Electron Microscope
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| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Ultim Extreme Infinity ∞ |
| Quotation | Upon Request |
| Detector Type | Sidewall-Insertion (Side-Entry) |
| Energy Resolution | C Ka ≤ 46 eV @ 50,000 cps |
| Elemental Range | Li (Z=3) to Cf (Z=98) |
| Window Type | Windowless |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Ultim Extreme |
| Instrument Type | Multi-Detector Configuration |
| Energy Resolution | 127 eV (Mn Kα) |
| Peak-to-Background Ratio | 20,000:1 |
| Maximum Count Rate | 500,000 cps |
| Elemental Detection Range | Li to Bi |
| Detector Active Area | 100 mm² |
| Window Type | Windowless |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Ultim Max Infinity ∞ |
| Quotation | Upon Request |
| Detector Mounting | Tilting (Side-Entry) |
| Energy Resolution | C Ka < 46 eV @ 50,000 cps |
| Elemental Detection Range | Be (Z=4) to Cf (Z=98) |
| Detector Active Area Options | 40 mm², 65 mm², 100 mm², 170 mm² |
| Window Type | SuperATW (Atmospheric Thin Window) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Ultim Max |
| Detector Type | Tilting Insertion Mount |
| Energy Resolution | 127 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Count Rate | 1,500,000 cps |
| Elemental Detection Range | Be to Cf |
| Active Detector Area | 40–170 mm² |
| Window Type | Super-Atmospheric Thin Window (SATW) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Ultim Max TLE |
| Instrument Type | Side-Insertion EDS Detector |
| Energy Resolution | 125 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Count Rate | >200,000 cps (Xplore TEM), up to 400,000 cps (Ultim Max TLE, quantitative mode) |
| Elemental Detection Range | Beryllium (Be) to Californium (Cf) |
| Active Detector Area | 80 mm² (Xplore TEM), 100 mm² (Ultim Max TLE) |
| Window Type | Windowless |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | UltimMax TEM |
| Instrument Type | Side-entry (tilt-compatible) |
| Energy Resolution | 125 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Count Rate | 400,000 cps |
| Elemental Detection Range | Be to Cf |
| Detector Active Area | 80 mm² |
| Window Type | Windowless |
| Solid Angle | 0.2–0.6 srad |
| Low-Energy X-ray Sensitivity Gain | Up to 8× vs. conventional windowed detectors |
| In Situ Operation Temperature | Up to 1000 °C |
| Compatible Accelerating Voltages | Up to 200 kV |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | UltimMax TLE |
| Detector Type | Tilting Insertion Geometry |
| Energy Resolution | 125 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Input Count Rate | 400,000 cps |
| Elemental Detection Range | Be to Cf |
| Active Detector Area | 100 mm² |
| Window Type | Windowless |
| Solid Angle | 0.5–1.1 srad |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Unity |
| Mounting Type | Side-entry (inclined insertion) |
| Detector Architecture | Integrated Backscattered Electron (BSE) and Energy-Dispersive X-ray (EDS) Sensor Assembly |
| Positioning | Mounted directly beneath the objective lens pole piece |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Xplore 30 |
| Detector Type | Tilting (Side-Entry) |
| Energy Resolution | 129 eV at Mn Kα |
| Peak-to-Background Ratio | 20,000:1 |
| Maximum Count Rate | 1,000,000 cps |
| Elemental Detection Range | Be to Cf |
| Active Detector Area | 300 mm² |
| Window Type | Beryllium Window |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Xplore TEM |
| Instrument Type | Side-entry (tilt-compatible) EDS system for TEM |
| Energy Resolution | 125 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Input Count Rate | 200,000 cps |
| Elemental Detection Range | Beryllium (Be) to Californium (Cf) |
| Detector Active Area | 80 mm² |
| Window Type | Windowless (ultra-thin polymer support) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Xplore15 / Xplore30 |
| Detector Geometry | Tilting (Side-entry) |
| Energy Resolution | 129 eV @ 100,000 cps |
| Peak-to-Background Ratio | 20,000:1 |
| Maximum Count Rate | 1,000,000 cps |
| Elemental Detection Range | Boron (B) to Californium (Cf) |
| Active Crystal Area | 15 mm² or 30 mm² |
| Window Type | Super-Atmospheric Thin Window (SATW) |
| Brand | Panco |
|---|---|
| Origin | Germany |
| Model | PSM II |
| Positioning Accuracy | Unidirectional 0.05 µm |
| Maximum Scan Area | 100 mm × 100 mm (typ.) |
| Local Measurement Resolution | 5 µm |
| Voltage Measurement Sensitivity | 100 nV |
| Seebeck Coefficient Measurement Uncertainty | < 3% (semiconductors), < 5% (metals) |
| Electrical Conductivity Measurement Uncertainty | < 4% |
| Point Acquisition Time | 4–20 s per measurement |
| Repeatability Error | < 3% |
| System Configuration | Triaxial precision positioning stage, force-sensing contact probe, integrated heating/temperature-sensing probe, analog multiplexer, 6½-digit digital voltmeter, lock-in amplifier, coaxial optical imaging module, dedicated control software with API support for LabVIEW and Python |
| Origin | South Korea |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | NX20 |
| Price Range | USD 195,000 – 260,000 (FOB) |
| Instrument Type | Atomic Force Microscope |
| Application Class | Materials Science AFM |
| XY Positional Noise | < 0.25 nm (over 80 µm scan range) |
| Z-Noise Floor | < 0.03 nm |
| Feedback Loop Bandwidth | > 9 kHz |
| Maximum Sample Diameter | 200 mm |
| XY Scan Range | 100 µm × 100 µm |
| Z Scan Range | 15 µm (extendable to 30 µm) |
| Control Software | Park SmartScan™ Automation Suite |
| Brand | Park SYSTEMS |
|---|---|
| Origin | South Korea |
| Model | NX-TSH |
| Instrument Type | Industrial AFM |
| Sample Stage Travel Range | 625 mm × 525 mm |
| Maximum Sample Dimensions | 520 mm × 520 mm × 10 mm (10 kg) |
| Acoustic Noise Attenuation | >20 dB with Integrated Acoustic Enclosure |
| XY Scanning Range (Closed-Loop) | 100 µm × 100 µm |
| Z Scanning Range | 15 µm |
| Z Sensor Noise Floor | Sub-nanometer (low-noise optical lever detection) |
| Probe Exchange | Automated Tip eXchanger (ATX) with vision-based tip recognition and magnetic probe handling |
| Laser Alignment | Motorized, auto-focused beam positioning |
| Electrostatic Control | Integrated bipolar ionizer for charge neutralization |
| Electrical Characterization Option | Conductive AFM (C-AFM) with micro-probe station and 2D encoder stage |
| Brand | Park SYSTEMS |
|---|---|
| Origin | Fujian, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China) |
| Model | NX10 High-Precision Atomic Force Microscope (SHNTI) |
| Price Range | USD 95,000 – 218,000 |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom AFM-SEM |
| Instrument Type | Benchtop SEM-AFM Hybrid System |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Maximum Sample Dimensions | 21 mm × 11 mm × 8 mm |
| Scan Range (Open-Loop) | 100 µm × 100 µm × 20 µm |
| Scan Range (Closed-Loop) | 80 µm × 80 µm × 16 µm |
| Spatial Resolution | 0.2 nm (lateral) × 0.04 nm (vertical) |
| Sample Mass Limit | 100 g |
| Imaging Modes | Topography & Roughness, Conductive AFM (CAFM), Kelvin Probe Force Microscopy (KPFM), Magnetic Force Microscopy (MFM), Piezoresponse Force Microscopy (PFM), Electrostatic Force Microscopy (EFM), Force–Distance (F–z) Curves, Current–Voltage (I–V) Spectroscopy |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | AFM-in-Phenom XL |
| Instrument Type | Benchtop SEM-AFM Hybrid System |
| Electron Source | Cerium Hexaboride (CeB₆) |
| Maximum Sample Dimensions | 21 mm × 11 mm × 8 mm |
| Sample Weight Limit | 100 g |
| Open-Loop Scan Range | 100 µm × 100 µm × 20 µm |
| Closed-Loop Scan Range | 80 µm × 80 µm × 16 µm |
| Spatial Resolution (XY/Z) | 0.2 nm × 0.2 nm / 0.04 nm |
| Compatible Modes | Topography, Roughness, CAFM, KPFM, FMM, PFM, EFM, Force-Distance (F-z), Current-Voltage (I-V) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Phenom Ar-C |
| Instrument Type | Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB6) |
| Secondary Electron Resolution | 8 nm |
| Maximum Magnification | 200,000× |
| Accelerating Voltage Range | 4.8–20.5 kV |
| Backscattered Electron Resolution | 8 nm |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | Automated Image Mapping |
| Pricing | Available Upon Request |
| Max Scan Area | 100 mm × 100 mm |
| Imaging Modes | Backscattered Electron (BSE), Secondary Electron (SE) |
| Focus Mode | Auto-focus |
| Stitching | Fully Automated, Sub-pixel Registration |
| Stage Control | High-precision Motorized XY Stage |
| UI | Integrated Touch-Optimized Interface |
| Compatible With | Phenom Desktop SEM Series (e.g., Phenom XL, Phenom Pharos, Phenom Pure) |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Avizo Trueput |
| Pricing | Available Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Manufacturer |
| Origin Category | Imported |
| Model | Charge Reduction Sample Holder |
| Price | Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | ChemiPhase |
| Type | SEM-EDS Statistical Phase Analysis Software |
| Compliance | Designed for ASTM E1508, ISO 16700, and USP <1058> analytical instrument qualification frameworks |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | ChemiSEM |
| Type | Integrated SEM-EDS Real-Time Quantitative Mapping Solution |
| Compliance | CE, ISO 9001 (Manufacturer), GLP-Compatible Data Acquisition |
| Brand | Phenom |
|---|---|
| Origin | Netherlands (Manufactured in Guangzhou, China) |
| Type | Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB6) |
| SEM Class | Entry-level Field Emission / Tungsten-Filament Hybrid Architecture |
| Secondary Electron Resolution | 8 nm @ 20 kV |
| Backscattered Electron Resolution | 8 nm @ 20 kV |
| Magnification Range | 20× – 200,000× |
| Accelerating Voltage | 4.8 – 20.5 kV |
| Vacuum Pumping Time | ≤15 s |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Automated Tilt-Rotate Sample Holder |
| Pricing | Available Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Product Type | Imported |
| Model | Standard Sample Holder |
| Pricing | Contact for Quote |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer | Phenom-World B.V. |
| Type | Desktop SEM |
| Model | DiatomScopeTM |
| Electron Source | CeB₆ (Cerium Hexaboride) |
| Secondary Electron Resolution | 8 nm |
| Backscattered Electron Resolution | 8 nm |
| Magnification Range | up to 200,000× |
| Accelerating Voltage | 4.8–20.5 kV |
| Sample Stage | Motorized XY-stage with automated tilt & rotation |
| Imaging Modes | SE, BSE, EDS-ready |
| Software Platform | Phenom Desktop Software v5.x with Diatom Analysis Module |
| Brand | Phenom |
|---|---|
| Country of Origin | Netherlands |
| Manufacturer Type | Manufacturer |
| Origin Category | Imported |
| Model | Phenom FiberMetric |
| Pricing | Upon Request |
| Brand | SHNTI |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Phenom G2 |
| Price Range | USD 70,000–140,000 |
| Instrument Type | Benchtop SEM |
| Electron Source | Lanthanum Hexaboride (LaB₆) |
| Secondary Electron Image Resolution | ≤5.0 nm at 10 kV |
| Magnification Range | 10×–130,000× |
| Accelerating Voltage | 5–15 kV (adjustable in 1 kV steps) |
| Backscattered Electron Image Resolution | ≤7.0 nm at 10 kV |
| Maximum Sample Dimensions | 100 mm diameter × 50 mm height |
| Expandable Chamber Interface Ports | 1 (for optional EDS or cathodoluminescence modules) |
| Stage Type | Motorized XY-stage with tilt (±90°), rotation (360°), and Z-height adjustment |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Manufacturer |
| Origin Category | Imported |
| Model | Phenom GSR |
| Instrument Type | Benchtop SEM |
| Electron Source | Cerium Hexaboride (CeB6) |
| Secondary Electron Resolution | 8 nm |
| Maximum Magnification | 200,000× |
| Accelerating Voltage Range | 4.8–20.5 kV |
| Backscattered Electron Resolution | 8 nm |
| Maximum Sample Dimensions | 100 mm × 100 mm × 65 mm |
| Sample Capacity | Up to 36 × 12.7 mm (0.5″) stubs |
| Optical Navigation Camera | Integrated color CCD |
| Lamp Lifetime | ≥1500 h |
| Load Time | <60 s |
| Vacuum Modes | High Vacuum / Low-Voltage Mode (reduced charging) |
| Detectors | Integrated BSED, Optional SE Detector |
| EDS Integration | Fully embedded energy-dispersive X-ray spectrometer |