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| Brand | Photo Research |
|---|---|
| Origin | USA |
| Model | PR-930 |
| Sensor Type | Interline-cooled CCD |
| Dynamic Range | 12-bit |
| Resolution | 8 MP (3,296 × 2,472) |
| Pixel Size | 5.5 × 5.5 µm |
| Minimum Measurable Spot | 27.5 × 27.5 µm (5×5 pixel binning) |
| FOV (@ 1 | 1 Macro Lens): 18.13 × 13.59 mm |
| Luminance Range | 0.005–500 cd/m² (ND-1 to ND-3 filters optional) |
| Luminance Accuracy (A-source) | ±2% (>0.05 cd/m²), ±3% (0.005–0.05 cd/m²) |
| Luminance Accuracy (Sample) | ±1% (>0.05 cd/m²), ±2% (0.005–0.05 cd/m²) |
| Luminance Repeatability (A-source) | ≥0.2% (>0.05 cd/m²), ≥1% (0.005–0.05 cd/m²) |
| Chromaticity Accuracy (A-source) | ±0.0015 CIE x,y (>0.05 cd/m²), ±0.005 CIE x,y (0.005–0.05 cd/m²) |
| Chromaticity Accuracy (Sample) | ±0.0015 CIE x,y (>0.05 cd/m²), ±0.005 CIE x,y (0.005–0.05 cd/m²) |
| Chromaticity Repeatability | ±0.001 CIE x,y (>0.05 cd/m²), ±0.003 CIE x,y (0.005–0.05 cd/m²) |
| Interface | USB 2.0 |
| Power Input | 100–240 VAC, 50–60 Hz |
| Power Consumption | 12 V, 3.8 A (45.6 W) |
| Operating Temperature | 5–30 °C, non-condensing |
| Weight | 3.77 kg |
| Brand | Photo Research |
|---|---|
| Origin | USA |
| Model | PR1050 |
| Dynamic Range | 500,000,000:1 |
| Spectral Bandwidth | 2, 5, or 8 nm (auto-selectable) |
| Detector | Back-illuminated CCD, 512 pixels, thermoelectrically cooled |
| Color Accuracy (CIE 1931 x,y) | ±0.0015 at 5.14E−4 cd/m² (A-source, 2856 K, 2° FOV, 8 nm BW) |
| Color Repeatability | ±0.0005 at 1.19E−2 cd/m² (A-source, 2° FOV) |
| Luminance Sensitivity | 1.71E−5 cd/m² (10:1 SNR, 2° FOV, 8 nm BW) |
| Luminance Accuracy | ±2% (NIST-traceable A-source, 5.14E−4 cd/m²) |
| Luminance Repeatability | ≤1% (NIST-traceable A-source, 5.14E−4 cd/m²) |
| Exposure Time | 7 ms – 120 s |
| Polarization Error | <0.2% (at 3.34 cd/m², 2° FOV) |
| Stray Light | <0.06% |
| Wavelength Accuracy | <0.4 nm |
| Spectral Resolution | 1 nm |
| Digital Resolution | 16-bit |
| Interfaces | USB, RS-232 |
| Apertures | 2°, 1°, 0.5°, 0.25°, 0.2°, 0.125°, 0.1°, 0.1°×1° (vertical slit), 0.5°×1.5° (horizontal slit) |
| Power | Rechargeable Li-ion battery or 90–240 VAC adapter |
| Battery Life | Up to 8 hours |
| Weight | 6.01 kg |
| Dimensions | 28.0 × 17.0 × 20.3 cm |
| Operating Temperature | 1–35 °C |
| Relative Humidity | 0–90% RH (non-condensing) |
| Brand | Photo Research |
|---|---|
| Origin | USA |
| Model | PR805/810 |
| Power Supply | Rechargeable Li-ion battery (≥12 h continuous operation) |
| Display | Full-color capacitive touchscreen |
| Lens | Standard 75 mm focal length (measurement distance: 355 mm to infinity) |
| Minimum Luminance | PR810 — 0.0001 fL (0.00034 cd/m²) |
| Apertures | PR805 — 10 fixed apertures |
| Neutral Density Filter Turret | 3-decade attenuation (10×, 100×, 1000×) |
| Dynamic Range | >9,000,000:1 |
| Interface | USB Virtual COM port (RS-232 emulation), optional Class 1 Bluetooth (100 m range) |
| Data Storage | Internal memory + SD card slot |
| Compliance | Designed for ASTM E308, CIE 15:2018, ISO/CIE 11664, USP <1033>, FDA 21 CFR Part 11–ready software integration |
| Brand | Photo Research |
|---|---|
| Origin | USA |
| Model | PR905 |
| Sensor Resolution | 1024 × 1024 pixels |
| Photopic V(λ) Filter Compliance | CIE 1931 Standard Observer |
| Standard Lens | 50 mm focal length |
| Optional Lenses | High-resolution telecentric and wide-angle optics |
| Optional ND Filters | OD 0.3 to OD 3.0 (logarithmic attenuation) |
| Software | VideoWin v5.x with real-time exposure optimization, ROI-based analysis, and Excel export capability |
| Compliance | Meets CIE Publication No. 15, ISO/CIE 11664-1:2016 (colorimetry), and ASTM E308-22 (computing tristimulus values) |
| Data Output | Luminance (cd/m²), Chromaticity (CIE x,y or u′,v′), Uniformity (% deviation), Contrast Ratio (luminance ratio), Defect localization map |
| Brand | CEAULIGHT |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | OEM Manufacturer |
| Product Category | Domestic |
| Model | Photoelectrochemical Testing Solution |
| Pricing | Available Upon Request |
| Light Source Type | Tunable Monochromatic Xenon-Based Light Source |
| Illumination Mode | External Irradiation |
| Key Configurations | CEL-SLA (2.00 mW/cm²), CEL-SLF (10.00 mW/cm²), CEL-SLB (200.00 mW/cm²) |
| Spectral Range | 200–1600 nm |
| Bandwidth (FWHM) | 1–20 nm (adjustable) |
| Compatible Lamps | Xenon (CEL-HX, CEL-S500, CEL-S150), Deuterium, Tungsten-Halogen, Mercury |
| Primary Applications | Photoelectrochemistry, IPCE/ABPE Quantum Yield Analysis, Electrochemical Impedance Spectroscopy (EIS) under Illumination, Transient Photocurrent/Photovoltage Measurement |
| Brand | Teledyne Photometrics |
|---|---|
| Origin | USA |
| Model | RETIGA E7 / RETIGA E20 |
| Sensor Resolution | 7.1 MP (RETIGA E7) / 20.4 MP (RETIGA E20) |
| Read Noise | <2.1 e⁻ (typ.) |
| Dark Current | ≤0.001 e⁻/pix/s (E7) / ≤0.003 e⁻/pix/s (E20) |
| Cooling Temperature | −25 °C |
| Interface | USB 3.2 Gen 1 |
| Software Support | PVCam™ API, SDK for Python/C++/LabVIEW/MATLAB |
| Compliance | CE, FCC, RoHS |
| Key | Brand: Edmund Optics |
|---|---|
| Model | NewOpto |
| Full-Scale Input Range | ±20 nA to ±20 mA (decade steps, 1 pA resolution) |
| Bias Voltage | Selectable from –14 V to +14 V (6.5 mV increments) |
| A/W Calibration Factor | 0.100–1.000 A/W (0.005 increments) |
| Analog Output | ±2 V (corresponds to ±20,000 counts of selected range) |
| Frequency Response | DC–40 kHz (least sensitive range), DC–2 kHz (most sensitive range) |
| Display | 4½-digit LCD (0.4" height) |
| Noise & Drift | <1 pA over 5 s (most sensitive range) |
| Output Impedance | 100 Ω |
| Power | Rechargeable Ni-MH battery (≈10 h operation) or external 85–250 VAC, 50–60 Hz (<9 VA) |
| Dimensions | 140 mm (W) × 63 mm (H) × 215 mm (L) |
| Weight | 0.9 kg (excluding external PSU) |
| Operating Temperature | 0–40 °C |
| Interfaces | RS-232 serial port, analog output port |
| Accessories | RS-232 cable, AC/DC power supply & charger, operator manual |
| Brand | Photon etc |
|---|---|
| Origin | Germany |
| Model | ZEPHIR 2.9 |
| Effective Resolution | 320 × 256 pixels |
| Pixel Size | 30 µm |
| Spectral Range | 0.85–2.9 µm |
| Frame Rate | Up to 340 fps |
| Cooling | 4-stage TEC with forced air |
| FPA Type | HgCdTe (MCT) |
| Operating FPA Temperature | −80 °C |
| Readout Noise | 150 e⁻ (high gain), 1650 e⁻ (low gain) |
| Full-Well Capacity | 168 ke⁻ (high gain), 3.5 Me⁻ (low gain) |
| Dynamic Range | 14 bits |
| Quantum Efficiency | up to 85% |
| Operability | >98.5% (typical) |
| Interface | CameraLink™ |
| Power Supply | 12 VDC @ 5 A |
| Dimensions | 169 mm × 130 mm × 97.25 mm |
| Weight | 2.6 kg |
| Certifications | CE |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | KAMAKIRI |
| Wavelength | 520 nm |
| Birefringence Range | 0–130 nm (standard), 0–260 nm (optional) |
| Fast Axis Orientation Range | 0–180° |
| Repeatability | <1 nm (σ) |
| Measurement Width | 350 mm |
| Spatial Resolution (Width Direction) | 2560 points |
| Output Parameters | Retardation [nm], Fast Axis Angle [°] |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | KAMAKIRI STS-LS |
| Output Parameters | Retardation [nm], Fast-Axis Orientation [°] |
| Measurement Wavelength | 543 nm (customizable) |
| Birefringence Range | 0–260 nm |
| Conveyor Speed Compatibility | Up to ~30 m/min (customizable) |
| Repeatability | <1 nm |
| Field of View | Full-width, full-length imaging |
| Optional Lens Expansion | Available |
| Custom Width Support | Systems scalable to >5 m web width |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Manufacturer Status | Authorized Distributor |
| Origin Category | Imported |
| Model | KAMAKIRI W |
| Price | Upon Request |
| Output Parameters | Retardation [nm], Fast Axis Orientation [°] |
| Measurement Wavelength | 520 nm |
| Birefringence Range | 0–130 nm (standard), 0–260 nm (optional) |
| Fast Axis Range | 0–180° |
| Repeatability | <1 nm (σ) |
| Measurement Width | 350 mm |
| Spatial Resolution Points Across Width | 2560 |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | KAMAKIRI WM |
| Price | Upon Request |
| Output Parameters | Retardation [nm], Fast Axis Orientation [°] |
| Measurement Wavelength | 520 nm |
| Birefringence Range | 0–130 nm (standard), 0–260 nm (optional) |
| Principal Axis Range | 0–180° |
| Repeatability | <1 nm (σ) |
| Measurement Width | 350 mm |
| Spatial Resolution Points Across Width | 2560 |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | KAMAKIRI-X Stage |
| Measurement Output | Retardation (nm), Fast Axis Orientation (°) |
| Wavelength | 543 nm (customizable) |
| Retardation Range | 0–260 nm (customizable) |
| Fast Axis Range | 0–180° |
| Repeatability | <1 nm (σ) |
| Standard Measurement Area | A4 format |
| Stage Options | Custom large-area translation stage available |
| Compliance | Designed for ISO/IEC 17025-aligned optical metrology workflows |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | ME-210 / ME-210-T |
| Incident Angle | 70° |
| Measurement Speed | 1,000 points/min |
| Single-Measurement Time | 3 s |
| Maximum Sample Size | 8-inch (200 mm) diameter |
| Thickness Accuracy | ±0.1 nm |
| Thickness Repeatability | ±0.1 nm |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | ME-210 |
| Incidence Angle | 70° |
| Measurement Speed | 1000 points/min |
| Single-Measurement Time | 3 s |
| Maximum Sample Size | 8-inch wafer |
| Thickness Accuracy | ±0.1 nm |
| Thickness Repeatability | ±0.1 nm |
| Spot Size Range | 0.0055–0.5 mm |
| Light Source | 636 nm semiconductor laser |
| Data Interface | Gigabit Ethernet (camera signal), RS-232C |
| Power Supply | AC 100–240 V, 50/60 Hz |
| Software | SE-View |
| Compliance | Designed for ISO/IEC 17025-aligned QC environments, supports audit-ready data logging per GLP/GMP requirements |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Manufacturer Status | Authorized Distributor |
| Product Origin | Imported |
| Model | PA Series |
| Price | USD 13,800 (approx.) |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PA-110-T |
| Measurement Range | 0–130 nm |
| Repeatability | < 1.0 nm |
| Pixel Resolution | 1120 × 868 |
| Measurement Wavelength | 520 nm |
| Maximum Sample Area | 8-inch diameter |
| Dimensions | 650 × 700 × 683 mm |
| Weight | 70 kg |
| Data Interface | Gigabit Ethernet (camera), RS-232C |
| Power Supply | AC 100–240 V, 50/60 Hz |
| Software | PA-View, PA-Rasterscan |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PA-300 / PA-300-L |
| Measurement Wavelength | 520 nm |
| Birefringence Range | 0–130 nm |
| Minimum Resolution | 0.001 nm |
| Repeatability | <0.1 nm (σ) |
| Field of View (Standard) | 30×36 mm to 100×132 mm |
| Optional FOV (with Expansion Lenses) | 5.5×6.6 mm to 25×30 mm |
| Output Parameters | Retardation (nm), Fast-Axis Orientation (°), Stress Conversion (MPa, optional) |
| Camera Resolution | 2056×2464 pixels |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PA-300 |
| Measurement Wavelength | 520 nm |
| Birefringence Range | 0–130 nm |
| Minimum Resolution | 0.001 nm |
| Repeatability | < 0.1 nm (σ) |
| Field of View (Standard) | 27 × 36 mm to 99 × 132 mm |
| Optional Expanded FOV | 7 × 8.4 mm (with beam-expanding lens) |
| Output Parameters | Retardation [nm], Fast Axis Orientation [°], Stress Conversion [MPa] (optional) |
| Camera Resolution | 2056 × 2464 pixels |
| Measurement Time per Sample | ≤ 3 s |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PA-300-L |
| Measurement Range | 0–130 nm |
| Wavelength | 520 nm |
| Minimum Resolution | 0.001 nm |
| Repeatability | <0.1 nm (σ) |
| Field of View (Standard) | 40×48 mm to 240×320 mm |
| Camera Resolution | 2056×2464 pixels |
| Output Parameters | Retardation (nm), Fast Axis Orientation (°), Stress Conversion (MPa, optional) |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PA-300-MT |
| Measurement Wavelength | 520 nm |
| Birefringence Range | 0–130 nm |
| Minimum Resolution | 0.001 nm |
| Repeatability | <0.1 nm (σ) |
| Field of View (Standard) | 17.5 × 21 mm to 33 × 40 mm |
| Optional FOV | 6.3 × 7.5 mm |
| Polarization Camera Resolution | 2056 × 2464 pixels |
| Output Parameters | Retardation [nm], Slow Axis Orientation [°], Stress Conversion [MPa] (optional) |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model Series | NIR |
| Measurement Wavelengths | 850 nm (PA-300-NIR) |
| Spatial Resolution | Up to 5 MP imaging module |
| Output Units | Retardation (nm), Azimuth Angle (°), Stress (MPa), Stress Birefringence (nm/mm) |
| Measurement Modes | Point, Line, Area, and 3D Stress Mapping |
| Compliance | Designed for ISO 11475, ASTM F2894, and JIS K 7106-aligned optical stress evaluation |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PA-300-NIR |
| Birefringence Range | 0–130 nm |
| Measurement Speed | < 5 s per full-field scan |
| Spatial Resolution | 5 MP (2448 × 2048) |
| Output Parameters | Retardation (nm), Azimuth Angle (°), Stress (MPa), Stress Birefringence (nm/mm) |
| Sample Size Capacity | Up to Ø500 mm |
| Optical Configuration | Near-Infrared (NIR) Imaging Polarimeter with Photonic Crystal Polarizer Array |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Manufacturer Status | Authorized Distributor |
| Origin Category | Imported |
| Model | PA-300-XL |
| Price Range | USD 1–4,999 |
| Output | Retardation (nm), Fast Axis Angle (°), Stress Conversion (MPa, optional) |
| Measurement Wavelength | 520 nm |
| Birefringence Range | 0–130 nm |
| Minimum Resolution | 0.001 nm |
| Repeatability | < 0.1 nm (σ) |
| Field of View | 40 × 48 mm to 240 × 320 mm (standard) |
| Polarization Camera | 2056 × 2464 pixels |
| Optional Features | Real-time Analysis Software, Lens Analysis Module, Data Processing Suite, External Control Interface |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PA-300-XL SIC |
| Output Parameters | Retardation [nm], Fast Axis Orientation [°], Stress Conversion [MPa] (optional) |
| Measurement Wavelength | 520 nm |
| Birefringence Range | 0–130 nm |
| Minimum Resolution | 0.001 nm |
| Repeatability | < 0.1 nm (σ) |
| Field of View | 40 × 48 mm to 246 × 320 mm (standard) |
| Camera Resolution | 2056 × 2464 pixels |
| Optional Features | Real-time analysis software, lens-specific analysis module, external control interface, stress-mapping data processing suite |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PA-Micro |
| Measurement Wavelength | 520 nm |
| Birefringence Range | 0–130 nm |
| Minimum Resolution | 0.001 nm |
| Repeatability | ±1 nm |
| Field of View | 142 × 170 µm to 3.5 × 4.2 mm (with ×2, ×5, ×10, ×20, ×50 objectives) |
| Output Parameters | Retardation (nm), Fast Axis Orientation (°), Stress-Converted Retardation (MPa, optional) |
| Optional Modules | Real-time Analysis Software, Lens Evaluation Software, Data Processing Suite, External Control Interface |
| Microscope Compatibility | Olympus or Nikon upright/brightfield microscopes |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PHL PA-110-T |
| Measurement Range | 0–130 nm |
| Repeatability | < 0.1 nm |
| Pixel Resolution | 1120 × 868 |
| Measurement Wavelength | 520 nm |
| Maximum Sample Diameter | 200 mm (8-inch) |
| Optical Configuration | Vertical-incidence telecentric lens |
| Data Interface | Gigabit Ethernet (camera), RS-232C |
| Software | PA-View v3.x |
| Power Supply | AC 100–240 V, 50/60 Hz |
| Dimensions | 650 × 700 × 683 mm |
| Weight | 70 kg |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PI-300 |
| Sensor Format | 1/2″ monochrome CCD |
| Bit Depth | 8-bit |
| Frame Rate | 20 fps |
| Polarization Image Resolution | 1120 × 868 pixels |
| Evaluation Wavelength | 520 nm |
| Dimensions | 33 × 45.7 × 58.6 mm |
| Weight | 0.1 kg |
| Lens Mount | C-mount |
| Interface | Gigabit Ethernet (video), RS-232 (control) |
| Power Supply | DC +12 V (or AC 100–200 V via adapter) |
| Included | Operation manual, software CD |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Manufacturer Status | Authorized Distributor |
| Origin Category | Imported |
| Model | VRG-100 |
| Wavelengths | 466 nm, 543 nm, 650 nm (customizable) |
| Retardation Range | 0–λ/2 (supports Quarter-Wave Plate measurement) |
| Measurable Parameters | Wavelength-resolved retardation and ellipticity (circular/elliptical polarization degree) per RGB channel |
| Sample Compatibility | Polarizer-integrated optics and QWP-stacked assemblies |
| Angular Resolution | Real-time relative angle measurement between polarizer and QWP |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Manufacturer Status | Authorized Distributor |
| Product Origin | Imported |
| Model | WPA Series |
| Price | USD 1,400 (approx. based on ¥10,000 at 1:7.1 exchange rate) |