| Elemental Range | Al to U |
| Quantification Range | 0.03 ppm – 100% |
| Energy Resolution | <140 eV (at Mn Kα) |
| Relative Standard Deviation (RSD) | ≤0.08% for major elements |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Brand | Raykol |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | JPX500 |
| Application Form Factor | Handheld/Portable |
| Industry Use | General-Purpose |
| Elemental Range | Al to U (40+ elements) |
| Quantification Range | 0.03 ppm – 100% |
| Energy Resolution | <140 eV (at Mn Kα) |
| Repeatability (RSD) | ≤0.08% |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | AZX 400 |
| Sample Capacity | Ø400 mm × 50 mm thickness × 30 kg max |
| Elemental Range | Ta, Cu, Ru, Pt, Mn |
| Repeatability | 0.12% RSD |
| Configuration | Floor-standing WD-XRF system |
| Application Focus | Semiconductor metrology, sputtering target QC, magnetic disk analysis, multilayer thin-film characterization |
| Compliance | Designed for ISO/IEC 17025-compliant labs |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | RIGAKU NEX CG |
| Price Range | USD 42,000 – 70,000 (FOB) |
| Form Factor | Benchtop (not handheld — corrected per technical specification) |
| Elemental Range | Na (11) to U (92) |
| Quantification Range | 0.1 ppm to 100 wt% |
| Energy Resolution | ≤140 eV at Mn Kα |
| Repeatability | ≤0.1% RSD for major elements under controlled conditions |
| Brand | Rigaku |
|---|---|
| Origin | USA |
| Model | NEX CG II |
| Element Range | Na (11) to U (92) |
| Detection Limits (typical for petroleum) | Si 1.1 ppm, P 0.8 ppm, S 0.5 ppm, Cl 0.4 ppm, Mn 0.9 ppm, Fe 0.7 ppm, Pb 0.7 ppm |
| Concentration Range | 0.11 ppm – 10% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability | 0.05% RSD |
| Detector | Silicon Drift Detector (SDD) with Peltier cooling |
| Excitation Source | Pd anode X-ray tube, max 50 kV / 50 W |
| Polarization Optics | 5-position polarized secondary target assembly |
| Geometry | Cartesian 3D configuration (X-ray tube → polarizer → sample → detector) |
| Sample Volume | 5 mL |
| Autosampler | 15-position carousel |
| Calibration Method | Compton scattering C/H ratio correction |
| Data Output | USB 2.0 and Ethernet (RJ-45), CSV/PDF export |
| Dimensions | 463 × 492 × 382 mm (W×D×H) |
| Power | AC 200–240 V, 50/60 Hz, 1.6 A |
| Operating Environment | 18–28 °C, RH <75% non-condensing, vibration-free, non-corrosive atmosphere |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | NEX QC+ |
| Application Form Factor | Benchtop (Not Handheld) |
| Elemental Range | Na (11) to U (92) |
| Quantitative Range | 0.1 ppm to 100 wt% |
| Energy Resolution | ≤140 eV at Mn Kα |
| Short-Term Repeatability | ≤0.1% RSD (for major elements, 100 s counting) |
| Origin | China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Model | RoHS II |
| Pricing | Available Upon Request |
| Brand | SciAps |
|---|---|
| Origin | USA |
| Model | X-200 |
| Application | Handheld/Portable |
| Element Range | Pb, Hg, Cd, Br, Cr |
| Detector | 20 mm² Silicon Drift Detector (SDD), 135 eV FWHM resolution at 5.95 keV Mn Kα line |
| Excitation Source | Rh anode (6–40 kV, 200 µA) for alloy analysis |
| Weight | 1.5 kg (3.3 lbs) with battery |
| Display | 5-inch color capacitive touchscreen |
| Operating Temperature | −4 °C to +54 °C (25 °F to 130 °F) at 10% duty cycle |
| Certifications | CE, RoHS, US FDA Registered, Canada RED Act compliant |
| Brand | SciAps |
|---|---|
| Origin | USA |
| Model | X-550 |
| Detector | 20 mm² Silicon Drift Detector (SDD), 140 eV FWHM resolution at 5.95 keV Mn Kα |
| Excitation Source | Rh anode (40 kV / 200 µA for alloys |
| Elemental Range | Standard 32 elements (Mg–U), configurable per application |
| Sample Form | Solid, powdered, or coated surfaces (non-destructive) |
| Weight | 1.35 kg (2.98 lb) with battery |
| Dimensions | 216 × 241 × 61 mm (8.5 × 9.5 × 2.4 in) |
| Display | 2.7″ color capacitive touchscreen, sunlight-readable |
| Processor | 1.2 GHz quad-core ARM Cortex-A53 (64/32-bit), 2 GB LP-DDR3 RAM, 16 GB eMMC storage |
| Battery | Rechargeable Li-ion, hot-swappable (≤60 s swap time) |
| Regulatory Compliance | CE, RoHS, US FDA 21 CFR Part 820 registered, ISED Canada RED compliant |
| Operating Temperature | –4 °C to 54 °C (25 °F to 130 °F) at 10% duty cycle |
| Calibration Method | Fundamental Parameters (FP) with optional Compton normalization and empirical calibration |
| Filter Wheel | 4-position motorized filter wheel for beam optimization |
| Pulse Processor | 12-bit, 80 MSPS digitization rate, 8K-channel MCA, FPGA-based digital pulse shaping (20 ns – 24 µs peaking time) |
| Software | SciAps ProfileBuilder for library management and method development |
| Applications | Alloy PMI, geochemical exploration, environmental soil screening (EPA Method 6200), RoHS/Br/Cl compliance, catalyst analysis, precious metals assay, lead-based paint (HUD), and empirical custom analysis |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer | LANScientific |
| Type | Benchtop/Floor-Standing Hybrid |
| Configuration | Conventional ED-XRF System |
| Application Sector | Non-Ferrous Metals Recycling |
| Elemental Range | Al (13) to U (92) |
| Detection Limit | Sub-ppm to % level (matrix-dependent) |
| Safety Compliance | IEC 62495, GB/Z 25480, EN 61000-6-3 |
| Software | ScopeX Analyze v3.2 with Audit Trail & CFR Part 11 Ready Mode |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Type | Benchtop/Floor-Standing ED-XRF |
| Model | ScopeX 980CS / ScopeX 980CSR |
| Elemental Range | Na (11) to U (92) |
| Detection Limit | 1 ppm (typical, matrix-dependent) |
| Energy Resolution | <125 eV at Mn Kα (5.89 keV) |
| Repeatability | ≤0.1% RSD (for major elements under optimized conditions) |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Sample Chamber | Dual-mode (air/vacuum) with motorized sample stage |
| Excitation Source | Rhodium-anode microfocus X-ray tube |
| Collimators | 5 mm, 3 mm, 1 mm, 0.5 mm (motorized auto-switching) |
| Filters | Multi-position filter wheel (Al, Cu, Ti, none) |
| Data Interface | USB 3.0, Wi-Fi 5 (802.11ac), Bluetooth 5.0 |
| Report Output | Customizable Excel/PDF templates with spectral overlays, logo embedding, and metadata fields |
| Safety Compliance | Fully shielded metal enclosure with interlocked vacuum door |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | ALTRACE |
| Configuration | Benchtop/Floor-standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-purpose |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Detector | Silicon Drift Detector (SDD) |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Model | EDX-700HS |
| Element Range | Na (11) to U (92) |
| Detection Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV |
| Repeatability | 0.1% |
| Configuration | Benchtop / Floor-standing |
| Application Focus | Geological & Mineralogical Analysis |
| Primary Excitation | Rh anode X-ray tube (5–50 kV, 1–1000 µA) |
| Sample Chamber | Ø300 mm × H150 mm |
| Beam Spot Size | 50 µm φ (with polycapillary lens) |
| Detector | Liquid-nitrogen-cooled Si(Li) |
| CCD Imaging | Dual-magnification optical system |
| Filter Exchange | Automated 5-position primary filter changer |
| Quantitative Methods | Fundamental Parameters (FP), Thin-Film FP, Background-corrected FP (BG-FP) |
| Mapping | Simultaneous multi-element scanning imaging |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Model | EDX-720 |
| Element Range | Na (11) – U (92) |
| Detection Limit | 1 ppm |
| Quantitative Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV (at Mn Kα) |
| Repeatability | ±0.1% RSD |
| Configuration | Benchtop or Floor-Standing |
| Application Sector | Geological & Mineralogical Analysis |
| Compliance | Designed for ISO/IEC 17025-aligned laboratories |
| Instrument Condition | Factory-refurbished, fully recalibrated and performance-verified |
| Brand | Shimadzu |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (PRC) |
| Model | EDX-7200 |
| Configuration | Benchtop or Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Quantitative Concentration Range | 0.1 ppm – 100 wt% |
| Energy Resolution | ≤140 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD (for major elements under standardized conditions) |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | EDX-8100 |
| Configuration | Benchtop & Floor-Standing Options |
| Application Scope | General-Purpose Elemental Analysis |
| Elemental Range | C (Z=6) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV at Mn Kα |
| Repeatability | <0.1% RSD (Relative Standard Deviation) |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Configuration | Benchtop/Floor-standing |
| Elemental Range | Al (13) to U (92) |
| Intended Use | Electronics Industry Applications |
| Compliance | Designed for ISO/IEC 17025-aligned QA/QC workflows |
| Condition | Factory-refurbished with full functional validation |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | EDX-LE |
| Configuration | Benchtop / Floor-standing |
| Detection Principle | Energy Dispersive X-Ray Fluorescence (EDXRF) |
| Sample Forms | Solid, Liquid, Powder |
| Elemental Range | Al (13) to U (92) |
| Sample Chamber Dimensions | Max. W370 mm × D320 mm × H155 mm |
| Detector | Peltier-cooled Si-PIN Semiconductor Detector |
| Primary Beam Filters | 5-position automatic filter changer + OPEN position |
| Analysis Modes | Screening, Qualitative, Quantitative |
| Regulatory Compliance Focus | RoHS Directive (EU 2011/65/EU), ELV Directive (2000/53/EC), China RoHS II (SJ/T 11364-2014) |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | EDX-LE Plus |
| Configuration | Benchtop/Floor-standing |
| Industry Application | Electronics |
| Elemental Range | Al (Z=13) to U (Z=92) |
| Detection Limit | 0.1 ppm |
| Quantitative Range | 0.1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD (at 100 s counting time, for Cr in stainless steel standard) |
| Brand | Sichuan Xinxianda |
|---|---|
| Origin | Sichuan, China |
| Model | CIT-2000SMP |
| Detector Type | Proportional Counter |
| Excitation Source | ²³⁸Pu Radioisotope |
| Energy Resolution | 15–20% (at 5.9 keV) |
| Detection Limit | 10⁻³ µg/g |
| Measurement Time | 0.5–5 min per sample |
| Operating Temperature | 0–50 °C |
| Power Consumption | ≤5 W |
| Weight | 3 kg |
| Dimensions | 30 × 20 × 13 cm |
| Elemental Range | Ca, Fe, Ti, Mn, Cu, Pb, Zn, Ni, Sn, Bi, Mo |
| Multichannel Analyzer | 512-channel |
| Sample Form | Solid (bulk or powder) |
| Compliance | CE-marked for field-deployable instrumentation |
| Software Interface | Standalone microcontroller with LCD display and onboard data storage |
| Brand | Sichuan Xinxianda |
|---|---|
| Origin | Sichuan, China |
| Model | CIT-3000SM |
| Form Factor | Benchtop/Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | Universal (Industrial & Laboratory) |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99% (matrix-dependent) |
| Energy Resolution | < 110 eV (with SDD or FAST-SDD detector) |
| Repeatability (RSD) | < 0.1% |
| Detector | Silicon Drift Detector (SDD) or FAST-SDD |
| High Voltage Supply | 0–50 kV (adjustable), 0–1 mA (adjustable) |
| Measurement Time | 100–300 s |
| Sample Mass | 3–8 g |
| Vacuum Level | ≤ 10⁻² Pa (stable for ≥30 min) |
| Dimensions | 480 × 420 × 660 mm (D×W×H) |
| Weight | 70 kg |
| Brand | Sichuan Xinxianda |
|---|---|
| Origin | Sichuan, China |
| Model | CIT-3000SMP |
| Detector | Si(Li) semiconductor, Peltier-cooled |
| Energy Resolution | ≤150 eV (Mn Kα, 5.9 keV) |
| Analytical Range | 2–30 keV |
| Elements Analyzed | S to U (Z = 16–92) |
| Detection Limits | Cd/Cr/Hg/Br ≤ 1 ppm, Pb ≤ 2 ppm |
| Precision | RSD ≤ 0.08% (standard deviation) |
| Measurement Time | < 200 s |
| Power Consumption | 4 W |
| Weight | 1.75 kg |
| Battery Life | ≥ 8 h (full-load operation) |
| Operating System | Embedded Chinese GUI on integrated PDA |
| Connectivity | Bluetooth v4.0, GPS module |
| Safety Indicators | Dual-color LED (green = power on, red = X-ray emission) |
| Sample Forms | Solid blocks, powders, pressed pellets |
| Compliance | IEC 61010-1, IEC 62471 (LED safety), RoHS-compliant construction |
| Data Storage | Internal flash memory (≥ 16 GB) |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | EDX 3200S PLUS C |
| Form Factor | Benchtop/Floor-Standing |
| Application Domain | Food Safety Testing |
| Elemental Range | S to U |
| Quantification Range | 0.03 ppm – 99.99% |
| Energy Resolution | ≤125 eV (FWHM at Mn Kα) |
| Repeatability | <10% RSD (at 0.2 mg/kg Cd) |
| Detector | FAST-SDD (Silicon Drift Detector with Fast Pulse Processing) |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | EDX-V |
| Form Factor | Benchtop/Floor-standing |
| Instrument Type | Conventional EDXRF |
| Application Scope | General-purpose coating & thin-film analysis |
| Compliance | ASTM B568, ISO 3497, DIN EN ISO 3497, IPC-4552 (ENIG), IPC-4556 (ENEPIG) |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Origin | Domestic (China) |
| Model | EDX2000H |
| Form Factor | Benchtop / Floor-Standing |
| Application Type | General-Purpose |
| Elemental Range | S (16) – U (92) |
| Quantification Range | 0.1 ppm – 99.99 wt% |
| Energy Resolution | ≤125 eV (Mn Kα) |
| Repeatability | ≤0.05% RSD (for major elements >96 wt%) |
| Detector | Si-PIN Semiconductor Detector |
| Operating Temperature | 15–30 °C |
| Sample Chamber Dimensions | 460 × 298 × 98 mm |
| Instrument Dimensions | 550 × 410 × 320 mm |
| Weight | 45 kg |
| Power Supply | AC 220 V ±5 V, recommended with line conditioner |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Category | Domestic |
| Model | EDX3000 |
| Form Factor | Benchtop/Floor-standing |
| Application Type | General-purpose |
| Elemental Range | S (16) to U (92) |
| Quantitative Range | 1 ppm – 99.9 wt% |
| Energy Resolution | 125 eV (at Mn Kα) |
| Repeatability | ≤0.05% RSD (for major elements >96 wt%) |
| Detector | Si-PIN semiconductor detector |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | EDX 3000 PLUS |
| Form Factor | Benchtop |
| Application Scope | General-Purpose |
| Elemental Range | S (16) to U (92) |
| Detection Limit | ppm-level |
| Quantification Range | 0.0001 wt% to 99.99 wt% |
| Energy Resolution | 125 eV (at Mn Kα) |
| Detector | FAST-SDD (25 mm² active area) |
| Brand | SkyRay Instrument |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | EDX 3200S PLUS |
| Configuration | Benchtop/Floor-standing |
| Industry Application | Energy & Petrochemicals |
| Energy Resolution | 125 eV |
| Detector | FAST-SDD |