Physical Property Testing Instruments
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| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | XAN500 |
| Detector Type | Silicon Drift Detector (SDD) |
| Measurement Principle | Energy-Dispersive X-ray Fluorescence (ED-XRF) |
| Portability | Handheld & Benchtop-Convertible Configuration |
| Compliance | CE, RoHS, ISO 3497, ASTM B568, DIN EN ISO 3497, ISO 2178 (for magnetic substrates), ISO 2360 (for non-magnetic substrates) |
| Software | WinFTM® v8.x with GLP/GMP-compliant audit trail, FDA 21 CFR Part 11 optional module |
| Price Range | USD 25,000 – 65,000 (FOB Hamburg) |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | FMP10 |
| Price Range | USD 27,000 – 68,000 |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | FMP10–FMP40 |
| Measurement Principles | Magnetic Induction (for ferrous substrates) & Eddy Current (for non-ferrous conductive substrates) |
| Compliance Modes | IMO PSPC, SSPC-PA2, QUALANOD, QUALICOAT |
| Memory Capacity | Thousands of measurement records |
| Probe Interface | Interchangeable probe system |
| Operating Principle | Dual-method substrate-agnostic thickness quantification via calibrated electromagnetic field perturbation analysis |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | FMP100 / FMP150 |
| Measurement Principle | Magnetic Induction (for ferrous substrates) & Eddy Current (for non-ferrous substrates) |
| Operating System | Windows CE |
| Display | High-Resolution Graphical Touchscreen |
| Onboard Memory | Supports >10,000 measurements |
| Compliance Modes | IMO PSPC, SSPC-PA2, QUALANOD, QUALICOAT |
| Probe Interface | Interchangeable probe design |
| Data Management | Compatible with DataCenter IP inspection planning software |
| Regulatory Context | Designed for GLP/GMP-aligned workflows |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MMSPC-2 |
| Price Range | USD 28,000 – 70,000 |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | MP0/MP0R |
| Measurement Principle | Dual-mode electromagnetic induction (for ferrous substrates) and eddy current (for non-ferrous substrates) |
| Display | Dual independent pivotable LCD screens with backlight |
| Housing | IP65-rated ruggedized enclosure |
| Probe | Wear-resistant integrated probe |
| Compliance Modes | IMO PSPC, SSPC-PA2 |
| Operating Temperature | −10 °C to +50 °C |
| Battery Life | Up to 30,000 measurements per charge (standard alkaline AA batteries) |
| Data Output | USB interface for PC transfer |
| Calibration | Factory-calibrated with traceable NIST-equivalent reference standards |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | PCB200 |
| Price Range | USD 68,000 – 136,000 |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | PMP10 |
| Measurement Principle | Phase-Sensitive Eddy Current |
| Operating Frequencies | 60 kHz / 240 kHz / 1.25 MHz |
| Probe Compatibility | ESD20Cu, ESD20Ni, ESD20Zn, ESD2.4, ESL080 |
| Max Data Storage | 20,000 measurements across 4,000 data groups |
| Applications | 100 user-defined programs |
| Display Resolution | 3-level precision |
| Measurement Modes | Automatic, Continuous, External Trigger |
| Analysis Modes | Scientific, Statistical, Limit (Hi/Lo), Analog Simulation |
| Security | Password protection & key lock |
| Power Management | Auto-off |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Fischer PHASCOPE PMP10 |
| Price | Upon Request |
| Measurement Principle | Phase-Sensitive Eddy Current |
| Compliance | DIN EN ISO 21968 |
| Probe Options | ESD20Cu (60/240 kHz), ESL080 (via-hole Cu), ESD20Ni, ESD20Zn, ESD2.4 |
| Software | FISCHER DataCenter v5.x |
| Data Capacity | 20,000 measurements, 4,000 data sets, 100 application configurations |
| Display Resolution | 3-level precision |
| Operating Modes | Manual, Continuous, External Trigger |
| Analysis Modes | Scientific, Statistical, Limit Check, Analog Simulation |
| Security | Password Protection, Keypad Lock |
| Power Management | Auto-Shutdown |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | HM500 LIGHT |
| Compliance | DIN EN ISO 14577-1, DIN EN ISO 14577-2, DIN 50359 |
| Measurement Principle | Continuous Stiffness Measurement (CSM) & Depth-Sensing Indentation |
| Load Range | 0.1 mN – 500 mN |
| Depth Resolution | ≤ 0.05 nm (50 pm) |
| Load Resolution | ≤ 0.01 mN |
| Indenter Types | Vickers (136° diamond pyramid), Berkovich (115.2° tri-pyramid), spherical WC or diamond |
| Stiffness Measurement Mode | Enhanced Stiffness Profiling (ESP) |
| Data Acquisition Rate | Up to 1 kHz |
| Zero-Point Detection | Capacitive contact sensing with sub-nm repeatability |
| Environmental Stability | Active thermal drift compensation (< 0.05 nm/s) |
| Software Platform | FISCHER FISCHERWIN v8.x (FDA 21 CFR Part 11 compliant audit trail, GLP/GMP-ready) |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | HM500 |
| Compliance | DIN EN ISO 14577-1, DIN EN ISO 14577-2, DIN 50359 |
| Measurement Principle | Continuous Stiffness Measurement (CSM) & Depth-Sensing Indentation |
| Load Range | 0.1 mN – 1000 mN |
| Depth Resolution | ≤ 0.05 nm (sub-pm interpolation capability) |
| Load Resolution | ≤ 10 nN |
| Indenter Types | Vickers (136° diamond pyramid), Berkovich (115.2° trihedral pyramid), spherical diamond (R = 1 µm to 100 µm) |
| Stiffness Measurement Mode | Enhanced Stiffness Profiling (ESP) |
| Data Acquisition Rate | Up to 1 kHz |
| Environmental Stability | Active temperature compensation (±0.1 °C) |
| Software Compliance | FDA 21 CFR Part 11 ready, GLP/GMP audit trail enabled |
| Origin | Guangdong, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Classification | Domestic (China) |
| Models | PMP10, RMP30-S, MPO, FMP |
| Pricing | Available Upon Request |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | PMP10 |
| Pricing | Upon Request |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Fischer PMP10 |
| Pricing | Upon Request |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | SIGMASCOPE® GOLD |
| Measurement Principle | Eddy Current Conductivity Testing per ASTM E 1004 |
| Application | Non-Destructive Authentication of Gold, Silver, and Other Noble Metal Coins & Bullion |
| Penetration Depth Adjustable (M | up to ~8 mm |
| B | up to ~17 mm) |
| Compliance | ASTM E 1004, ISO 2360, EN 10045-1 |
| Sample Handling | Surface measurement through non-conductive coatings (e.g., plastic encapsulation films) |
| Display | High-resolution color touchscreen with real-time phase-angle analysis |
| Data Output | CSV export, GLP-compliant audit trail (optional), USB & Bluetooth connectivity |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | RMP30-S |
| Measurement Principle | Micro-resistive Method per EN 14571:2004 |
| Display | Dual-line, 16-character LCD (2 × 16) |
| Memory Capacity | Up to 100 application setups |
| Data Storage | Up to 10,000 measurements across 1,000 data blocks with timestamp (date/time stamping) |
| Interface | Bidirectional RS232 port |
| Probe Recognition | Automatic probe identification |
| Audio Feedback | Audible limit alarm |
| Statistical Functions | Mean, Std. Dev., Min/Max, Cp/Cpk, histogram generation |
| Compatible Probes | ERCU-N, ERCU-D10 |
| Power Supply | Rechargeable battery or AC adapter |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | ST200 |
| Instrument Type | Micro- and Nano-Scratch Tester |
| Maximum Indentation Depth | 1000 µm |
| Effective Normal Load Range | 0.1–200 N |
| Load Resolution | 3.3 µN |
| Displacement Range | 130 mm |
| Displacement Resolution | 0.01 nm |
| Maximum Friction Force | 200 N |
| Indenter Type | Natural Diamond Tip |
| Thermal Drift | ≤0.05 nm/s |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | ST30 |
| Instrument Type | Micro/Nano Scratch Tester |
| Maximum Indentation Depth | 1000 µm |
| Effective Load Range | 0.01–30 N |
| Load Resolution | 0.7 µN |
| Displacement Range | 100 mm |
| Displacement Resolution | 0.01 nm |
| Maximum Friction Force | 50 N |
| Indenter Type | Rockwell Indenter |
| Origin | UK |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | FISCHERSCOPE X-RAY Series |
| Pricing | Available Upon Request |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Fischer X-RAY XULM |
| Pricing | Available Upon Request |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | XDL-B Series |
| Measurement Principle | Energy-Dispersive X-Ray Fluorescence (ED-XRF) |
| Standards Compliance | DIN 50987, ISO 3497, ASTM B568 |
| X-ray Tube Voltage | Adjustable up to 50 kV |
| Collimator Options | 0.3 mm Ø standard |
| Measurement Chamber Dimensions (H×W×D) | 650 × 570 × 740 mm |
| Chamber Internal Dimensions (H×W×D) | 300 × 460 × 500 mm |
| Mass | ~105 kg |
| Viewing System | Integrated color CCD camera with real-time zoom and focus control |
| Distance Control Method | DCM (Distance Correction Method) for automated spectral intensity compensation across 3 fixed source-to-sample distances (standard: mid-position) |
| Sample Height Adjustment | Fixed-height X-ray head with removable support plate for oversized parts |
| Interface | RS-232, Ethernet-ready for remote command control |
| Software Platform | Native Win32 application for Windows 2000/XP |
| Language Support | English, German, French, Italian, Spanish, Chinese |
| Reporting & SPC | Embedded statistical engine with SPC charts, probability plots, histogram analysis, and customizable report generation including annotated sample images |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | XDLM Series |
| Measurement Principle | Energy-Dispersive X-Ray Fluorescence (ED-XRF) |
| Standards Compliance | DIN 50987, ISO 3497, ASTM B568 |
| X-Ray Tube | Microfocus, adjustable high voltage (30/40/50 kV) |
| Collimator Set | Circular (0.1 / 0.2 / 0.3 mm) and rectangular (0.05 × 0.3 mm) |
| Sample Chamber Dimensions (W×D×H) | 570 × 740 × 650 mm |
| Internal Chamber Volume (W×D×H) | 460 × 500 × 300 mm |
| Z-Axis Travel Range | 144 mm (motorized) |
| Camera System | Integrated color CCD camera with live imaging and on-screen crosshair overlay |
| Beam Spot Visualization | Real-time X-ray beam size indicator synchronized with focal distance |
| Distance Correction Method | DCM (Distance Control Measurement), effective up to 80 mm |
| Software Platform | WinFTM® v6 (Windows-based, 32-bit), multilingual UI (EN/DE/FR/IT/ES/ZH) |
| Data Interface | RS-232, Ethernet-compatible remote command protocol |
| Reporting & SPC | Embedded statistical engine with control charts (X̄/R, X̄/S), probability plots, histogram analysis, and customizable PDF/Excel report generation |
| Regulatory Support | Audit trail, user access levels, electronic signature readiness per FDA 21 CFR Part 11 and GLP/GMP requirements |
| Origin | Guangdong, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Classification | Domestic (China) |
| Model | Fischer XDLM-PCB 200 / 210 / 220 |
| Price Range | USD 70,000 – 140,000 |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | XDLM-PCB |
| Pricing | Available Upon Request |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | XUL Series |
| Measurement Principle | Energy-Dispersive X-Ray Fluorescence (ED-XRF) |
| Standards Compliance | DIN 50987, ISO 3497, ASTM B568 |
| X-ray Tube Voltage | Adjustable to 30 kV / 40 kV / 50 kV |
| Collimator Options | Ø0.3 mm circular or 0.05 × 0.3 mm rectangular (optional) |
| Sample Chamber Dimensions (W×D×H) | 455 × 580 × 510 mm |
| Internal Chamber Dimensions (W×D×H) | 360 × 380 × 240 mm |
| Manual X-Y Stage Travel | 50 mm (X) × 50 mm (Y) |
| Imaging System | Integrated color CCD camera with real-time magnified view and auto-focus |
| Beam Indicator | On-screen X-ray beam size overlay synchronized with focal distance |
| Software Platform | WinFTM® v6 (base) or Super WinFTM® (optional, order no. 602-950) |
| Language Support | English, German, French, Italian, Spanish, Chinese |
| Reporting | Graphical reports with embedded sample images, SPC charts, probability plots, histogram analysis |
| Regulatory Readiness | Supports GLP/GMP documentation workflows |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | XULM Series |
| Measurement Principle | Energy-Dispersive X-Ray Fluorescence (ED-XRF) |
| Standards Compliance | DIN 50987, ISO 3497, ASTM B568 |
| X-Ray Tube | Microfocus, adjustable high voltage (30/40/50 kV) |
| Collimator Options | Ø0.1 mm / Ø0.2 mm circular |
| Sample Chamber Dimensions (W×D×H) | 375 × 580 × 480 mm |
| Internal Chamber Dimensions (W×D×H) | 360 × 460 × 240 mm |
| Manual X-Y Stage Travel | 50 mm (X) × 50 mm (Y) |
| Stage Platform Size | 360 × 240 mm |
| Viewing System | Integrated color CCD camera with real-time zoom and auto-focus |
| Beam Alignment | On-screen calibrated crosshair + dynamic X-ray beam size indicator |
| Software Platform | WinFTM® v6 (Win32 native, multilingual UI) |
| Reporting | Embedded sample image capture, SPC charts (X̄/R, X̄/S), probability plots, histogram analysis |
| Regulatory Support | Audit trail, user access levels, electronic signature readiness per FDA 21 CFR Part 11 & GLP/GMP requirements |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | HM2000 |
| Instrument Type | Nanoindentation Tester |
| Max Indentation Depth | 500 µm |
| Effective Load Range | 0.1–2000 mN |
| Load Resolution | 150 nN |
| Displacement Range | 130 mm |
| Displacement Resolution | 0.01 nm |
| Max Friction Force | 50 N |
| Indenter Types | Vickers, Berkovich, Tungsten Carbide Sphere |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | HM2000S |
| Instrument Type | Microhardness Tester |
| Compliance | DIN EN ISO 14577 |
| Measurement Principle | Instrumented Indentation Testing (IIT) |
| Key Output Parameters | Martens Hardness (HM), Indentation Hardness (HIT), Indentation Modulus (EIT), Indentation Creep (CIT), Elastic Work Ratio (ηIT), Depth- and Load-Dependent Property Mapping via ESP Mode |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | MMS PC2 BU |
| Price Range | USD 27,000 – 68,000 (based on configuration and probe selection) |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MMS PC2 |
| Pricing | Upon Request |