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| Brand | Molecular Vista |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | VistaScope |
| Price Range | USD 420,000 – 700,000 |
| Instrument Type | Material Science AFM |
| Position Detection Noise | ≤ 50 pm RMS |
| Sample Dimensions | Ø ≤ 25 mm, Thickness ≤ 10 mm |
| XY Stage Travel Range | 6 mm × 6 mm |
| Origin | USA |
|---|---|
| Supplier Type | Authorized Distributor |
| Import Status | Imported |
| Available Volumes | 50 mL, 100 mL, 200 mL, 500 mL (aqueous or organic dispersion) |
| Pricing | Upon Request |
| Brand | Molecular Vista |
|---|---|
| Origin | USA |
| Model | Vista-SNOM |
| Positioning Detection Noise | ≤ 50 pm RMS |
| Sample Size | Ø ≤ 25 mm, Thickness ≤ 10 mm |
| Sample Stage Travel Range | 6 mm × 6 mm |
| Origin | Imported |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Model | Ntegra Spectra |
| Pricing | Available Upon Request |
| Origin | Czech Republic |
|---|---|
| Manufacturer Type | Distributor |
| Origin Category | Imported |
| Model | LiteScope |
| Price Range | USD 65,000–130,000 |
| Instrument Type | Atomic Force Microscope |
| Positional Detection Noise | AFM-in-SEM Integration |
| Sample Dimensions | In-situ AFM-compatible |
| Stage Travel Range | 100 × 100 × 100 µm |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Prime |
| Price Range | USD 135,000 – 205,000 |
| Instrument Type | Atomic Force Microscope (AFM)-Based Scanning Microwave Impedance Microscope |
| Positional Detection Noise | 0.01 nm |
| Scan Area | 20 µm × 20 µm (model-dependent) |
| Stage Travel Range | 100 µm × 100 µm × 10 µm |
| Origin | Imported |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Model | NTegra Platform Series (Prima, Aura, Therma, Maximus, Solaris, Vita, Tomo, Spectra) |
| Pricing | Available Upon Request |
| Brand | NT-MDT |
|---|---|
| Origin | Russia |
| Model | Solver Next |
| Instrument Type | Atomic Force Microscope |
| Z-direction Position Detection Noise | 0.02 nm (low-current mode) |
| Maximum Sample Dimensions | Ø ≤ 20 mm, Height ≤ 10 mm |
| XY Sample Stage Travel Range | 5 mm × 5 mm |
| Scan Range (Closed-loop) | 100 µm × 100 µm × 10 µm |
| Z-noise (RMS, 10–1000 Hz) | ≤ 0.04 nm (closed-loop), 0.02 nm (low-current mode) |
| XY Nonlinearity | ≤ 0.1% (closed-loop) |
| Video Microscope Resolution | 2 µm |
| Temperature Control Range | Room Temperature to 150 °C |
| Origin | USA |
|---|---|
| Manufacturer Type | Distributor |
| Origin Category | Imported |
| Model | VertiSense |
| Price Range | USD 14,000 – 72,000 (based on AFM integration configuration) |
| Instrument Type | Atomic Force Microscope (AFM)-Compatible Thermal Scanning Probe Module |
| Temperature Resolution | ≤ 10 mK (dependent on host AFM electronics and thermal calibration) |
| Spatial Thermal Resolution | ≤ 20 nm (tip-limited, under optimal vacuum/low-noise conditions) |
| Maximum Tip Operating Temperature | 700 °C |
| Sample Stage Compatibility | Fully compatible with standard commercial AFM sample stages (e.g., Bruker Dimension, Keysight 5500, Park Systems XE-series, Nanosurf Flex-Axiom) |
| Brand | NanoMagnetics |
|---|---|
| Origin | United Kingdom |
| Model | ezAFM |
| Instrument Type | Material-Grade AFM |
| Position Detection Noise | 75 fm/√Hz |
| Maximum Sample Dimensions | 10 × 10 × 5 mm |
| XY Stage Travel Range | 38 × 38 mm |
| Scan Areas | 120 × 120 × 40 µm (Z resolution: 0.2 nm) or 40 × 40 × 4 µm (Z resolution: 0.02 nm) |
| Lateral Resolution | 16 nm (large scan) / 5 nm (high-res scan) |
| Optical View System | Full HD CCD, 2 µm resolution, 390 × 230 µm FOV, 2516 × 1960 pixels, 30 fps |
| Controller | 24-bit ADC/DAC, FPGA/DSP-based digital feedback |
| Standard Imaging Modes | Contact, Tapping, Phase, LFM, MFM |
| Extended Modes (ezAFM+) | EFM, KPFM, C-AFM, SSRM, PRFM, FMM, nanomechanical mapping, liquid-phase, vacuum-compatible configurations |
| Brand | Park SYSTEMS |
|---|---|
| Origin | Fujian, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China) |
| Model | NX10 High-Precision Atomic Force Microscope (SHNTI) |
| Price Range | USD 95,000 – 218,000 |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Brand | NT-MDT |
|---|---|
| Origin | Imported |
| Manufacturer Type | Authorized Distributor |
| Model | Solver P47-Pro |
| Pricing | Available Upon Request |
| Measurement Modes | STM, AFM (Contact/Tapping/Non-contact), LFM, Phase Imaging, Force Modulation, Force Spectroscopy, Adhesion Mapping, MFM, EFM, Kelvin Probe, SSRM, Nanoindentation, Voltage/Force Nanolithography |
| Scanning Configurations | Sample Scanning, Tip Scanning, Dual-Scan Option |
| Max Sample Size (Sample Scan) | Ø40 mm × 10 mm |
| XY Sample Positioning Range | 5 × 5 µm |
| Positioning Accuracy | ±5 µm |
| Environmental Operation | Ambient Air, Controlled Atmosphere, Liquid Cell Compatible |
| Temperature Control | Room Temperature to 130 °C |
| Optical System | Custom-Configurable |
| SPM Techniques Supported | >40 Quantitative Modes |
| Brand | Nanosensors (distributed by SHNTI) |
|---|---|
| Origin | Switzerland |
| Probe Type | Tapping Mode AFM Cantilevers |
| Substrate Material | Boron-Doped Silicon (5×10²⁰/cm³) |
| Substrate Dimensions | 1.6 mm × 3.6 mm × 0.4 mm |
| Reflective Coating | Au (3× reflectivity vs. uncoated) |
| Tip Radius | ≤10 nm (SEM-verified, S-series option available) |
| Tip Height | 10–15 µm |
| Cantilevers per Chip | 2 rectangular beams |
| Aspect Ratio | 3:1 |
| Half-Angle | ≤22° |
| Conductive Coating Options | TiN, W₂C, Pt, Au |
| Compatibility | Universal SPM platforms (Bruker, Keysight, Park Systems, NT-MDT, etc.) |
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