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| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | M6204 |
| Type | Import Instrument |
| Distribution Channel | Authorized Distributor |
| Pricing | Upon Request |
| Brand | McScience |
|---|---|
| Origin | Imported |
| Model | LAB |
| Power Supply | DC/Pulse |
| Operation Modes | Constant Current / Constant Voltage |
| Voltage Range | -20 V to +5 V |
| Current Options | 30 mA / 1 A / 20 A (user-selectable) |
| Imaging Sensor | High-Resolution CCD |
| Sample Compatibility | Individual Solar Cells & Large-Area PV Modules |
| Additional Capabilities | Integrated PL Imaging Option, Reflectance Mapping, LBIC (Light Beam Induced Current), Visual Inspection |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | T4000 |
| Type | Integrated Organic Semiconductor Parameter Measurement System |
| Light Source | High-Stability LED Array |
| Measurement Modes | TPV, TPC, Linear Ramp Charge Extraction (Dark & Photo), Transient Electroluminescence, DC I–V, Impedance Spectroscopy (IS), Capacitance–Voltage (C–V), IMVS, IMPS |
| Compliance | Designed for ISO/IEC 17025-aligned laboratory environments |
| Software Interface | Windows-based with automated script execution and raw data export (CSV, TXT, HDF5) |
| Data Acquisition | 16-bit ADC, up to 1 MS/s sampling rate |
| Voltage Range | ±20 V (programmable), Current Range: ±100 mA (auto-ranging) |
| Environmental Operation | 15–35 °C, <70% RH non-condensing |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | K3100 |
| Measurement Mode | AC |
| Channel Configuration | Single- or Multi-Channel |
| Spectral Range Options | UV–VIS–NIR–IR (configurable via optional optical modules) |
| Import Status | Imported Instrument |
| Distributor Type | Authorized General Distributor |
| Pricing | Available Upon Request |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | M6400 |
| Pricing | Upon Request |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | K3100 OPD |
| Type | Imported Instrument |
| Distribution Channel | Authorized Distributor |
| Application Domain | Lithium Battery Industry — Optical Sensor & Photodetector Evaluation |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | K3100-EI |
| Application | Photovoltaic Device Characterization |
| Measurement Modes | Spectral Response (SR), External Quantum Efficiency (EQE), Internal Quantum Efficiency (IQE), DC/AC/NIR Photocurrent Analysis |
| Automation | Motorized Monochromator with Precision Sample Positioning |
| Compliance | Designed for ASTM E1021, IEC 60904-8, and ISO 18585 alignment |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | K5700 |
| Operating Mode | Steady-State |
| Application | Light Soaking Treatment of PV Modules |
| Category | Solar Simulator (Industry-Specific Instrument) |
| Import Status | Imported |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | T3000 |
| Type | Time-of-Flight Carrier Mobility Characterization System |
| Application Domain | Organic Light-Emitting Diode (OLED) Materials & Thin-Film Semiconductor Research |
| Temperature Range | 10 K to 350 K (with optional cryostat integration) |
| Excitation Source | Pulsed UV–Vis Laser (e.g., 355 nm or 405 nm, <10 ns pulse width) |
| Detection Bandwidth | ≥500 MHz transient current acquisition |
| Measurement Modes | Standard TOF, Dark Injection Transient (DIT), Charge Extraction by Linearly Increasing Voltage (CELIV) |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | T5000 |
| Channel Configuration | Single-Channel & Multi-Channel |
| Test Modes | Standard, Thermal Stress, Photo-Stress |
| Measurement Capabilities | Field-Effect Mobility (µFE), Saturation Mobility (µSAT), On/Off Current Ratio (Ion/Ioff), Threshold Voltage (Vth), Subthreshold Swing (SS) |
| Compliance | Designed for semiconductor device characterization per JEDEC JESD22-A108 (reliability), ISO/IEC 17025-compliant test environments |
| Software | McTestSuite v4.2 with GLP/GMP audit trail support |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | M6000 PIXX |
| Device Type | Imaging-Based Electroluminescence Degradation Analyzer |
| Application Domain | Perovskite LED, OLED, QLED, Flexible Optoelectronic Devices, Inkjet-Printed Emissive Layer Development |
| Compliance Context | Designed for GLP-compliant lifetime testing workflows |
| Software Architecture | Windows-based acquisition and spatiotemporal EL intensity mapping platform |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | L3000 |
| Type | Integrated PL/EQE/IQE/Spectral Characterization System |
| Sample Forms | Thin Films, Bulk Solids, Powders, Liquids |
| Measurement Modes | Steady-State PL, Time-Resolved PL (TRPL), External Quantum Efficiency (EQE), Internal Quantum Efficiency (IQE), Absorption Spectroscopy, Emission Spectroscopy |
| Excitation Sources | Tunable CW and Pulsed LEDs/Lasers (UV–Vis range) |
| Detection | Back-Thinned CCD or EMCCD Spectrometer (200–1100 nm) |
| Spectral Resolution | ≤ 0.1 nm (typ.) |
| Integration Time Range | 1 ms – 300 s |
| Software Control | Fully Automated via McScience PL-Studio v4.x |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | OPD-LT |
| Channel Configuration | Multi-channel (configurable) |
| Spectral Range Options | UV to IR (200–1700 nm, selectable modules) |
| Compliance | ISO/IEC 17025-compatible test environment support |
| Software Control | PC-based with timestamped event logging and real-time degradation trend analysis |
| Operating Mode | Constant-bias or pulsed-bias stress testing under controlled ambient (N₂ glovebox or environmental chamber integration optional) |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | M7000 |
| Category | Imported Semiconductor Inspection Instrument |
| Configuration | Multi-Channel I-V-L & Degradation Monitoring Platform |
| Optical Detection | Integrated Spectrometer and Tristimulus Colorimeter with Motorized XYZ Positioning |
| Thermal Control | Independent Temperature Chamber (−40 °C to +120 °C) |
| Electrical Biasing | Precision Source-Measure Units (SMUs) for DC/Pulsed Operation |
| Measurement Modes | Luminance (cd/m²), Chromaticity (CIE 1931 xy), Spectral Power Distribution (380–780 nm), EQE, Impedance (1 Hz–1 MHz), Viewing Angle (±85°), Transient EL (µs–s resolution) |
| Compliance | ASTM F2699, ISO 13406-2, IEC 62341-6-1, JEDEC JESD22-A108 (HTOL), USP <1058> (Analytical Instrument Qualification) |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | K3500 |
| Application | In-line I-V characterization, electroluminescence (EL) / photoluminescence (PL) imaging, automated optical inspection (AOI), micro-crack & hot-spot detection |
| Compliance | Designed for ISO 9001-certified PV manufacturing environments |
| Control Interface | Touch-enabled HMI with recipe-based operation |
| Throughput | Up to 6,000 wafers/hour (standard 156.75 mm × 156.75 mm M2 cells) |
| Integration | Compatible with standard conveyor-based inline PV production lines (SECS/GEM optional) |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | M6200 |
| Application | Transient EL/PL, Carrier Dynamics, Low-Temperature Spectroscopy |
| Excitation Sources | Precision Current Pulse Generator (for Tr-EL) & Ultrafast Pulsed Laser (for TR-PL) |
| Temperature Range | 10 K – 300 K (with Closed-Cycle Cryostat) |
| Detection | Time-Correlated Single Photon Counting (TCSPC) or Fast Digitizer (up to 1 GS/s) |
| Spectral Resolution | < 0.5 nm (with 1/4 m Monochromator) |
| Temporal Resolution | < 50 ps (TR-PL), < 100 ns (Tr-EL) |
| Compliance | ASTM F2891–22 (OLED Device Testing), ISO/IEC 17025–2017 (Calibration Traceability) |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | T6000 |
| Detection Principle | Calcium Thin-Film Degradation Assay |
| Temperature Range | 15–85 °C (±0.1 °C stability) |
| Humidity Range | 5–90 % RH (±1 % RH accuracy) |
| WVTR Measurement Range | 1×10⁻⁶ – 1×10⁻¹ g/m²/day |
| Channel Capacity | Up to 8 independent test channels |
| Electrical Measurement | DC resistance/conductance with ±0.05 % reading accuracy |
| Environmental Chamber | Dual-zone, programmable ramping profiles |
| Compliance | ASTM F1249, ISO 15106-3, JIS K 7129 |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | T3000 PLUS |
| Application | Transient charge dynamics characterization of organic optoelectronic devices |
| Core Excitation Source | Nanosecond-pulsed laser system |
| Timing Resolution | Sub-nanosecond delay control |
| Bias Control | Programmable DC/AC voltage source (±100 V, <10 mV resolution) |
| Detection Bandwidth | DC to 2 GHz (current amplification + digitization) |
| Compliance | Fully compatible with ISO/IEC 17025 laboratory practices for transient electrical measurements |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | K3600 |
| Light Source Options | Metal Halide, Plasma-based AAA, LED-based AAA Simulators |
| Environmental Control | Ambient-Temperature or Temperature/Humidity-Controlled Chamber Configurations |
| Test Capabilities | Continuous Illumination, High-Speed I-V Characterization, Multi-Channel Parallel Testing, Maximum Power Point Tracking (MPPT), Light-Induced Degradation (LID) Monitoring, Light Soaking Protocols |
| Compliance Support | ASTM E927, IEC 60904-9, IEC 61215 (for stability protocols), ISO 17025-aligned test reporting frameworks |
| Software | McScience Lifetest Suite with GLP/GMP-compliant audit trail, data versioning, and 21 CFR Part 11-ready user access controls |
| Brand | McScience |
|---|---|
| Origin | Imported |
| Manufacturer Type | Authorized Distributor |
| Model | K3300PLX |
| Pricing | Available Upon Request |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | L5300 |
| Type | Integrated PLQY & IVL Measurement Platform |
| Compliance | ISO/IEC 17025-aligned optical calibration traceability |
| Software | McScience QYLab v4.2 with audit trail and user access control |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | K5300 |
| Price Range | USD 140,000 – 280,000 (FOB) |
| Trigger Mode | Steady-State |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | K5000 |
| Category | Imported Semiconductor Inspection Instrument |
| Supplier Type | Authorized Distributor |
| Pricing | Available Upon Request |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | M3000 |
| Application Scope | OLED, Perovskite LED, QLED, Micro-OLED device characterization |
| Measurement Capabilities | I-V-L, C-V, spectral radiance, chromaticity coordinates (CIE 1931), viewing angle, luminance uniformity, EQE/IPCE, temperature-dependent optoelectronic profiling |
| Compliance | Designed for GLP-compliant lab environments |
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