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| Brand | KLA |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | Gemini |
| Price Range | USD $65,000 – $130,000 |
| Instrument Type | Multi-Axis Nanomechanical Testing System |
| Maximum Indentation Depth | 50 µm |
| Effective Load Range | 50 mN |
| Load Resolution | 3 nN |
| Displacement Range | 50 µm |
| Displacement Resolution | 4 nm |
| Maximum Friction Force | 50 mN |
| Indenter Tip Material | Single-Crystal Diamond |
| Brand | Molecular Vista |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | VistaScope |
| Price Range | USD 420,000 – 700,000 |
| Instrument Type | Material Science AFM |
| Position Detection Noise | ≤ 50 pm RMS |
| Sample Dimensions | Ø ≤ 25 mm, Thickness ≤ 10 mm |
| XY Stage Travel Range | 6 mm × 6 mm |
| Origin | Germany |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Nanofocus μSurf |
| Pricing | Upon Request |
| Origin | Jiangsu, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Regional Origin | Domestic (PRC) |
| Model | Custom Grating Fabrication |
| Pricing | Available Upon Technical Consultation |
| Brand | LUMINA |
|---|---|
| Origin | USA |
| Model | AT1 |
| Type | Non-contact Profilometer / Surface Metrology System |
| Measurement Principle | Multi-modal Optical Scattering, Ellipsometry, Reflectometry, and Surface Slope Analysis |
| Sample Compatibility | Transparent (e.g., fused silica, sapphire, glass), semi-transparent (e.g., GaN, SiC), and opaque substrates (e.g., Si, GaAs, InP, metals) |
| Scan Area | Up to 300 × 300 mm |
| Wafer Handling | Supports 150 mm wafers (full-surface scan in ≤ 3 min), 50 × 50 mm samples in ≤ 30 s |
| Detection Sensitivity | Sub-nanometer vertical resolution for film thickness uniformity |
| Mechanical Architecture | Fixed-optics, non-rotating platform with high inertial damping |
| Regulatory Alignment | Designed for GLP/GMP-compliant environments |
| Brand | KLA |
|---|---|
| Origin | Malaysia |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | ZETA-20 |
| Product Type | Non-contact Optical Profilometer / Surface Roughness Analyzer |
| Operating Principle | White-light Interferometry |
| Key Imaging Technology | ZDot™ 3D Imaging |
| Vertical Resolution | Sub-Ångström (≤0.1 nm) |
| Measurement Modes | Six Integrated Optical Modules |
| Surface Reflectivity Range | 0.5% – >85% |
| Output | True-color 2D/3D Images |
| Compliance | ASTM E2921, ISO 25178-2, ISO 4287, USP <1056>, FDA 21 CFR Part 11 Ready (via optional software module) |
| Brand | BI/Biosensing Instrument |
|---|---|
| Origin | USA |
| Model | BI-4500 |
| Detection Principle | Surface Plasmon Resonance (SPR) |
| Optical Wavelength | 670 nm |
| Angular Resolution | <0.01 mDeg RMS |
| Sensitivity | <0.06 RU RMS |
| Flow Channels | 5 independent microfluidic channels |
| Flow Rate Range | 1.0–250 µL/min |
| Minimum Analyte MW | 100 Da |
| Injection Volume | >50 µL |
| Injection Time | <0.2 s |
| Liquid-Phase Incident Angle Range | 67–81° |
| Gas-Phase Incident Angle Range (optional) | 40–47° |
| BI-DirectFlow™ Technology | Yes |
| Software Compliance | FDA 21 CFR Part 11 ready (audit trail, electronic signature support), GLP/GMP-compatible data handling |
| Brand | FemtoTools |
|---|---|
| Origin | Switzerland |
| Model | FT-G Series Nanotweezers (FT-G30, FT-G60, FT-G100) |
| Compatible Systems | FT-GS1000 Micro-Nano Assembler, FT-GS5000 Nano Assembly System |
| Controller | FT-GC01 Nanotweezer Controller |
| Operating Environments | Ambient air, liquid, and high vacuum (SEM-compatible) |
| Force Feedback | Integrated capacitive force sensor (FT-G30 & FT-G100) |
| Displacement Resolution | <1 nm |
| Force Resolution | <100 pN |
| Brand | SHNTI |
|---|---|
| Origin | Shanghai, China |
| Model | AMT |
| Type | Desktop Active Vibration Isolation System |
| Control Architecture | Digital Adaptive Feedback + Bottom-Mounted Feedforward |
| Sensor Configuration | Triaxial Floor-Mounted + Platform-Mounted Accelerometers |
| Stability | Robust Control Algorithm with Long-Term Drift Compensation |
| Compliance | Designed for ISO 20483 Class 1–2 Laboratory Environments |
| Load Capacity | Up to 50 kg (typical for mid-size AFM, optical interferometers, nanoindenter systems) |
| Interface | Ethernet/USB, Web-Based GUI with Real-Time Monitoring |
| Brand | SWIFT |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SWIFT In Situ Tensile Stage |
| Instrument Classification | In Situ Mechanical Testing Stage |
| Application Field | Materials Science |
| Maximum Load Capacity | 10 kN |
| Temperature Range | 0–1200 °C |
| Tensile Load Capacity | 10 kN |
| Stroke | 26 mm |
| Brand | SHNTI |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | IPS Series SiC Crystal Growth System |
| Crystal Types | Silicon Carbide (SiC) only |
| Max. Crystal Diameter | 6-inch and 8-inch |
| Typical Boule Length (Constant-Diameter Section) | 20–30 mm |
| Base Vacuum | ≤5.0 × 10⁻⁵ Pa |
| Pressure Rise Rate | ≤3 Pa / 12 h |
| Microtube Density (6″ P-type Substrate) | <0.5 cm⁻² |
| Resistivity Range (6″ P-type) | 0.015–0.028 Ω·cm |
| Cooling System | Dual-loop water cooling with real-time temperature & flow monitoring |
| Heating Method | Optimized RF induction coil architecture |
| Process Control | Fully integrated PIM self-diagnostic module + multi-stage PID thermal profiling |
| Origin | Shaanxi, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (PRC) |
| Model | MPD-01 |
| Price | USD 7,000 (FOB) |
| Temperature Range | Ambient to 400 °C |
| Temperature Resolution | 0.1 °C |
| Sampling Rate | 1 Hz |
| Power Consumption | 1 kW |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | 8500 |
| Price Range | USD 135,000 – 205,000 (FOB) |
| Electron Gun Type | Cold Field-Emission (CFE) |
| Secondary Electron Imaging Resolution | 10 nm @ 1 kV |
| Magnification Range | 250× – 800,000× |
| Accelerating Voltage | 0.5 – 2.0 kV |
| Brand | SHNTI |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | SN-LDE |
| Pricing | Upon Request |
| Frame Dimensions | 5×5 mm, 7.5×7.5 mm, or 10×10 mm |
| Window Aperture | 1.0×1.0 mm to 5.0×5.0 mm (square) |
| Si₃N₄ Membrane Thickness | 50–200 nm (custom 30–500 nm, MOQ 100 pcs) |
| Frame Thickness | 200 µm, 381 µm, or 525 µm |
| Surface Roughness | <1 nm RMS |
| Max Operating Temperature | 1000 °C |
| Vacuum Rating | ≥1 atm differential pressure (dependent on membrane thickness & aperture size) |
| Chemical Stability | Inert, compatible with plasma, glow discharge, and mild chemical cleaning (no ultrasonication) |
| Brand | FRT |
|---|---|
| Origin | Germany |
| Model | MicroProf MHU |
| Wafer Handling | Semi-Automatic with Material Handling Unit (MHU) |
| Throughput | Up to 220 wafers/hour |
| Wafer Diameter Support | 2″ to 8″ |
| Cassette Capacity | Up to 4 open FOUPs/SMIF pods |
| Integrated Options | Pre-aligner, OCR reader |
| Application Focus | Semiconductor, MEMS, Sapphire, LED wafer manufacturing |
| Brand | DENTON |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Voyager |
| Price Range | USD $38,000 – $64,000 |
| Brand | SHNTI |
|---|---|
| Origin | Shanghai, China |
| Model | YPL-NIL-SI400 |
| Temperature Range | RT to 350 °C |
| Pressure Range | 0–20 psi (on 4″ wafer) |
| Vacuum Range | 101.3 kPa to 0.1 Pa |
| UV Exposure System | Integrated |
| Sample Holder Max Diameter | 100 mm (4″) |
| Cooling | Integrated Water-Cooled System |
| Control | PLC-based with Touchscreen HMI |
| Software | Proprietary SI400 Machine Control Suite |
| Loading Method | Manual Wafer/Template Handling |
| Sealing | Bellows-Sealed Vacuum Chamber |
| Compliance | Designed for Class 100–1000 cleanroom integration |
| Origin | USA |
|---|---|
| Supplier Type | Authorized Distributor |
| Import Status | Imported |
| Available Volumes | 50 mL, 100 mL, 200 mL, 500 mL (aqueous or organic dispersion) |
| Pricing | Upon Request |
| Brand | MVI |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | Vista-IR |
| Instrument Category | Laser-Based Infrared Spectrometer |
| Instrument Type | Laboratory Benchtop System |
| Wavenumber Range | 760–4400 cm⁻¹ |
| Spatial Resolution | <10 nm |
| Spectral Resolution | <2 cm⁻¹ |
| Scan Rate | 10 spectra/sec |
| Signal-to-Noise Ratio | 100:1 |
| Brand | SHNTI |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | VIL1000 |
| Light Source | Coherent Laser (UV/Deep-UV or Visible, Configurable) |
| Minimum Achievable Line Width | <50 nm |
| Grating Period Range | 240–1500 nm |
| Maximum Exposure Field | 200 mm × 200 mm (8-inch wafer compatible) |
| Pattern Reconfigurability | Real-time, maskless, via beam steering optics |
| Positioning Accuracy | Sub-10 nm (closed-loop piezo stage) |
| Brand | Molecular Vista |
|---|---|
| Origin | USA |
| Model | Vista-SNOM |
| Positioning Detection Noise | ≤ 50 pm RMS |
| Sample Size | Ø ≤ 25 mm, Thickness ≤ 10 mm |
| Sample Stage Travel Range | 6 mm × 6 mm |
| Origin | Imported |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Model | Ntegra Spectra |
| Pricing | Available Upon Request |
| Origin | Czech Republic |
|---|---|
| Manufacturer Type | Distributor |
| Origin Category | Imported |
| Model | LiteScope |
| Price Range | USD 65,000–130,000 |
| Instrument Type | Atomic Force Microscope |
| Positional Detection Noise | AFM-in-SEM Integration |
| Sample Dimensions | In-situ AFM-compatible |
| Stage Travel Range | 100 × 100 × 100 µm |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Prime |
| Price Range | USD 135,000 – 205,000 |
| Instrument Type | Atomic Force Microscope (AFM)-Based Scanning Microwave Impedance Microscope |
| Positional Detection Noise | 0.01 nm |
| Scan Area | 20 µm × 20 µm (model-dependent) |
| Stage Travel Range | 100 µm × 100 µm × 10 µm |
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