Optical Measurement Instruments
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| Brand | Photo Research |
|---|---|
| Origin | USA |
| Model | PR1050 |
| Dynamic Range | 500,000,000:1 |
| Spectral Bandwidth | 2, 5, or 8 nm (auto-selectable) |
| Detector | Back-illuminated CCD, 512 pixels, thermoelectrically cooled |
| Color Accuracy (CIE 1931 x,y) | ±0.0015 at 5.14E−4 cd/m² (A-source, 2856 K, 2° FOV, 8 nm BW) |
| Color Repeatability | ±0.0005 at 1.19E−2 cd/m² (A-source, 2° FOV) |
| Luminance Sensitivity | 1.71E−5 cd/m² (10:1 SNR, 2° FOV, 8 nm BW) |
| Luminance Accuracy | ±2% (NIST-traceable A-source, 5.14E−4 cd/m²) |
| Luminance Repeatability | ≤1% (NIST-traceable A-source, 5.14E−4 cd/m²) |
| Exposure Time | 7 ms – 120 s |
| Polarization Error | <0.2% (at 3.34 cd/m², 2° FOV) |
| Stray Light | <0.06% |
| Wavelength Accuracy | <0.4 nm |
| Spectral Resolution | 1 nm |
| Digital Resolution | 16-bit |
| Interfaces | USB, RS-232 |
| Apertures | 2°, 1°, 0.5°, 0.25°, 0.2°, 0.125°, 0.1°, 0.1°×1° (vertical slit), 0.5°×1.5° (horizontal slit) |
| Power | Rechargeable Li-ion battery or 90–240 VAC adapter |
| Battery Life | Up to 8 hours |
| Weight | 6.01 kg |
| Dimensions | 28.0 × 17.0 × 20.3 cm |
| Operating Temperature | 1–35 °C |
| Relative Humidity | 0–90% RH (non-condensing) |
| Brand | Photo Research |
|---|---|
| Origin | USA |
| Model | PR805/810 |
| Power Supply | Rechargeable Li-ion battery (≥12 h continuous operation) |
| Display | Full-color capacitive touchscreen |
| Lens | Standard 75 mm focal length (measurement distance: 355 mm to infinity) |
| Minimum Luminance | PR810 — 0.0001 fL (0.00034 cd/m²) |
| Apertures | PR805 — 10 fixed apertures |
| Neutral Density Filter Turret | 3-decade attenuation (10×, 100×, 1000×) |
| Dynamic Range | >9,000,000:1 |
| Interface | USB Virtual COM port (RS-232 emulation), optional Class 1 Bluetooth (100 m range) |
| Data Storage | Internal memory + SD card slot |
| Compliance | Designed for ASTM E308, CIE 15:2018, ISO/CIE 11664, USP <1033>, FDA 21 CFR Part 11–ready software integration |
| Brand | Photo Research |
|---|---|
| Origin | USA |
| Model | PR905 |
| Sensor Resolution | 1024 × 1024 pixels |
| Photopic V(λ) Filter Compliance | CIE 1931 Standard Observer |
| Standard Lens | 50 mm focal length |
| Optional Lenses | High-resolution telecentric and wide-angle optics |
| Optional ND Filters | OD 0.3 to OD 3.0 (logarithmic attenuation) |
| Software | VideoWin v5.x with real-time exposure optimization, ROI-based analysis, and Excel export capability |
| Compliance | Meets CIE Publication No. 15, ISO/CIE 11664-1:2016 (colorimetry), and ASTM E308-22 (computing tristimulus values) |
| Data Output | Luminance (cd/m²), Chromaticity (CIE x,y or u′,v′), Uniformity (% deviation), Contrast Ratio (luminance ratio), Defect localization map |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | KAMAKIRI |
| Wavelength | 520 nm |
| Birefringence Range | 0–130 nm (standard), 0–260 nm (optional) |
| Fast Axis Orientation Range | 0–180° |
| Repeatability | <1 nm (σ) |
| Measurement Width | 350 mm |
| Spatial Resolution (Width Direction) | 2560 points |
| Output Parameters | Retardation [nm], Fast Axis Angle [°] |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | KAMAKIRI STS-LS |
| Output Parameters | Retardation [nm], Fast-Axis Orientation [°] |
| Measurement Wavelength | 543 nm (customizable) |
| Birefringence Range | 0–260 nm |
| Conveyor Speed Compatibility | Up to ~30 m/min (customizable) |
| Repeatability | <1 nm |
| Field of View | Full-width, full-length imaging |
| Optional Lens Expansion | Available |
| Custom Width Support | Systems scalable to >5 m web width |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Manufacturer Status | Authorized Distributor |
| Origin Category | Imported |
| Model | KAMAKIRI W |
| Price | Upon Request |
| Output Parameters | Retardation [nm], Fast Axis Orientation [°] |
| Measurement Wavelength | 520 nm |
| Birefringence Range | 0–130 nm (standard), 0–260 nm (optional) |
| Fast Axis Range | 0–180° |
| Repeatability | <1 nm (σ) |
| Measurement Width | 350 mm |
| Spatial Resolution Points Across Width | 2560 |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | KAMAKIRI WM |
| Price | Upon Request |
| Output Parameters | Retardation [nm], Fast Axis Orientation [°] |
| Measurement Wavelength | 520 nm |
| Birefringence Range | 0–130 nm (standard), 0–260 nm (optional) |
| Principal Axis Range | 0–180° |
| Repeatability | <1 nm (σ) |
| Measurement Width | 350 mm |
| Spatial Resolution Points Across Width | 2560 |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | KAMAKIRI-X Stage |
| Measurement Output | Retardation (nm), Fast Axis Orientation (°) |
| Wavelength | 543 nm (customizable) |
| Retardation Range | 0–260 nm (customizable) |
| Fast Axis Range | 0–180° |
| Repeatability | <1 nm (σ) |
| Standard Measurement Area | A4 format |
| Stage Options | Custom large-area translation stage available |
| Compliance | Designed for ISO/IEC 17025-aligned optical metrology workflows |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | ME-210 / ME-210-T |
| Incident Angle | 70° |
| Measurement Speed | 1,000 points/min |
| Single-Measurement Time | 3 s |
| Maximum Sample Size | 8-inch (200 mm) diameter |
| Thickness Accuracy | ±0.1 nm |
| Thickness Repeatability | ±0.1 nm |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | ME-210 |
| Incidence Angle | 70° |
| Measurement Speed | 1000 points/min |
| Single-Measurement Time | 3 s |
| Maximum Sample Size | 8-inch wafer |
| Thickness Accuracy | ±0.1 nm |
| Thickness Repeatability | ±0.1 nm |
| Spot Size Range | 0.0055–0.5 mm |
| Light Source | 636 nm semiconductor laser |
| Data Interface | Gigabit Ethernet (camera signal), RS-232C |
| Power Supply | AC 100–240 V, 50/60 Hz |
| Software | SE-View |
| Compliance | Designed for ISO/IEC 17025-aligned QC environments, supports audit-ready data logging per GLP/GMP requirements |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Manufacturer Status | Authorized Distributor |
| Product Origin | Imported |
| Model | PA Series |
| Price | USD 13,800 (approx.) |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PA-110-T |
| Measurement Range | 0–130 nm |
| Repeatability | < 1.0 nm |
| Pixel Resolution | 1120 × 868 |
| Measurement Wavelength | 520 nm |
| Maximum Sample Area | 8-inch diameter |
| Dimensions | 650 × 700 × 683 mm |
| Weight | 70 kg |
| Data Interface | Gigabit Ethernet (camera), RS-232C |
| Power Supply | AC 100–240 V, 50/60 Hz |
| Software | PA-View, PA-Rasterscan |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PA-300 / PA-300-L |
| Measurement Wavelength | 520 nm |
| Birefringence Range | 0–130 nm |
| Minimum Resolution | 0.001 nm |
| Repeatability | <0.1 nm (σ) |
| Field of View (Standard) | 30×36 mm to 100×132 mm |
| Optional FOV (with Expansion Lenses) | 5.5×6.6 mm to 25×30 mm |
| Output Parameters | Retardation (nm), Fast-Axis Orientation (°), Stress Conversion (MPa, optional) |
| Camera Resolution | 2056×2464 pixels |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PA-300 |
| Measurement Wavelength | 520 nm |
| Birefringence Range | 0–130 nm |
| Minimum Resolution | 0.001 nm |
| Repeatability | < 0.1 nm (σ) |
| Field of View (Standard) | 27 × 36 mm to 99 × 132 mm |
| Optional Expanded FOV | 7 × 8.4 mm (with beam-expanding lens) |
| Output Parameters | Retardation [nm], Fast Axis Orientation [°], Stress Conversion [MPa] (optional) |
| Camera Resolution | 2056 × 2464 pixels |
| Measurement Time per Sample | ≤ 3 s |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PA-300-L |
| Measurement Range | 0–130 nm |
| Wavelength | 520 nm |
| Minimum Resolution | 0.001 nm |
| Repeatability | <0.1 nm (σ) |
| Field of View (Standard) | 40×48 mm to 240×320 mm |
| Camera Resolution | 2056×2464 pixels |
| Output Parameters | Retardation (nm), Fast Axis Orientation (°), Stress Conversion (MPa, optional) |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PA-300-MT |
| Measurement Wavelength | 520 nm |
| Birefringence Range | 0–130 nm |
| Minimum Resolution | 0.001 nm |
| Repeatability | <0.1 nm (σ) |
| Field of View (Standard) | 17.5 × 21 mm to 33 × 40 mm |
| Optional FOV | 6.3 × 7.5 mm |
| Polarization Camera Resolution | 2056 × 2464 pixels |
| Output Parameters | Retardation [nm], Slow Axis Orientation [°], Stress Conversion [MPa] (optional) |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model Series | NIR |
| Measurement Wavelengths | 850 nm (PA-300-NIR) |
| Spatial Resolution | Up to 5 MP imaging module |
| Output Units | Retardation (nm), Azimuth Angle (°), Stress (MPa), Stress Birefringence (nm/mm) |
| Measurement Modes | Point, Line, Area, and 3D Stress Mapping |
| Compliance | Designed for ISO 11475, ASTM F2894, and JIS K 7106-aligned optical stress evaluation |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PA-300-NIR |
| Birefringence Range | 0–130 nm |
| Measurement Speed | < 5 s per full-field scan |
| Spatial Resolution | 5 MP (2448 × 2048) |
| Output Parameters | Retardation (nm), Azimuth Angle (°), Stress (MPa), Stress Birefringence (nm/mm) |
| Sample Size Capacity | Up to Ø500 mm |
| Optical Configuration | Near-Infrared (NIR) Imaging Polarimeter with Photonic Crystal Polarizer Array |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Manufacturer Status | Authorized Distributor |
| Origin Category | Imported |
| Model | PA-300-XL |
| Price Range | USD 1–4,999 |
| Output | Retardation (nm), Fast Axis Angle (°), Stress Conversion (MPa, optional) |
| Measurement Wavelength | 520 nm |
| Birefringence Range | 0–130 nm |
| Minimum Resolution | 0.001 nm |
| Repeatability | < 0.1 nm (σ) |
| Field of View | 40 × 48 mm to 240 × 320 mm (standard) |
| Polarization Camera | 2056 × 2464 pixels |
| Optional Features | Real-time Analysis Software, Lens Analysis Module, Data Processing Suite, External Control Interface |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PA-300-XL SIC |
| Output Parameters | Retardation [nm], Fast Axis Orientation [°], Stress Conversion [MPa] (optional) |
| Measurement Wavelength | 520 nm |
| Birefringence Range | 0–130 nm |
| Minimum Resolution | 0.001 nm |
| Repeatability | < 0.1 nm (σ) |
| Field of View | 40 × 48 mm to 246 × 320 mm (standard) |
| Camera Resolution | 2056 × 2464 pixels |
| Optional Features | Real-time analysis software, lens-specific analysis module, external control interface, stress-mapping data processing suite |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PA-Micro |
| Measurement Wavelength | 520 nm |
| Birefringence Range | 0–130 nm |
| Minimum Resolution | 0.001 nm |
| Repeatability | ±1 nm |
| Field of View | 142 × 170 µm to 3.5 × 4.2 mm (with ×2, ×5, ×10, ×20, ×50 objectives) |
| Output Parameters | Retardation (nm), Fast Axis Orientation (°), Stress-Converted Retardation (MPa, optional) |
| Optional Modules | Real-time Analysis Software, Lens Evaluation Software, Data Processing Suite, External Control Interface |
| Microscope Compatibility | Olympus or Nikon upright/brightfield microscopes |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PHL PA-110-T |
| Measurement Range | 0–130 nm |
| Repeatability | < 0.1 nm |
| Pixel Resolution | 1120 × 868 |
| Measurement Wavelength | 520 nm |
| Maximum Sample Diameter | 200 mm (8-inch) |
| Optical Configuration | Vertical-incidence telecentric lens |
| Data Interface | Gigabit Ethernet (camera), RS-232C |
| Software | PA-View v3.x |
| Power Supply | AC 100–240 V, 50/60 Hz |
| Dimensions | 650 × 700 × 683 mm |
| Weight | 70 kg |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | PI-300 |
| Sensor Format | 1/2″ monochrome CCD |
| Bit Depth | 8-bit |
| Frame Rate | 20 fps |
| Polarization Image Resolution | 1120 × 868 pixels |
| Evaluation Wavelength | 520 nm |
| Dimensions | 33 × 45.7 × 58.6 mm |
| Weight | 0.1 kg |
| Lens Mount | C-mount |
| Interface | Gigabit Ethernet (video), RS-232 (control) |
| Power Supply | DC +12 V (or AC 100–200 V via adapter) |
| Included | Operation manual, software CD |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Manufacturer Status | Authorized Distributor |
| Origin Category | Imported |
| Model | VRG-100 |
| Wavelengths | 466 nm, 543 nm, 650 nm (customizable) |
| Retardation Range | 0–λ/2 (supports Quarter-Wave Plate measurement) |
| Measurable Parameters | Wavelength-resolved retardation and ellipticity (circular/elliptical polarization degree) per RGB channel |
| Sample Compatibility | Polarizer-integrated optics and QWP-stacked assemblies |
| Angular Resolution | Real-time relative angle measurement between polarizer and QWP |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Manufacturer Status | Authorized Distributor |
| Product Origin | Imported |
| Model | WPA Series |
| Price | USD 1,400 (approx. based on ¥10,000 at 1:7.1 exchange rate) |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Manufacturer Status | Authorized Distributor |
| Origin Category | Imported |
| Model | WPA |
| Pricing | Upon Request |
| Wavelengths | 523 nm, 543 nm, 575 nm |
| Phase Difference Range | Up to 3000 nm |
| Optical Configuration | Custom-Engineered Large-Aperture Circular Polarization Illumination System |
| Detection | Wide-Angle Polarimetric CMOS Area Sensor |
| Application Scope | Automotive Glazing, Architectural Laminated Glass, Display Cover Glass |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | WPA-100, WPA-100-L, WPA-100-S |
| Measurement Range | 0–4000 nm |
| Repeatability | <1.0 nm |
| Pixel Resolution | 384 × 288 |
| Wavelength Options | 523 nm, 543 nm, 575 nm |
| Max Field of View (WPA-100) | 100 × 136 mm |
| Max Field of View (WPA-100-L) | 250 × 340 mm |
| Max Field of View (WPA-100-S) | 11.6 × 15.8 mm |
| Dimensions (WPA-100) | 310 × 466 × 605.5 mm |
| Dimensions (WPA-100-L) | 450 × 593 × 915.5 mm |
| Dimensions (WPA-100-S) | 200 × 275 × 309.5 mm |
| Weight (WPA-100) | 20 kg |
| Weight (WPA-100-L) | 26 kg |
| Weight (WPA-100-S) | 4 kg (unit) + 9 kg (power supply) |
| Data Interface | GigE (camera), RS232C (motor control) |
| Power Supply | AC 100–240 V, 50/60 Hz |
| Software | WPA-View |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | WPA-100-S |
| Measurement Range | 0–4000 nm |
| Repeatability | <1.0 nm |
| Pixel Resolution | 384 × 288 (≈110,000 pixels) |
| Measurement Wavelengths | 523 nm, 543 nm, 575 nm |
| Field of View | 11.6 × 15.8 mm |
| Dimensions | 200 × 275 × 309.5 mm |
| Weight | 9 kg (unit), 4 kg (power supply) |
| Power Supply | AC 100–240 V, 50/60 Hz |
| Software | WPA-View (dedicated for WPA-100-S) |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | WPA-200, WPA-200-L |
| Measurement Range | 0–3500 nm |
| Repeatability | <0.1 nm |
| Pixel Resolution | 384 × 288 |
| Measurement Wavelengths | 523 nm, 543 nm, 575 nm |
| Field of View | 100 × 136 mm (WPA-200), 250 × 340 mm (WPA-200-L) |
| Dimensions | 310 × 466 × 605.5 mm (WPA-200), 450 × 593 × 915.5 mm (WPA-200-L) |
| Weight | 20 kg (WPA-200), 26 kg (WPA-200-L) |
| Data Interface | GigE (camera), RS232C (motor control) |
| Power Supply | AC 100–240 V, 50/60 Hz |
| Software | WPA-View |
| Brand | Photonic Lattice |
|---|---|
| Origin | Japan |
| Model | WPA-200 |
| Measurement Principle | Full-field quantitative photoelasticity via monochromatic polarized light imaging |
| Phase Retardation Range | 0–3500 nm |
| Wavelength Options | 520 nm, 543 nm, 575 nm |
| Minimum Resolution | 0.001 nm |
| Repeatability (σ) | < 0.1 nm |
| Field of View (Standard) | 218 × 290 mm to 360 × 480 mm |
| Output Data | Retardation (nm), Slow Axis Orientation (°), Optional Stress Conversion (MPa) |
| Imaging Sensor | High-sensitivity CCD camera |
| Measurement Time per Frame | ≤ 3 s |
| Software Options | Real-time analysis, Lens-specific evaluation module, External control interface, CD mode |